Database for ITk Pixel Module

Serial Number	20UPGFC0134493
ProdDB ID	bcd2ac…88d984
LocalDB ID	65d9200fba853e0042697419
Component Type	fe_chip
Parents	20UPGM23610026 20UPGB43320008
Children	No match.
Flags

Item	Value
Wafer serial number	None

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	65d9200fba853e0042697419
Stage	MODULE/INITIAL_WARM
Test Type	LP_MODE
Institute ObjectId
User Name	KojiNakamura
ObjectId of this record	67037a36c447bfb7e213b670
ObjectId of RAW record	67037a33c447bfb7e213b669
Tags	No tags

Key	Data
ANALYSIS_VERSION	mqat v2.2.4
LP_DIGITAL_FAIL	0
LP_IINA	0.22
LP_IIND	0.32
LP_ISHUNTA	0.0567
LP_ISHUNTD	0.0236
LP_VINA	1.419
LP_VIND	1.418
LP_VOFFS	1.259

Filename	Contents
output.log	Download
0x20d5d.log	Download
0x20d5d_summary.png

Expand ProductionDB Record

6703ae62ef991c0043e8b87b

state

ready

stateTs

2024-10-07T09:48:18.522Z

stateUserIdentity

24-779-1

date

2024-10-07T06:05:00.000Z

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode
state	active

institution

id	64229fe1b8fd040036839f29
code	HR
name	Hayashi-Repic Co.

user

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

runNumber

67037a36c447bfb7e213b670

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	LP Analysis Version	string	None	True	2.2.4	None	None

results

code	name	dataType	valueType	arrayDimensions	additional	rangeMin	rangeMax	value	associateChild
LP_DIGITAL_FAIL	Failing pixels in LP digital scan	integer	single	None	None	None	None	0	None
LP_IINA	LP Iin Analog	float	single	None	None	None	None	0.22	None
LP_IIND	LP Iin Digital	float	single	None	None	None	None	0.32	None
LP_ISHUNTA	LP Ishunt Analog	float	single	None	None	None	None	0.0567	None
LP_ISHUNTD	LP Ishunt Digital	float	single	None	None	None	None	0.0236	None
LP_VINA	LP Vin Analog	float	single	None	None	None	None	1.419	None
LP_VIND	LP Vin Digital	float	single	None	None	None	None	1.418	None
LP_VOFFS	LP V Offset	float	single	None	None	None	None	1.259	None

cts

2024-10-07T09:48:18.522Z

sys

cts	2024-10-07T09:48:18.522Z
mts	2024-10-07T09:48:20.199Z
rev	2

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

binaryStoreg02

filename

user

a68ff69892efed078d15377acdf1a005

2024-10-07T09:48:19.587Z

TestRun_6703ae62ef991c0043e8b87b_Attachment_Pack.zip

/nas/db/localdb-tools/viewer/static/cache/thumbnail/TestRun_6703ae62ef991c0043e8b87b_Attachment_Pack.zip

application/zip

file

True

TestRun_6703ae62ef991c0043e8b87b_Attachment_Pack.zip

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

66cd939a33f082747c6744dfdfa49c84

2024-10-07T09:48:20.122Z

RAW

text/plain

file

True

20UPGFC0134493_MODULE__INITIAL_WARM_LP_MODE_6703ae62ef991c0043e8b87b_67037a33c447bfb7e213b669.json

id	5ca2afc878a5090009836718
userIdentity	24-779-1
firstName	Koji
middleName	None
lastName	Nakamura

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

65d9200fba853e0042697419

bcd2acd6c1c3452af60b47d95388d984

ready

2024-02-23T22:45:35.700Z

9024-6168-1

False

None

False

None

20UPGFC0134493

None

parent

component

66f0618ad7e818004374c6a5

code

aac38c169adae40946a838fff6aa4b9a

state

ready

stateTs

2024-09-22T18:27:22.771Z

stateUserIdentity

24-779-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43320008

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	MODULE/ASSEMBLY
name	Bare module to module PCB assembly

highestLevelParent

component

66fc950aef991c0043c4acde

code

d3325dc2e385155027623f41e5c03215

state

ready

stateTs

2024-10-02T00:34:18.384Z

stateUserIdentity

3168-5516-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGM23610026

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	MODULE
name	Module

type

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

testedAtStage

code	MODULE/ASSEMBLY
name	Bare module to module PCB assembly

code	P
name	Pixels

code	PG
name	Pixel general

code	FE_CHIP
name	Front-end Chip

code	ITKPIX_V2
name	ITkpix_V2

None

code	MODULE/INITIAL_WARM
name	Initial Warm
order	7
initial	False
final	False

code	BONN
name	University of Bonn

Past QC Stages and Results

Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE)

OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY)

Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS)

Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK)

Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM)

Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD)

Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES)

Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY)

Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT)

Electrical testing at reception of LLS (LLS/RECEPTION)

Electrical testing on LLS at cold temperature (LLS/POST_TC_COLD)

Electrical testing on LLS at warm temperature (LLS/POST_TC_WARM)

Electrical testing before thermal cycling on LLS at cold temperature (LLS/PRE_TC_COLD)

Electrical testing before thermal cycling on LLS at warm temperature (LLS/PRE_TC_WARM)

Module PCB tab cutting (MODULE/TAB_CUTTING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Module reception (MODULE/RECEPTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Module Complete (MODULE/COMPLETE)

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Final Warm (MODULE/FINAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Thermal Cycles (MODULE/THERMAL_CYCLES)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Initial Warm (MODULE/INITIAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
Analog Readback (ANALOG_READBACK)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

Test	Local Result	ProdDB Record
Electrical FE chip tests (FECHIP_TEST)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
6704cf…13d174	MODULE/INITIAL_COLD	DATA_TRANSMISSION	KojiNakamura	a year ago	a year ago	No tags	Selected
6704ca…13d131	MODULE/INITIAL_COLD	LP_MODE	KojiNakamura	a year ago	a year ago	No tags	Selected
6705e9…13e62d	MODULE/INITIAL_COLD	PIXEL_FAILURE_ANALYSIS	KojiNakamura	N/A	a year ago	No tags	Selected
6705e8…13e508	MODULE/INITIAL_COLD	MIN_HEALTH_TEST	KojiNakamura	N/A	a year ago	No tags	Selected
6705e9…13e5c0	MODULE/INITIAL_COLD	TUNING	KojiNakamura	N/A	a year ago	No tags	Selected
6704c7…13ce4e	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	KojiNakamura	a year ago	a year ago	No tags	Selected
6704c5…13cbe3	MODULE/INITIAL_COLD	VCAL_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
6704bb…13ca08	MODULE/INITIAL_COLD	SLDO	KojiNakamura	a year ago	a year ago	No tags	Selected
67049a…13c454	MODULE/INITIAL_COLD	ANALOG_READBACK	KojiNakamura	a year ago	a year ago	No tags	Selected
670491…13c052	MODULE/INITIAL_COLD	ADC_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
670395…13b99a	MODULE/INITIAL_WARM	PIXEL_FAILURE_ANALYSIS	KojiNakamura	N/A	a year ago	No tags	Selected
670395…13b8f2	MODULE/INITIAL_WARM	TUNING	KojiNakamura	N/A	a year ago	No tags	Selected
670394…13b840	MODULE/INITIAL_WARM	MIN_HEALTH_TEST	KojiNakamura	N/A	a year ago	No tags	Selected
670378…13b60e	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	KojiNakamura	a year ago	a year ago	No tags	Selected
67037b…13b699	MODULE/INITIAL_WARM	DATA_TRANSMISSION	KojiNakamura	a year ago	a year ago	No tags	Selected
67037a…13b670	MODULE/INITIAL_WARM	LP_MODE	KojiNakamura	a year ago	a year ago	No tags	Selected
670377…13b5c9	MODULE/INITIAL_WARM	VCAL_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
670370…13b4ac	MODULE/INITIAL_WARM	SLDO	KojiNakamura	a year ago	a year ago	No tags	Selected
670345…13ad56	MODULE/INITIAL_WARM	ANALOG_READBACK	KojiNakamura	a year ago	a year ago	No tags	Selected
67033b…13a931	MODULE/INITIAL_WARM	ADC_CALIBRATION	KojiNakamura	a year ago	a year ago	No tags	Selected
65d921…697c01	TESTONWAFER	FECHIP_TEST	KonstantinMauer	N/A	a year ago	No tags	Selected

