20UPGFC0134493

OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Component Information

Serial Number	20UPGFC0134493
ProdDB ID	bcd2ac…88d984
LocalDB ID	65d9200fba853e0042697419
Component Type	fe_chip
Parents	20UPGM23610026 20UPGB43320008
Children	No match.
Flags

Wafer

Wafer Probing

Properties

Item	Value
Wafer serial number	None

Comments

Test: TUNING QC Failed

(Stage: MODULE/INITIAL_COLD)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	65d9200fba853e0042697419
Stage	MODULE/INITIAL_COLD
Test Type	TUNING
Institute ObjectId
User Name	KojiNakamura
ObjectId of this record	6705e957c447bfb7e213e5c0
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat v2.2.6
TUNING_TUNED_NOISE_95_HIGH	114.055
TUNING_TUNED_NOISE_95_LOW	72.136
TUNING_TUNED_NOISE_MEAN	92.311
TUNING_TUNED_NOISE_SIGMA	11.364
TUNING_TUNED_TDAC_MEAN	-1.2
TUNING_TUNED_TDAC_SIGMA	4.7
TUNING_TUNED_THRESHOLD_95_HIGH	1561.796
TUNING_TUNED_THRESHOLD_95_LOW	1429.106
TUNING_TUNED_THRESHOLD_FAILED_FITS	16
TUNING_TUNED_THRESHOLD_MEAN	1497.8
TUNING_TUNED_THRESHOLD_SIGMA	38
TUNING_TUNED_TOT_95_HIGH	12.27
TUNING_TUNED_TOT_95_LOW	4.11
TUNING_TUNED_TOT_MEAN	7.5
TUNING_TUNED_TOT_SIGMA	2
TUNING_UNTUNED_NOISE_95_HIGH	113.254
TUNING_UNTUNED_NOISE_95_LOW	70.406
TUNING_UNTUNED_NOISE_MEAN	90.322
TUNING_UNTUNED_NOISE_SIGMA	11.816
TUNING_UNTUNED_TDAC_MEAN	0
TUNING_UNTUNED_TDAC_SIGMA	0
TUNING_UNTUNED_THRESHOLD_95_HIGH	3314.292
TUNING_UNTUNED_THRESHOLD_95_LOW	1797.802
TUNING_UNTUNED_THRESHOLD_FAILED_FITS	179
TUNING_UNTUNED_THRESHOLD_MEAN	2502
TUNING_UNTUNED_THRESHOLD_SIGMA	385

Attachments

Filename	Contents
0x20d5d_MODULE/INITIAL_COLD_L2_cold.json	Download
output.log	Download
0x20d5d_UNTUNED_THRESHOLD_MEAN_Threshold_1d.png
0x20d5d_UNTUNED_TDAC_MEAN_TDAC_1d.png
0x20d5d_UNTUNED_NOISE_MEAN_Noise_1d.png
0x20d5d_TUNED_THRESHOLD_MEAN_Threshold_1d.png
0x20d5d_TUNED_TDAC_MEAN_TDAC_1d.png
0x20d5d_TUNED_NOISE_MEAN_Noise_1d.png
0x20d5d_TUNED_TOT_MEAN_TOT_1d.png
0x20d5d.log	Download
0x20d5d_Tuned_failures.png
0x20d5d_Untuned_failures.png
0x20d5d_summary_untuned.png
0x20d5d_summary_tuned.png
20UPGFC0134493_MODULE__INITIAL_COLD_TUNING.zip	Download

ProductionDB Record

Expand ProductionDB Record

6705f5f7e399350043fe9fcf

state

ready

stateTs

2024-10-09T03:18:15.318Z

stateUserIdentity

24-779-1

date

2024-10-09T02:24:00.000Z

testType

id	6393a09015838700361eecc5
code	TUNING
name	Tuning
state	active

institution

id	64229fe1b8fd040036839f29
code	HR
name	Hayashi-Repic Co.

