Database for ITk Pixel Module

Serial Number	20UPGS33305045
ProdDB ID	f35ec9…96ba59
LocalDB ID	6708f17fe12318004225fe5c
Component Type	SENSOR_TILE
Parents	20UPGB43200165
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7262
Alternative Identifier	V4-2-007262-3-004
Original Manufacturer ID	Q4
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	61.78

Key	Data
QC Passed	True
Date	6 months ago
component ObjectId	6708f17fe12318004225fe5c
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	Simpson,Liana Rae
ObjectId of this record	68507c5f9092149c9f9dd016
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:7416366
HUM	35
MEASUREMENT_DATE	2025-06-16T09:18Z
TEMP	20
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.8, 9.8, 14.8, 19.9, 24.8, 29.9, 34.9, 39.9, 45, 50, 55.1, 59.9, 64.8, 69.9, 74.9, 79.9, 84.9, 90, 94.9, 100, 105, 110, 114.9, 119.9, 124.9, 130, 135, 140.1, 145, 150.1, 155, 160.1, 165.1, 170.1, 175.1, 180, 185.1, 190.1, 195, 200], 'current': [0, 5.1885e-07, 5.859e-07, 6.276999999999999e-07, 6.571999999999999e-07, 6.794e-07, 6.967499999999999e-07, 7.113499999999999e-07, 7.232499999999999e-07, 7.338e-07, 7.427e-07, 7.5025e-07, 7.575999999999997e-07, 7.646500000000001e-07, 7.711999999999999e-07, 7.7785e-07, 7.845500000000001e-07, 7.9145e-07, 7.975e-07, 8.0345e-07, 8.093e-07, 8.1515e-07, 8.204e-07, 8.2505e-07, 8.3105e-07, 8.359999999999999e-07, 8.418499999999999e-07, 8.477e-07, 8.5395e-07, 8.5995e-07, 8.659e-07, 8.721000000000002e-07, 8.784499999999999e-07, 8.846e-07, 8.912999999999999e-07, 8.9755e-07, 9.038e-07, 9.104499999999999e-07, 9.1905e-07, 9.262999999999999e-07, 9.338000000000001e-07], 'sigma current': [0, 2.6081602711490097e-09, 1.757839583124694e-09, 1.6613247725836103e-09, 1.4177446878757767e-09, 1.1575836902790311e-09, 1.0781929326424012e-09, 8.381527307120161e-10, 7.500000000000025e-10, 7.141428428542794e-10, 3.999999999999976e-10, 6.020797289395899e-10, 4.898979485566292e-10, 5.937171043518819e-10, 5.099019513592876e-10, 5.024937810560388e-10, 6.499999999999941e-10, 6.50000000000007e-10, 4.999999999999894e-10, 4.716990566028394e-10, 6.000000000000172e-10, 5.024937810560344e-10, 3.7416573867739146e-10, 4.1533119314589544e-10, 3.5000000000000427e-10, 5.477225575051869e-10, 3.201562118716297e-10, 6.403124237432871e-10, 4.1533119314591276e-10, 5.22015325445537e-10, 4.898979485566429e-10, 3.741657386774004e-10, 6.103277807866844e-10, 3.741657386774004e-10, 3.3166247903553016e-10, 6.873863542433697e-10, 4.000000000000031e-10, 6.873863542433898e-10, 4.716990566028394e-10, 6.403124237432871e-10, 7.810249675906647e-10]}
LEAK_CURRENT	8.204e-07
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

68507c5f9092149c9f9dd016

state

ready

stateTs

2025-06-16T20:19:43.316Z

stateUserIdentity

1294-8027-1

date

2025-06-16T20:19:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6797ca0f2ffbf908f24868f9
userIdentity	1294-8027-1
firstName	Simpson,
middleName
lastName	Liana Rae

runNumber

...

