Database for ITk Pixel Module

Serial Number	20UPGS33304409
ProdDB ID	626bc0…435ad5
LocalDB ID	66fa7eed13e0b00043367ffd
Component Type	SENSOR_TILE
Parents	20UPGB43000308
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7334
Alternative Identifier	V4-2-007334-3-004
Original Manufacturer ID	Q4
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	51.34

Key	Data
QC Passed	True
Date	6 months ago
component ObjectId	66fa7eed13e0b00043367ffd
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	BeatriceCervato
ObjectId of this record	68ff5e2946c81c946f8056f0
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:6224e48
HUM	69.74268292682926
MEASUREMENT_DATE	2025-09-24T14:35Z
TEMP	19.302682926829267
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'current': [0.008090882122221322, 0.05957859681241134, 0.06435996186358552, 0.0673279025073479, 0.069136579855774, 0.0706207347618627, 0.07195302846361712, 0.07360791365475974, 0.07425504992808972, 0.07513944872040229, 0.07525691874840931, 0.07515896677153454, 0.07598715834279517, 0.07670851768138687, 0.07723724238766849, 0.07841747487453515, 0.08009809227448272, 0.08055212261403898, 0.0802405072357121, 0.08274222221558981, 0.08304220612912716, 0.0827790741600556, 0.08287220247815826, 0.0843247546529223, 0.08533862197867464, 0.0870310346818438, 0.08734399587586249, 0.08874349631522044, 0.089311593311718, 0.09011825608745311, 0.09090391030787871, 0.09226730777846022, 0.09096559973308872, 0.09355505551275808, 0.09467929036409958, 0.09573530459455348, 0.09697162727502058, 0.09802771597748906, 0.09886688259592516, 0.09997091318971447, 0.10128283560382688], 'sigma current': [0.00017661717017791766, 0.00028162840226085274, 0.0002786932685388868, 0.00028817923301885205, 0.0003704698953191446, 0.00033646977958403876, 0.0006466353313507606, 0.0004542679677801539, 0.00024529165647811494, 0.0003268640620689637, 0.0002895385311702443, 0.00047290787713300425, 0.0003766938063378972, 0.0003669442019889874, 0.00032259558934954184, 0.0003897288239575468, 0.00048262520971131335, 0.00027599854403802867, 0.0005464816033306959, 0.0003505579623416229, 0.0003929375898776898, 0.0006522944425163999, 0.0002655965620175733, 0.0005056301664710625, 0.00065961405344843, 0.00043910063843168246, 0.0004264542169565232, 0.0005024506735602123, 0.0003636039050884287, 0.0007285997500449439, 0.00041299155611626304, 0.0005030970304258736, 0.00046047980889020056, 0.00028692767337973985, 0.0004065149353016857, 0.00036887495619337843, 0.0003250559083193729, 0.00025622982316012206, 0.0002046309569390153, 0.00046686484758558293, 0.00033648977276186604]}
LEAK_CURRENT	0.08304220612912716
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

68ff5e2946c81c946f8056f0

state

ready

stateTs

2025-10-27T11:57:29.386Z

stateUserIdentity

4348-9718-1

date

2025-10-27T11:56:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d41d8ddf6e07b000a559aee
code	INFN_MILANO
name	INFN Milano

user

id	6583190a13093c0042d5b2d0
userIdentity	4348-9718-1
firstName	Beatrice
middleName
lastName	Cervato

runNumber

...

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:6224e48	None	None
HUM	Humidity [%]	float	single	True	69.74268292682926	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2025-09-24T14:35Z	None	None
TEMP	Temperature [°C]	float	single	True	19.302682926829267	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 115 120 125 130 135 140 145 150 155 160 165 170 175 180 185 190 195 200
current	0.008090882122221322 0.05957859681241134 0.06435996186358552 0.0673279025073479 0.069136579855774 0.0706207347618627 0.07195302846361712 0.07360791365475974 0.07425504992808972 0.07513944872040229 0.07525691874840931 0.07515896677153454 0.07598715834279517 0.07670851768138687 0.07723724238766849 0.07841747487453515 0.08009809227448272 0.08055212261403898 0.0802405072357121 0.08274222221558981 0.08304220612912716 0.0827790741600556 0.08287220247815826 0.0843247546529223 0.08533862197867464 0.0870310346818438 0.08734399587586249 0.08874349631522044 0.089311593311718 0.09011825608745311 0.09090391030787871 0.09226730777846022 0.09096559973308872 0.09355505551275808 0.09467929036409958 0.09573530459455348 0.09697162727502058 0.09802771597748906 0.09886688259592516 0.09997091318971447 0.10128283560382688
sigma current	0.00017661717017791766 0.00028162840226085274 0.0002786932685388868 0.00028817923301885205 0.0003704698953191446 0.00033646977958403876 0.0006466353313507606 0.0004542679677801539 0.00024529165647811494 0.0003268640620689637 0.0002895385311702443 0.00047290787713300425 0.0003766938063378972 0.0003669442019889874 0.00032259558934954184 0.0003897288239575468 0.00048262520971131335 0.00027599854403802867 0.0005464816033306959 0.0003505579623416229 0.0003929375898776898 0.0006522944425163999 0.0002655965620175733 0.0005056301664710625 0.00065961405344843 0.00043910063843168246 0.0004264542169565232 0.0005024506735602123 0.0003636039050884287 0.0007285997500449439 0.00041299155611626304 0.0005030970304258736 0.00046047980889020056 0.00028692767337973985 0.0004065149353016857 0.00036887495619337843 0.0003250559083193729 0.00025622982316012206 0.0002046309569390153 0.00046686484758558293 0.00033648977276186604

associateChild

None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.08304220612912716
associateChild	None

code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-10-27T11:57:29.386Z

sys

cts	2025-10-27T11:57:29.386Z
mts	2025-10-27T11:57:29.386Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

66fa7eed13e0b00043367ffd

626bc08bff042b3fc3bc4d9b69435ad5

ready

2024-09-30T10:35:25.231Z

8937-9560-1

False

None

False

None

20UPGS33304409

V4-2-007334-3-004

parent

component

68d2c40c46c81c946fdc4480

code

b8d1b53d6861458d6ad14fad783e5864

state

ready

stateTs

2025-09-23T16:00:12.538Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43000308

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

highestLevelParent

component

68d2c40c46c81c946fdc4480

code

b8d1b53d6861458d6ad14fad783e5864

state

ready

stateTs

2025-09-23T16:00:12.538Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43000308

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7334
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007334-3-004
MAN_ID	Original Manufacturer ID	string	False	False	Q4
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	51.34

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Post-Parylene Warm

No tests are allocated for this stage.

Past QC Stages and Results

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
68ff5e…8056f0	BAREMODULERECEPTION	IV_MEASURE	BeatriceCervato	N/A	6 months ago	No tags	Selected
66fa92…36dd6f	sensor_manufacturer	IV_MEASURE	ChristopherKrause	N/A	a year ago	No tags	Selected
66fa92…36dd2c	sensor_manufacturer	CV_MEASURE	ChristopherKrause	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/WIREBOND_PROTECTION
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33304409

MODULE/POST_PARYLENE_WARM

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Post-Parylene Warm

Past QC Stages and Results

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

Back to top page of this component