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20UPGFC0135075
ITkPixV2-0f-(10,3)
  ITkPD Component Page Jump to ITkPD component page

Component Information

Item Value
Serial Number 20UPGFC0135075
Production DB Component ID f72006dd0782e55b1927c650ef7961c4
LocalDB Component ID 65d94133ba853e00426a0bcc
Component Type front-end_chip
Super-Component 20UPGM23603041  20UPGB43309002 
Sub-Components No match.
Flags

Properties

Item Data Type Value
Wafer serial number string None

Comments

Current Stage: Initial Warm

Test Type Local Result
ADC Calibration
(ADC_CALIBRATION)
No TestRun! TestRun is missing in LocalDB.
Analog Readback
(ANALOG_READBACK)
TestRun Present At least one candidate TestRun is registered in LocalDB.
SLDO
(SLDO)
TestRun Present At least one candidate TestRun is registered in LocalDB.
VCAL Calibration
(VCAL_CALIBRATION)
TestRun Present At least one candidate TestRun is registered in LocalDB.
Low Power Mode
(LP_MODE)
TestRun Present At least one candidate TestRun is registered in LocalDB.
Overvoltage Protection
(OVERVOLTAGE_PROTECTION)
No TestRun! TestRun is missing in LocalDB.
Undershunt Protection
(UNDERSHUNT_PROTECTION)
No TestRun! TestRun is missing in LocalDB.
Data Transmission
(DATA_TRANSMISSION)
No TestRun! TestRun is missing in LocalDB.
Injection Capacitance
(INJECTION_CAPACITANCE)
TestRun Present At least one candidate TestRun is registered in LocalDB.
Minimal Health Test
(MIN_HEALTH_TEST)
No TestRun! TestRun is missing in LocalDB.
Tuning
(TUNING)
No TestRun! TestRun is missing in LocalDB.
Pixel Failure Analysis
(PIXEL_FAILURE_ANALYSIS)
No TestRun! TestRun is missing in LocalDB.

Candidate TestRuns of this Stage

LocalDB Object ID TestRun Code QC Passed Inspector Date Analysis Version QC Registration
6659100e442c248f1aebbb62 INJECTION_CAPACITANCE Failed None 2024-05-30 16:47:23 PDT(-0700) 2.2.4 Selected
66590cbd442c248f1aebbb26 VCAL_CALIBRATION Passed None 2024-05-30 16:33:14 PDT(-0700) 2.2.4 Selected
66590bdf442c248f1aebbae4 SLDO Failed None 2024-05-30 16:29:31 PDT(-0700) 2.2.4 Selected
6658fb73442c248f1aebbaa7 ANALOG_READBACK Failed None 2024-05-30 15:19:21 PDT(-0700) 2.2.4 Selected
6658c968442c248f1aebba0b INJECTION_CAPACITANCE Failed None 2024-05-30 11:45:57 PDT(-0700) 2.2.4
6658c931442c248f1aebb9cf VCAL_CALIBRATION Passed None 2024-05-30 11:45:02 PDT(-0700) 2.2.4
6658c87d442c248f1aebb98d SLDO Failed None 2024-05-30 11:42:01 PDT(-0700) 2.2.4
6658c6f8442c248f1aebb94d ANALOG_READBACK Failed None 2024-05-30 11:35:25 PDT(-0700) 2.2.4
665895ef442c248f1aebb89c LP_MODE Failed None 2024-05-30 08:06:21 PDT(-0700) 2.2.4 Selected
665890b1442c248f1aebb869 INJECTION_CAPACITANCE Failed None 2024-05-30 07:43:58 PDT(-0700) 2.2.4
66588fad442c248f1aebb825 INJECTION_CAPACITANCE Failed None 2024-05-30 07:39:38 PDT(-0700) 2.2.4
6657c2a2c44d66a9d04b8a16 VCAL_CALIBRATION Passed None 2024-05-29 17:04:47 PDT(-0700) 2.2.4
6657a79fc44d66a9d04b89c4 VCAL_CALIBRATION Passed None 2024-05-29 15:09:32 PDT(-0700) 2.2.4
6657a203c44d66a9d04b897e SLDO Failed None 2024-05-29 14:45:35 PDT(-0700) 2.2.4
665799a4c44d66a9d04b8935 ANALOG_READBACK Failed None 2024-05-29 14:09:46 PDT(-0700) 2.2.4
665778a4c44d66a9d04b88b7 ANALOG_READBACK Failed None 2024-05-29 11:48:58 PDT(-0700) 2.2.4
66577391c44d66a9d04b881e ANALOG_READBACK Failed None 2024-05-29 11:27:19 PDT(-0700) 2.2.4

