Database for ITk Pixel Module

Serial Number	20UPGS33302905
ProdDB ID	ae8d05…52313e
LocalDB ID	66ed707fa2dfe000420ad2d5
Component Type	SENSOR_TILE
Parents	20UPGB43000593
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	production
Scratch id (to be used if not the same as agreed manufacturer ID)	7352
Alternative Identifier	V4-2-007352-3-006
Original Manufacturer ID	Q6
Breakdown Voltage (-999 if no breakdown occurred)	-999
Depletion Voltage (V)	51.72

Key	Data
QC Passed	True
Date	4 months ago
component ObjectId	66ed707fa2dfe000420ad2d5
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	ElizaHoward
ObjectId of this record	69793ee4a49e3a81a41a3051
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp SHA:c0ffb89
HUM	35
MEASUREMENT_DATE	2026-01-26T13:12Z
TEMP	20
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.9, 9.9, 14.8, 19.9, 24.9, 30, 35.1, 40, 45.1, 50, 55.1, 60, 64.9, 70, 74.9, 80, 85.1, 90, 95, 100.1, 105, 110.1, 114.9, 120, 125, 130.1, 135, 140.1, 145.1, 150.1, 155.1, 160.2, 165.2, 170.2, 175.1, 180.2, 185.2, 190.1, 195.1, 200.1], 'current': [0, 0.054000000000000006, 0.058550000000000005, 0.0615, 0.06349999999999999, 0.06499999999999999, 0.0664, 0.06699999999999999, 0.0675, 0.06805, 0.06870000000000001, 0.06945, 0.07000000000000002, 0.0705, 0.07099999999999998, 0.07149999999999998, 0.07199999999999998, 0.0725, 0.07299999999999998, 0.0735, 0.07399999999999997, 0.0745, 0.07524999999999998, 0.07599999999999998, 0.07649999999999998, 0.07699999999999999, 0.0775, 0.07799999999999999, 0.0785, 0.07899999999999997, 0.07955000000000001, 0.08045, 0.08099999999999999, 0.08149999999999999, 0.0825, 0.08305, 0.08399999999999999, 0.08455000000000001, 0.0855, 0.08634999999999998, 0.08699999999999998], 'sigma current': [0, 6.938893903907228e-18, 0.00014999999999999804, 0, 0, 1.3877787807814457e-17, 0.00020000000000000017, 1.3877787807814457e-17, 0, 0.00015000000000000015, 0.000244948974278318, 0.00015000000000000012, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 0.0002500000000000002, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0, 1.3877787807814457e-17, 0.00015000000000000015, 0.00015000000000000015, 1.3877787807814457e-17, 0, 0, 0.00015000000000000015, 1.3877787807814457e-17, 0.00015000000000000015, 0, 0.00022912878474779219, 0]}
LEAK_CURRENT	0.074
MAXIMUM_VOLTAGE	200.1
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Expand ProductionDB Record

697b1e31f15342ae7f8d8ba4

state

ready

stateTs

2026-01-29T08:45:37.617Z

stateUserIdentity

4561-2270-1

date

2026-01-27T22:40:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	68755ce03942dab85ad88269
userIdentity	4561-2270-1
firstName	Eliza
middleName
lastName	Howard

