Database for ITk Pixel Module

Item	Value
Serial Number	20UPGFC0134502
Production DB Component ID	ddcd49ac1efc95a4143c4434d31de778
LocalDB Component ID	65d920309960840042848490
Component Type	front-end_chip
Super-Component	20UPGM23610026 20UPGB43320008
Sub-Components	No match.
Flags

Key	Data
QC Passed	False
Date	2024-10-07 02:50:25 PDT(-0700)
component ObjectId	65d920309960840042848490
Stage	MODULE/INITIAL_WARM
Test Type	PIXEL_FAILURE_ANALYSIS
Institute ObjectId
User Name	KojiNakamura
ObjectId of this record	6703959ec447bfb7e213b9d8
ObjectId of RAW record	None

Key	Data
ANALYSIS_VERSION	mqat v2.2.4
PIXEL_FAILURE_BAD_ANALOG	8
PIXEL_FAILURE_BAD_DIGITAL	0
PIXEL_FAILURE_DEAD_ANALOG	36
PIXEL_FAILURE_DEAD_DIGITAL	0
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	0
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	0
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	-1
PIXEL_FAILURE_DISCONNECTED_PIXELS	0
PIXEL_FAILURE_DISC_PIXEL_ALL_ELEC	-1
PIXEL_FAILURE_ELECTRICALLY_FAILED	192
PIXEL_FAILURE_FAILING_PIXELS	-1
PIXEL_FAILURE_HIGH_ENC	4
PIXEL_FAILURE_HIGH_NOISE	6
PIXEL_FAILURE_MERGED_BUMPS	10
PIXEL_FAILURE_SOURCE_SCAN_DONE	True
PIXEL_FAILURE_TUNING_BAD	138

Filename	Contents
output.log	Download
0x20d66.log	Download
0x20d66_TUNING_BAD_Threshold_1d.png
0x20d66_HIGH_ENC_Noise_1d.png
0x20d66_PFA_electrical_failures.png
0x20d66_merged.png
0x20d66_source2d.png
0x20d66_matrix_pixels_source1d_xtalk.png
0x20d66_inneredge_pixels_source1d_xtalk.png
0x20d66_outeredge_pixels_source1d_xtalk.png
0x20d66_all_pixels_source1d_xtalk.png
0x20d66_source_vs_xtalk.png
0x20d66_PIXEL_FAILURE_ANALYSIS_depclassification.png
0x20d66_PIXEL_FAILURE_ANALYSIS_indepclassification.png
0x20d66_summary.png
20UPGFC0134502_MODULE__INITIAL_WARM_PIXEL-FAILURE-ANALYSIS.zip	Download

Expand ProductionDB Record

6703aee0ef991c0043e8ba88

state

ready

stateTs

2024-10-07T09:50:24.049Z

stateUserIdentity

24-779-1

date

2024-10-07T08:02:00.000Z

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis
state	active

institution

id	64229fe1b8fd040036839f29
code	HR
name	Hayashi-Repic Co.

user

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

runNumber

6703959ec447bfb7e213b9d8

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Pixel Failure Analysis Version	string	None	True	2.2.4	None	None

results

code	name	dataType	valueType	arrayDimensions	additional	rangeMin	rangeMax	value	associateChild
PIXEL_FAILURE_BAD_ANALOG	Number of bad pixels from analog scan	integer	single	None	None	None	None	8	None
PIXEL_FAILURE_BAD_DIGITAL	Number of bad pixels from digital scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DEAD_ANALOG	Number of dead pixels from analog scan	integer	single	None	None	None	None	36	None
PIXEL_FAILURE_DEAD_DIGITAL	Number of dead pixels from digital scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	Number of disconnected bump from source scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	Number of bad (transition region) pixels from disconnected bump bond scan (xtalk based)	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	Number of disconnected bumps from 0-bias threshold scan	integer	single	None	None	None	None	-1	None
PIXEL_FAILURE_DISCONNECTED_PIXELS	Number of disconnected pixels	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISC_PIXEL_ALL_ELEC	Number of pixels failing disconnected pixel test	integer	single	None	None	None	None	-1	None
PIXEL_FAILURE_ELECTRICALLY_FAILED	Number of electrically failed pixels	integer	single	None	None	None	None	192	None
PIXEL_FAILURE_FAILING_PIXELS	Total number of failing pixels	integer	single	None	None	None	None	-1	None
PIXEL_FAILURE_HIGH_ENC	Number of pixels with High ENC	integer	single	None	None	None	None	4	None
PIXEL_FAILURE_HIGH_NOISE	Number of pixels with high noise occupancy	integer	single	None	None	None	None	6	None
PIXEL_FAILURE_MERGED_BUMPS	Number of merged bumps	integer	single	None	None	None	None	10	None
PIXEL_FAILURE_SOURCE_SCAN_DONE	Source scan done	boolean	single	None	None	None	None	True	None
PIXEL_FAILURE_TUNING_BAD	Number of pixels with bad tuning	integer	single	None	None	None	None	138	None

