Database for ITk Pixel Module

Item	Value
Serial Number	20UPGS33300929
Production DB Component ID	3b9dadacb3f2b200d894cc91718c72f4
LocalDB Component ID	66268795b345a200357e3dfe
Component Type	sensor_tile
Super-Component	20UPGB43320008
Sub-Components	No match.
Flags

Key	Data
QC Passed	True
Date	2024-09-29 06:01:11 PDT(-0700)
component ObjectId	66268795b345a200357e3dfe
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	KojiNakamura
ObjectId of this record	66f650d162de602d4549a876
ObjectId of RAW record	66f650d162de602d4549a871

Results

Key	Data
ANALYSIS_VERSION	mqat v2.2.7rc2.dev16
HUM	0
TEMP	20
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'time': [0, 7, 14, 21, 28, 35, 42, 49, 56, 63, 70, 77, 83, 90, 97, 104, 111, 118, 125, 132, 139, 146, 153, 160, 167, 174, 181, 188, 195, 202, 209, 216, 223, 229, 236, 243, 250, 257, 264, 271, 278], 'voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'current': [0.027918, 0.0330135, 0.0363743, 0.0385005, 0.040291900000000005, 0.0412168, 0.041807, 0.0422297, 0.0426273, 0.0427989, 0.0430794, 0.0431881, 0.0435272, 0.0439625, 0.0442262, 0.044686500000000004, 0.0449754, 0.045331100000000006, 0.0456325, 0.0460259, 0.0464402, 0.046950900000000004, 0.0473359, 0.0476875, 0.048152099999999996, 0.0483363, 0.0488217, 0.0494035, 0.0497928, 0.050307500000000005, 0.050613099999999994, 0.051002399999999996, 0.0514292, 0.0519984, 0.0525426, 0.0531745, 0.0535303, 0.0542293, 0.054677, 0.0552883, 0.0559954], 'sigma current': [0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0], 'temperature': [20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20, 20], 'humidity': [0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0]}
LEAK_CURRENT	0.0476875
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

Attachments

Filename	Contents
output.log	Download
20UPGS33300929_plot.png

RAW Results Record

_id

66f650d162de602d4549a871

raw

serialNumber

testType

subtestType

results

stage

component

dbVersion

address

sys

20UPGS33300929

IV_MEASURE

property

TEMP	None
HUM	None
ANALYSIS_VERSION	None

comment

Metadata

QCHELPER_VERSION	4.0.dev1
MODULE_SN	20UPGS33300929
Institution

Measurements

IV_ARRAY

time	0 7 14 21 28 35 42 49 56 63 70 77 83 90 97 104 111 118 125 132 139 146 153 160 167 174 181 188 195 202 209 216 223 229 236 243 250 257 264 271 278
voltage	-0.0 5.0 10.0 15.0 20.0 25.0 30.0 35.0 40.0 45.0 50.0 55.0 60.0 65.0 70.0 75.0 80.0 85.0 90.0 95.0 100.0 105.0 110.0 115.0 120.0 125.0 130.0 135.0 140.0 145.0 150.0 155.0 160.0 165.0 170.0 175.0 180.0 185.0 190.0 195.0 200.0
current	-0.027918 0.0330135 0.0363743 0.0385005 0.040291900000000005 0.0412168 0.041807 0.0422297 0.0426273 0.0427989 0.0430794 0.0431881 0.0435272 0.0439625 0.0442262 0.044686500000000004 0.0449754 0.045331100000000006 0.0456325 0.0460259 0.0464402 0.046950900000000004 0.0473359 0.0476875 0.048152099999999996 0.0483363 0.0488217 0.0494035 0.0497928 0.050307500000000005 0.050613099999999994 0.051002399999999996 0.0514292 0.0519984 0.0525426 0.0531745 0.0535303 0.0542293 0.054677 0.0552883 0.0559954
sigma current	0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
temperature	20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20
humidity	0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0