runNumber

69793ee4a49e3a81a41a3051

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	webApp SHA:c0ffb89	None	None
HUM	Humidity [%]	float	single	True	35	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	single	False	2026-01-26T13:12Z	None	None
TEMP	Temperature [°C]	float	single	True	20	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.9 9.9 14.8 19.9 24.9 30 35.1 40 45.1 50 55.1 60 64.9 70 74.9 80 85.1 90 95 100.1 105 110.1 114.9 120 125 130.1 135 140.1 145.1 150.1 155.1 160.2 165.2 170.2 175.1 180.2 185.2 190.1 195.1 200.1
current	0 0.054000000000000006 0.058550000000000005 0.0615 0.06349999999999999 0.06499999999999999 0.0664 0.06699999999999999 0.0675 0.06805 0.06870000000000001 0.06945 0.07000000000000002 0.0705 0.07099999999999998 0.07149999999999998 0.07199999999999998 0.0725 0.07299999999999998 0.0735 0.07399999999999997 0.0745 0.07524999999999998 0.07599999999999998 0.07649999999999998 0.07699999999999999 0.0775 0.07799999999999999 0.0785 0.07899999999999997 0.07955000000000001 0.08045 0.08099999999999999 0.08149999999999999 0.0825 0.08305 0.08399999999999999 0.08455000000000001 0.0855 0.08634999999999998 0.08699999999999998
sigma current	0 6.938893903907228e-18 0.00014999999999999804 0 0 1.3877787807814457e-17 0.00020000000000000017 1.3877787807814457e-17 0 0.00015000000000000015 0.000244948974278318 0.00015000000000000012 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0 0.0002500000000000002 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0 1.3877787807814457e-17 0.00015000000000000015 0.00015000000000000015 1.3877787807814457e-17 0 0 0.00015000000000000015 1.3877787807814457e-17 0.00015000000000000015 0 0.00022912878474779219 0

dateTime

2026-02-19T22:17:52.218Z

userIdentity

5257-8848-1

associateChild

None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.074
dateTime	2026-02-19T22:18:16.718Z
userIdentity	5257-8848-1
associateChild	None

code MAXIMUM_VOLTAGE
name Maximum measured Voltage [V]
dataType float
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 200.1
associateChild None
code NO_BREAKDOWN_VOLTAGE_OBSERVED
name No breakdown voltage observed
dataType boolean
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value True
associateChild None

cts

2026-01-29T08:45:37.617Z

sys

cts	2026-01-29T08:45:37.617Z
mts	2026-02-19T22:18:16.722Z
rev	2

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

66ed707fa2dfe000420ad2d5

ae8d0530171bba8913a1e9c06f52313e

ready

2024-09-20T12:54:23.747Z

8937-9560-1

False

None

False

None

20UPGS33302905

V4-2-007352-3-006

parent

component

693187cea6b1941f4bba45a1

code

f62c88f24d160c948b98ea583b1c0007

state

ready

stateTs

2025-12-04T13:08:30.574Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43000593

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	NOT_USED
name	Not to be used for the detector

highestLevelParent

component

693187cea6b1941f4bba45a1

code

f62c88f24d160c948b98ea583b1c0007

state

ready

stateTs

2025-12-04T13:08:30.574Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB43000593

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	NOT_USED
name	Not to be used for the detector

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAIN_VENDOR	Main Vendor	integer	True	False	3
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	7352
MAN_SNO	Alternative Identifier	string	True	True	V4-2-007352-3-006
MAN_ID	Original Manufacturer ID	string	False	False	Q6
BREAKDOWN_VOLTAGE	Breakdown Voltage (-999 if no breakdown occurred)	float	True	False	-999
V_FULLDEPL	Depletion Voltage (V)	float	True	False	51.72

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	6
initial	False
final	False

code	HPK
name	Hamamatsu Photonics K.K (HPK)

Current Stage: Modules failed test, needs investigation

No tests are allocated for this stage.

Past QC Stages and Results

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
69f0d6…d8783c	sensor_manufacturer	CV_MEASURE	KojiNakamura	N/A	a month ago	No tags	Selected
69793e…1a3051	BAREMODULERECEPTION	IV_MEASURE	ElizaHoward	N/A	4 months ago	No tags	Selected
66fa56…441c3c	sensor_manufacturer	IV_MEASURE	ChristopherKrause	N/A	a year ago	No tags	Selected
66fa56…35a309	sensor_manufacturer	CV_MEASURE	ChristopherKrause	N/A	a year ago	No tags

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/WIREBOND_PROTECTION
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/GRAVEYARD
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33302905

MODULE/UNHAPPY

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Modules failed test, needs investigation

Past QC Stages and Results

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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