cts

2024-10-07T09:50:24.049Z

sys

cts	2024-10-07T09:50:24.049Z
mts	2024-10-07T09:50:25.495Z
rev	1

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

url

urlCernbox

filename

user

f2a9fa3371a98bd393c6baf8375cdca7

2024-10-07T09:50:25.495Z

TestRun_6703aee0ef991c0043e8ba88_Attachment_Pack.zip

/nas/db/localdb-tools/viewer/static/cache/thumbnail/TestRun_6703aee0ef991c0043e8ba88_Attachment_Pack.zip

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/f/2/a/f2a9fa3371a98bd393c6baf8375cdca7?authz=zteos64:MDAwMDAyOWN4nOPazsTFWCSw_N2uHWxSrJkl2QUpSkxVBRqMRsb6qfnF-oklOYlQMjm1KC-9KL-0ICWzOFs_JbVEF6hcv6AoP0U3JUk_Td9IP9FLxdI4LdHMwiJZ1yLJyFjX0DA1TdfS2CJVN9EkKc3A0NzSNMXIMugwY3RIaaqCf3KJgqGpgpGBlTEQWQIZRiaxCqWZKVaGJoZmFobRYOfEKqSDRIwNzKOrCmIVSjJTUvNKrIry80v0jI0sTIxNDK1MzSxNHKKtrNKAwMrUUM_Q0EzP0kLP0CBWIS8xN9UKbI5CSp6VAtC1JVbZRUmmCokFBVYKGfnFJVbYNabk5yZm5lkhiaSn5lsZmBoaKxSXpgBZQgoBx6ZM1-6wD_fzPnb_6bz79iI-k_iuTjJ-3f0vz2yixPF_UqNhS2bYKjw-vGgVEwCeltA0

https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/f/2/a/f2a9fa3371a98bd393c6baf8375cdca7

f2a9fa3371a98bd393c6baf8375cdca7

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

65d920309960840042848490

ddcd49ac1efc95a4143c4434d31de778

ready

2024-02-23T22:46:08.161Z

9024-6168-1

False

None

False

None

20UPGFC0134502

None

parent

component

66f0618ad7e818004374c6a5

code

aac38c169adae40946a838fff6aa4b9a

state

ready

stateTs

2024-09-22T18:27:22.771Z

stateUserIdentity

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dummy

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completedUserIdentity

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trashed

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trashedTs

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trashedUserIdentity

None

serialNumber

20UPGB43320008

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	MODULE/ASSEMBLY
name	Bare module to module PCB assembly

highestLevelParent

component

66fc950aef991c0043c4acde

code

d3325dc2e385155027623f41e5c03215

state

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2024-10-02T00:34:18.384Z

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None

serialNumber

20UPGM23610026

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	MODULE
name	Module

type

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

testedAtStage

code	MODULE/ASSEMBLY
name	Bare module to module PCB assembly

code	P
name	Pixels

code	PG
name	Pixel general

code	FE_CHIP
name	Front-end Chip

code	ITKPIX_V2
name	ITkpix_V2

None

code	MODULE/INITIAL_WARM
name	Initial Warm
order	7
initial	False
final	False

code	BONN
name	University of Bonn

Current Stage: Insertion of pigtail and strain relief glueing

No tests are allocated for this stage.

Past QC Stages and Results

Results Stage: Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING) Alternative

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION) Locally Signed Off

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Stage: OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE) Not signed-off

No tests are allocated for this stage.

Stage: OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS) Locally Signed Off

No tests are allocated for this stage.

Stage: Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK) Complete

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM) Not signed-off

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD) Not signed-off

No tests are allocated for this stage.

