20UPGS33300929

OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Component Information

Serial Number 20UPGS33300929
ProdDB ID  3b9dad…8c72f4
LocalDB ID 66268795b345a200357e3dfe
Component Type SENSOR_TILE
Parents 20UPGB43320008 
Children No match.
Flags

 Properties

Item Value
Main Vendor readonly 3
Sensor Type or Test Structure readonly 3
Version of component production
Scratch id (to be used if not the same as agreed manufacturer ID) 50
Alternative Identifier V4-2-000050-3-004
Original Manufacturer ID Q4
Breakdown Voltage (-999 if no breakdown occurred) -999
Depletion Voltage (V) 64.52

 Comments


Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date a year ago
component ObjectId 66268795b345a200357e3dfe
Stage BAREMODULERECEPTION
Test Type IV_MEASURE
Institute ObjectId
User Name KojiNakamura
ObjectId of this record 66f650d162de602d4549a876
ObjectId of RAW record 66f650d162de602d4549a871
Tags No tags

Results

Key Data
ANALYSIS_VERSION mqat v2.2.7rc2.dev16
HUM 0
TEMP 20
BREAKDOWN_VOLTAGE -999
IV_ARRAY {'time': [0, 7, 14, 21, 28, 35, 42, 49, 56, 63, 70, 77, 83, 90, 97, 104, 111, 118, 125, 132, 139, 146, 153, 160, 167, 174, 181, 188, 195, 202, 209, 216, 223, 229, 236, 243, 250, 257, 264, 271, 278], 'voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'current': [0.027918, 0.0330135, 0.0363743, 0.0385005, 0.040291900000000005, 0.0412168, 0.041807, 0.0422297, 0.0426273, 0.0427989, 0.0430794, 0.0431881, 0.0435272, 0.0439625, 0.0442262, 0.044686500000000004, 0.0449754, 0.045331100000000006, 0.0456325, 0.0460259, 0.0464402, 0.046950900000000004, 0.0473359, 0.0476875, 0.048152099999999996, 0.0483363, 0.0488217, 0.0494035, 0.0497928, 0.050307500000000005, 0.050613099999999994, 0.051002399999999996, 0.0514292, 0.0519984, 0.0525426, 0.0531745, 0.0535303, 0.0542293, 0.054677, 0.0552883, 0.0559954], 'sigma current': [0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0], 'temperature': [20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20], 'humidity': [0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0]}
LEAK_CURRENT 0.0476875
MAXIMUM_VOLTAGE 200
NO_BREAKDOWN_VOLTAGE_OBSERVED True

Attachments

Filename Contents
output.log Download
20UPGS33300929_plot.png

RAW Results Record

Download RAW
_id66f650d162de602d4549a871
raw
serialNumbertestTypesubtestTyperesultsstagecomponentdbVersionaddresssys
20UPGS33300929IV_MEASURE
property
TEMPNone
HUMNone
ANALYSIS_VERSIONNone
comment
Metadata
QCHELPER_VERSION4.0.dev1
MODULE_SN20UPGS33300929
Institution
Measurements
IV_ARRAY
time
  • 0
  • 7
  • 14
  • 21
  • 28
  • 35
  • 42
  • 49
  • 56
  • 63
  • 70
  • 77
  • 83
  • 90
  • 97
  • 104
  • 111
  • 118
  • 125
  • 132
  • 139
  • 146
  • 153
  • 160
  • 167
  • 174
  • 181
  • 188
  • 195
  • 202
  • 209
  • 216
  • 223
  • 229
  • 236
  • 243
  • 250
  • 257
  • 264
  • 271
  • 278
voltage
  • -0.0
  • 5.0
  • 10.0
  • 15.0
  • 20.0
  • 25.0
  • 30.0
  • 35.0
  • 40.0
  • 45.0
  • 50.0
  • 55.0
  • 60.0
  • 65.0
  • 70.0
  • 75.0
  • 80.0
  • 85.0
  • 90.0
  • 95.0
  • 100.0
  • 105.0
  • 110.0
  • 115.0
  • 120.0
  • 125.0
  • 130.0
  • 135.0
  • 140.0
  • 145.0
  • 150.0
  • 155.0
  • 160.0
  • 165.0
  • 170.0
  • 175.0
  • 180.0
  • 185.0
  • 190.0
  • 195.0
  • 200.0
current
  • -0.027918
  • 0.0330135
  • 0.0363743
  • 0.0385005
  • 0.040291900000000005
  • 0.0412168
  • 0.041807
  • 0.0422297
  • 0.0426273
  • 0.0427989
  • 0.0430794
  • 0.0431881
  • 0.0435272
  • 0.0439625
  • 0.0442262
  • 0.044686500000000004
  • 0.0449754
  • 0.045331100000000006
  • 0.0456325
  • 0.0460259
  • 0.0464402
  • 0.046950900000000004
  • 0.0473359
  • 0.0476875
  • 0.048152099999999996
  • 0.0483363
  • 0.0488217
  • 0.0494035
  • 0.0497928
  • 0.050307500000000005
  • 0.050613099999999994
  • 0.051002399999999996
  • 0.0514292
  • 0.0519984
  • 0.0525426
  • 0.0531745
  • 0.0535303
  • 0.0542293
  • 0.054677
  • 0.0552883
  • 0.0559954
sigma current
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
temperature
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
  • 20
humidity
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
  • 0
IV_IMGNone
BREAKDOWN_VOLTAGENone
LEAK_CURRENTNone
MAXIMUM_VOLTAGENone
NO_BREAKDOWN_VOLTAGE_OBSERVEDNone
BAREMODULERECEPTION66268795b345a200357e3dfe1.0164657cef8d79bac1f3f0057a
mts2024-09-27 06:29:37.084000
cts2024-09-27 06:29:37.084000
rev0
rawHash2912a93a51cadbbd07f1cf3068dd7743
stageBAREMODULERECEPTION

