Database for ITk Pixel Module

Serial Number	20UPGS33303657
ProdDB ID	07a7db…765153
LocalDB ID	66f6b90013e0b0004328c98f
Component Type	SENSOR_TILE
Parents	20UPGB43200036
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7016
Alternative Identifier	V4-2-007016-3-002
Original Manufacturer ID	Q2
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	59.48

Key	Data
QC Passed	True
Date	9 months ago
component ObjectId	66f6b90013e0b0004328c98f
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	Simpson,Liana Rae
ObjectId of this record	67b8df35d89b87c79ae64cd2
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:a3332c9
HUM	35
MEASUREMENT_DATE	2025-01-30T15:20:00.000Z
TEMP	20
BREAKDOWN_REDUCTION	N/A
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.8, 9.8, 14.8, 19.9, 24.8, 29.9, 34.9, 39.9, 45, 50, 54.9, 59.9, 64.8, 69.9, 74.9, 79.9, 84.9, 89.9, 94.9, 100, 105, 110, 114.9, 119.9, 124.9, 130, 135, 140, 145, 150.1, 155, 160.1, 165.1, 170.1, 175.1, 180, 185.1, 190, 195, 200], 'current': [0, 0.47065, 0.53075, 0.5559999999999999, 0.5753, 0.5873, 0.5963, 0.60415, 0.61175, 0.61885, 0.6265000000000001, 0.6340499999999999, 0.6412000000000001, 0.64865, 0.6557999999999999, 0.66265, 0.6691, 0.6760999999999999, 0.68305, 0.68985, 0.6960999999999999, 0.7028, 0.7092999999999999, 0.71585, 0.72185, 0.7286000000000001, 0.73545, 0.7423500000000001, 0.74855, 0.7558499999999999, 0.76305, 0.7701, 0.7777999999999999, 0.7858, 0.7935, 0.8012500000000001, 0.8099000000000001, 0.8189500000000001, 0.8271, 0.8365, 0.8456000000000001], 'sigma current': [0, 0.0014840822079655, 0.00125, 0.0019748417658131, 0.0014352700094407, 0.0007810249675906, 0.0006782329983125, 0.0007088723439378, 0.0005123475382979, 0.000502493781056, 0.0003872983346207, 0.0004153311931459, 0.0004582575694955, 0.0003201562118716, 0.0003316624790355, 0.0003201562118716, 0.0003741657386773, 0.0003741657386773, 0.0004153311931459, 0.0003201562118716, 0.0002, 0.0003316624790355, 0.0002449489742783, 0.0003201562118716, 0.0002291287847477, 0.0001999999999999, 0.0002692582403567, 0.0002291287847478, 0.0001499999999999, 0.0002291287847478, 0.0001499999999999, 0.0002999999999999, 0.0002449489742783, 0.0002449489742783, 0.0002236067977499, 0.0002499999999999, 0.0002, 0.0003499999999999, 0.0003, 0.0002236067977499, 0.0001999999999999]}
IV_IMG	N/A
LEAK_CURRENT	0.7028
LEAK_PER_AREA	N/A
LEAK_INCREASE_FACTOR	N/A
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

67be34d25cfcdd14472e1501

state

ready

stateTs

2025-02-25T21:23:30.735Z

stateUserIdentity

1294-8027-1

date

2025-02-21T20:16:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6797ca0f2ffbf908f24868f9
userIdentity	1294-8027-1
firstName	Simpson,
middleName
lastName	Liana Rae

runNumber

67b8df35d89b87c79ae64cd2

passed

True

problems

False

properties

code ANALYSIS_VERSION
name Analysis Version
dataType string
valueType single
required False
value webApp SHA:a3332c9
userIdentity 1294-8027-1
dateTime 2025-03-11T18:23:30.851Z
rangeMin None
rangeMax None
code HUM
name Humidity [%]
dataType float
valueType single
required True
value 35
rangeMin None
rangeMax None
code MEASUREMENT_DATE
name Date measurement performed
dataType datetime
valueType single
required False
value 2025-01-30T15:20:00.000Z
rangeMin None
rangeMax None
code TEMP
name Temperature [°C]
dataType float
valueType single
required True
value 20
rangeMin None
rangeMax None