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:7416366	None	None
HUM	Humidity [%]	float	single	True	35	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2025-06-16T09:18Z	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.8 9.8 14.8 19.9 24.8 29.9 34.9 39.9 45 50 55.1 59.9 64.8 69.9 74.9 79.9 84.9 90 94.9 100 105 110 114.9 119.9 124.9 130 135 140.1 145 150.1 155 160.1 165.1 170.1 175.1 180 185.1 190.1 195 200
current	0 5.1885e-07 5.859e-07 6.276999999999999e-07 6.571999999999999e-07 6.794e-07 6.967499999999999e-07 7.113499999999999e-07 7.232499999999999e-07 7.338e-07 7.427e-07 7.5025e-07 7.575999999999997e-07 7.646500000000001e-07 7.711999999999999e-07 7.7785e-07 7.845500000000001e-07 7.9145e-07 7.975e-07 8.0345e-07 8.093e-07 8.1515e-07 8.204e-07 8.2505e-07 8.3105e-07 8.359999999999999e-07 8.418499999999999e-07 8.477e-07 8.5395e-07 8.5995e-07 8.659e-07 8.721000000000002e-07 8.784499999999999e-07 8.846e-07 8.912999999999999e-07 8.9755e-07 9.038e-07 9.104499999999999e-07 9.1905e-07 9.262999999999999e-07 9.338000000000001e-07
sigma current	0 2.6081602711490097e-09 1.757839583124694e-09 1.6613247725836103e-09 1.4177446878757767e-09 1.1575836902790311e-09 1.0781929326424012e-09 8.381527307120161e-10 7.500000000000025e-10 7.141428428542794e-10 3.999999999999976e-10 6.020797289395899e-10 4.898979485566292e-10 5.937171043518819e-10 5.099019513592876e-10 5.024937810560388e-10 6.499999999999941e-10 6.50000000000007e-10 4.999999999999894e-10 4.716990566028394e-10 6.000000000000172e-10 5.024937810560344e-10 3.7416573867739146e-10 4.1533119314589544e-10 3.5000000000000427e-10 5.477225575051869e-10 3.201562118716297e-10 6.403124237432871e-10 4.1533119314591276e-10 5.22015325445537e-10 4.898979485566429e-10 3.741657386774004e-10 6.103277807866844e-10 3.741657386774004e-10 3.3166247903553016e-10 6.873863542433697e-10 4.000000000000031e-10 6.873863542433898e-10 4.716990566028394e-10 6.403124237432871e-10 7.810249675906647e-10

associateChild

None

code LEAK_CURRENT
name Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType float
valueType single
arrayDimensions None
additional False
value 8.204e-07
associateChild None
code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-06-16T20:19:43.316Z

sys

cts	2025-06-16T20:19:43.316Z
mts	2025-06-16T20:19:43.316Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

6708f17fe12318004225fe5c

f35ec9c2725b3f65c0f880e85696ba59

ready

2024-10-11T09:35:59.451Z

1440-4166-1

False

None

False

None

20UPGS33305045

V4-2-007262-3-004

parent

component

67c71484ccae83c989e5da93

code

17a1ae56a2bda662bc5a700587bf4652

state

ready

stateTs

2025-03-04T14:56:04.974Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200165

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

highestLevelParent

component

67c71484ccae83c989e5da93

code

17a1ae56a2bda662bc5a700587bf4652

state

ready

stateTs

2025-03-04T14:56:04.974Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200165

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7262
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007262-3-004
MAN_ID	Original Manufacturer ID	string	False	False	Q4
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	61.78

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Final flatness measurement

No tests are allocated for this stage.

Past QC Stages and Results

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
68507c…9dd016	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	6 months ago	No tags	Selected
670cf5…353d9d	sensor_manufacturer	IV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected
670cee…351c62	sensor_manufacturer	CV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33305045

MODULE/FINAL_METROLOGY

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Final flatness measurement

Past QC Stages and Results

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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