Database for ITk Pixel Module

Serial Number	20UPGS33303758
ProdDB ID	6ebe09…c2a303
LocalDB ID	66f6bc8413e0b0004328e122
Component Type	SENSOR_TILE
Parents	20UPGB43200207
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7033
Alternative Identifier	V4-2-007033-3-001
Original Manufacturer ID	Q1
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	58.62

Key	Data
QC Passed	True
Date	6 months ago
component ObjectId	66f6bc8413e0b0004328e122
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	Simpson,Liana Rae
ObjectId of this record	6848947b6945881eaae6d6bd
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:7416366
HUM	35
MEASUREMENT_DATE	2025-06-03T07:43Z
TEMP	20
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.9, 9.8, 14.8, 19.9, 24.9, 30, 34.9, 40, 45.1, 50, 55.1, 59.9, 64.9, 69.9, 74.9, 80, 84.9, 90, 95, 100, 105, 110, 114.9, 120, 124.9, 130, 135, 140.1, 145, 150.1, 155.1, 160.1, 165.1, 170.1, 175.1, 180.2, 185.1, 190.1, 195, 200], 'current': [0, 2.6719999999999996e-07, 2.9635e-07, 3.141e-07, 3.2665e-07, 3.3574999999999997e-07, 3.428000000000001e-07, 3.4805e-07, 3.5219999999999994e-07, 3.5499999999999994e-07, 3.577e-07, 3.5949999999999996e-07, 3.6134999999999994e-07, 3.6314999999999997e-07, 3.6515e-07, 3.6750000000000003e-07, 3.699e-07, 3.725e-07, 3.7525e-07, 3.7785e-07, 3.7999999999999996e-07, 3.8274999999999996e-07, 3.854e-07, 3.88e-07, 3.9049999999999996e-07, 3.9315e-07, 3.956e-07, 3.982e-07, 4.0070000000000003e-07, 4.03e-07, 4.0500000000000004e-07, 4.0744999999999996e-07, 4.098e-07, 4.124499999999999e-07, 4.1494999999999994e-07, 4.1749999999999997e-07, 4.2004999999999995e-07, 4.2245e-07, 4.249499999999999e-07, 4.2750000000000004e-07, 4.305e-07], 'sigma current': [0, 1.4000000000000012e-09, 8.958236433584465e-10, 8.306623862918083e-10, 3.2015621187164273e-10, 5.123475382979804e-10, 4.000000000000003e-10, 3.500000000000003e-10, 3.3166247903554024e-10, 3.162277660168382e-10, 2.44948974278318e-10, 3.162277660168382e-10, 3.2015621187164273e-10, 2.291287847477922e-10, 2.291287847477922e-10, 3.162277660168382e-10, 2.0000000000000016e-10, 2.2360679774997914e-10, 3.354101966249688e-10, 2.291287847477922e-10, 0, 2.500000000000002e-10, 2.0000000000000016e-10, 0, 5.551115123125782e-23, 2.291287847477922e-10, 2.0000000000000016e-10, 2.44948974278318e-10, 2.44948974278318e-10, 0, 5.551115123125782e-23, 1.5000000000000015e-10, 2.44948974278318e-10, 1.5000000000000013e-10, 1.5000000000000015e-10, 0, 1.5000000000000013e-10, 4.153311931459041e-10, 1.5000000000000013e-10, 5.551115123125782e-23, 0]}
LEAK_CURRENT	3.8274999999999996e-07
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