results

code BREAKDOWN_REDUCTION
name Breakdown Voltage Reduction (V)
order 8
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.8 9.8 14.8 19.9 24.8 29.9 34.9 39.9 45 50 54.9 59.9 64.8 69.9 74.9 79.9 84.9 89.9 94.9 100 105 110 114.9 119.9 124.9 130 135 140 145 150.1 155 160.1 165.1 170.1 175.1 180 185.1 190 195 200
current	0 0.47065 0.53075 0.5559999999999999 0.5753 0.5873 0.5963 0.60415 0.61175 0.61885 0.6265000000000001 0.6340499999999999 0.6412000000000001 0.64865 0.6557999999999999 0.66265 0.6691 0.6760999999999999 0.68305 0.68985 0.6960999999999999 0.7028 0.7092999999999999 0.71585 0.72185 0.7286000000000001 0.73545 0.7423500000000001 0.74855 0.7558499999999999 0.76305 0.7701 0.7777999999999999 0.7858 0.7935 0.8012500000000001 0.8099000000000001 0.8189500000000001 0.8271 0.8365 0.8456000000000001
sigma current	0 0.0014840822079655 0.00125 0.0019748417658131 0.0014352700094407 0.0007810249675906 0.0006782329983125 0.0007088723439378 0.0005123475382979 0.000502493781056 0.0003872983346207 0.0004153311931459 0.0004582575694955 0.0003201562118716 0.0003316624790355 0.0003201562118716 0.0003741657386773 0.0003741657386773 0.0004153311931459 0.0003201562118716 0.0002 0.0003316624790355 0.0002449489742783 0.0003201562118716 0.0002291287847477 0.0001999999999999 0.0002692582403567 0.0002291287847478 0.0001499999999999 0.0002291287847478 0.0001499999999999 0.0002999999999999 0.0002449489742783 0.0002449489742783 0.0002236067977499 0.0002499999999999 0.0002 0.0003499999999999 0.0003 0.0002236067977499 0.0001999999999999

associateChild

None

code IV_IMG
name Plot of IV curves (not for bare modules and modules)
dataType image
valueType single
arrayDimensions None
additional False
value None
associateChild None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.7028
dateTime	2025-03-11T18:24:04.919Z
userIdentity	1294-8027-1
associateChild	None

code LEAK_PER_AREA
name Leakage Current per Area (uA/cm^2)
order 1
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code LEAK_INCREASE_FACTOR
name Leakage Current Increase Factor
order 9
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2025-02-25T21:23:30.735Z

sys

cts	2025-02-25T21:23:30.735Z
mts	2025-03-11T18:24:04.924Z
rev	2

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

66f6b90013e0b0004328c98f

07a7db4b21ae92bd84cb0bdd12765153

ready

2024-09-27T13:54:08.122Z

20-8539-1

False

None

False

None

20UPGS33303657

V4-2-007016-3-002

parent

component

6720fc49a98f020043569a6c

code

821052cfbc303144e0a011b531d77387

state

ready

stateTs

2024-10-29T15:16:24.988Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200036

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

highestLevelParent

component

6720fc49a98f020043569a6c

code

821052cfbc303144e0a011b531d77387

state

ready

stateTs

2024-10-29T15:16:24.988Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43200036

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULEASSEMBLY
name	Bare module assembly

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7016
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007016-3-002
MAN_ID	Original Manufacturer ID	string	False	False	Q2
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	59.48

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Module PCB tab cutting

No tests are allocated for this stage.

Past QC Stages and Results

Module reception (MODULE/RECEPTION)

Module Complete (MODULE/COMPLETE)

Module damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
67b8df…e64cd2	BAREMODULERECEPTION	IV_MEASURE	Simpson,Liana Rae	N/A	9 months ago	No tags	Selected
66f6c7…294fcf	sensor_manufacturer	IV_MEASURE	JörnGroße-Knetter	N/A	a year ago	No tags	Selected
66f6c4…2932d6	sensor_manufacturer	CV_MEASURE	JörnGroße-Knetter	N/A	a year ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33303657

MODULE/TAB_CUTTING

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Module PCB tab cutting

Past QC Stages and Results

Module reception (MODULE/RECEPTION)

Module Complete (MODULE/COMPLETE)

Module damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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