20UPGFC0134521

OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Component Information

Serial Number	20UPGFC0134521
ProdDB ID	3373e2…8d1027
LocalDB ID	65d92049ba853e0042697470
Component Type	fe_chip
Parents	20UPGM23610026 20UPGB43320008
Children	No match.
Flags

Wafer

Wafer Probing

Properties

Item	Value
Wafer serial number	None

Comments

Test: TUNING QC Failed

(Stage: MODULE/INITIAL_COLD)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	65d92049ba853e0042697470
Stage	MODULE/INITIAL_COLD
Test Type	TUNING
Institute ObjectId
User Name	KojiNakamura
ObjectId of this record	6705e959c447bfb7e213e5d2
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat v2.2.6
TUNING_TUNED_NOISE_95_HIGH	110.052
TUNING_TUNED_NOISE_95_LOW	70.172
TUNING_TUNED_NOISE_MEAN	89.196
TUNING_TUNED_NOISE_SIGMA	11.271
TUNING_TUNED_TDAC_MEAN	-1.2
TUNING_TUNED_TDAC_SIGMA	4.4
TUNING_TUNED_THRESHOLD_95_HIGH	1564.513
TUNING_TUNED_THRESHOLD_95_LOW	1432.55
TUNING_TUNED_THRESHOLD_FAILED_FITS	48
TUNING_TUNED_THRESHOLD_MEAN	1501
TUNING_TUNED_THRESHOLD_SIGMA	36
TUNING_TUNED_TOT_95_HIGH	11.76
TUNING_TUNED_TOT_95_LOW	4.29
TUNING_TUNED_TOT_MEAN	7.4
TUNING_TUNED_TOT_SIGMA	1.8
TUNING_UNTUNED_NOISE_95_HIGH	110.343
TUNING_UNTUNED_NOISE_95_LOW	68.598
TUNING_UNTUNED_NOISE_MEAN	87.599
TUNING_UNTUNED_NOISE_SIGMA	11.503
TUNING_UNTUNED_TDAC_MEAN	0
TUNING_UNTUNED_TDAC_SIGMA	0
TUNING_UNTUNED_THRESHOLD_95_HIGH	3036.805
TUNING_UNTUNED_THRESHOLD_95_LOW	1635.175
TUNING_UNTUNED_THRESHOLD_FAILED_FITS	214
TUNING_UNTUNED_THRESHOLD_MEAN	2280
TUNING_UNTUNED_THRESHOLD_SIGMA	357

Attachments

Filename	Contents
0x20d79_MODULE/INITIAL_COLD_L2_cold.json	Download
output.log	Download
0x20d79_UNTUNED_THRESHOLD_MEAN_Threshold_1d.png
0x20d79_UNTUNED_TDAC_MEAN_TDAC_1d.png
0x20d79_UNTUNED_NOISE_MEAN_Noise_1d.png
0x20d79_TUNED_THRESHOLD_MEAN_Threshold_1d.png
0x20d79_TUNED_TDAC_MEAN_TDAC_1d.png
0x20d79_TUNED_NOISE_MEAN_Noise_1d.png
0x20d79_TUNED_TOT_MEAN_TOT_1d.png
0x20d79.log	Download
0x20d79_Tuned_failures.png
0x20d79_Untuned_failures.png
0x20d79_summary_untuned.png
0x20d79_summary_tuned.png
20UPGFC0134521_MODULE__INITIAL_COLD_TUNING.zip	Download

ProductionDB Record

Expand ProductionDB Record

6705f5fbb5325c00438e1a18

state

ready

stateTs

2024-10-09T03:18:19.224Z

stateUserIdentity

24-779-1

date

2024-10-09T02:24:00.000Z

testType

id	6393a09015838700361eecc5
code	TUNING
name	Tuning
state	active

institution

id	64229fe1b8fd040036839f29
code	HR
name	Hayashi-Repic Co.