Stage	Tests
TESTONWAFER	Electrical FE chip tests (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING	ADC Calibration (ADC_CALIBRATION) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO) Low Power Mode (LP_MODE) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/INITIAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Low Power Mode (LP_MODE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE)
MODULE/WIREBOND_PROTECTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) Low Power Mode (LP_MODE) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION)
MODULE/POST_PARYLENE_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE)
MODULE/POST_PARYLENE_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/THERMAL_CYCLES	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Cold startup (COLD_STARTUP)
MODULE/LONG_TERM_STABILITY_TEST	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Undershunt Protection (UNDERSHUNT_PROTECTION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Data Transmission (DATA_TRANSMISSION) Cold startup (COLD_STARTUP)
MODULE/FINAL_METROLOGY	Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE) Analog Readback (ANALOG_READBACK)
MODULE/QC_STATUS
MODULE/UNHAPPY	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/NOTCONSIDEREDINYIELDS	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Undershunt Protection (UNDERSHUNT_PROTECTION) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION) Tuning (TUNING)
MODULE/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
LLS/PRE_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Low Power Mode (LP_MODE) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/PRE_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY	OB:Loaded local support QC electrical connectivity (OBLoadedLocalSupportQC_ElectricalConnectivity) OB:Loaded local support QC electrical performance (OBLoadedLocalSupportQC_ElectricalPerformance) OB:Loaded local support reception at the integration site (OBLoadedLocalSupport_IntegrationSite) OB:Loaded local support QC electrical low power (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE

20UPGFC0134493

OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Component Information

Wafer

Properties

Comments

Test: LP_MODE QC Failed

(Stage: MODULE/INITIAL_WARM)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

RAW Results Record

ProductionDB Record

Current Stage: Insertion of pigtail and strain relief glueing

Past QC Stages and Results

Module PCB tab cutting (in Combined Method) (OB_LOADED_MODULE_CELL/TAB_CUTTING)

Reception at Cell Integration Sites (OB_LOADED_MODULE_CELL/RECEPTION)

OB Loaded Module Cell Complete (OB_LOADED_MODULE_CELL/COMPLETE)

OB Loaded Module Cells failed test, needs investigation (OB_LOADED_MODULE_CELL/UNHAPPY)

Grading of OB Loaded Module Cells (OB_LOADED_MODULE_CELL/QC_STATUS)

Envelope Check (OB_LOADED_MODULE_CELL/ENVELOPE_CHECK)

Thermal Conductivity Test at Warm Temperature (OB_LOADED_MODULE_CELL/THERMAL_WARM)

Thermal Conductivity Test at Cold Temperature (OB_LOADED_MODULE_CELL/THERMAL_COLD)

Electrical Tests at Cold Temperature (OB_LOADED_MODULE_CELL/FINAL_COLD)

Electrical Tests at Warm Temperature (OB_LOADED_MODULE_CELL/FINAL_WARM)

Cold Cycle (OB_LOADED_MODULE_CELL/THERMAL_CYCLES)

Module to cell assembly (OB_LOADED_MODULE_CELL/ASSEMBLY)

Initial state to associate bare cell to module (OB_LOADED_MODULE_CELL/INIT)

Electrical testing at reception of LLS (LLS/RECEPTION)

Electrical testing on LLS at cold temperature (LLS/POST_TC_COLD)

Electrical testing on LLS at warm temperature (LLS/POST_TC_WARM)

Electrical testing before thermal cycling on LLS at cold temperature (LLS/PRE_TC_COLD)

Electrical testing before thermal cycling on LLS at warm temperature (LLS/PRE_TC_WARM)

Module PCB tab cutting (MODULE/TAB_CUTTING)

Module reception (MODULE/RECEPTION)

Module Complete (MODULE/COMPLETE)

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

All Registered QC Tests

Check QC Flow

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