Database for ITk Pixel Module

Serial Number	20UPIS17100708
ProdDB ID	427edf…2a3489
LocalDB ID	671631b2eff9780043c33480
Component Type	SENSOR_TILE
Parents	20UPGB13200048
Children	No match.
Flags

Item	Value
Main Vendor readonly	7
Sensor Type or Test Structure readonly	1
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	2010-8488
Alternative Identifier	V8-2-523115-1-023
Original Manufacturer ID	W
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	-999

Key	Data
QC Passed	True
Date	a year ago
component ObjectId	671631b2eff9780043c33480
Stage	sensor_manufacturer
Test Type	IV_MEASURE
Institute ObjectId
User Name	Jixing
ObjectId of this record	6716358eeff9780043c34d29
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vf8b32ac5
HUM	0
MEASUREMENT_DATE	None
TEMP	24
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80, 82, 84, 86, 88, 90, 92, 94, 96, 98, 100, 102, 104, 106, 108, 110, 112, 114, 116, 118, 120, 122, 124, 126, 128, 130, 132, 134, 136, 138, 140, 142, 144, 146, 148, 150, 152, 154, 156, 158, 160, 162, 164, 166, 168, 170, 172, 174, 176, 178, 180, 182, 184, 186, 188, 190, 192, 194, 196, 198, 200], 'voltage': [0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40], 'current': [0.00010483999999999999, 0.043255, 0.046551999999999996, 0.048145, 0.049211000000000005, 0.050034, 0.050728999999999996, 0.051341000000000005, 0.051923000000000004, 0.052489, 0.053103000000000004, 0.05383, 0.054699, 0.055467, 0.056032, 0.056516000000000004, 0.056976, 0.057426, 0.057862, 0.058278, 0.05866, 0.059039999999999995, 0.059400999999999995, 0.059763000000000004, 0.060115999999999996, 0.060474, 0.060821, 0.06118, 0.061526000000000004, 0.061886000000000004, 0.062246, 0.062601, 0.062962, 0.063329, 0.06369999999999999, 0.064077, 0.06446500000000001, 0.064865, 0.065276, 0.065704, 0.066145], 'sigma current': [], 'temperature': [24], 'humidity': []}
IV_IMG	[]
LEAK_CURRENT	0.04202356846731919
MAXIMUM_VOLTAGE	40
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

6716358eeff9780043c34d29

state

ready

stateTs

2024-10-21T11:05:50.236Z

stateUserIdentity

7797-1502-1

date

2024-10-21T11:05:49.898Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	6255994be668fe000ae62a5d
code	FBK
name	Fondazione Bruno Kessler (FBK)

user

id	6523e938d2e425004225570f
userIdentity	7797-1502-1
firstName	Jixing
middleName
lastName

runNumber

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	f8b32ac5	None	None
HUM	Humidity [%]	float	single	True	0	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	None	None	None
TEMP	Temperature [°C]	float	single	True	24	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

time	0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50 52 54 56 58 60 62 64 66 68 70 72 74 76 78 80 82 84 86 88 90 92 94 96 98 100 102 104 106 108 110 112 114 116 118 120 122 124 126 128 130 132 134 136 138 140 142 144 146 148 150 152 154 156 158 160 162 164 166 168 170 172 174 176 178 180 182 184 186 188 190 192 194 196 198 200
voltage	0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40
current	0.00010483999999999999 0.043255 0.046551999999999996 0.048145 0.049211000000000005 0.050034 0.050728999999999996 0.051341000000000005 0.051923000000000004 0.052489 0.053103000000000004 0.05383 0.054699 0.055467 0.056032 0.056516000000000004 0.056976 0.057426 0.057862 0.058278 0.05866 0.059039999999999995 0.059400999999999995 0.059763000000000004 0.060115999999999996 0.060474 0.060821 0.06118 0.061526000000000004 0.061886000000000004 0.062246 0.062601 0.062962 0.063329 0.06369999999999999 0.064077 0.06446500000000001 0.064865 0.065276 0.065704 0.066145
sigma current
temperature	24
humidity

associateChild

None

code IV_IMG
name IV_IMG
order 0
dataType None
valueType None
arrayDimensions None
additional None
rangeMin None
rangeMax None
value
associateChild None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.04202356846731919
associateChild	None

code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 40
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2024-10-21T11:05:50.236Z

sys

cts	2024-10-21T11:05:50.236Z
mts	2024-10-21T11:05:50.236Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

project

subproject

componentType

type

properties

testedAtStage

institution

671631b2eff9780043c33480

427edf90101a1519f5a48c10772a3489

ready

2024-10-21T10:49:22.727Z

7797-1502-1

False

None

False

None

20UPIS17100708

V8-2-523115-1-023

code	P
name	Pixels

code	PI
name	Inner pixels

code	SENSOR_TILE
name	Sensor Tile

code	L0_INNER_PIXEL_3D_SENSOR_TILE_50
name	L0 Inner Pixel 3D Sensor Tile (50x50)

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	7
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	1
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	2010-8488
MAN_SNO	Alternative Identifier	string	True	True	V8-2-523115-1-023
MAN_ID	Original Manufacturer ID	string	False	False	W
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	-999

code	sensor_manufacturer
name	Sensor Manufacturer
order	0
initial	True
final	False

code	FBK
name	Fondazione Bruno Kessler (FBK)

Current Stage: QC cross-check (module swapping)

No tests are allocated for this stage.

Past QC Stages and Results

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
6888fd…a0c7ca	BAREMODULERECEPTION	IV_MEASURE	AnnaRaquel Petri	N/A	5 months ago	No tags	Selected
671635…c34d29	sensor_manufacturer	IV_MEASURE	Jixing	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPIS17100708

MODULE/QC_CROSSCHECK

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: sensor_manufacturer)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: QC cross-check (module swapping)

Past QC Stages and Results

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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