user

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

runNumber

6705e957c447bfb7e213e5c0

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Tuning analysis version	string	None	True	2.2.6	None	None

results

code	name	dataType	valueType	arrayDimensions	additional	rangeMin	rangeMax	value	associateChild
TUNING_TUNED_NOISE_95_HIGH	Tuned noise 95% high	float	single	None	None	None	None	114.055	None
TUNING_TUNED_NOISE_95_LOW	Tuned noise 95% low	float	single	None	None	None	None	72.136	None
TUNING_TUNED_NOISE_MEAN	Tuned noise mean	float	single	None	None	None	None	92.311	None
TUNING_TUNED_NOISE_SIGMA	Tuned noise sigma	float	single	None	None	None	None	11.364	None
TUNING_TUNED_TDAC_MEAN	Tuned TDAC mean	float	single	None	None	None	None	-1.2	None
TUNING_TUNED_TDAC_SIGMA	Tuned TDAC sigma	float	single	None	None	None	None	4.7	None
TUNING_TUNED_THRESHOLD_95_HIGH	Tuned threshold 95% high	float	single	None	None	None	None	1561.796	None
TUNING_TUNED_THRESHOLD_95_LOW	Tuned threshold 95% low	float	single	None	None	None	None	1429.106	None
TUNING_TUNED_THRESHOLD_FAILED_FITS	Number of failed fits from the tuned threshold scan	integer	single	None	None	None	None	16	None
TUNING_TUNED_THRESHOLD_MEAN	Mean of the tuned threshold distribution	float	single	None	None	None	None	1497.8	None
TUNING_TUNED_THRESHOLD_SIGMA	Sigma of the tuned threshold distribution	float	single	None	None	None	None	38	None
TUNING_TUNED_TOT_95_HIGH	Tuned ToT 95% high	float	single	None	None	None	None	12.27	None
TUNING_TUNED_TOT_95_LOW	Tuned ToT 95% low	float	single	None	None	None	None	4.11	None
TUNING_TUNED_TOT_MEAN	Mean of tuned ToT distribution	float	single	None	None	None	None	7.5	None
TUNING_TUNED_TOT_SIGMA	Sigma of tuned ToT distribution	float	single	None	None	None	None	2	None
TUNING_UNTUNED_NOISE_95_HIGH	Untuned noise 95% high	float	single	None	None	None	None	113.254	None
TUNING_UNTUNED_NOISE_95_LOW	Noise 95% low	float	single	None	None	None	None	70.406	None
TUNING_UNTUNED_NOISE_MEAN	Untuned noise mean	float	single	None	None	None	None	90.322	None
TUNING_UNTUNED_NOISE_SIGMA	Untuned noise sigma	float	single	None	None	None	None	11.816	None
TUNING_UNTUNED_TDAC_MEAN	Untuned TDAC mean	float	single	None	None	None	None	0	None
TUNING_UNTUNED_TDAC_SIGMA	Untuned TDAC sigma	float	single	None	None	None	None	0	None
TUNING_UNTUNED_THRESHOLD_95_HIGH	Untuned threshold 95% high	float	single	None	None	None	None	3314.292	None
TUNING_UNTUNED_THRESHOLD_95_LOW	Untuned threshold 95% low	float	single	None	None	None	None	1797.802	None
TUNING_UNTUNED_THRESHOLD_FAILED_FITS	Number of failed fits from the untuned threshold scan	integer	single	None	None	None	None	179	None
TUNING_UNTUNED_THRESHOLD_MEAN	Mean of the untuned threshold distribution	float	single	None	None	None	None	2502	None
TUNING_UNTUNED_THRESHOLD_SIGMA	Sigma of the untuned threshold distribution	float	single	None	None	None	None	385	None

cts

2024-10-09T03:18:15.318Z

sys

cts	2024-10-09T03:18:15.318Z
mts	2024-10-09T03:18:31.033Z
rev	2

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

url

urlCernbox

filename

user

f6e8fb9e68cb8c9c5f6afb9d897a4990

2024-10-09T03:18:25.307Z

0x20d5d_MODULE/INITIAL_COLD_L2_cold.json

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None

eos

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https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/f/6/e/f6e8fb9e68cb8c9c5f6afb9d897a4990

f6e8fb9e68cb8c9c5f6afb9d897a4990

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

ffb6bfd4bdc8fe68f1a7d4c2eb5ce40e

2024-10-09T03:18:31.033Z

TestRun_6705f5f7e399350043fe9fcf_Attachment_Pack.zip

/nas/db/localdb-tools/viewer/static/cache/thumbnail/TestRun_6705f5f7e399350043fe9fcf_Attachment_Pack.zip