IV_IMG

None

BREAKDOWN_VOLTAGE

None

LEAK_CURRENT

None

MAXIMUM_VOLTAGE

None

NO_BREAKDOWN_VOLTAGE_OBSERVED

None

BAREMODULERECEPTION

66268795b345a200357e3dfe

1.01

64657cef8d79bac1f3f0057a

mts	2024-09-27 06:29:37.084000
cts	2024-09-27 06:29:37.084000
rev	0

rawHash

2912a93a51cadbbd07f1cf3068dd7743

stage

BAREMODULERECEPTION

ProductionDB Record

Expand ProductionDB Record

66f94f9113e0b0004331e634

state

ready

stateTs

2024-09-29T13:01:05.421Z

stateUserIdentity

24-779-1

date

2024-09-27T06:29:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d31879ddf98f200097387f5
code	KEK
name	High Energy Accelerator Research Organization (KEK)

user

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

runNumber

66f650d162de602d4549a876

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	2.2.7rc2.dev16	None	None
HUM	Humidity [%]	float	single	True	0	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
order 1
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

order

dataType

object

valueType

single

arrayDimensions

additional

False

value

time	0 7 14 21 28 35 42 49 56 63 70 77 83 90 97 104 111 118 125 132 139 146 153 160 167 174 181 188 195 202 209 216 223 229 236 243 250 257 264 271 278
voltage	0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 115 120 125 130 135 140 145 150 155 160 165 170 175 180 185 190 195 200
current	0.027918 0.0330135 0.0363743 0.0385005 0.040291900000000005 0.0412168 0.041807 0.0422297 0.0426273 0.0427989 0.0430794 0.0431881 0.0435272 0.0439625 0.0442262 0.044686500000000004 0.0449754 0.045331100000000006 0.0456325 0.0460259 0.0464402 0.046950900000000004 0.0473359 0.0476875 0.048152099999999996 0.0483363 0.0488217 0.0494035 0.0497928 0.050307500000000005 0.050613099999999994 0.051002399999999996 0.0514292 0.0519984 0.0525426 0.0531745 0.0535303 0.0542293 0.054677 0.0552883 0.0559954
sigma current	0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
temperature	20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20
humidity	0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0

associateChild

None

code LEAK_CURRENT
name Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
order 1
dataType float
valueType single
arrayDimensions None
additional False
value 0.0476875
associateChild None
code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
order 1
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
order 1
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2024-09-29T13:01:05.421Z

sys

cts	2024-09-29T13:01:05.421Z
mts	2024-09-29T13:01:11.926Z
rev	2

defects

comments

None

attachments

code

202bb0897cd83fc9be7a2a89fcd16141

dateTime

2024-09-29T13:01:06.510Z

title

TestRun_66f94f9113e0b0004331e634_Attachment_Pack.zip

description

/nas/db/localdb-tools/viewer/static/cache/thumbnail/TestRun_66f94f9113e0b0004331e634_Attachment_Pack.zip

contentType

None

type

eos

url

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/2/0/2/202bb0897cd83fc9be7a2a89fcd16141?authz=zteos64:MDAwMDAyOWF4nO1QIU_DQBjNlgDJglgQCNRlQWDa613bXfspLJiFBVcqrrvraMZ6l_YqmACDxU7wAwgasQyCAkNCgkHwHxD8AQxlQSBQaD7x8vLy3peX15o1W42i_fh-O1_eWMrMSItOc6K3GtTFUpWYmyP-jQNZ5MNCVVpk5QgLaazajnWhhCUSTLGD6e4mZ4ylPPGsIKGuRYhMrTBNqcW9JHUIC31Bw_59I9qvJOoNDCI-og64BAitCfViVGUCiEe6AYkWdWI0_FJch0UTHSOTCZkbKJQytksD32EMqNfdjgDS-sAnNiFdOwxs4sQo52MJizdI5IDqsgZGReIjrjWgQ1Ua-D0o1JhnOfxQhlKB4xMXlZWo2Rr6ODm43mu_rF-o88n07Lnz2ps-zcrTndV-8PZA7443_qf927To5mp-ufIJx_LPLg%3d%3d

urlCernbox

https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/2/0/2/202bb0897cd83fc9be7a2a89fcd16141

filename

202bb0897cd83fc9be7a2a89fcd16141

user

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

code

fa1f9ca84da786cd7ea3a5e631e4727f

dateTime

2024-09-29T13:01:11.037Z

title

RAW

description

RAW

contentType

text/plain

type

file

binaryStoreg02

True

filename

20UPGS33300929_BAREMODULERECEPTION_IV_MEASURE_66f94f9113e0b0004331e634_66f650d162de602d4549a871.json

