Database for ITk Pixel Module

Serial Number	20UPGS33304327
ProdDB ID	2c0f08…313c49
LocalDB ID	66fa7c1313e0b000433672a7
Component Type	SENSOR_TILE
Parents	20UPGB43000292
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7320
Alternative Identifier	V4-2-007320-3-006
Original Manufacturer ID	Q6
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	51

Key	Data
QC Passed	True
Date	4 months ago
component ObjectId	66fa7c1313e0b000433672a7
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	ElizaHoward
ObjectId of this record	690e186b07e8852b9292f1a4
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:3cd4cc4
HUM	35
MEASUREMENT_DATE	2025-11-06T08:22Z
TEMP	20
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.8, 9.8, 14.8, 19.9, 24.8, 29.9, 34.9, 39.9, 45, 50, 54.9, 59.9, 64.9, 69.9, 74.9, 79.9, 84.9, 89.9, 94.9, 100, 104.9, 110, 114.9, 119.9, 124.9, 130, 135, 140, 145, 150.1, 155, 160.1, 165.1, 170.1, 175.1, 180, 185.1, 190.1, 195, 200], 'current': [0, 0.048, 0.052000000000000005, 0.05475, 0.056900000000000006, 0.05850000000000001, 0.05989999999999999, 0.06099999999999998, 0.06200000000000001, 0.0625, 0.06325, 0.06400000000000002, 0.0645, 0.06499999999999999, 0.0655, 0.066, 0.06659999999999999, 0.06699999999999999, 0.0675, 0.06800000000000002, 0.06849999999999999, 0.06899999999999998, 0.0695, 0.07000000000000002, 0.0708, 0.07144999999999999, 0.07199999999999998, 0.0725, 0.07344999999999999, 0.07399999999999997, 0.0745, 0.0755, 0.07599999999999998, 0.07694999999999999, 0.0775, 0.0785, 0.0793, 0.07999999999999999, 0.08099999999999999, 0.08149999999999999, 0.0825], 'sigma current': [0, 0, 6.938893903907228e-18, 0.0002500000000000002, 0.00020000000000000017, 6.938893903907228e-18, 0.00020000000000000017, 1.3877787807814457e-17, 1.3877787807814457e-17, 0, 0.0002500000000000002, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0.00020000000000000017, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0.00024494897427831806, 0.00015000000000000015, 1.3877787807814457e-17, 0, 0.00015000000000000015, 1.3877787807814457e-17, 0, 0, 1.3877787807814457e-17, 0.00015000000000000015, 0, 0, 0.00024494897427831806, 1.3877787807814457e-17, 1.3877787807814457e-17, 0, 0]}
LEAK_CURRENT	0.0685
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

690e454744c06a976341e0b5

state

ready

stateTs

2025-11-07T19:15:19.186Z

stateUserIdentity

4561-2270-1

date

2025-11-07T16:03:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	68755ce03942dab85ad88269
userIdentity	4561-2270-1
firstName	Eliza
middleName
lastName	Howard

runNumber

690e186b07e8852b9292f1a4

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:3cd4cc4	None	None
HUM	Humidity [%]	float	single	True	35	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2025-11-06T08:22Z	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.8 9.8 14.8 19.9 24.8 29.9 34.9 39.9 45 50 54.9 59.9 64.9 69.9 74.9 79.9 84.9 89.9 94.9 100 104.9 110 114.9 119.9 124.9 130 135 140 145 150.1 155 160.1 165.1 170.1 175.1 180 185.1 190.1 195 200
current	0 0.048 0.052000000000000005 0.05475 0.056900000000000006 0.05850000000000001 0.05989999999999999 0.06099999999999998 0.06200000000000001 0.0625 0.06325 0.06400000000000002 0.0645 0.06499999999999999 0.0655 0.066 0.06659999999999999 0.06699999999999999 0.0675 0.06800000000000002 0.06849999999999999 0.06899999999999998 0.0695 0.07000000000000002 0.0708 0.07144999999999999 0.07199999999999998 0.0725 0.07344999999999999 0.07399999999999997 0.0745 0.0755 0.07599999999999998 0.07694999999999999 0.0775 0.0785 0.0793 0.07999999999999999 0.08099999999999999 0.08149999999999999 0.0825
sigma current	0 0 6.938893903907228e-18 0.0002500000000000002 0.00020000000000000017 6.938893903907228e-18 0.00020000000000000017 1.3877787807814457e-17 1.3877787807814457e-17 0 0.0002500000000000002 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0.00020000000000000017 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0.00024494897427831806 0.00015000000000000015 1.3877787807814457e-17 0 0.00015000000000000015 1.3877787807814457e-17 0 0 1.3877787807814457e-17 0.00015000000000000015 0 0 0.00024494897427831806 1.3877787807814457e-17 1.3877787807814457e-17 0 0

dateTime

2026-02-19T21:35:10.840Z

userIdentity

5257-8848-1

associateChild

None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.0685
dateTime	2026-02-19T21:35:24.135Z
userIdentity	5257-8848-1
associateChild	None

code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-11-07T19:15:19.186Z

sys

cts	2025-11-07T19:15:19.186Z
mts	2026-02-19T21:35:24.140Z
rev	2

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

66fa7c1313e0b000433672a7

2c0f089cfb10fa2fc6f6c39182313c49

ready

2024-09-30T10:23:15.005Z

8937-9560-1

False

None

False

None

20UPGS33304327

V4-2-007320-3-006

parent

component

68d2c40aecbbcc3f84460799

code

d6d322de7c8dabc1ed8458a204b44fb9

state

ready

stateTs

2025-09-23T16:00:10.443Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43000292

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULERECEPTION
name	Reception at ITk institute

highestLevelParent

component

68d2c40aecbbcc3f84460799

code

d6d322de7c8dabc1ed8458a204b44fb9

state

ready

stateTs

2025-09-23T16:00:10.443Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43000292

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULERECEPTION
name	Reception at ITk institute

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7320
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007320-3-006
MAN_ID	Original Manufacturer ID	string	False	False	Q6
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	51

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Post-Parylene Cold

No tests are allocated for this stage.

Past QC Stages and Results

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
690e18…92f1a4	BAREMODULERECEPTION	IV_MEASURE	ElizaHoward	N/A	4 months ago	No tags	Selected
66fa92…454d90	sensor_manufacturer	IV_MEASURE	ChristopherKrause	N/A	a year ago	No tags	Selected
66fa92…454d33	sensor_manufacturer	CV_MEASURE	ChristopherKrause	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/WIREBOND_PROTECTION
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/GRAVEYARD
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33304327

MODULE/POST_PARYLENE_COLD

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Post-Parylene Cold

Past QC Stages and Results

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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