Database for ITk Pixel Module

Serial Number	20UPGS33304995
ProdDB ID	b0e828…fb2492
LocalDB ID	6708efc57ad67b0043b488d4
Component Type	SENSOR_TILE
Parents	20UPGB43200170
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7254
Alternative Identifier	V4-2-007254-3-002
Original Manufacturer ID	Q2
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	60.77

Key	Data
QC Passed	True
Date	6 months ago
component ObjectId	6708efc57ad67b0043b488d4
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	Simpson,Liana Rae
ObjectId of this record	68488d556945881eaae6c3d7
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:7416366
HUM	35
MEASUREMENT_DATE	2025-06-02T07:32Z
TEMP	20
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.8, 9.8, 14.7, 19.8, 24.8, 29.9, 34.8, 39.9, 45, 49.9, 54.9, 59.8, 64.8, 69.8, 74.8, 79.9, 84.9, 89.9, 94.9, 99.9, 104.9, 109.9, 114.8, 119.9, 124.9, 129.9, 134.9, 140, 144.9, 150, 155, 160, 165, 170.1, 175, 180, 185.1, 190, 195, 199.9], 'current': [0, 3.5044999999999997e-07, 3.9025000000000004e-07, 4.1265e-07, 4.2745e-07, 4.373e-07, 4.4485e-07, 4.5075000000000004e-07, 4.5535e-07, 4.5865e-07, 4.6184999999999997e-07, 4.647500000000001e-07, 4.671e-07, 4.6939999999999995e-07, 4.717499999999999e-07, 4.740499999999999e-07, 4.7625e-07, 4.783999999999999e-07, 4.803499999999999e-07, 4.822499999999999e-07, 4.834999999999999e-07, 4.852e-07, 4.867999999999999e-07, 4.880499999999999e-07, 4.894499999999999e-07, 4.907499999999999e-07, 4.921e-07, 4.9355e-07, 4.949e-07, 4.963499999999999e-07, 4.978999999999999e-07, 4.992499999999999e-07, 5.007999999999999e-07, 5.021499999999999e-07, 5.036999999999999e-07, 5.052999999999998e-07, 5.0695e-07, 5.085e-07, 5.0975e-07, 5.1135e-07, 5.1305e-07], 'sigma current': [0, 1.6347782724271828e-09, 1.0781929326423923e-09, 8.958236433584465e-10, 7.228416147400487e-10, 6.782329983125274e-10, 5.500000000000005e-10, 5.123475382979803e-10, 4.5000000000000036e-10, 3.9051248379533307e-10, 3.2015621187164273e-10, 4.0311288741492784e-10, 3.0000000000000026e-10, 3.7416573867739446e-10, 2.500000000000002e-10, 2.6925824035672544e-10, 2.500000000000002e-10, 2.0000000000000016e-10, 2.291287847477922e-10, 2.500000000000002e-10, 3.162277660168382e-10, 2.44948974278318e-10, 2.44948974278318e-10, 1.5000000000000013e-10, 1.5000000000000015e-10, 2.500000000000002e-10, 2.0000000000000016e-10, 1.5000000000000015e-10, 2.0000000000000016e-10, 2.291287847477922e-10, 2.0000000000000016e-10, 2.500000000000002e-10, 2.449489742783452e-10, 2.2912878474776676e-10, 2.449489742783452e-10, 2.449489742782908e-10, 1.5000000000001675e-10, 0, 2.50000000000028e-10, 2.2912878474776676e-10, 1.4999999999998346e-10]}
LEAK_CURRENT	4.867999999999999e-07
MAXIMUM_VOLTAGE	199.9
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

68488d556945881eaae6c3d7

state

ready

stateTs

2025-06-10T19:53:57.321Z

stateUserIdentity

1294-8027-1

date

2025-06-10T19:53:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6797ca0f2ffbf908f24868f9
userIdentity	1294-8027-1
firstName	Simpson,
middleName
lastName	Liana Rae

runNumber

...