user

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

66268795b345a200357e3dfe

3b9dadacb3f2b200d894cc91718c72f4

ready

2024-04-22T15:51:49.080Z

24-779-1

False

None

False

None

20UPGS33300929

V4-2-000050-3-004

parent

component

66f0618ad7e818004374c6a5

code

aac38c169adae40946a838fff6aa4b9a

state

ready

stateTs

2024-09-22T18:27:22.771Z

stateUserIdentity

24-779-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43320008

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	NOT_USED
name	Not to be used for the detector

highestLevelParent

component

66f0618ad7e818004374c6a5

code

aac38c169adae40946a838fff6aa4b9a

state

ready

stateTs

2024-09-22T18:27:22.771Z

stateUserIdentity

24-779-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43320008

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	NOT_USED
name	Not to be used for the detector

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	50
MAN_SNO	Alternative Identifier	string	True	True	V4-2-000050-3-004
MAN_ID	Original Manufacturer ID	string	False	False	Q4
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	64.52

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Insertion of pigtail and strain relief glueing

No tests are allocated for this stage.

Past QC Stages and Results

Stage: Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING) Alternative

No tests are allocated for this stage.

Stage: Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION) Locally Signed Off

No tests are allocated for this stage.

Stage: OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE) Not signed-off

No tests are allocated for this stage.

Stage: OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS) Locally Signed Off

No tests are allocated for this stage.

Stage: Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK) Complete

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM) Not signed-off

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD) Not signed-off

No tests are allocated for this stage.

Stage: Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD) Complete

No tests are allocated for this stage.

Stage: Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM) Complete

No tests are allocated for this stage.

Stage: Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES) Complete

No tests are allocated for this stage.

Stage: Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT) Locally Signed Off

No tests are allocated for this stage.

Stage: Module PCB tab cutting (MODULE/TAB_CUTTING) Complete

No tests are allocated for this stage.

Stage: Module reception (MODULE/RECEPTION) Complete

No tests are allocated for this stage.

Stage: Module Complete (MODULE/COMPLETE) Complete

No tests are allocated for this stage.

Stage: Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS) Not signed-off

No tests are allocated for this stage.

Stage: Modules failed test, needs investigation (MODULE/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Ranking of the module (MODULE/QC_STATUS) Not signed-off

No tests are allocated for this stage.

Stage: Final flatness measurement (MODULE/FINAL_METROLOGY) Not signed-off

No tests are allocated for this stage.

Stage: Final Cold (MODULE/FINAL_COLD) Complete

No tests are allocated for this stage.

Stage: Final Warm (MODULE/FINAL_WARM) Complete

No tests are allocated for this stage.

Stage: Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST) Complete

No tests are allocated for this stage.

Stage: Thermal Cycles (MODULE/THERMAL_CYCLES) Complete

No tests are allocated for this stage.

Stage: Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION) Complete

No tests are allocated for this stage.

Stage: Post-Parylene Cold (MODULE/POST_PARYLENE_COLD) Complete

No tests are allocated for this stage.

Stage: Post-Parylene Warm (MODULE/POST_PARYLENE_WARM) Complete

No tests are allocated for this stage.

Stage: Parylene Unmasking (MODULE/PARYLENE_UNMASKING) Complete

No tests are allocated for this stage.

Stage: Parylene Coating (MODULE/PARYLENE_COATING) Complete

No tests are allocated for this stage.

Stage: Parylene Masking (MODULE/PARYLENE_MASKING) Complete

No tests are allocated for this stage.

Stage: Initial Cold (MODULE/INITIAL_COLD) Locally Signed Off

No tests are allocated for this stage.

Stage: QC cross-check (module swapping) (MODULE/QC_CROSSCHECK) Complete

No tests are allocated for this stage.

Stage: Initial Warm (MODULE/INITIAL_WARM) Complete

No tests are allocated for this stage.

Stage: Wire Bonding (MODULE/WIREBONDING) Locally Signed Off

No tests are allocated for this stage.

Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Initial state to associate flex to bare module (MODULE/INIT) Not signed-off

No tests are allocated for this stage.

Results Stage: Bare module reception at ITk institute (BAREMODULERECEPTION) Complete

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!