Past QC Stages and Results

  Stage: Wire Bonding (MODULE/WIREBONDING) Locally Signed Off

No tests are allocated for this stage.

  Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Initial state to associate flex to bare module (MODULE/INIT) Not signed-off

No tests are allocated for this stage.

  Stage: Reception at ITk institute (BAREMODULERECEPTION) Locally Signed Off

Test Local Result ProdDB Record
Analog Readback
(ANALOG_READBACK)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Minimal Health Test
(MIN_HEALTH_TEST)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Bare module assembly (BAREMODULEASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Not to be used for detector (UNUSABLE) Locally Signed Off

No tests are allocated for this stage.

  Stage: Hybridisation (HYBRIDISATION) Locally Signed Off

No tests are allocated for this stage.

  Stage: Testing on wafer (TESTONWAFER) Locally Signed Off

Test Local Result ProdDB Record
Electrical FE chip tests
(FECHIP_TEST)
Registered Test is registered in LocalDB.
Registered Jump to the ITkPD TestRun Page!
LocalDB Test ID Stage Test Name Inspector Date QC Registration
6659100e442c248f1aebbb62 MODULE/INITIAL_WARM INJECTION_CAPACITANCE None 2024-05-30 16:47:23 PDT(-0700) Selected
66590cbd442c248f1aebbb26 MODULE/INITIAL_WARM VCAL_CALIBRATION None 2024-05-30 16:33:14 PDT(-0700) Selected
66590bdf442c248f1aebbae4 MODULE/INITIAL_WARM SLDO None 2024-05-30 16:29:31 PDT(-0700) Selected
6658fb73442c248f1aebbaa7 MODULE/INITIAL_WARM ANALOG_READBACK None 2024-05-30 15:19:21 PDT(-0700) Selected
6658c968442c248f1aebba0b MODULE/INITIAL_WARM INJECTION_CAPACITANCE None 2024-05-30 11:45:57 PDT(-0700)
6658c931442c248f1aebb9cf MODULE/INITIAL_WARM VCAL_CALIBRATION None 2024-05-30 11:45:02 PDT(-0700)
6658c87d442c248f1aebb98d MODULE/INITIAL_WARM SLDO None 2024-05-30 11:42:01 PDT(-0700)
6658c6f8442c248f1aebb94d MODULE/INITIAL_WARM ANALOG_READBACK None 2024-05-30 11:35:25 PDT(-0700)
665895ef442c248f1aebb89c MODULE/INITIAL_WARM LP_MODE None 2024-05-30 08:06:21 PDT(-0700) Selected
665890b1442c248f1aebb869 MODULE/INITIAL_WARM INJECTION_CAPACITANCE None 2024-05-30 07:43:58 PDT(-0700)
66588fad442c248f1aebb825 MODULE/INITIAL_WARM INJECTION_CAPACITANCE None 2024-05-30 07:39:38 PDT(-0700)
6657c2a2c44d66a9d04b8a16 MODULE/INITIAL_WARM VCAL_CALIBRATION None 2024-05-29 17:04:47 PDT(-0700)
6657a79fc44d66a9d04b89c4 MODULE/INITIAL_WARM VCAL_CALIBRATION None 2024-05-29 15:09:32 PDT(-0700)
6657a203c44d66a9d04b897e MODULE/INITIAL_WARM SLDO None 2024-05-29 14:45:35 PDT(-0700)
665799a4c44d66a9d04b8935 MODULE/INITIAL_WARM ANALOG_READBACK None 2024-05-29 14:09:46 PDT(-0700)
665778a4c44d66a9d04b88b7 MODULE/INITIAL_WARM ANALOG_READBACK None 2024-05-29 11:48:58 PDT(-0700)
66577391c44d66a9d04b881e MODULE/INITIAL_WARM ANALOG_READBACK None 2024-05-29 11:27:19 PDT(-0700)
65d942a4ba853e00426a21c4 TESTONWAFER FECHIP_TEST KonstantinMauer 2024-04-29 08:38:14 PDT(-0700) Selected

