Top Page > Component List > 20UPGS33300902 > QC Result / sensor_manufacturer / CV_MEASURE

20UPGS33300902
Outer-Quad-Sensor
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Component Information

Item Value
Serial Number 20UPGS33300902
Production DB Component ID 7a849a1894623f009428b04c14fd7233
LocalDB Component ID 6602eea23024280035a755cf
Component Type sensor_tile
Super-Component 20UPGB43309001 
Sub-Components No match.
Flags

Properties

Item Data Type Value
Main Vendor integer 3
Sensor Type or Test Structure integer 3
Version of component string pre-production
Scratch id (to be used if not the same as agreed manufacturer ID) string 77
Alternative Identifier string V4-1-000077-3-001
Original Manufacturer ID string Q1
Breakdown Voltage (-999 if no breakdown occurred) float -999
Depletion Voltage (V) float 66.33

Comments


Test: CV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2024-04-29 08:37:47 PDT(-0700)
component ObjectId 6602eea23024280035a755cf
Stage sensor_manufacturer
Test Type CV_MEASURE
Institute ObjectId
User Name KojiNakamura
ObjectId of this record 6620883115f25500356b8908
ObjectId of RAW record None

Results

Key Data
ANALYSIS_VERSION mqat vad4945a2
HUM 0
TEMP 20
CV_IMG 8cd0e38c8cc52eb25ad0e753a57367c10af270d88d0def2511f7c6864a9d584c
V_FULLDEPL 66.32867147382173
CV_ARRAY {'Time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'Voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'Capacitance': [0.0041613643387599444, 0.06544047442469743, 0.12509083533553308, 0.18527925764026443, 0.2458279548327811, 0.307002445802525, 0.36829091257936064, 0.42965378291938544, 0.49080458950979, 0.5522910978804747, 0.6137031631335008, 0.6751788717626017, 0.7399699387212395, 0.7874613412588065, 0.7989048995111853, 0.8024872675564534, 0.8046482663563429, 0.806818005876846, 0.8155853200155752, 0.8188358379979476, 0.8198741696478384, 0.8372191394557678, 0.8209144775483952, 0.8210632545817631, 0.8215098284326836, 0.8216587673488319, 0.8219567667179842, 0.8224040698343102, 0.8224040698343102, 0.822702474791882, 0.8228517381788459, 0.8232997721493184, 0.8231503868428168, 0.8234491981251709, 0.8232997721493184, 0.823598664785139, 0.8232997721493184, 0.823598664785139, 0.8237481721439934, 0.8237481721439934, 0.823598664785139], 'Sigma Capacitance': [], 'Temperature': [], 'Humidity': []}

ProductionDB Record

{}

Current Stage: Initial Warm

No tests are allocated for this stage.

Past QC Stages and Results

  Stage: Wire Bonding (MODULE/WIREBONDING) Locally Signed Off

No tests are allocated for this stage.

  Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Initial state to associate flex to bare module (MODULE/INIT) Not signed-off

No tests are allocated for this stage.

  Stage: Bare module reception at ITk institute (BAREMODULERECEPTION) Locally Signed Off

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Bare Module Assembly (BAREMODULEASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Not to be used for detector (NOT_USED) Locally Signed Off

No tests are allocated for this stage.

  Stage: Post Irradiation (POST_IRRAD) Locally Signed Off

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: QA at Institutes (QA) Locally Signed Off

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IT measurement
(IT_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING) Locally Signed Off

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Visual inspection
(VISUAL_INSPECTION)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Sensor Manufacturer (sensor_manufacturer) Locally Signed Off

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
Registered Test is registered in LocalDB.
Registered Jump to the ITkPD TestRun Page!
IV measurement
(IV_MEASURE)
Registered Test is registered in LocalDB.
Registered Jump to the ITkPD TestRun Page!
LocalDB Test ID Stage Test Name Inspector Date QC Registration
662088405e538000342f0aa8 sensor_manufacturer IV_MEASURE KojiNakamura 2024-04-29 08:37:47 PDT(-0700) Selected
6620883115f25500356b8908 sensor_manufacturer CV_MEASURE KojiNakamura 2024-04-29 08:37:47 PDT(-0700) Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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