Database for ITk Pixel Module

Serial Number	20UPIS22300135
ProdDB ID	b7ac64…865a11
LocalDB ID	67bf02a5d89b87c79afff352
Component Type	SENSOR_TILE
Parents	20UPGB43000044
Children	No match.
Flags

Item	Value
Main Vendor readonly	2
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	0220
Alternative Identifier	V3-2-021220-3-001
Original Manufacturer ID	QUAD_1
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	13.844

Key	Data
QC Passed	True
Date	10 months ago
component ObjectId	67bf02a5d89b87c79afff352
Stage	sensor_manufacturer
Test Type	IV_MEASURE
Institute ObjectId
User Name	FrancescoCrescioli
ObjectId of this record	67c03bc5d89b87c79a079dc3
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat va04d900e
HUM	0
MEASUREMENT_DATE	None
TEMP	24
BREAKDOWN_REDUCTION	-1
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80, 82, 84, 86, 88, 90, 92, 94, 96, 98, 100, 102, 104, 106, 108, 110, 112, 114, 116, 118, 120, 122, 124, 126, 128, 130, 132, 134, 136, 138, 140, 142, 144], 'voltage': [0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'current': [1.0026e-05, 0.001314, 0.00144, 0.001607, 0.001846, 0.0021270000000000004, 0.002446, 0.00282, 0.003252, 0.003471, 0.003542, 0.003604, 0.003671, 0.003735, 0.0038069999999999996, 0.0038849999999999996, 0.003964, 0.004046999999999999, 0.004123, 0.004188, 0.004247, 0.004298, 0.004344, 0.004384, 0.004422, 0.004456000000000001, 0.004487, 0.004514, 0.004547, 0.004573, 0.0046, 0.004627, 0.004653, 0.004677000000000001, 0.004703, 0.004728, 0.004752, 0.004775, 0.004797, 0.004822, 0.004843, 0.005209, 0.00532, 0.005439, 0.005528, 0.005642, 0.005745, 0.005847, 0.005972, 0.006094, 0.006227, 0.00639, 0.006438999999999999, 0.006671, 0.0067610000000000005, 0.006936, 0.007104999999999999, 0.007287, 0.007461999999999999, 0.007639, 0.007859, 0.008055999999999999, 0.008274, 0.008532999999999999, 0.008788, 0.009049, 0.009323, 0.009604, 0.009904000000000001, 0.010208, 0.010538, 0.010884, 0.011231999999999999], 'sigma current': [], 'temperature': [24], 'humidity': []}
IV_IMG	[]
LEAK_CURRENT	0.003967287005214177
LEAK_PER_AREA	-1
LEAK_INCREASE_FACTOR	-1
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

67c03bc5d89b87c79a079dc3

state

ready

stateTs

2025-02-27T10:17:41.478Z

stateUserIdentity

9086-39-1

date

2025-02-27T10:17:41.264Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	6255994be668fe000ae62a5d
code	FBK
name	Fondazione Bruno Kessler (FBK)

user

id	5e98594f8bc0cb000ba8d3a8
userIdentity	9086-39-1
firstName	Francesco
middleName
lastName	Crescioli

runNumber

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	a04d900e	None	None
HUM	Humidity [%]	float	single	True	0	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	None	None	None
TEMP	Temperature [°C]	float	single	True	24	None	None

results

code BREAKDOWN_REDUCTION
name Breakdown Voltage Reduction (V)
order 8
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value -1
associateChild None
code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

time	0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50 52 54 56 58 60 62 64 66 68 70 72 74 76 78 80 82 84 86 88 90 92 94 96 98 100 102 104 106 108 110 112 114 116 118 120 122 124 126 128 130 132 134 136 138 140 142 144
voltage	0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 115 120 125 130 135 140 145 150 155 160 165 170 175 180 185 190 195 200
current	1.0026e-05 0.001314 0.00144 0.001607 0.001846 0.0021270000000000004 0.002446 0.00282 0.003252 0.003471 0.003542 0.003604 0.003671 0.003735 0.0038069999999999996 0.0038849999999999996 0.003964 0.004046999999999999 0.004123 0.004188 0.004247 0.004298 0.004344 0.004384 0.004422 0.004456000000000001 0.004487 0.004514 0.004547 0.004573 0.0046 0.004627 0.004653 0.004677000000000001 0.004703 0.004728 0.004752 0.004775 0.004797 0.004822 0.004843 0.005209 0.00532 0.005439 0.005528 0.005642 0.005745 0.005847 0.005972 0.006094 0.006227 0.00639 0.006438999999999999 0.006671 0.0067610000000000005 0.006936 0.007104999999999999 0.007287 0.007461999999999999 0.007639 0.007859 0.008055999999999999 0.008274 0.008532999999999999 0.008788 0.009049 0.009323 0.009604 0.009904000000000001 0.010208 0.010538 0.010884 0.011231999999999999
sigma current
temperature	24
humidity

associateChild

None

code IV_IMG
name Plot of IV curves (not for bare modules and modules)
dataType image
valueType single
arrayDimensions None
additional False
value
associateChild None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.003967287005214177
associateChild	None

code LEAK_PER_AREA
name Leakage Current per Area (uA/cm^2)
order 1
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value -1
associateChild None
code LEAK_INCREASE_FACTOR
name Leakage Current Increase Factor
order 9
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value -1
associateChild None
code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-02-27T10:17:41.478Z

sys

cts	2025-02-27T10:17:41.478Z
mts	2025-02-27T10:17:41.478Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

project

subproject

componentType

type

properties

testedAtStage

institution

67bf02a5d89b87c79afff352

b7ac6465abad96b97d18285050865a11

ready

2025-02-26T12:01:41.043Z

9086-39-1

False

None

False

None

20UPIS22300135

V3-2-021220-3-001

code	P
name	Pixels

code	PI
name	Inner pixels

code	SENSOR_TILE
name	Sensor Tile

code	L1_INNER_PIXEL_QUAD_SENSOR_TILE
name	L1 Inner Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	2
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	0220
MAN_SNO	Alternative Identifier	string	True	True	V3-2-021220-3-001
MAN_ID	Original Manufacturer ID	string	False	False	QUAD_1
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	13.844

code	sensor_manufacturer
name	Sensor Manufacturer
order	0
initial	True
final	False

code	FBK
name	Fondazione Bruno Kessler (FBK)

Current Stage: Final Cold

No tests are allocated for this stage.

Past QC Stages and Results

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
681d02…d9830f	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	7 months ago	No tags	Selected
67c03b…079dc3	sensor_manufacturer	IV_MEASURE	FrancescoCrescioli	N/A	10 months ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPIS22300135

MODULE/FINAL_COLD

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: sensor_manufacturer)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Final Cold

Past QC Stages and Results

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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