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:7416366	None	None
HUM	Humidity [%]	float	single	True	35	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2025-06-02T07:32Z	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.8 9.8 14.7 19.8 24.8 29.9 34.8 39.9 45 49.9 54.9 59.8 64.8 69.8 74.8 79.9 84.9 89.9 94.9 99.9 104.9 109.9 114.8 119.9 124.9 129.9 134.9 140 144.9 150 155 160 165 170.1 175 180 185.1 190 195 199.9
current	0 3.5044999999999997e-07 3.9025000000000004e-07 4.1265e-07 4.2745e-07 4.373e-07 4.4485e-07 4.5075000000000004e-07 4.5535e-07 4.5865e-07 4.6184999999999997e-07 4.647500000000001e-07 4.671e-07 4.6939999999999995e-07 4.717499999999999e-07 4.740499999999999e-07 4.7625e-07 4.783999999999999e-07 4.803499999999999e-07 4.822499999999999e-07 4.834999999999999e-07 4.852e-07 4.867999999999999e-07 4.880499999999999e-07 4.894499999999999e-07 4.907499999999999e-07 4.921e-07 4.9355e-07 4.949e-07 4.963499999999999e-07 4.978999999999999e-07 4.992499999999999e-07 5.007999999999999e-07 5.021499999999999e-07 5.036999999999999e-07 5.052999999999998e-07 5.0695e-07 5.085e-07 5.0975e-07 5.1135e-07 5.1305e-07
sigma current	0 1.6347782724271828e-09 1.0781929326423923e-09 8.958236433584465e-10 7.228416147400487e-10 6.782329983125274e-10 5.500000000000005e-10 5.123475382979803e-10 4.5000000000000036e-10 3.9051248379533307e-10 3.2015621187164273e-10 4.0311288741492784e-10 3.0000000000000026e-10 3.7416573867739446e-10 2.500000000000002e-10 2.6925824035672544e-10 2.500000000000002e-10 2.0000000000000016e-10 2.291287847477922e-10 2.500000000000002e-10 3.162277660168382e-10 2.44948974278318e-10 2.44948974278318e-10 1.5000000000000013e-10 1.5000000000000015e-10 2.500000000000002e-10 2.0000000000000016e-10 1.5000000000000015e-10 2.0000000000000016e-10 2.291287847477922e-10 2.0000000000000016e-10 2.500000000000002e-10 2.449489742783452e-10 2.2912878474776676e-10 2.449489742783452e-10 2.449489742782908e-10 1.5000000000001675e-10 0 2.50000000000028e-10 2.2912878474776676e-10 1.4999999999998346e-10

associateChild

None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	4.867999999999999e-07
associateChild	None

code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 199.9
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-06-10T19:53:57.321Z

sys

cts	2025-06-10T19:53:57.321Z
mts	2025-06-10T19:53:57.321Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

6708efc57ad67b0043b488d4

b0e8282316750e7ea93b8e7d71fb2492

ready

2024-10-11T09:28:37.382Z

1440-4166-1

False

None

False

None

20UPGS33304995

V4-2-007254-3-002

parent

component

67c714855cfcdd14475557ce

code

552a4b7c8aa38e7ae25270f4b9329a8f

state

ready

stateTs

2025-03-04T14:56:05.560Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200170

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

highestLevelParent

component

67c714855cfcdd14475557ce

code

552a4b7c8aa38e7ae25270f4b9329a8f

state

ready

stateTs

2025-03-04T14:56:05.560Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200170

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7254
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007254-3-002
MAN_ID	Original Manufacturer ID	string	False	False	Q2
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	60.77

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Final flatness measurement

No tests are allocated for this stage.

Past QC Stages and Results

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
68488d…e6c3d7	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	6 months ago	No tags	Selected
670cf5…c3cc55	sensor_manufacturer	IV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected
670cee…351a47	sensor_manufacturer	CV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33304995

MODULE/FINAL_METROLOGY

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Final flatness measurement

Past QC Stages and Results

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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