user

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

runNumber

6705e959c447bfb7e213e5d2

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Tuning analysis version	string	None	True	2.2.6	None	None

results

code	name	dataType	valueType	arrayDimensions	additional	rangeMin	rangeMax	value	associateChild
TUNING_TUNED_NOISE_95_HIGH	Tuned noise 95% high	float	single	None	None	None	None	110.052	None
TUNING_TUNED_NOISE_95_LOW	Tuned noise 95% low	float	single	None	None	None	None	70.172	None
TUNING_TUNED_NOISE_MEAN	Tuned noise mean	float	single	None	None	None	None	89.196	None
TUNING_TUNED_NOISE_SIGMA	Tuned noise sigma	float	single	None	None	None	None	11.271	None
TUNING_TUNED_TDAC_MEAN	Tuned TDAC mean	float	single	None	None	None	None	-1.2	None
TUNING_TUNED_TDAC_SIGMA	Tuned TDAC sigma	float	single	None	None	None	None	4.4	None
TUNING_TUNED_THRESHOLD_95_HIGH	Tuned threshold 95% high	float	single	None	None	None	None	1564.513	None
TUNING_TUNED_THRESHOLD_95_LOW	Tuned threshold 95% low	float	single	None	None	None	None	1432.55	None
TUNING_TUNED_THRESHOLD_FAILED_FITS	Number of failed fits from the tuned threshold scan	integer	single	None	None	None	None	48	None
TUNING_TUNED_THRESHOLD_MEAN	Mean of the tuned threshold distribution	float	single	None	None	None	None	1501	None
TUNING_TUNED_THRESHOLD_SIGMA	Sigma of the tuned threshold distribution	float	single	None	None	None	None	36	None
TUNING_TUNED_TOT_95_HIGH	Tuned ToT 95% high	float	single	None	None	None	None	11.76	None
TUNING_TUNED_TOT_95_LOW	Tuned ToT 95% low	float	single	None	None	None	None	4.29	None
TUNING_TUNED_TOT_MEAN	Mean of tuned ToT distribution	float	single	None	None	None	None	7.4	None
TUNING_TUNED_TOT_SIGMA	Sigma of tuned ToT distribution	float	single	None	None	None	None	1.8	None
TUNING_UNTUNED_NOISE_95_HIGH	Untuned noise 95% high	float	single	None	None	None	None	110.343	None
TUNING_UNTUNED_NOISE_95_LOW	Noise 95% low	float	single	None	None	None	None	68.598	None
TUNING_UNTUNED_NOISE_MEAN	Untuned noise mean	float	single	None	None	None	None	87.599	None
TUNING_UNTUNED_NOISE_SIGMA	Untuned noise sigma	float	single	None	None	None	None	11.503	None
TUNING_UNTUNED_TDAC_MEAN	Untuned TDAC mean	float	single	None	None	None	None	0	None
TUNING_UNTUNED_TDAC_SIGMA	Untuned TDAC sigma	float	single	None	None	None	None	0	None
TUNING_UNTUNED_THRESHOLD_95_HIGH	Untuned threshold 95% high	float	single	None	None	None	None	3036.805	None
TUNING_UNTUNED_THRESHOLD_95_LOW	Untuned threshold 95% low	float	single	None	None	None	None	1635.175	None
TUNING_UNTUNED_THRESHOLD_FAILED_FITS	Number of failed fits from the untuned threshold scan	integer	single	None	None	None	None	214	None
TUNING_UNTUNED_THRESHOLD_MEAN	Mean of the untuned threshold distribution	float	single	None	None	None	None	2280	None
TUNING_UNTUNED_THRESHOLD_SIGMA	Sigma of the untuned threshold distribution	float	single	None	None	None	None	357	None

cts

2024-10-09T03:18:19.225Z

sys

cts	2024-10-09T03:18:19.225Z
mts	2024-10-09T03:18:31.589Z
rev	2

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

url

urlCernbox

filename

user

92a0bf456d846af6a29acf1a0b8020af

2024-10-09T03:18:25.870Z

0x20d79_MODULE/INITIAL_COLD_L2_cold.json

{"_id":"6703af65c447bfb7e213bc38","serialNumber":"20UPGFC0134521","stage":"MODULE/INITIAL_COLD","branch":"cold","current_revision_id":"6705e0e605214682cf55b3d1"}

None

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https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/9/2/a/92a0bf456d846af6a29acf1a0b8020af

92a0bf456d846af6a29acf1a0b8020af

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

f87accedaed14426422336bc71268e38

2024-10-09T03:18:31.589Z

TestRun_6705f5fbb5325c00438e1a18_Attachment_Pack.zip

/nas/db/localdb-tools/viewer/static/cache/thumbnail/TestRun_6705f5fbb5325c00438e1a18_Attachment_Pack.zip

