Database for ITk Pixel Module

Serial Number	20UPGS33304128
ProdDB ID	1d640b…a30ea5
LocalDB ID	66f6d32713e0b00043298d10
Component Type	SENSOR_TILE
Parents	20UPGB43200663
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7143
Alternative Identifier	V4-2-007143-3-005
Original Manufacturer ID	Q5
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	66.22

Key	Data
QC Passed	True
Date	4 months ago
component ObjectId	66f6d32713e0b00043298d10
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	Simpson,Liana Rae
ObjectId of this record	6931e8da88b791b617ba81d6
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
TEMP	20
HUM	35
ANALYSIS_VERSION	mqat vwebApp SHA:17d7788
MEASUREMENT_DATE	2025-11-21T15:51Z
IV_ARRAY	{'voltage': [0, 4.8, 9.8, 14.7, 19.8, 24.8, 29.9, 34.8, 39.9, 45, 49.9, 54.9, 59.9, 64.8, 69.9, 74.8, 79.9, 84.9, 89.9, 94.9, 99.9, 104.9, 110, 114.8, 119.9, 124.9, 129.9, 134.9, 140, 145, 150, 155, 160.1, 165, 170.1, 175, 180, 185.1, 190, 195, 199.9], 'current': [0, 0.13174999999999998, 0.14844999999999997, 0.15944999999999998, 0.16850000000000004, 0.17450000000000002, 0.1795, 0.18399999999999997, 0.187, 0.19014999999999996, 0.1933, 0.196, 0.19839999999999997, 0.20095000000000002, 0.20309999999999997, 0.20549999999999996, 0.20729999999999998, 0.20945, 0.21144999999999997, 0.21385, 0.21644999999999995, 0.21849999999999997, 0.2205, 0.22249999999999998, 0.22410000000000002, 0.2265, 0.22849999999999998, 0.2305, 0.23249999999999998, 0.23450000000000001, 0.23695, 0.23899999999999996, 0.24119999999999997, 0.24349999999999997, 0.246, 0.24809999999999996, 0.25035, 0.25284999999999996, 0.2555, 0.257, 0.25999999999999995], 'sigma current': [0, 0.000782623792124927, 0.0012932517156377576, 0.000522015325445528, 0.0003162277660168382, 2.7755575615628914e-17, 0, 0, 0, 0.00022912878474779219, 0.000244948974278318, 0, 0.00020000000000000017, 0.00015000000000000012, 0.00019999999999998906, 2.7755575615628914e-17, 0.00040000000000000034, 0.00015000000000000012, 0.00026925824035672544, 0.0003905124837953331, 0.00015000000000000015, 0, 0, 0, 0.00020000000000000017, 0, 0, 0, 0, 2.7755575615628914e-17, 0.00015000000000000015, 2.7755575615628914e-17, 0.000244948974278318, 0, 0, 0.00020000000000000017, 0.00022912878474779219, 0.00022912878474779219, 0, 0, 5.551115123125783e-17]}
BREAKDOWN_VOLTAGE	-999
LEAK_CURRENT	0.2225
NO_BREAKDOWN_VOLTAGE_OBSERVED	True
MAXIMUM_VOLTAGE	199.9

ProductionDB Record

Expand ProductionDB Record

6931e8da88b791b617ba81d6

state

ready

stateTs

2025-12-04T20:02:34.780Z

stateUserIdentity

1294-8027-1

date

2025-12-04T20:01:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6797ca0f2ffbf908f24868f9
userIdentity	1294-8027-1
firstName	Simpson,
middleName
lastName	Liana Rae

runNumber

...

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
TEMP	Temperature [°C]	float	single	True	20	None	None
HUM	Humidity [%]	float	single	True	35	None	None
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:17d7788	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2025-11-21T15:51Z	None	None

results

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.8 9.8 14.7 19.8 24.8 29.9 34.8 39.9 45 49.9 54.9 59.9 64.8 69.9 74.8 79.9 84.9 89.9 94.9 99.9 104.9 110 114.8 119.9 124.9 129.9 134.9 140 145 150 155 160.1 165 170.1 175 180 185.1 190 195 199.9
current	0 0.13174999999999998 0.14844999999999997 0.15944999999999998 0.16850000000000004 0.17450000000000002 0.1795 0.18399999999999997 0.187 0.19014999999999996 0.1933 0.196 0.19839999999999997 0.20095000000000002 0.20309999999999997 0.20549999999999996 0.20729999999999998 0.20945 0.21144999999999997 0.21385 0.21644999999999995 0.21849999999999997 0.2205 0.22249999999999998 0.22410000000000002 0.2265 0.22849999999999998 0.2305 0.23249999999999998 0.23450000000000001 0.23695 0.23899999999999996 0.24119999999999997 0.24349999999999997 0.246 0.24809999999999996 0.25035 0.25284999999999996 0.2555 0.257 0.25999999999999995
sigma current	0 0.000782623792124927 0.0012932517156377576 0.000522015325445528 0.0003162277660168382 2.7755575615628914e-17 0 0 0 0.00022912878474779219 0.000244948974278318 0 0.00020000000000000017 0.00015000000000000012 0.00019999999999998906 2.7755575615628914e-17 0.00040000000000000034 0.00015000000000000012 0.00026925824035672544 0.0003905124837953331 0.00015000000000000015 0 0 0 0.00020000000000000017 0 0 0 0 2.7755575615628914e-17 0.00015000000000000015 2.7755575615628914e-17 0.000244948974278318 0 0 0.00020000000000000017 0.00022912878474779219 0.00022912878474779219 0 0 5.551115123125783e-17

dateTime

2026-02-19T21:41:46.975Z

userIdentity

5257-8848-1

associateChild

None

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.2225
dateTime	2026-02-19T21:41:58.597Z
userIdentity	5257-8848-1
associateChild	None

code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None
code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 199.9
associateChild None

cts

2025-12-04T20:02:34.780Z

sys

cts	2025-12-04T20:02:34.780Z
mts	2026-02-19T21:41:58.601Z
rev	2

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

66f6d32713e0b00043298d10

1d640b11b36b5f23103be24ce5a30ea5

ready

2024-09-27T15:45:43.625Z

1440-4166-1

False

None

False

None

20UPGS33304128

V4-2-007143-3-005

parent

component

68ee458cb5f1d1f55a725c59

code

403d22062b6a985c068061eed257f284

state

ready

stateTs

2025-10-14T12:43:56.065Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200663

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

highestLevelParent

component

68ee458cb5f1d1f55a725c59

code

403d22062b6a985c068061eed257f284

state

ready

stateTs

2025-10-14T12:43:56.065Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200663

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7143
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007143-3-005
MAN_ID	Original Manufacturer ID	string	False	False	Q5
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	66.22

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Modules failed test, needs investigation

No tests are allocated for this stage.

Past QC Stages and Results

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
6931e8…ba81d6	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	4 months ago	No tags	Selected
66fadf…47ff8c	sensor_manufacturer	IV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected
66fad9…47aba9	sensor_manufacturer	CV_MEASURE	AnaTorrento	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/WIREBOND_PROTECTION
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/GRAVEYARD
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33304128

MODULE/UNHAPPY

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Modules failed test, needs investigation

Past QC Stages and Results

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

Back to top page of this component