Stage: Bare Module Assembly (BAREMODULEASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Not to be used for detector (NOT_USED) Complete

No tests are allocated for this stage.

Results Stage: Post Irradiation (POST_IRRAD) Alternative

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
IV measurement (IV_MEASURE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: QA at Institutes (QA) Alternative

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
IT measurement (IT_MEASURE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
IV measurement (IV_MEASURE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING) Locally Signed Off

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
IV measurement (IV_MEASURE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Visual inspection (VISUAL_INSPECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Sensor Manufacturer (sensor_manufacturer) Complete

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
IV measurement (IV_MEASURE)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!

LocalDB Test ID	Stage	Test Name	Inspector	Date	QC Registration
66f650d162de602d4549a876	BAREMODULERECEPTION	IV_MEASURE	KojiNakamura	2024-09-29 06:01:11 PDT(-0700)	Selected
66ee45e5a2dfe0004211541a	sensor_manufacturer	IV_MEASURE	KojiNakamura	2024-09-20 21:04:53 PDT(-0700)	Selected
66ee3e86d7e81800436bc309	sensor_manufacturer	CV_MEASURE	KojiNakamura	2024-09-20 20:33:26 PDT(-0700)	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33300929 Outer-Quad-Sensor ITkPD Component Page Jump to ITkPD component page

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

RAW Results Record

ProductionDB Record

Current Stage: Insertion of pigtail and strain relief glueing

No tests are allocated for this stage.

Past QC Stages and Results

Stage: Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING) Alternative

No tests are allocated for this stage.

Stage: Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION) Locally Signed Off

No tests are allocated for this stage.

Stage: OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE) Not signed-off

No tests are allocated for this stage.

Stage: OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS) Locally Signed Off

No tests are allocated for this stage.

Stage: Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK) Complete

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM) Not signed-off

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD) Not signed-off

No tests are allocated for this stage.

Stage: Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD) Complete

No tests are allocated for this stage.

Stage: Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM) Complete

No tests are allocated for this stage.

Stage: Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES) Complete

No tests are allocated for this stage.

Stage: Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT) Locally Signed Off

No tests are allocated for this stage.

Stage: Module PCB tab cutting (MODULE/TAB_CUTTING) Complete

No tests are allocated for this stage.

Stage: Module reception (MODULE/RECEPTION) Complete

No tests are allocated for this stage.

Stage: Module Complete (MODULE/COMPLETE) Complete

No tests are allocated for this stage.

Stage: Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS) Not signed-off

No tests are allocated for this stage.

Stage: Modules failed test, needs investigation (MODULE/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Ranking of the module (MODULE/QC_STATUS) Not signed-off

No tests are allocated for this stage.

Stage: Final flatness measurement (MODULE/FINAL_METROLOGY) Not signed-off

No tests are allocated for this stage.

Stage: Final Cold (MODULE/FINAL_COLD) Complete

No tests are allocated for this stage.

Stage: Final Warm (MODULE/FINAL_WARM) Complete

No tests are allocated for this stage.

Stage: Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST) Complete

No tests are allocated for this stage.

Stage: Thermal Cycles (MODULE/THERMAL_CYCLES) Complete

No tests are allocated for this stage.

Stage: Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION) Complete

No tests are allocated for this stage.

Stage: Post-Parylene Cold (MODULE/POST_PARYLENE_COLD) Complete

No tests are allocated for this stage.

Stage: Post-Parylene Warm (MODULE/POST_PARYLENE_WARM) Complete

No tests are allocated for this stage.

Stage: Parylene Unmasking (MODULE/PARYLENE_UNMASKING) Complete

No tests are allocated for this stage.

Stage: Parylene Coating (MODULE/PARYLENE_COATING) Complete

No tests are allocated for this stage.

Stage: Parylene Masking (MODULE/PARYLENE_MASKING) Complete

No tests are allocated for this stage.

Stage: Initial Cold (MODULE/INITIAL_COLD) Locally Signed Off

No tests are allocated for this stage.

Stage: QC cross-check (module swapping) (MODULE/QC_CROSSCHECK) Complete

No tests are allocated for this stage.

Stage: Initial Warm (MODULE/INITIAL_WARM) Complete

20UPGS33300929
Outer-Quad-Sensor

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