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/f/8/7/f87accedaed14426422336bc71268e38?authz=zteos64:MDAwMDAyOWN4nO1QsUrDUBQlBaUUBBGnTpfSoUuS9_Ka5OVOLi4uBRGXkCHpe6mhNi8kL0snv0C_QKQI_kJFdHLwH1yEfoA4ubgYi4ODk7N3OBwO51wOp7NsdYxy-_L17nazu5HpaSF6rXkxMBxmS1XZsT6Nv3Esy3xSqroQWTW1hdRmY7eLUglTJHZqc9s_6HORppQwz-SJw0xKZWomLA7MeJikhPqBK5zg8NEIj2oJo7EG6oJDkBF0goY4wwjqTCAdUo_TcF0ngsmXwogfzosIdCZkrrFUSlvM4SzgHvo-J3shYtocutSi1LMCblESQR7PJK7_gMgRmrYap2XiQlwUCCeq0vh7UKhZnOX4Q5lIhcSlDKpaNGwHrtpLr786fn6T9-0BXD9svbR7u-X708XH_nx0oxbd_23_uC2cna-WxieyfM6D

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f87accedaed14426422336bc71268e38

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

components

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stateTs

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dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

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ancestorMap

project

subproject

componentType

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properties

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institution

65d92049ba853e0042697470

3373e24c072d8a16d3b13d7a3f8d1027

ready

2024-02-23T22:46:33.267Z

9024-6168-1

False

None

False

None

20UPGFC0134521

None

parent

component

66f0618ad7e818004374c6a5

code

aac38c169adae40946a838fff6aa4b9a

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ready

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2024-09-22T18:27:22.771Z

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serialNumber

20UPGB43320008

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	MODULE/INITIAL_COLD
name	Initial Cold

highestLevelParent

component

66fc950aef991c0043c4acde

code

d3325dc2e385155027623f41e5c03215

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2024-10-02T00:34:18.384Z

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subproject

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componentType

code	MODULE
name	Module

type

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

testedAtStage

code	MODULE/INITIAL_COLD
name	Initial Cold

code	P
name	Pixels

code	PG
name	Pixel general

code	FE_CHIP
name	Front-end Chip

code	ITKPIX_V2
name	ITkpix_V2

None

code	MODULE/INITIAL_COLD
name	Initial Cold
order	9
initial	False
final	False

code	BONN
name	University of Bonn

Current Stage: Insertion of pigtail and strain relief glueing

No tests are allocated for this stage.

Past QC Stages and Results

Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE)

OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY)

Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS)

Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK)

Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM)

Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD)

Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES)

Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY)

Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT)

Electrical testing at reception of LLS (LLS/RECEPTION)

Electrical testing on LLS at cold temperature (LLS/POST_TC_COLD)

Electrical testing on LLS at warm temperature (LLS/POST_TC_WARM)

Electrical testing before thermal cycling on LLS at cold temperature (LLS/PRE_TC_COLD)

Electrical testing before thermal cycling on LLS at warm temperature (LLS/PRE_TC_WARM)

Module PCB tab cutting (MODULE/TAB_CUTTING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Module reception (MODULE/RECEPTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Module Complete (MODULE/COMPLETE)

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Final Warm (MODULE/FINAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Thermal Cycles (MODULE/THERMAL_CYCLES)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Initial Warm (MODULE/INITIAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
Analog Readback (ANALOG_READBACK)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

