Top Page > Component List > 20UPGS33303740 > QC Result / sensor_manufacturer / CV_MEASURE

20UPGS33303740
Outer-Quad-Sensor
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Component Information

Item Value
Serial Number 20UPGS33303740
Production DB Component ID 206a8343ee434fe51c0e1230463ea0eb
LocalDB Component ID 66f6bbe213e0b0004328dad7
Component Type sensor_tile
Super-Component 20UPGB43200156 
Sub-Components No match.
Flags

Properties

Item Data Type Value
Main Vendor integer 3
Sensor Type or Test Structure integer 3
Version of component string production
Scratch id (to be used if not the same as agreed manufacturer ID) string 7030
Alternative Identifier string V4-2-007030-3-001
Original Manufacturer ID string Q1
Breakdown Voltage (-999 if no breakdown occurred) float -999
Depletion Voltage (V) float 58.24

Comments


Test: CV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2024-09-27 07:42:45 PDT(-0700)
component ObjectId 66f6bbe213e0b0004328dad7
Stage sensor_manufacturer
Test Type CV_MEASURE
Institute ObjectId
User Name JörnGroße-Knetter
ObjectId of this record 66f6c465db6782004337b0ff
ObjectId of RAW record None

Results

Key Data
ANALYSIS_VERSION mqat vf8b32ac5
HUM 0
TEMP 20
CV_ARRAY {'Time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'Voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'Capacitance': [0.0008741863033162576, 0.07179102977458011, 0.13874216731267866, 0.2053774571081709, 0.27183338570656557, 0.3382958527069871, 0.40471581177446275, 0.46900266639271904, 0.5352128266579834, 0.6013915297912074, 0.6679147945905528, 0.7351559029317496, 0.7735334000119124, 0.7846736229709623, 0.7949210522567111, 0.8009080631547402, 0.8078335555252598, 0.8126470703272654, 0.8144081108662883, 0.8154380293354812, 0.8169127338527067, 0.495165890996726, 0.818687665939803, 0.8191323028173866, 0.8195773020229887, 0.8198741696478384, 0.8203197736088053, 0.8206170447691156, 0.8210632545817631, 0.8213609300092399, 0.8216587673488319, 0.8221058272003758, 0.8224040698343102, 0.82255325201528, 0.822702474791882, 0.8228517381788459, 0.8230010421909099, 0.8231503868428168, 0.8232997721493184, 0.8234491981251709, 0.8234491981251709], 'Sigma Capacitance': [], 'Temperature': [], 'Humidity': []}
CV_IMG []
V_FULLDEPL 58.23543592331946

ProductionDB Record

{}

Current Stage: Initial Cold

No tests are allocated for this stage.

Past QC Stages and Results

  Stage: QC cross-check (module swapping) (MODULE/QC_CROSSCHECK) Alternative

No tests are allocated for this stage.

  Stage: Initial Warm (MODULE/INITIAL_WARM) Complete

No tests are allocated for this stage.

  Stage: Wire Bonding (MODULE/WIREBONDING) Complete

No tests are allocated for this stage.

  Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Complete

No tests are allocated for this stage.

  Stage: Initial state to associate flex to bare module (MODULE/INIT) Locally Signed Off

No tests are allocated for this stage.

  Stage: Bare module reception at ITk institute (BAREMODULERECEPTION) Complete

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!

  Stage: Bare Module Assembly (BAREMODULEASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Not to be used for detector (NOT_USED) Alternative

No tests are allocated for this stage.

  Stage: Post Irradiation (POST_IRRAD) Alternative

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: QA at Institutes (QA) Alternative

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IT measurement
(IT_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING) Locally Signed Off

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Visual inspection
(VISUAL_INSPECTION)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Sensor Manufacturer (sensor_manufacturer) Complete

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
IV measurement
(IV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
LocalDB Test ID Stage Test Name Inspector Date QC Registration
67c9ccc72717b3491d6a2c3b BAREMODULERECEPTION IV_MEASURE AnnaRaquel Petri 2025-03-06 08:26:47 PST(-0800) Selected
66f6c72413e0b000432952cb sensor_manufacturer IV_MEASURE JörnGroße-Knetter 2024-09-27 07:54:28 PDT(-0700) Selected
66f6c465db6782004337b0ff sensor_manufacturer CV_MEASURE JörnGroße-Knetter 2024-09-27 07:42:45 PDT(-0700) Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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