Database for ITk Pixel Module

Serial Number	20UPIS22300138
ProdDB ID	a2cfca…feaa07
LocalDB ID	67bf02b4ccae83c989c1bf5a
Component Type	SENSOR_TILE
Parents	20UPGB43000045
Children	No match.
Flags

Item	Value
Main Vendor readonly	2
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	0220
Alternative Identifier	V3-2-021220-3-004
Original Manufacturer ID	QUAD_4
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	13.844

Key	Data
QC Passed	False
Date	7 months ago
component ObjectId	67bf02b4ccae83c989c1bf5a
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	Simpson,Liana Rae
ObjectId of this record	681d031a5631bb896b8d3fd3
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:d5087b2
HUM	49
TEMP	20
BREAKDOWN_VOLTAGE	134.9
IV_ARRAY	{'voltage': [0, 4.1, 9.8, 14.8, 19.8, 24.8, 29.9, 34.8, 39.9, 45, 49.9, 54.9, 59.9, 64.8, 69.9, 74.8, 79.9, 84.9, 89.9, 94.9, 99.9, 104.9, 109.9, 114.8, 119.9, 124.9, 129.9, 134.9, 140, 145, 150, 155, 160.1, 165], 'current': [0, 0.01225, 0.0384999999999999, 0.0455, 0.05295, 0.0598999999999999, 0.0655, 0.07005, 0.0735, 0.0753, 0.0769, 0.0779999999999999, 0.0795, 0.0805, 0.0819999999999999, 0.0835, 0.0849, 0.0860999999999999, 0.0875, 0.089, 0.0905, 0.092, 0.09305, 0.0947, 0.0965, 0.09825, 0.1065, 0.1352, 0.1864499999999999, 0.24005, 0.36315, 0.51915, 0.8143, 13.65435], 'sigma current': [0, 0.0154681123605952, 6.938893903907228e-18, 0, 0.00015, 0.0002, 0, 0.0001499999999999, 0, 0.0002449489742783, 0.0002, 1.3877787807814457e-17, 0, 0, 1.3877787807814457e-17, 0, 0.0002, 0.0002, 0, 0, 0, 0, 0.00015, 0.0002449489742783, 0, 0.00025, 0.0005916079783099, 0.00652380257212, 0.0222805408372418, 0.0370009797167588, 0.0840684393812565, 0.197346275617251, 0.4789520435283683, 10.962458141425216]}
LEAK_CURRENT	0.0795
MAXIMUM_VOLTAGE	165
NO_BREAKDOWN_VOLTAGE_OBSERVED	False

ProductionDB Record

Expand ProductionDB Record

681d031a5631bb896b8d3fd3

state

ready

stateTs

2025-05-08T19:16:42.879Z

stateUserIdentity

1294-8027-1

date

2025-05-08T19:16:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6797ca0f2ffbf908f24868f9
userIdentity	1294-8027-1
firstName	Simpson,
middleName
lastName	Liana Rae

runNumber

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:d5087b2	None	None
HUM	Humidity [%]	float	single	True	49	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value 134.9
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.1 9.8 14.8 19.8 24.8 29.9 34.8 39.9 45 49.9 54.9 59.9 64.8 69.9 74.8 79.9 84.9 89.9 94.9 99.9 104.9 109.9 114.8 119.9 124.9 129.9 134.9 140 145 150 155 160.1 165
current	0 0.01225 0.0384999999999999 0.0455 0.05295 0.0598999999999999 0.0655 0.07005 0.0735 0.0753 0.0769 0.0779999999999999 0.0795 0.0805 0.0819999999999999 0.0835 0.0849 0.0860999999999999 0.0875 0.089 0.0905 0.092 0.09305 0.0947 0.0965 0.09825 0.1065 0.1352 0.1864499999999999 0.24005 0.36315 0.51915 0.8143 13.65435
sigma current	0 0.0154681123605952 6.938893903907228e-18 0 0.00015 0.0002 0 0.0001499999999999 0 0.0002449489742783 0.0002 1.3877787807814457e-17 0 0 1.3877787807814457e-17 0 0.0002 0.0002 0 0 0 0 0.00015 0.0002449489742783 0 0.00025 0.0005916079783099 0.00652380257212 0.0222805408372418 0.0370009797167588 0.0840684393812565 0.197346275617251 0.4789520435283683 10.962458141425216

associateChild

None

code LEAK_CURRENT
name Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType float
valueType single
arrayDimensions None
additional False
value 0.0795
associateChild None
code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 165
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value False
associateChild None

cts

2025-05-08T19:16:42.880Z

sys

cts	2025-05-08T19:16:42.880Z
mts	2025-05-08T19:16:42.880Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

67bf02b4ccae83c989c1bf5a

a2cfca8ded4d743c1b90fd6db1feaa07

ready

2025-02-26T12:01:56.209Z

9086-39-1

False

None

False

None

20UPIS22300138

V3-2-021220-3-004

parent

component

67eaa631c7aa1e4ddbd6527b

code

dff798f3a40457bbe053a72404cd5e3f

state

ready

stateTs

2025-03-31T14:26:57.097Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43000045

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULERECEPTION
name	Reception at ITk institute

highestLevelParent

component

681b95085631bb896b86016b

code

12432fa214d21b1d961250557c1b9ce8

state

ready

stateTs

2025-05-07T17:14:48.305Z

stateUserIdentity

1294-8027-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPIM13710116

alternativeIdentifier

ANL_ITkPix_77

project

code	P
name	Pixels

subproject

code	PI
name	Inner pixels

componentType

code	MODULE
name	Module

type

code	L1_QUAD_MODULE
name	L1 quad module

testedAtStage

code	MODULE/INIT
name	Initial state to associate flex to bare module

code	P
name	Pixels

code	PI
name	Inner pixels

code	SENSOR_TILE
name	Sensor Tile

code	L1_INNER_PIXEL_QUAD_SENSOR_TILE
name	L1 Inner Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	2
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	0220
MAN_SNO	Alternative Identifier	string	True	True	V3-2-021220-3-004
MAN_ID	Original Manufacturer ID	string	False	False	QUAD_4
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	13.844

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	FBK
name	Fondazione Bruno Kessler (FBK)

Current Stage: Post-Parylene Cold

No tests are allocated for this stage.

Past QC Stages and Results

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
681d03…8d3fd3	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	7 months ago	No tags	Selected
67c03b…38e427	sensor_manufacturer	IV_MEASURE	FrancescoCrescioli	N/A	10 months ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPIS22300138

MODULE/POST_PARYLENE_COLD

Component Information

Properties

Comments

Test: IV_MEASURE QC Failed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Post-Parylene Cold

Past QC Stages and Results

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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