| Serial Number | 20UPGFC0088388 |
|---|---|
| ProdDB ID | bdcfdc…451035 |
| LocalDB ID | 622528e380e95c000a57beea |
| Component Type | fe_chip |
| Parents | 20UPGM22601022 20UPGB42302001 20UPGM22601022 20UPGB42302001 |
| Children | No match. |
| Flags |
| Test Type | Local Result |
|---|---|
| ADC Calibration (ADC_CALIBRATION) |
No TestRun! |
| Analog Readback (ANALOG_READBACK) |
No TestRun! |
| SLDO (SLDO) |
No TestRun! |
| VCAL Calibration (VCAL_CALIBRATION) |
No TestRun! |
| Low Power Mode (LP_MODE) |
No TestRun! |
| Data Transmission (DATA_TRANSMISSION) |
No TestRun! |
| Injection Capacitance (INJECTION_CAPACITANCE) |
No TestRun! |
| Minimal Health Test (MIN_HEALTH_TEST) |
No TestRun! |
| Tuning (TUNING) |
No TestRun! |
| Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) |
No TestRun! |
| LDB ID | TestRun Code | QC Passed | Inspector | Measurement Date | Analysis Date | Analysis Version | Tags | QC Registration |
|---|
| Test | Local Result | ProdDB Record |
|---|---|---|
| Electrical FE chip tests (FECHIP_TEST) |
Registered | Registered |
| LocalDB Test ID | Stage | Test Name | Inspector | Measurement Date | Analysis Date | Tags | QC Registration |
|---|---|---|---|---|---|---|---|
| 622529…57c743 | TESTONWAFER | FECHIP_TEST | MarkStandke | N/A | No tags | Selected |
| Index | Revision ID | Timestamp | Message |
|---|---|---|---|
| HEAD | 66a2...4d26b5 | initial generation from module-qc-database-tools |
| Index | Revision ID | Timestamp | Message |
|---|---|---|---|
| HEAD | 66a2...4d26da | initial generation from module-qc-database-tools |
| Index | Revision ID | Timestamp | Message |
|---|---|---|---|
| HEAD | 66a2...4d26ff | initial generation from module-qc-database-tools | |
| HEAD^1 | 66a2...4d26f8 | initial generation from module-qc-database-tools |
| Stage | Tests |
|---|---|
| TESTONWAFER |
|
| HYBRIDISATION |
|
| UNUSABLE |
|
| BAREMODULEASSEMBLY |
|
| BAREMODULERECEPTION |
|
| MODULE/INIT |
|
| MODULE/ASSEMBLY |
|
| MODULE/WIREBONDING |
|
| MODULE/INITIAL_WARM |
|
| MODULE/QC_CROSSCHECK |
|
| MODULE/INITIAL_COLD |
|
| MODULE/PARYLENE_MASKING |
|
| MODULE/PARYLENE_COATING |
|
| MODULE/PARYLENE_UNMASKING |
|
| MODULE/WIREBOND_PROTECTION |
|
| MODULE/POST_PARYLENE_WARM |
|
| MODULE/POST_PARYLENE_COLD |
|
| MODULE/THERMAL_CYCLES |
|
| MODULE/LONG_TERM_STABILITY_TEST |
|
| MODULE/FINAL_WARM |
|
| MODULE/FINAL_COLD |
|
| MODULE/FINAL_METROLOGY |
|
| MODULE/QC_STATUS |
|
| MODULE/UNHAPPY |
|
| MODULE/NOTCONSIDEREDINYIELDS |
|
| MODULE/GRAVEYARD |
|
| MODULE/COMPLETE |
|
| MODULE/RECEPTION |
|
| MODULE/TAB_CUTTING |
|
| LLS/PRE_TC_WARM |
|
| LLS/PRE_TC_COLD |
|
| LLS/POST_TC_WARM |
|
| LLS/POST_TC_COLD |
|
| LLS/RECEPTION |
|
| OB_LOADED_MODULE_CELL/INIT |
|
| OB_LOADED_MODULE_CELL/ASSEMBLY |
|
| OB_LOADED_MODULE_CELL/THERMAL_CYCLES |
|
| OB_LOADED_MODULE_CELL/FINAL_WARM |
|
| OB_LOADED_MODULE_CELL/FINAL_COLD |
|
| OB_LOADED_MODULE_CELL/THERMAL_COLD |
|
| OB_LOADED_MODULE_CELL/THERMAL_WARM |
|
| OB_LOADED_MODULE_CELL/ENVELOPE_CHECK |
|
| OB_LOADED_MODULE_CELL/QC_STATUS |
|
| OB_LOADED_MODULE_CELL/UNHAPPY |
|
| OB_LOADED_MODULE_CELL/COMPLETE |
|
| OB_LOADED_MODULE_CELL/RECEPTION |
|
| OB_LOADED_MODULE_CELL/TAB_CUTTING |
|
| OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION |
|
| TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY |
|
| TEST_JM_OEC_FE |
|