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/f/f/b/ffb6bfd4bdc8fe68f1a7d4c2eb5ce40e?authz=zteos64:MDAwMDAyOWN4nO1QPUvEQBTkDjzwsBAruWoRC5tNspvv12hhpYIgdjFFNrs5Q7xsSDbNdZa211t4-AMEFcXqwFI7_4CNndjZiILxsLCwsnYeDMPw3mOY7lW72yrnz15urju9mVRlBV9qD4uVFjV1ISs9UgfRN8eizPulrAueVpnOhcLNul6UkmPO9KQZtrHs-xFlnDjYY9TEhIgEM0JjHFksMYjr25z6O7etYLcWaDtWiNiIGmAaYHmNoFaI6pQDsYjjkWAaJ0T9L8c03GBYhEilXOQKSimVZlLPclwXqGVaawFA0gBsohHiaL6nESNEeTQQMP2DeA6oSasgK5mNoqIAtC8rBb8fcjmI0hx-OH0hwbCJiaqaN2oBndw9v0_uN98mj7PrePVw72PuiB7HI2e8tXh6Pnoa9_67_WO36PXy4qHzCeff0fM%3d

https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/f/f/b/ffb6bfd4bdc8fe68f1a7d4c2eb5ce40e

ffb6bfd4bdc8fe68f1a7d4c2eb5ce40e

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

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properties

testedAtStage

institution

65d9200fba853e0042697419

bcd2acd6c1c3452af60b47d95388d984

ready

2024-02-23T22:45:35.700Z

9024-6168-1

False

None

False

None

20UPGFC0134493

None

parent

component

66f0618ad7e818004374c6a5

code

aac38c169adae40946a838fff6aa4b9a

state

ready

stateTs

2024-09-22T18:27:22.771Z

stateUserIdentity

24-779-1

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False

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None

completedUserIdentity

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False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43320008

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	MODULE/INITIAL_COLD
name	Initial Cold

highestLevelParent

component

66fc950aef991c0043c4acde

code

d3325dc2e385155027623f41e5c03215

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2024-10-02T00:34:18.384Z

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20UPGM23610026

alternativeIdentifier

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project

code	P
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subproject

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name	Pixel general

componentType

code	MODULE
name	Module

type

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

testedAtStage

code	MODULE/INITIAL_COLD
name	Initial Cold

code	P
name	Pixels

code	PG
name	Pixel general

code	FE_CHIP
name	Front-end Chip

code	ITKPIX_V2
name	ITkpix_V2

None

code	MODULE/INITIAL_COLD
name	Initial Cold
order	9
initial	False
final	False

code	BONN
name	University of Bonn

Current Stage: Insertion of pigtail and strain relief glueing

No tests are allocated for this stage.

Past QC Stages and Results

Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE)

OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY)

Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS)

Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK)

Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM)

Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD)

Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES)

Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY)

Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT)

Electrical testing at reception of LLS (LLS/RECEPTION)

Electrical testing on LLS at cold temperature (LLS/POST_TC_COLD)

Electrical testing on LLS at warm temperature (LLS/POST_TC_WARM)

Electrical testing before thermal cycling on LLS at cold temperature (LLS/PRE_TC_COLD)

Electrical testing before thermal cycling on LLS at warm temperature (LLS/PRE_TC_WARM)

Module PCB tab cutting (MODULE/TAB_CUTTING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Module reception (MODULE/RECEPTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Module Complete (MODULE/COMPLETE)

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Final Warm (MODULE/FINAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Thermal Cycles (MODULE/THERMAL_CYCLES)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Initial Warm (MODULE/INITIAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
Analog Readback (ANALOG_READBACK)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