Results Stage: Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Data Transmission (DATA_TRANSMISSION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Injection Capacitance (INJECTION_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Low Power Mode (LP_MODE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
SLDO (SLDO)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Tuning (TUNING)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Data Transmission (DATA_TRANSMISSION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Injection Capacitance (INJECTION_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Low Power Mode (LP_MODE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
SLDO (SLDO)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Tuning (TUNING)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Stage: Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES) Complete

No tests are allocated for this stage.

Stage: Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT) Locally Signed Off

No tests are allocated for this stage.

Results Stage: Module PCB tab cutting (MODULE/TAB_CUTTING) Complete

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Module reception (MODULE/RECEPTION) Complete

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Stage: Module Complete (MODULE/COMPLETE) Complete

No tests are allocated for this stage.

Stage: Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS) Not signed-off

No tests are allocated for this stage.

Stage: Modules failed test, needs investigation (MODULE/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Ranking of the module (MODULE/QC_STATUS) Not signed-off

No tests are allocated for this stage.

Stage: Final flatness measurement (MODULE/FINAL_METROLOGY) Not signed-off

No tests are allocated for this stage.

Results Stage: Final Cold (MODULE/FINAL_COLD) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Data Transmission (DATA_TRANSMISSION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Injection Capacitance (INJECTION_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Low Power Mode (LP_MODE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
SLDO (SLDO)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Tuning (TUNING)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Final Warm (MODULE/FINAL_WARM) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Data Transmission (DATA_TRANSMISSION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Injection Capacitance (INJECTION_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Low Power Mode (LP_MODE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
SLDO (SLDO)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Tuning (TUNING)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST) Complete

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Thermal Cycles (MODULE/THERMAL_CYCLES) Complete

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION) Complete

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Post-Parylene Cold (MODULE/POST_PARYLENE_COLD) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Data Transmission (DATA_TRANSMISSION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Injection Capacitance (INJECTION_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Low Power Mode (LP_MODE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
SLDO (SLDO)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Tuning (TUNING)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Post-Parylene Warm (MODULE/POST_PARYLENE_WARM) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Data Transmission (DATA_TRANSMISSION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Injection Capacitance (INJECTION_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Low Power Mode (LP_MODE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
SLDO (SLDO)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Tuning (TUNING)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Parylene Unmasking (MODULE/PARYLENE_UNMASKING) Complete

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Stage: Parylene Coating (MODULE/PARYLENE_COATING) Complete

No tests are allocated for this stage.

Stage: Parylene Masking (MODULE/PARYLENE_MASKING) Complete

No tests are allocated for this stage.

Results Stage: Initial Cold (MODULE/INITIAL_COLD) Locally Signed Off

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Analog Readback (ANALOG_READBACK)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Data Transmission (DATA_TRANSMISSION)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Injection Capacitance (INJECTION_CAPACITANCE)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Low Power Mode (LP_MODE)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Minimal Health Test (MIN_HEALTH_TEST)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
SLDO (SLDO)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Tuning (TUNING)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	Registered Test is registered in LocalDB.	Registered Jump to the ITkPD TestRun Page!

Results Stage: QC cross-check (module swapping) (MODULE/QC_CROSSCHECK) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Data Transmission (DATA_TRANSMISSION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Injection Capacitance (INJECTION_CAPACITANCE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Low Power Mode (LP_MODE)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
SLDO (SLDO)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Tuning (TUNING)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Results Stage: Initial Warm (MODULE/INITIAL_WARM) Complete

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Analog Readback (ANALOG_READBACK)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Data Transmission (DATA_TRANSMISSION)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Injection Capacitance (INJECTION_CAPACITANCE)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Low Power Mode (LP_MODE)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Minimal Health Test (MIN_HEALTH_TEST)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
SLDO (SLDO)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Tuning (TUNING)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
VCAL Calibration (VCAL_CALIBRATION)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!

Stage: Wire Bonding (MODULE/WIREBONDING) Locally Signed Off

No tests are allocated for this stage.

Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Initial state to associate flex to bare module (MODULE/INIT) Not signed-off

No tests are allocated for this stage.

Results Stage: Reception at ITk institute (BAREMODULERECEPTION) Complete

Test	Local Result	ProdDB Record
Analog Readback (ANALOG_READBACK)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.
Minimal Health Test (MIN_HEALTH_TEST)	No result Test is missing in LocalDB.	N/A Test is not pushed to ITkPD.

Stage: Bare module assembly (BAREMODULEASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Not to be used for detector (UNUSABLE) Alternative

No tests are allocated for this stage.