ProductionDB Record

id66f94f9113e0b0004331e634
stateready
stateTs2024-09-29T13:01:05.421Z
stateUserIdentity24-779-1
date2024-09-27T06:29:00.000Z
testType
id5b1a3abf130f5600054a42a8
codeIV_MEASURE
nameIV measurement
stateactive
institution
id5d31879ddf98f200097387f5
codeKEK
nameHigh Energy Accelerator Research Organization (KEK)
user
id5ca2afc878a5090009836718
userIdentity24-779-1
firstNameKoji
middleNameNone
lastNameNakamura
runNumber66f650d162de602d4549a876
passedTrue
problemsFalse
properties
codenamedataTypevalueTyperequiredvaluerangeMinrangeMax
ANALYSIS_VERSIONAnalysis VersionstringsingleFalse2.2.7rc2.dev16NoneNone
HUMHumidity [%]floatsingleTrue0NoneNone
TEMPTemperature [°C]floatsingleTrue20NoneNone
results
  • codeBREAKDOWN_VOLTAGE
    nameBreakdown voltage [V] (if no breakdown put -999)
    order1
    dataTypefloat
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    value-999
    associateChildNone
  • codeIV_ARRAY
    nameIV data
    order1
    dataTypeobject
    valueTypesingle
    arrayDimensions1
    additionalFalse
    value
    time
    • 0
    • 7
    • 14
    • 21
    • 28
    • 35
    • 42
    • 49
    • 56
    • 63
    • 70
    • 77
    • 83
    • 90
    • 97
    • 104
    • 111
    • 118
    • 125
    • 132
    • 139
    • 146
    • 153
    • 160
    • 167
    • 174
    • 181
    • 188
    • 195
    • 202
    • 209
    • 216
    • 223
    • 229
    • 236
    • 243
    • 250
    • 257
    • 264
    • 271
    • 278
    voltage
    • 0
    • 5
    • 10
    • 15
    • 20
    • 25
    • 30
    • 35
    • 40
    • 45
    • 50
    • 55
    • 60
    • 65
    • 70
    • 75
    • 80
    • 85
    • 90
    • 95
    • 100
    • 105
    • 110
    • 115
    • 120
    • 125
    • 130
    • 135
    • 140
    • 145
    • 150
    • 155
    • 160
    • 165
    • 170
    • 175
    • 180
    • 185
    • 190
    • 195
    • 200
    current
    • 0.027918
    • 0.0330135
    • 0.0363743
    • 0.0385005
    • 0.040291900000000005
    • 0.0412168
    • 0.041807
    • 0.0422297
    • 0.0426273
    • 0.0427989
    • 0.0430794
    • 0.0431881
    • 0.0435272
    • 0.0439625
    • 0.0442262
    • 0.044686500000000004
    • 0.0449754
    • 0.045331100000000006
    • 0.0456325
    • 0.0460259
    • 0.0464402
    • 0.046950900000000004
    • 0.0473359
    • 0.0476875
    • 0.048152099999999996
    • 0.0483363
    • 0.0488217
    • 0.0494035
    • 0.0497928
    • 0.050307500000000005
    • 0.050613099999999994
    • 0.051002399999999996
    • 0.0514292
    • 0.0519984
    • 0.0525426
    • 0.0531745
    • 0.0535303
    • 0.0542293
    • 0.054677
    • 0.0552883
    • 0.0559954
    sigma current
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    temperature
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    • 20
    humidity
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    • 0
    associateChildNone
  • codeLEAK_CURRENT
    nameLeakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
    order1
    dataTypefloat
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    value0.0476875
    associateChildNone
  • codeMAXIMUM_VOLTAGE
    nameMaximum measured Voltage [V]
    order1
    dataTypefloat
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    rangeMinNone
    rangeMaxNone
    value200
    associateChildNone
  • codeNO_BREAKDOWN_VOLTAGE_OBSERVED
    nameNo breakdown voltage observed
    order1
    dataTypeboolean
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    rangeMinNone
    rangeMaxNone
    valueTrue
    associateChildNone
cts2024-09-29T13:01:05.421Z
sys
cts2024-09-29T13:01:05.421Z
mts2024-09-29T13:01:11.926Z
rev2
defects
commentsNone
attachments
  • code202bb0897cd83fc9be7a2a89fcd16141
    dateTime2024-09-29T13:01:06.510Z
    titleTestRun_66f94f9113e0b0004331e634_Attachment_Pack.zip