Stage: MODULE/INITIAL_WARM

Mode: warm
Index Revision ID Timestamp Message
HEAD 6659...ebbb63 2024-05-30 16:47:26 PDT(-0700) config revision by INJECTION-CAPACITANCE with RAW data 6659100b442c248f1aebbb55 and analysis result 6659100e442c248f1aebbb62
HEAD^1 6659...ebbb27 2024-05-30 16:33:17 PDT(-0700) config revision by VCAL-CALIBRATION with RAW data 66590cba442c248f1aebbb17 and analysis result 66590cbd442c248f1aebbb26
HEAD^2 6659...ebbae5 2024-05-30 16:29:35 PDT(-0700) config revision by SLDO with RAW data 66590bdb442c248f1aebbad7 and analysis result 66590bdf442c248f1aebbae4
HEAD^3 6658...ebbaa8 2024-05-30 15:19:31 PDT(-0700) config revision by ANALOG-READBACK with RAW data 6658fb69442c248f1aebba83 and analysis result 6658fb73442c248f1aebbaa7
HEAD^4 6658...ebba0c 2024-05-30 11:46:00 PDT(-0700) config revision by INJECTION-CAPACITANCE with RAW data 6658c965442c248f1aebb9fe and analysis result 6658c968442c248f1aebba0b
HEAD^5 6658...ebb9d0 2024-05-30 11:45:05 PDT(-0700) config revision by VCAL-CALIBRATION with RAW data 6658c92e442c248f1aebb9c0 and analysis result 6658c931442c248f1aebb9cf
HEAD^6 6658...ebb98e 2024-05-30 11:42:05 PDT(-0700) config revision by SLDO with RAW data 6658c879442c248f1aebb97d and analysis result 6658c87d442c248f1aebb98d
HEAD^7 6658...ebb94e 2024-05-30 11:35:36 PDT(-0700) config revision by ANALOG-READBACK with RAW data 6658c6ed442c248f1aebb929 and analysis result 6658c6f8442c248f1aebb94d
HEAD^8 6658...ebb86a 2024-05-30 07:44:01 PDT(-0700) config revision by INJECTION-CAPACITANCE with RAW data 665890ae442c248f1aebb85c and analysis result 665890b1442c248f1aebb869
HEAD^9 6658...ebb826 2024-05-30 07:39:41 PDT(-0700) config revision by INJECTION-CAPACITANCE with RAW data 66588faa442c248f1aebb818 and analysis result 66588fad442c248f1aebb825
HEAD^10 6657...4b8a17 2024-05-29 17:04:50 PDT(-0700) config revision by VCAL-CALIBRATION with RAW data 6657c29fc44d66a9d04b8a07 and analysis result 6657c2a2c44d66a9d04b8a16
HEAD^11 6657...4b89c5 2024-05-29 15:09:35 PDT(-0700) config revision by VCAL-CALIBRATION with RAW data 6657a79cc44d66a9d04b89b5 and analysis result 6657a79fc44d66a9d04b89c4
HEAD^12 6657...4b897f 2024-05-29 14:45:39 PDT(-0700) config revision by SLDO with RAW data 6657a1ffc44d66a9d04b8971 and analysis result 6657a203c44d66a9d04b897e
HEAD^13 6657...4b8936 2024-05-29 14:09:56 PDT(-0700) config revision by ANALOG-READBACK with RAW data 6657999ac44d66a9d04b8911 and analysis result 665799a4c44d66a9d04b8935
HEAD^14 6657...4b88b8 2024-05-29 11:49:08 PDT(-0700) config revision by ANALOG-READBACK with RAW data 6657789ac44d66a9d04b8893 and analysis result 665778a4c44d66a9d04b88b7
HEAD^15 6657...4b881f 2024-05-29 11:27:29 PDT(-0700) config revision by ANALOG-READBACK with RAW data 66577387c44d66a9d04b87fa and analysis result 66577391c44d66a9d04b881e
HEAD^16 6656...3ad866 2024-05-28 13:55:27 PDT(-0700) initial generation from module-qc-database-tools
Mode: cold
Index Revision ID Timestamp Message
HEAD 6656...3ad86e 2024-05-28 13:55:27 PDT(-0700) initial generation from module-qc-database-tools
Mode: LP
Index Revision ID Timestamp Message
HEAD 6658...ebb89d 2024-05-30 08:06:23 PDT(-0700) config revision by LP-MODE with RAW data 665895ed442c248f1aebb895 and analysis result 665895ef442c248f1aebb89c
HEAD^1 6656...3ad876 2024-05-28 13:55:27 PDT(-0700) initial generation from module-qc-database-tools
Stage Tests
TESTONWAFER
  • Electrical FE chip tests   (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Analog Readback  (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Low Power Mode  (LP_MODE)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • Data Transmission  (DATA_TRANSMISSION)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Tuning  (TUNING)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Low Power Mode  (LP_MODE)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • Data Transmission  (DATA_TRANSMISSION)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Tuning  (TUNING)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Tuning  (TUNING)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
