Database for ITk Pixel Module

Serial Number	20UPGS33304726
ProdDB ID	2cfa65…b7656a
LocalDB ID	67053e7bb5325c00438a55e4
Component Type	SENSOR_TILE
Parents	20UPGB43200364
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7245
Alternative Identifier	V4-2-007245-3-003
Original Manufacturer ID	Q3
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	60.84

Key	Data
QC Passed	True
Date	4 months ago
component ObjectId	67053e7bb5325c00438a55e4
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	Simpson,Liana Rae
ObjectId of this record	68b0949b1c401c65b5049d4a
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:6c8945e
HUM	49
TEMP	20
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.7, 9.7, 14.7, 19.8, 24.8, 29.8, 34.8, 39.9, 44.8, 49.9, 54.9, 59.8, 64.8, 69.8, 74.8, 79.9, 84.8, 89.9, 94.9, 99.9, 104.9, 109.9, 114.8, 119.9, 124.8, 129.9, 134.9, 139.9, 144.9, 150, 155, 160, 165, 169.9, 175, 180, 185, 190, 194.9, 199.9], 'current': [0, 0.2828499999999999, 0.32195, 0.3343, 0.34385, 0.3522999999999999, 0.35955, 0.366, 0.37065, 0.3745999999999999, 0.3784999999999999, 0.38195, 0.38585, 0.39035, 0.395, 0.3995000000000001, 0.4040499999999999, 0.408, 0.4125, 0.417, 0.4215, 0.42615, 0.4305, 0.4342, 0.4385, 0.4426, 0.4471, 0.4510999999999999, 0.45515, 0.4589999999999999, 0.4631, 0.4674500000000001, 0.4719999999999998, 0.4765, 0.481, 0.4852, 0.4905, 0.4955, 0.5005, 0.5056499999999999, 0.5105500000000001], 'sigma current': [0, 0.0008674675786448, 0.0005220153254455, 0.0003316624790355, 0.0003201562118716, 0.0002449489742783, 0.0002692582403567, 0.0003162277660168, 0.0002291287847477, 0.0002, 0, 0.00015, 0.0002291287847477, 0.0002291287847477, 0, 0, 0.00015, 0, 0, 0, 0, 0.0002291287847477, 0, 0.0002449489742783, 0, 0.0002, 0.0002, 0.0002, 0.0002291287847477, 0, 0.0002, 0.00015, 0, 0, 0, 0.0002449489742783, 0, 0, 0, 0.0002291287847478, 0.00015]}
LEAK_CURRENT	0.4305
MAXIMUM_VOLTAGE	199.9
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

68b0949b1c401c65b5049d4a

state

ready

stateTs

2025-08-28T17:40:43.409Z

stateUserIdentity

1294-8027-1

date

2025-08-28T17:40:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6797ca0f2ffbf908f24868f9
userIdentity	1294-8027-1
firstName	Simpson,
middleName
lastName	Liana Rae

runNumber

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:6c8945e	None	None
HUM	Humidity [%]	float	single	True	49	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.7 9.7 14.7 19.8 24.8 29.8 34.8 39.9 44.8 49.9 54.9 59.8 64.8 69.8 74.8 79.9 84.8 89.9 94.9 99.9 104.9 109.9 114.8 119.9 124.8 129.9 134.9 139.9 144.9 150 155 160 165 169.9 175 180 185 190 194.9 199.9
current	0 0.2828499999999999 0.32195 0.3343 0.34385 0.3522999999999999 0.35955 0.366 0.37065 0.3745999999999999 0.3784999999999999 0.38195 0.38585 0.39035 0.395 0.3995000000000001 0.4040499999999999 0.408 0.4125 0.417 0.4215 0.42615 0.4305 0.4342 0.4385 0.4426 0.4471 0.4510999999999999 0.45515 0.4589999999999999 0.4631 0.4674500000000001 0.4719999999999998 0.4765 0.481 0.4852 0.4905 0.4955 0.5005 0.5056499999999999 0.5105500000000001
sigma current	0 0.0008674675786448 0.0005220153254455 0.0003316624790355 0.0003201562118716 0.0002449489742783 0.0002692582403567 0.0003162277660168 0.0002291287847477 0.0002 0 0.00015 0.0002291287847477 0.0002291287847477 0 0 0.00015 0 0 0 0 0.0002291287847477 0 0.0002449489742783 0 0.0002 0.0002 0.0002 0.0002291287847477 0 0.0002 0.00015 0 0 0 0.0002449489742783 0 0 0 0.0002291287847478 0.00015

associateChild

None

code LEAK_CURRENT
name Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType float
valueType single
arrayDimensions None
additional False
value 0.4305
associateChild None
code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 199.9
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-08-28T17:40:43.409Z

sys

cts	2025-08-28T17:40:43.409Z
mts	2025-08-28T17:40:43.409Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

67053e7bb5325c00438a55e4

2cfa652246834710cd184612fbb7656a

ready

2024-10-08T14:15:23.575Z

1440-4166-1

False

None

False

None

20UPGS33304726

V4-2-007245-3-003

parent

component

6810f23e54aadc8e96c6f24d

code

92d9a2640a95fa48498949ba97edaa5e

state

ready

stateTs

2025-04-29T15:37:34.257Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200364

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

highestLevelParent

component

689ce4f6e945399df1ed713b

code

e7fc973881c738c84c94246a4286c796

state

ready

stateTs

2025-08-13T19:18:14.270Z

stateUserIdentity

1294-8027-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGM24210577

alternativeIdentifier

ANL_ITkPix_126

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	MODULE
name	Module

type

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

testedAtStage

code	MODULE/INIT
name	Initial state to associate flex to bare module

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7245
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007245-3-003
MAN_ID	Original Manufacturer ID	string	False	False	Q3
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	60.84

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: QC cross-check (module swapping)

No tests are allocated for this stage.

Past QC Stages and Results

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
68b094…049d4a	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	4 months ago	No tags	Selected
670cf5…c3ca3c	sensor_manufacturer	IV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected
670cee…35184c	sensor_manufacturer	CV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33304726

MODULE/QC_CROSSCHECK

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: QC cross-check (module swapping)

Past QC Stages and Results

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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