    description/nas/db/localdb-tools/viewer/static/cache/thumbnail/TestRun_66f94f9113e0b0004331e634_Attachment_Pack.zip
    contentTypeNone
    typeeos
    urlhttps://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/2/0/2/202bb0897cd83fc9be7a2a89fcd16141?authz=zteos64:MDAwMDAyOWF4nO1QIU_DQBjNlgDJglgQCNRlQWDa613bXfspLJiFBVcqrrvraMZ6l_YqmACDxU7wAwgasQyCAkNCgkHwHxD8AQxlQSBQaD7x8vLy3peX15o1W42i_fh-O1_eWMrMSItOc6K3GtTFUpWYmyP-jQNZ5MNCVVpk5QgLaazajnWhhCUSTLGD6e4mZ4ylPPGsIKGuRYhMrTBNqcW9JHUIC31Bw_59I9qvJOoNDCI-og64BAitCfViVGUCiEe6AYkWdWI0_FJch0UTHSOTCZkbKJQytksD32EMqNfdjgDS-sAnNiFdOwxs4sQo52MJizdI5IDqsgZGReIjrjWgQ1Ua-D0o1JhnOfxQhlKB4xMXlZWo2Rr6ODm43mu_rF-o88n07Lnz2ps-zcrTndV-8PZA7443_qf927To5mp-ufIJx_LPLg%3d%3d
    urlCernboxhttps://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/2/0/2/202bb0897cd83fc9be7a2a89fcd16141
    filename202bb0897cd83fc9be7a2a89fcd16141
    user
    id5ca2afc878a5090009836718
    userIdentity24-779-1
    firstNameKoji
    middleNameNone
    lastNameNakamura
  • codefa1f9ca84da786cd7ea3a5e631e4727f
    dateTime2024-09-29T13:01:11.037Z
    titleRAW
    descriptionRAW
    contentTypetext/plain
    typefile
    binaryStoreg02True
    filename20UPGS33300929_BAREMODULERECEPTION_IV_MEASURE_66f94f9113e0b0004331e634_66f650d162de602d4549a871.json
    user
    id5ca2afc878a5090009836718
    userIdentity24-779-1
    firstNameKoji
    middleNameNone
    lastNameNakamura
components
idcodestatestateTsstateUserIdentitydummycompletedcompletedTscompletedUserIdentitytrashedtrashedTstrashedUserIdentityserialNumberalternativeIdentifierancestorMapprojectsubprojectcomponentTypetypepropertiestestedAtStageinstitution
66268795b345a200357e3dfe3b9dadacb3f2b200d894cc91718c72f4ready2024-04-22T15:51:49.080Z24-779-1FalseFalseNoneNoneFalseNoneNone20UPGS33300929V4-2-000050-3-004
parent
component
id66f0618ad7e818004374c6a5
codeaac38c169adae40946a838fff6aa4b9a
stateready
stateTs2024-09-22T18:27:22.771Z
stateUserIdentity24-779-1
dummyFalse
completedFalse
completedTsNone
completedUserIdentityNone
trashedFalse
trashedTsNone
trashedUserIdentityNone
serialNumber20UPGB43320008
alternativeIdentifierNone
project
codeP
namePixels
subproject
codePG
namePixel general
componentType
codeBARE_MODULE
nameBare Module
type
codeQUAD_BARE_MODULE
nameQuad bare module
testedAtStage
codeNOT_USED
nameNot to be used for the detector
highestLevelParent
component
id66f0618ad7e818004374c6a5
codeaac38c169adae40946a838fff6aa4b9a
stateready
stateTs2024-09-22T18:27:22.771Z
stateUserIdentity24-779-1
dummyFalse
completedFalse
completedTsNone
completedUserIdentityNone
trashedFalse
trashedTsNone
trashedUserIdentityNone
serialNumber20UPGB43320008
alternativeIdentifierNone
project
codeP
namePixels
subproject
codePG
namePixel general
componentType
codeBARE_MODULE
nameBare Module
type
codeQUAD_BARE_MODULE
nameQuad bare module
testedAtStage
codeNOT_USED
nameNot to be used for the detector
codeP
namePixels
codePG
namePixel general
codeSENSOR_TILE
nameSensor Tile
codeOUTER_PIXEL_QUAD_SENSOR_TILE
nameOuter Pixel Quad Sensor Tile
codenamedataTyperequireddefaultvalue
MAIN_VENDORMain VendorintegerTrueFalse3
SENSOR_TYPE_OR_TEST_STRUCTURESensor Type or Test StructureintegerTrueFalse3
VERSIONVersion of componentstringTrueFalseproduction
SENSOR_SCRATCHIDScratch id (to be used if not the same as agreed manufacturer ID)stringFalseFalse50
MAN_SNOAlternative IdentifierstringTrueTrueV4-2-000050-3-004
MAN_IDOriginal Manufacturer IDstringFalseFalseQ4
BREAKDOWN_VOLTAGEBreakdown Voltage (-999 if no breakdown occurred)floatTrueFalse-999
V_FULLDEPLDepletion Voltage (V)floatTrueFalse64.52
codeBAREMODULERECEPTION
nameBare module reception at ITk institute
order6
initialFalse
finalFalse
codeHPK
nameHamamatsu Photonics K.K (HPK)