Test	Local Result	ProdDB Record
Electrical FE chip tests (FECHIP_TEST)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
6704cf…13d174	MODULE/INITIAL_COLD	DATA_TRANSMISSION	KojiNakamura	a year ago	a year ago	No tags	Selected
6704ca…13d131	MODULE/INITIAL_COLD	LP_MODE	KojiNakamura	a year ago	a year ago	No tags	Selected
6705e9…13e62d	MODULE/INITIAL_COLD	PIXEL_FAILURE_ANALYSIS	KojiNakamura	N/A	a year ago	No tags	Selected
6705e8…13e508	MODULE/INITIAL_COLD	MIN_HEALTH_TEST	KojiNakamura	N/A	a year ago	No tags	Selected
6705e9…13e5c0	MODULE/INITIAL_COLD	TUNING	KojiNakamura	N/A	a year ago	No tags	Selected
6704c7…13ce4e	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	KojiNakamura	a year ago	a year ago	No tags	Selected
6704c5…13cbe3	MODULE/INITIAL_COLD	VCAL_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
6704bb…13ca08	MODULE/INITIAL_COLD	SLDO	KojiNakamura	a year ago	a year ago	No tags	Selected
67049a…13c454	MODULE/INITIAL_COLD	ANALOG_READBACK	KojiNakamura	a year ago	a year ago	No tags	Selected
670491…13c052	MODULE/INITIAL_COLD	ADC_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
670395…13b99a	MODULE/INITIAL_WARM	PIXEL_FAILURE_ANALYSIS	KojiNakamura	N/A	a year ago	No tags	Selected
670395…13b8f2	MODULE/INITIAL_WARM	TUNING	KojiNakamura	N/A	a year ago	No tags	Selected
670394…13b840	MODULE/INITIAL_WARM	MIN_HEALTH_TEST	KojiNakamura	N/A	a year ago	No tags	Selected
670378…13b60e	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	KojiNakamura	a year ago	a year ago	No tags	Selected
67037b…13b699	MODULE/INITIAL_WARM	DATA_TRANSMISSION	KojiNakamura	a year ago	a year ago	No tags	Selected
67037a…13b670	MODULE/INITIAL_WARM	LP_MODE	KojiNakamura	a year ago	a year ago	No tags	Selected
670377…13b5c9	MODULE/INITIAL_WARM	VCAL_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
670370…13b4ac	MODULE/INITIAL_WARM	SLDO	KojiNakamura	a year ago	a year ago	No tags	Selected
670345…13ad56	MODULE/INITIAL_WARM	ANALOG_READBACK	KojiNakamura	a year ago	a year ago	No tags	Selected
67033b…13a931	MODULE/INITIAL_WARM	ADC_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
65d921…697c01	TESTONWAFER	FECHIP_TEST	KonstantinMauer	N/A	a year ago	No tags	Selected

Stage	Tests
TESTONWAFER	Electrical FE chip tests (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING	ADC Calibration (ADC_CALIBRATION) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO) Low Power Mode (LP_MODE) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/INITIAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Low Power Mode (LP_MODE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE)
MODULE/WIREBOND_PROTECTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) Low Power Mode (LP_MODE) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION)
MODULE/POST_PARYLENE_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE)
MODULE/POST_PARYLENE_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/THERMAL_CYCLES	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Cold startup (COLD_STARTUP)
MODULE/LONG_TERM_STABILITY_TEST	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Undershunt Protection (UNDERSHUNT_PROTECTION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Data Transmission (DATA_TRANSMISSION) Cold startup (COLD_STARTUP)
MODULE/FINAL_METROLOGY	Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE) Analog Readback (ANALOG_READBACK)
MODULE/QC_STATUS
MODULE/UNHAPPY	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/NOTCONSIDEREDINYIELDS	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Undershunt Protection (UNDERSHUNT_PROTECTION) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION) Tuning (TUNING)
MODULE/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
LLS/PRE_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Low Power Mode (LP_MODE) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/PRE_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY	OB:Loaded local support QC electrical connectivity (OBLoadedLocalSupportQC_ElectricalConnectivity) OB:Loaded local support QC electrical performance (OBLoadedLocalSupportQC_ElectricalPerformance) OB:Loaded local support reception at the integration site (OBLoadedLocalSupport_IntegrationSite) OB:Loaded local support QC electrical low power (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE

20UPGFC0134493

OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Component Information

Wafer

Properties

Comments

Test: TUNING QC Failed

(Stage: MODULE/INITIAL_COLD)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

ProductionDB Record

Current Stage: Insertion of pigtail and strain relief glueing

Past QC Stages and Results

Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING)

Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION)

OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE)

OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY)

Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS)

Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK)

Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM)

Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD)

Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD)

Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM)

Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES)

Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY)

Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT)

Electrical testing at reception of LLS (LLS/RECEPTION)

Electrical testing on LLS at cold temperature (LLS/POST_TC_COLD)

Electrical testing on LLS at warm temperature (LLS/POST_TC_WARM)

Electrical testing before thermal cycling on LLS at cold temperature (LLS/PRE_TC_COLD)

Electrical testing before thermal cycling on LLS at warm temperature (LLS/PRE_TC_WARM)

Module PCB tab cutting (MODULE/TAB_CUTTING)

Module reception (MODULE/RECEPTION)

Module Complete (MODULE/COMPLETE)

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

All Registered QC Tests

Check QC Flow

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