685dc4a69b78e594d7b430b2

state

ready

stateTs

2025-06-26T22:07:34.802Z

stateUserIdentity

1294-8027-1

date

2025-06-10T20:24:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6797ca0f2ffbf908f24868f9
userIdentity	1294-8027-1
firstName	Simpson,
middleName
lastName	Liana Rae

runNumber

6848947b6945881eaae6d6bd

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:7416366	None	None
HUM	Humidity [%]	float	single	True	35	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2025-06-03T07:43Z	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.9 9.8 14.8 19.9 24.9 30 34.9 40 45.1 50 55.1 59.9 64.9 69.9 74.9 80 84.9 90 95 100 105 110 114.9 120 124.9 130 135 140.1 145 150.1 155.1 160.1 165.1 170.1 175.1 180.2 185.1 190.1 195 200
current	0 2.6719999999999996e-07 2.9635e-07 3.141e-07 3.2665e-07 3.3574999999999997e-07 3.428000000000001e-07 3.4805e-07 3.5219999999999994e-07 3.5499999999999994e-07 3.577e-07 3.5949999999999996e-07 3.6134999999999994e-07 3.6314999999999997e-07 3.6515e-07 3.6750000000000003e-07 3.699e-07 3.725e-07 3.7525e-07 3.7785e-07 3.7999999999999996e-07 3.8274999999999996e-07 3.854e-07 3.88e-07 3.9049999999999996e-07 3.9315e-07 3.956e-07 3.982e-07 4.0070000000000003e-07 4.03e-07 4.0500000000000004e-07 4.0744999999999996e-07 4.098e-07 4.124499999999999e-07 4.1494999999999994e-07 4.1749999999999997e-07 4.2004999999999995e-07 4.2245e-07 4.249499999999999e-07 4.2750000000000004e-07 4.305e-07
sigma current	0 1.4000000000000012e-09 8.958236433584465e-10 8.306623862918083e-10 3.2015621187164273e-10 5.123475382979804e-10 4.000000000000003e-10 3.500000000000003e-10 3.3166247903554024e-10 3.162277660168382e-10 2.44948974278318e-10 3.162277660168382e-10 3.2015621187164273e-10 2.291287847477922e-10 2.291287847477922e-10 3.162277660168382e-10 2.0000000000000016e-10 2.2360679774997914e-10 3.354101966249688e-10 2.291287847477922e-10 0 2.500000000000002e-10 2.0000000000000016e-10 0 5.551115123125782e-23 2.291287847477922e-10 2.0000000000000016e-10 2.44948974278318e-10 2.44948974278318e-10 0 5.551115123125782e-23 1.5000000000000015e-10 2.44948974278318e-10 1.5000000000000013e-10 1.5000000000000015e-10 0 1.5000000000000013e-10 4.153311931459041e-10 1.5000000000000013e-10 5.551115123125782e-23 0

associateChild

None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	3.8274999999999996e-07
associateChild	None

code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-06-26T22:07:34.802Z

sys

cts	2025-06-26T22:07:34.802Z
mts	2025-06-26T22:07:34.802Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

66f6bc8413e0b0004328e122

6ebe09f740b6a7e26af8e8dfb8c2a303

ready

2024-09-27T14:09:08.536Z

20-8539-1

False

None

False

None

20UPGS33303758

V4-2-007033-3-001

parent

component

67c71489d89b87c79a241566

code

9e37f52b4763801af5fa8b7f75c4277e

state

ready

stateTs

2025-03-04T14:56:09.601Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200207

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULERECEPTION
name	Reception at ITk institute

highestLevelParent

component

67c71489d89b87c79a241566

code

9e37f52b4763801af5fa8b7f75c4277e

state

ready

stateTs

2025-03-04T14:56:09.601Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200207

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULERECEPTION
name	Reception at ITk institute

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7033
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007033-3-001
MAN_ID	Original Manufacturer ID	string	False	False	Q1
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	58.62

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Post-Parylene Warm

No tests are allocated for this stage.

Past QC Stages and Results

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
684894…e6d6bd	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	6 months ago	No tags	Selected
66f6c7…29537b	sensor_manufacturer	IV_MEASURE	JörnGroße-Knetter	N/A	a year ago	No tags	Selected
66f6c4…2936b9	sensor_manufacturer	CV_MEASURE	JörnGroße-Knetter	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33303758

MODULE/POST_PARYLENE_WARM

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Post-Parylene Warm

Past QC Stages and Results

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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