 Current Stage: Insertion of pigtail and strain relief glueing

Past QC Stages and Results

Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING)

Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION)

OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE)

OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY)

Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS)

Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK)

Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM)

Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD)

Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD)

Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM)

Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES)

Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY)

Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT)

Electrical testing at reception of LLS (LLS/RECEPTION)

Electrical testing on LLS at cold temperature (LLS/POST_TC_COLD)

Electrical testing on LLS at warm temperature (LLS/POST_TC_WARM)

Electrical testing before thermal cycling on LLS at cold temperature (LLS/PRE_TC_COLD)

Electrical testing before thermal cycling on LLS at warm temperature (LLS/PRE_TC_WARM)

Module PCB tab cutting (MODULE/TAB_CUTTING)

Module reception (MODULE/RECEPTION)

Module Complete (MODULE/COMPLETE)

Module damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)		 Registered Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A

QA at Institutes (QA)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)		 No result N/A
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)		 No result N/A
IT measurement
(IT_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A
Visual inspection
(VISUAL_INSPECTION)		 No result N/A

Sensor Manufacturer (sensor_manufacturer)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 Registered Registered
IV measurement
(IV_MEASURE)		 Registered Registered
LocalDB Test ID Stage Test Name Inspector Measurement Date Analysis Date Tags QC Registration
66f650…49a876 BAREMODULERECEPTION IV_MEASURE KojiNakamura N/A a year ago No tags Selected
66ee45…11541a sensor_manufacturer IV_MEASURE KojiNakamura N/A a year ago No tags Selected
66ee3e…6bc309 sensor_manufacturer CV_MEASURE KojiNakamura N/A a year ago No tags Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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