20UPGB12200058

MODULE/INIT

Component Information

Serial Number	20UPGB12200058
ProdDB ID	59c88f…c2fbee
LocalDB ID	651ed652f0937c0038e9aae3
Component Type	BARE_MODULE
Parents	20UPIM52002136
Children	20UPGFC0096197 FE Chip 20UPIS17100138 Sensor Tile
Flags

Broken at FE chip level

Broken during handling

Broken at sensor level

FE chip or chips fell off

Other issues

Inner pixel

Used for bare module QA

Distribution of chips on wafer

Properties

Item	Value
FE chip version readonly	2
Sensor Type	2
Vendor code readonly	2
Thickness of FE chips (RD53A)	None

Comments

Test: VISUAL_INSPECTION QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key	Data
QC Passed	True
Date	a year ago
component ObjectId	651ed652f0937c0038e9aae3
Stage	BAREMODULERECEPTION
Test Type	VISUAL_INSPECTION
Institute ObjectId
User Name	MarioJose
ObjectId of this record	670083ebef991c0043d72649
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vNone
DEFECTS	0
FE_CHIP_CONDITION_PASSED_QC	1
SENSOR_CONDITION_PASSED_QC	1

ProductionDB Record

Expand ProductionDB Record

670083ebef991c0043d72649

state

ready

stateTs

2024-10-05T00:10:19.500Z

stateUserIdentity

6200-2650-1

date

2024-09-24T00:00:00.000Z

testType

id	5f869f6646cd14000b5108c6
code	VISUAL_INSPECTION
name	Visual Inspection
state	active

institution

id	5d41d52cf6e07b000a559ada
code	INFN_GENOA
name	INFN Genoa

user

id	64526724012cc8004282cb9e
userIdentity	6200-2650-1
firstName	Mario
middleName
lastName	Jose

runNumber

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	None	None	None

results

code

DEFECTS

name

Defect source

dataType

codeTable

valueType

single

arrayDimensions

None

additional

False

value

associateChild

None

codeTable

code	value
0	no defect
1	Sensor systematic rough edge or dicing defect
2	Sensor tooling marks
3	Sensor scratch (random)
4	Sensor dot-like contamination
5	Sensor chipped corner
6	FE chip chipped outer corner
7	FE chip bond pad contamination
8	FE chip irregular dicing
9	FE chip scratch on back side
10	FE chip scratch on top side (pad side)
11	FE chip chipped inner corner
12	FE chip excess material (not diced near FE border)
13	Other defect

code FE_CHIP_CONDITION_PASSED_QC
name FE chip condition passed QC (1: good, 2: issues, 3: bad)
dataType integer
valueType single
arrayDimensions None
additional False
value 1
associateChild None
code SENSOR_CONDITION_PASSED_QC
name Sensor condition passed QC (1: good, 2: issues, 3: bad)
dataType integer
valueType single
arrayDimensions None
additional False
value 1
associateChild None

cts

2024-10-05T00:10:19.500Z

sys

cts	2024-10-05T00:10:19.500Z
mts	2024-10-05T00:51:45.349Z
rev	2

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

url

urlCernbox

filename

user

5dcf3316ea38076d5b23fe8cf3767567

2024-10-05T00:51:29.396Z

a testRun image attachment

from webApp 2024-10-05T00:51Z

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/5/d/c/5dcf3316ea38076d5b23fe8cf3767567?authz=zteos64:MDAwMDAyOWF4nO1Qu0rEQBRlF91iK7HcxkEsbPKYSSaTudViYbEggmwXsphkJmvY3UxIJs222ukXiIV-gZ1s6wts_Ac77f0AjYuFhZW1l8vlcjjncDjdm3a3Va59nL8sOr3VTE8KsdmeF9st4lhSVVakp9H3TWSZj0tVFyKrJpaQ2mjoVlEqYYjYopawksEWpQxH1PYNbseugbFMDU5FbERunNqYcY8RfnDXCoa1RPuJRoQ0C4QDYYjYxA1RnQnALvZ8HCzjhGj8hTg2C-ZFiHQmZK6hVEqbDuOO4zPwHN4PANJmgGITY8_kvontEOXRTMLSBokcUBNWw6SMKYqKAtCRqjT8LhRqFmU5_EDGUoFNsYOqWjTfOjrsXx8Pp5eLqy49G23crjyke6-7p6Pnxwv2js2dQe-_2r9Vi-5P3p46n_ThzVQ%3d

https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/5/d/c/5dcf3316ea38076d5b23fe8cf3767567

5dcf3316ea38076d5b23fe8cf3767567

id	64526724012cc8004282cb9e
userIdentity	6200-2650-1
firstName	Mario
middleName
lastName	Jose

4876b1584ec94728d98ff80bd0f6e583

2024-10-05T00:51:45.349Z

a testRun image attachment

from webApp 2024-10-05T00:51Z

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/4/8/7/4876b1584ec94728d98ff80bd0f6e583?authz=zteos64:MDAwMDAyOWN4nO1QPUvDUBQ1BTvUQXGzLhd1UCEf7yN9eQ9BZ5dCURFChqTvtYbavJC8LPUnOLm6-SOK4uoobv4AXfwNxUVjcXBwcvZyuRwO9xwOp3XbaFnFysf1y12zvZiaUS43GpN828LEVbp0Y3Mef9--KrJhoatcpuXIlcrY9bubF1raMnGpG7jscMv3OaOEeDb3EmojpAZ2QBGzY5oMPMR4h2Hee7DCo0pBt28A43oF5gIzwB6mEVSpFIiiToDCeZwIhl8M8Vg4ySMwqVSZEYXWxiGME4pqLUXoIBRiUI_wkYNQx-GBg7wIsnisxNwHZCagTmvEqEh8iPNcwJkujfhdKPU4TjPxgxkqLTwfESgrWaNV4GuvV9N9unO8uzw7eTudPe5dwE252W2S9YXe0uV7-7_bP3YL90_T5-Yn5w_KCA%3d%3d

https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/4/8/7/4876b1584ec94728d98ff80bd0f6e583