Stage: Hybridisation (HYBRIDISATION) Locally Signed Off

No tests are allocated for this stage.

Results Stage: Testing on wafer (TESTONWAFER) Complete

Test	Local Result	ProdDB Record
Electrical FE chip tests (FECHIP_TEST)	Registered Jump to the LocalDB Test Record!	Registered Jump to the ITkPD TestRun Page!

LocalDB Test ID	Stage	Test Name	Inspector	Date	QC Registration
6704cf52c447bfb7e213d16a	MODULE/INITIAL_COLD	DATA_TRANSMISSION	KojiNakamura	2024-10-08 20:21:17 PDT(-0700)	Selected
6704ca0bc447bfb7e213d127	MODULE/INITIAL_COLD	LP_MODE	KojiNakamura	2024-10-08 20:21:09 PDT(-0700)	Selected
6705e9afc447bfb7e213e662	MODULE/INITIAL_COLD	PIXEL_FAILURE_ANALYSIS	KojiNakamura	2024-10-08 20:20:13 PDT(-0700)	Selected
6705e81ec447bfb7e213e4d5	MODULE/INITIAL_COLD	MIN_HEALTH_TEST	KojiNakamura	2024-10-08 20:19:39 PDT(-0700)	Selected
6705e956c447bfb7e213e5ac	MODULE/INITIAL_COLD	TUNING	KojiNakamura	2024-10-08 20:18:44 PDT(-0700)	Selected
6704c72cc447bfb7e213ce3e	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	KojiNakamura	2024-10-08 20:18:23 PDT(-0700)	Selected
6704c557c447bfb7e213cbd2	MODULE/INITIAL_COLD	VCAL_CALIBRATION	KojiNakamura	2024-10-08 20:18:11 PDT(-0700)	Selected
6704bbe9c447bfb7e213c9fa	MODULE/INITIAL_COLD	SLDO	KojiNakamura	2024-10-08 20:18:02 PDT(-0700)	Selected
67049adec447bfb7e213c42f	MODULE/INITIAL_COLD	ANALOG_READBACK	KojiNakamura	2024-10-08 20:17:44 PDT(-0700)	Selected
67049169c447bfb7e213c047	MODULE/INITIAL_COLD	ADC_CALIBRATION	KojiNakamura	2024-10-08 20:17:24 PDT(-0700)	Selected
6703959ec447bfb7e213b9d8	MODULE/INITIAL_WARM	PIXEL_FAILURE_ANALYSIS	KojiNakamura	2024-10-07 02:50:25 PDT(-0700)	Selected
67039565c447bfb7e213b8d3	MODULE/INITIAL_WARM	TUNING	KojiNakamura	2024-10-07 02:49:24 PDT(-0700)	Selected
67039490c447bfb7e213b843	MODULE/INITIAL_WARM	MIN_HEALTH_TEST	KojiNakamura	2024-10-07 02:48:43 PDT(-0700)	Selected
6703786dc447bfb7e213b5ff	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	KojiNakamura	2024-10-07 02:48:39 PDT(-0700)	Selected
67037be8c447bfb7e213b68f	MODULE/INITIAL_WARM	DATA_TRANSMISSION	KojiNakamura	2024-10-07 02:48:30 PDT(-0700)	Selected
67037a33c447bfb7e213b667	MODULE/INITIAL_WARM	LP_MODE	KojiNakamura	2024-10-07 02:48:21 PDT(-0700)	Selected
67037750c447bfb7e213b5b8	MODULE/INITIAL_WARM	VCAL_CALIBRATION	KojiNakamura	2024-10-07 02:48:13 PDT(-0700)	Selected
6703704cc447bfb7e213b49c	MODULE/INITIAL_WARM	SLDO	KojiNakamura	2024-10-07 02:48:04 PDT(-0700)	Selected
67034bb5c447bfb7e213ae8e	MODULE/INITIAL_WARM	ANALOG_READBACK	KojiNakamura	2024-10-07 02:47:52 PDT(-0700)	Selected
67033ba8c447bfb7e213a925	MODULE/INITIAL_WARM	ADC_CALIBRATION	KojiNakamura	2024-10-07 02:47:37 PDT(-0700)	Selected
65d921649960840042848e31	TESTONWAFER	FECHIP_TEST	KonstantinMauer	2024-10-06 11:17:38 PDT(-0700)	Selected

