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20UPGS33303578
Outer-Quad-Sensor
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Component Information

Item Value
Serial Number 20UPGS33303578
Production DB Component ID 4c49fec03cdf13aca310a6cc5c1945ae
LocalDB Component ID 66f6b645db678200433738f2
Component Type sensor_tile
Super-Component 20UPGB43200080 
Sub-Components No match.
Flags

Properties

Item Data Type Value
Main Vendor integer 3
Sensor Type or Test Structure integer 3
Version of component string production
Scratch id (to be used if not the same as agreed manufacturer ID) string 7003
Alternative Identifier string V4-2-007003-3-001
Original Manufacturer ID string Q1
Breakdown Voltage (-999 if no breakdown occurred) float -999
Depletion Voltage (V) float 58.74

Comments


Test: CV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2024-09-27 07:41:38 PDT(-0700)
component ObjectId 66f6b645db678200433738f2
Stage sensor_manufacturer
Test Type CV_MEASURE
Institute ObjectId
User Name JörnGroße-Knetter
ObjectId of this record 66f6c422db6782004337aa8b
ObjectId of RAW record None

Results

Key Data
ANALYSIS_VERSION mqat vf8b32ac5
HUM 0
TEMP 20
CV_ARRAY {'Time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'Voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'Capacitance': [0.0006153293184424294, 0.0715799052039972, 0.13806251398564637, 0.20417281831711773, 0.27005637904912444, 0.33590805062628776, 0.40174561845883555, 0.46536242115893844, 0.5306995662045825, 0.5961098917617041, 0.6623816359619551, 0.7315135694596713, 0.7728535201062674, 0.7845346258279782, 0.7969092416959112, 0.8029187703138448, 0.8095789642110724, 0.8154380293354812, 0.8177994775962362, 0.8189840502856206, 0.8203197736088053, 0.4819183627883845, 0.8209144775483952, 0.8215098284326836, 0.8219567667179842, 0.8222549282342477, 0.82255325201528, 0.8230010421909099, 0.8231503868428168, 0.823598664785139, 0.8237481721439934, 0.8240473090174774, 0.8243466088639223, 0.8244963199390032, 0.824795864466937, 0.8250955722640524, 0.8252454874256355, 0.8255454403490751, 0.8255454403490751, 0.8256954781406411, 0.8258455568385891], 'Sigma Capacitance': [], 'Temperature': [], 'Humidity': []}
CV_IMG []
V_FULLDEPL 58.74358382277343

ProductionDB Record

{}

Current Stage: Wafer Processing (dicing, UBM, flip-chip)

Test Type Local Result
Visual inspection
(VISUAL_INSPECTION)
No TestRun! TestRun is missing in LocalDB.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No TestRun! TestRun is missing in LocalDB.
IV measurement
(IV_MEASURE)
No TestRun! TestRun is missing in LocalDB.
CV measurement
(CV_MEASURE)
No TestRun! TestRun is missing in LocalDB.

Candidate TestRuns of this Stage

LocalDB Object ID TestRun Code QC Passed Inspector Date Analysis Version QC Registration
66f6c6ea13e0b00043294c5a IV_MEASURE Passed JörnGroße-Knetter 2024-09-27 07:53:30 PDT(-0700) f8b32ac5 Selected
66f6c422db6782004337aa8b CV_MEASURE Passed JörnGroße-Knetter 2024-09-27 07:41:38 PDT(-0700) f8b32ac5 Selected

Past QC Stages and Results

  Stage: Sensor Manufacturer (sensor_manufacturer) Complete

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
IV measurement
(IV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
LocalDB Test ID Stage Test Name Inspector Date QC Registration
6790b1a04d1c6006c3fc1ae7 BAREMODULERECEPTION IV_MEASURE MarioJose 2025-01-22 00:51:44 PST(-0800) Selected
66f6c6ea13e0b00043294c5a sensor_manufacturer IV_MEASURE JörnGroße-Knetter 2024-09-27 07:53:30 PDT(-0700) Selected
66f6c422db6782004337aa8b sensor_manufacturer CV_MEASURE JörnGroße-Knetter 2024-09-27 07:41:38 PDT(-0700) Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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