  • Low Power Mode  (LP_MODE)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • Data Transmission  (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
MODULE/POST_PARYLENE_WARM
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Data Transmission  (DATA_TRANSMISSION)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Tuning  (TUNING)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
  • Low Power Mode  (LP_MODE)
MODULE/POST_PARYLENE_COLD
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Low Power Mode  (LP_MODE)
  • Data Transmission  (DATA_TRANSMISSION)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • SLDO  (SLDO)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Tuning  (TUNING)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
MODULE/WIREBOND_PROTECTION
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
MODULE/THERMAL_CYCLES
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
MODULE/LONG_TERM_STABILITY_TEST
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
MODULE/FINAL_WARM
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Data Transmission  (DATA_TRANSMISSION)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
  • Tuning  (TUNING)
  • Low Power Mode  (LP_MODE)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Low Power Mode  (LP_MODE)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • Tuning  (TUNING)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
  • Data Transmission  (DATA_TRANSMISSION)
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
  • ADC Calibration  (ADC_CALIBRATION)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • SLDO  (SLDO)
  • Undershunt Protection  (UNDERSHUNT_PROTECTION)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Tuning  (TUNING)
  • Analog Readback  (ANALOG_READBACK)
  • Overvoltage Protection  (OVERVOLTAGE_PROTECTION)
  • Low Power Mode  (LP_MODE)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Data Transmission  (DATA_TRANSMISSION)
MODULE/COMPLETE
MODULE/RECEPTION
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • Data Transmission  (DATA_TRANSMISSION)
MODULE/TAB_CUTTING
  • Minimal Health Test  (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Low Power Mode  (LP_MODE)
  • Data Transmission  (DATA_TRANSMISSION)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Tuning  (TUNING)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD
  • ADC Calibration  (ADC_CALIBRATION)
  • Analog Readback  (ANALOG_READBACK)
  • SLDO  (SLDO)
  • VCAL Calibration  (VCAL_CALIBRATION)
  • Injection Capacitance  (INJECTION_CAPACITANCE)
  • Low Power Mode  (LP_MODE)
  • Data Transmission  (DATA_TRANSMISSION)
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Tuning  (TUNING)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
  • Minimal Health Test  (MIN_HEALTH_TEST)
  • Pixel Failure Analysis  (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/TAB_CUTTING
  • Minimal Health Test  (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY
  • OB:Loaded local support QC electrical connectivity  (OBLoadedLocalSupportQC_ElectricalConnectivity)
  • OB:Loaded local support QC electrical performance  (OBLoadedLocalSupportQC_ElectricalPerformance)
  • OB:Loaded local support reception at the integration site  (OBLoadedLocalSupport_IntegrationSite)
  • OB:Loaded local support QC electrical low power  (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE
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