Stage	Tests
TESTONWAFER	Electrical FE chip tests (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/POST_PARYLENE_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE)
MODULE/POST_PARYLENE_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/WIREBOND_PROTECTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/THERMAL_CYCLES	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/LONG_TERM_STABILITY_TEST	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Undershunt Protection (UNDERSHUNT_PROTECTION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Data Transmission (DATA_TRANSMISSION)
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Undershunt Protection (UNDERSHUNT_PROTECTION) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/COMPLETE
MODULE/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION)
MODULE/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY	OB:Loaded local support QC electrical connectivity (OBLoadedLocalSupportQC_ElectricalConnectivity) OB:Loaded local support QC electrical performance (OBLoadedLocalSupportQC_ElectricalPerformance) OB:Loaded local support reception at the integration site (OBLoadedLocalSupport_IntegrationSite) OB:Loaded local support QC electrical low power (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE

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Component Information

Properties

Comments

Test: PIXEL_FAILURE_ANALYSIS QC Failed

(Stage: MODULE/INITIAL_WARM)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

ProductionDB Record

Current Stage: Insertion of pigtail and strain relief glueing

No tests are allocated for this stage.

Past QC Stages and Results

Results Stage: Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING) Alternative

Results Stage: Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION) Locally Signed Off

Stage: OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE) Not signed-off

No tests are allocated for this stage.

Stage: OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS) Locally Signed Off

No tests are allocated for this stage.

Stage: Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK) Complete

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM) Not signed-off

No tests are allocated for this stage.

Stage: Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD) Not signed-off

No tests are allocated for this stage.

Results Stage: Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD) Complete

Results Stage: Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM) Complete

Stage: Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES) Complete

No tests are allocated for this stage.

Stage: Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT) Locally Signed Off

No tests are allocated for this stage.

Results Stage: Module PCB tab cutting (MODULE/TAB_CUTTING) Complete

Results Stage: Module reception (MODULE/RECEPTION) Complete

Stage: Module Complete (MODULE/COMPLETE) Complete

No tests are allocated for this stage.

Stage: Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS) Not signed-off

No tests are allocated for this stage.

Stage: Modules failed test, needs investigation (MODULE/UNHAPPY) Complete

No tests are allocated for this stage.

Stage: Ranking of the module (MODULE/QC_STATUS) Not signed-off

No tests are allocated for this stage.

Stage: Final flatness measurement (MODULE/FINAL_METROLOGY) Not signed-off

No tests are allocated for this stage.

Results Stage: Final Cold (MODULE/FINAL_COLD) Complete

Results Stage: Final Warm (MODULE/FINAL_WARM) Complete

Results Stage: Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST) Complete

Results Stage: Thermal Cycles (MODULE/THERMAL_CYCLES) Complete

Results Stage: Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION) Complete

Results Stage: Post-Parylene Cold (MODULE/POST_PARYLENE_COLD) Complete

Results Stage: Post-Parylene Warm (MODULE/POST_PARYLENE_WARM) Complete

Results Stage: Parylene Unmasking (MODULE/PARYLENE_UNMASKING) Complete

Stage: Parylene Coating (MODULE/PARYLENE_COATING) Complete

No tests are allocated for this stage.

Stage: Parylene Masking (MODULE/PARYLENE_MASKING) Complete

No tests are allocated for this stage.

Results Stage: Initial Cold (MODULE/INITIAL_COLD) Locally Signed Off

Results Stage: QC cross-check (module swapping) (MODULE/QC_CROSSCHECK) Complete

Results Stage: Initial Warm (MODULE/INITIAL_WARM) Complete

Stage: Wire Bonding (MODULE/WIREBONDING) Locally Signed Off

No tests are allocated for this stage.

Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Initial state to associate flex to bare module (MODULE/INIT) Not signed-off

No tests are allocated for this stage.

Results Stage: Reception at ITk institute (BAREMODULERECEPTION) Complete

Stage: Bare module assembly (BAREMODULEASSEMBLY) Complete

No tests are allocated for this stage.

Stage: Not to be used for detector (UNUSABLE) Alternative

No tests are allocated for this stage.

Stage: Hybridisation (HYBRIDISATION) Locally Signed Off

No tests are allocated for this stage.

Results Stage: Testing on wafer (TESTONWAFER) Complete

All Registered QC Tests

Check QC Flow

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20UPGFC0134502
ITkPixV2-0d-(6,6)

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