Database for ITk Pixel Module

Serial Number	20UPIS17100340
ProdDB ID	9afd41…dbe9e5
LocalDB ID	67150e3aeff9780043bdc1dd
Component Type	SENSOR_TILE
Parents	20UPGB13200054
Children	No match.
Flags

Item	Value
Main Vendor readonly	7
Sensor Type or Test Structure readonly	1
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	2010-11356
Alternative Identifier	V8-2-522105-1-008
Original Manufacturer ID	H
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	-999

Key	Data
QC Passed	True
Date	5 months ago
component ObjectId	67150e3aeff9780043bdc1dd
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	ClaudiaGemme
ObjectId of this record	686ce5b72cb2a5e98101646b
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:7416366
HUM	84
MEASUREMENT_DATE	2025-07-04T12:26Z
TEMP	24
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'current': [0.007266004, 0.3485854, 0.4195068, 0.4609044, 0.4951597, 0.5235827, 0.5479787, 0.5706184999999999, 0.5918494000000001, 0.6120454, 0.6313638, 0.6496339999999999, 0.6680158, 0.6864169, 0.7043543, 0.7197992000000001, 0.7368433, 0.7565704, 0.7730997000000001, 0.7869725000000001, 0.8063312, 0.8223603, 0.8355619, 0.8517608999999999, 0.8634634, 0.8816835000000001, 0.8943481, 0.9121342, 0.931211, 0.9486889, 0.9707608, 0.9912519, 1.015396, 1.033236, 1.061154, 1.09437, 1.126939, 1.167153, 1.208406, 1.257519, 1.307154], 'sigma current': [0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0]}
LEAK_CURRENT	0.6496339999999999
MAXIMUM_VOLTAGE	80
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

686ce5b72cb2a5e98101646b

state

ready

stateTs

2025-07-08T09:32:39.178Z

stateUserIdentity

23-9871-1

date

2025-07-08T09:30:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d41d52cf6e07b000a559ada
code	INFN_GENOA
name	INFN Genoa

user

id	5c8252a9072e020009ba96df
userIdentity	23-9871-1
firstName	Claudia
middleName	None
lastName	Gemme

runNumber

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:7416366	None	None
HUM	Humidity [%]	float	single	True	84	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2025-07-04T12:26Z	None	None
TEMP	Temperature [°C]	float	single	True	24	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50 52 54 56 58 60 62 64 66 68 70 72 74 76 78 80
current	0.007266004 0.3485854 0.4195068 0.4609044 0.4951597 0.5235827 0.5479787 0.5706184999999999 0.5918494000000001 0.6120454 0.6313638 0.6496339999999999 0.6680158 0.6864169 0.7043543 0.7197992000000001 0.7368433 0.7565704 0.7730997000000001 0.7869725000000001 0.8063312 0.8223603 0.8355619 0.8517608999999999 0.8634634 0.8816835000000001 0.8943481 0.9121342 0.931211 0.9486889 0.9707608 0.9912519 1.015396 1.033236 1.061154 1.09437 1.126939 1.167153 1.208406 1.257519 1.307154
sigma current	0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0

associateChild

None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.6496339999999999
associateChild	None

code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 80
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-07-08T09:32:39.178Z

sys

cts	2025-07-08T09:32:39.178Z
mts	2025-07-08T09:32:39.178Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

67150e3aeff9780043bdc1dd

9afd41b78fca0bf3a11e769789dbe9e5

ready

2024-10-20T14:05:46.067Z

7797-1502-1

False

None

False

None

20UPIS17100340

V8-2-522105-1-008

parent

component

683ef91c9f4d7e6ede6db144

code

c823dd8bce0a736746f6757874501710

state

ready

stateTs

2025-06-03T13:31:08.543Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB13200054

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	SINGLE_BARE_MODULE
name	Single bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

highestLevelParent

component

683ef91c9f4d7e6ede6db144

code

c823dd8bce0a736746f6757874501710

state

ready

stateTs

2025-06-03T13:31:08.543Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB13200054

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	SINGLE_BARE_MODULE
name	Single bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

code	P
name	Pixels

code	PI
name	Inner pixels

code	SENSOR_TILE
name	Sensor Tile

code	L0_INNER_PIXEL_3D_SENSOR_TILE_50
name	L0 Inner Pixel 3D Sensor Tile (50x50)

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	7
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	1
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	2010-11356
MAN_SNO	Alternative Identifier	string	True	True	V8-2-522105-1-008
MAN_ID	Original Manufacturer ID	string	False	False	H
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	-999

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	FBK
name	Fondazione Bruno Kessler (FBK)

Current Stage: QC cross-check (module swapping)

No tests are allocated for this stage.

Past QC Stages and Results

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
6888fe…056759	BAREMODULERECEPTION	IV_MEASURE	AnnaRaquel Petri	N/A	5 months ago	No tags
686ce5…01646b	BAREMODULERECEPTION	IV_MEASURE	ClaudiaGemme	N/A	5 months ago	No tags	Selected
671653…437180	sensor_manufacturer	IV_MEASURE	Jixing	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPIS17100340

MODULE/QC_CROSSCHECK

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: QC cross-check (module swapping)

Past QC Stages and Results

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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