Test	Local Result	ProdDB Record
Electrical FE chip tests (FECHIP_TEST)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
6704cf…13d160	MODULE/INITIAL_COLD	DATA_TRANSMISSION	KojiNakamura	a year ago	a year ago	No tags	Selected
6704ca…13d11e	MODULE/INITIAL_COLD	LP_MODE	KojiNakamura	a year ago	a year ago	No tags	Selected
6705e9…13e60e	MODULE/INITIAL_COLD	PIXEL_FAILURE_ANALYSIS	KojiNakamura	N/A	a year ago	No tags	Selected
6705e8…13e4e6	MODULE/INITIAL_COLD	MIN_HEALTH_TEST	KojiNakamura	N/A	a year ago	No tags	Selected
6705e9…13e5d2	MODULE/INITIAL_COLD	TUNING	KojiNakamura	N/A	a year ago	No tags	Selected
6704c7…13ce2e	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	KojiNakamura	a year ago	a year ago	No tags	Selected
6704c5…13cbc1	MODULE/INITIAL_COLD	VCAL_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
6704bb…13c9ec	MODULE/INITIAL_COLD	SLDO	KojiNakamura	a year ago	a year ago	No tags	Selected
67049a…13c40a	MODULE/INITIAL_COLD	ANALOG_READBACK	KojiNakamura	a year ago	a year ago	No tags	Selected
670491…13c03c	MODULE/INITIAL_COLD	ADC_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
670395…13b9f7	MODULE/INITIAL_WARM	PIXEL_FAILURE_ANALYSIS	KojiNakamura	N/A	a year ago	No tags	Selected
670395…13b8f0	MODULE/INITIAL_WARM	TUNING	KojiNakamura	N/A	a year ago	No tags	Selected
670394…13b845	MODULE/INITIAL_WARM	MIN_HEALTH_TEST	KojiNakamura	N/A	a year ago	No tags	Selected
670378…13b5f0	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	KojiNakamura	a year ago	a year ago	No tags	Selected
67037b…13b685	MODULE/INITIAL_WARM	DATA_TRANSMISSION	KojiNakamura	a year ago	a year ago	No tags	Selected
67037a…13b65e	MODULE/INITIAL_WARM	LP_MODE	KojiNakamura	a year ago	a year ago	No tags	Selected
670377…13b5a7	MODULE/INITIAL_WARM	VCAL_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
670370…13b48e	MODULE/INITIAL_WARM	SLDO	KojiNakamura	a year ago	a year ago	No tags	Selected
670345…13ad0c	MODULE/INITIAL_WARM	ANALOG_READBACK	KojiNakamura	a year ago	a year ago	No tags	Selected
67033b…13a919	MODULE/INITIAL_WARM	ADC_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
65d921…84919c	TESTONWAFER	FECHIP_TEST	KonstantinMauer	N/A	a year ago	No tags	Selected

Stage	Tests
TESTONWAFER	Electrical FE chip tests (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING	ADC Calibration (ADC_CALIBRATION) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO) Low Power Mode (LP_MODE) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/INITIAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Low Power Mode (LP_MODE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE)
MODULE/WIREBOND_PROTECTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) Low Power Mode (LP_MODE) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION)
MODULE/POST_PARYLENE_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE)
MODULE/POST_PARYLENE_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/THERMAL_CYCLES	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Cold startup (COLD_STARTUP)
MODULE/LONG_TERM_STABILITY_TEST	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Undershunt Protection (UNDERSHUNT_PROTECTION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Data Transmission (DATA_TRANSMISSION) Cold startup (COLD_STARTUP)
MODULE/FINAL_METROLOGY	Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE) Analog Readback (ANALOG_READBACK)
MODULE/QC_STATUS
MODULE/UNHAPPY	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/NOTCONSIDEREDINYIELDS	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Undershunt Protection (UNDERSHUNT_PROTECTION) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION) Tuning (TUNING)
MODULE/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
LLS/PRE_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Low Power Mode (LP_MODE) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/PRE_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY	OB:Loaded local support QC electrical connectivity (OBLoadedLocalSupportQC_ElectricalConnectivity) OB:Loaded local support QC electrical performance (OBLoadedLocalSupportQC_ElectricalPerformance) OB:Loaded local support reception at the integration site (OBLoadedLocalSupport_IntegrationSite) OB:Loaded local support QC electrical low power (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE

20UPGFC0134521

OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Component Information

Wafer

Properties

Comments

Test: TUNING QC Failed

(Stage: MODULE/INITIAL_COLD)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

ProductionDB Record

Current Stage: Insertion of pigtail and strain relief glueing

Past QC Stages and Results

Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING)

Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION)

OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE)

OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY)

Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS)

Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK)

Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM)

Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD)

Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD)

Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM)

Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES)

Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY)

Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT)

Electrical testing at reception of LLS (LLS/RECEPTION)

Electrical testing on LLS at cold temperature (LLS/POST_TC_COLD)

Electrical testing on LLS at warm temperature (LLS/POST_TC_WARM)

Electrical testing before thermal cycling on LLS at cold temperature (LLS/PRE_TC_COLD)

Electrical testing before thermal cycling on LLS at warm temperature (LLS/PRE_TC_WARM)

Module PCB tab cutting (MODULE/TAB_CUTTING)

Module reception (MODULE/RECEPTION)

Module Complete (MODULE/COMPLETE)

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

All Registered QC Tests

Check QC Flow

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