4876b1584ec94728d98ff80bd0f6e583

id	64526724012cc8004282cb9e
userIdentity	6200-2650-1
firstName	Mario
middleName
lastName	Jose

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

651ed652f0937c0038e9aae3

59c88f5fa6c13d220b11c3275ac2fbee

ready

2023-10-05T15:29:22.783Z

23-6780-1

False

None

False

None

20UPGB12200058

None

parent

component

664745686e3f8c0035fc7c4f

code

9ab583a9c716cf13629f0e38957dc6d2

state

ready

stateTs

2024-05-17T11:54:16.677Z

stateUserIdentity

7608-2618-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPIM52002136

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PI
name	Inner pixels

componentType

code	MODULE
name	Module

type

code	TRIPLET_L0_RING0.5_MODULE
name	Triplet L0 Ring0.5 module

testedAtStage

code	MODULE/FINAL_COLD
name	Final Cold

highestLevelParent

component

664745686e3f8c0035fc7c4f

code

9ab583a9c716cf13629f0e38957dc6d2

state

ready

stateTs

2024-05-17T11:54:16.677Z

stateUserIdentity

7608-2618-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPIM52002136

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PI
name	Inner pixels

componentType

code	MODULE
name	Module

type

code	TRIPLET_L0_RING0.5_MODULE
name	Triplet L0 Ring0.5 module

testedAtStage

code	MODULE/FINAL_COLD
name	Final Cold

code	P
name	Pixels

code	PG
name	Pixel general

code	BARE_MODULE
name	Bare Module

code	SINGLE_BARE_MODULE
name	Single bare module

code

name

dataType

required

default

value

codeTable

FECHIP_VERSION

FE chip version

codeTable

True

False

ITkpix_v1.1

code	value
0	RD53A
1	ITkpix_v1
2	ITkpix_v1.1
3	ITkpix_v2
9	No FE chip

SENSOR_TYPE

Sensor Type

codeTable

True

False

L0 inner pixel 3D sensor tile

code	value
0	No sensor
1	Market survey sensor tile
2	L0 inner pixel 3D sensor tile
3	L0 inner pixel planar sensor tile
4	L1 inner pixel quad sensor tile
5	Outer pixel quad sensor tile
9	Dummy sensor tile

VENDOR

Vendor code

codeTable

True

False

IZM

code	value
0	Advacam
1	Leonardo
2	IZM
3	HPK (in-kind)
4	HPK (CERN order)
5	RAL (in-house)
6	Glasgow (in-house)
9	ITk institute

code	BAREMODULERECEPTION
name	Reception at ITk institute
order	3
initial	False
final	False

code	IZM
name	Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (IZM)

Current Stage: Initial state to associate flex to bare module

No tests are allocated for this stage.

Past QC Stages and Results

Reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
Sensor IV on bare module (BARE_MODULE_SENSOR_IV)	Registered	Registered
Flatness (FLATNESS)	No result	N/A
Mass Measurement (MASS_MEASUREMENT)	Registered	Registered
Quad Bare Module Metrology (QUAD_BARE_MODULE_METROLOGY)	No result	N/A
Single Bare Module Metrology (SINGLE_BARE_MODULE_METROLOGY)	Registered	Registered
Visual Inspection (VISUAL_INSPECTION)	Registered	Registered

Not to be used for the detector (NOT_USED)

Bare module failed test, needs investigation (UNHAPPY)

Bare module assembly (BAREMODULEASSEMBLY)

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
672cc5…069a5e	BAREMODULERECEPTION	SINGLE_BARE_MODULE_METROLOGY	MarioJose	N/A	a year ago	No tags	Selected
670083…d72649	BAREMODULERECEPTION	VISUAL_INSPECTION	MarioJose	N/A	a year ago	No tags	Selected
66f2b8…28fa65	BAREMODULERECEPTION	MASS_MEASUREMENT	MarioJose	N/A	a year ago	No tags	Selected
667d6f…7d3bbd	BAREMODULERECEPTION	BARE_MODULE_SENSOR_IV	MarioJose	N/A	a year ago	No tags	Selected

Stage	Tests
BAREMODULEASSEMBLY
UNHAPPY
NOT_USED
BAREMODULERECEPTION	Visual Inspection (VISUAL_INSPECTION) Mass Measurement (MASS_MEASUREMENT) Quad Bare Module Metrology (QUAD_BARE_MODULE_METROLOGY) Flatness (FLATNESS) Sensor IV on bare module (BARE_MODULE_SENSOR_IV) Single Bare Module Metrology (SINGLE_BARE_MODULE_METROLOGY)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/WIREBOND_PROTECTION
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGB12200058

MODULE/INIT

Component Information

Distribution of chips on wafer

Properties

Comments

Test: VISUAL_INSPECTION QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Initial state to associate flex to bare module

Past QC Stages and Results

Reception at ITk institute (BAREMODULERECEPTION)

Not to be used for the detector (NOT_USED)

Bare module failed test, needs investigation (UNHAPPY)

Bare module assembly (BAREMODULEASSEMBLY)

All Registered QC Tests

Check QC Flow

Back to top page of this component