Top Page > Component List > 20UPGB12200057 > QC Result / BAREMODULERECEPTION / VISUAL_INSPECTION

20UPGB12200057
Single-BareModule/ITkPix_v1.1/IZM
  ITkPD Component Page Jump to ITkPD component page

Component Information

Item Value
Serial Number 20UPGB12200057
Production DB Component ID 38f44a923c3cb311adc4b477a6abb1da
LocalDB Component ID 651ed652a40d6900382ce924
Component Type bare_module
Super-Component 20UPIM52002136 
Sub-Components •  20UPGFC0096181   FE Chip
•  20UPIS17100132   Sensor Tile
Flags

Properties

Item Data Type Value
FE chip version codeTable 2
Sensor Type codeTable 2
Vendor code codeTable 2
Thickness of FE chips (RD53A) codeTable None

Comments


Test: VISUAL_INSPECTION QC Passed

(Stage: BAREMODULERECEPTION)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2024-10-04 17:50:43 PDT(-0700)
component ObjectId 651ed652a40d6900382ce924
Stage BAREMODULERECEPTION
Test Type VISUAL_INSPECTION
Institute ObjectId
User Name MarioJose
ObjectId of this record 670083ebf081870042d8568f
ObjectId of RAW record None

Results

Key Data
ANALYSIS_VERSION mqat vNone
DEFECTS 0
FE_CHIP_CONDITION_PASSED_QC 1
SENSOR_CONDITION_PASSED_QC 1

ProductionDB Record

id670083ebf081870042d8568f
stateready
stateTs2024-10-05T00:10:19.293Z
stateUserIdentity6200-2650-1
date2024-09-24T00:00:00.000Z
testType
id5f869f6646cd14000b5108c6
codeVISUAL_INSPECTION
nameVisual Inspection
stateactive
institution
id5d41d52cf6e07b000a559ada
codeINFN_GENOA
nameINFN Genoa
user
id64526724012cc8004282cb9e
userIdentity6200-2650-1
firstNameMario
middleName
lastNameJose
runNumber1
passedTrue
problemsFalse
properties
codenamedataTypevalueTyperequiredvaluerangeMinrangeMax
ANALYSIS_VERSIONAnalysis VersionstringsingleFalseNoneNoneNone
results
  • codeDEFECTS
    nameDefect source
    dataTypecodeTable
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    value0
    associateChildNone
    codeTable
    codevalue
    0no defect
    1Sensor systematic rough edge or dicing defect
    2Sensor tooling marks
    3Sensor scratch (random)
    4Sensor dot-like contamination
    5Sensor chipped corner
    6FE chip chipped outer corner
    7FE chip bond pad contamination
    8FE chip irregular dicing
    9FE chip scratch on back side
    10FE chip scratch on top side (pad side)
    11FE chip chipped inner corner
    12FE chip excess material (not diced near FE border)
    13Other defect
  • codeFE_CHIP_CONDITION_PASSED_QC
    nameFE chip condition passed QC (1: good, 2: issues, 3: bad)
    dataTypeinteger
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    value1
    associateChildNone
  • codeSENSOR_CONDITION_PASSED_QC
    nameSensor condition passed QC (1: good, 2: issues, 3: bad)
    dataTypeinteger
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    value1
    associateChildNone
cts2024-10-05T00:10:19.293Z
sys
cts2024-10-05T00:10:19.293Z
mts2024-10-05T00:50:43.406Z
rev2
defects
commentsNone
attachments
codedateTimetitledescriptioncontentTypetypeurlurlCernboxfilenameuser
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id64526724012cc8004282cb9e
userIdentity6200-2650-1
firstNameMario
middleName
lastNameJose
00259fc1a9afe3c73a6981c2a8c92e752024-10-05T00:50:43.406Za testRun image attachmentfrom webApp 2024-10-05T00:50ZNoneeoshttps://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/0/0/2/00259fc1a9afe3c73a6981c2a8c92e75?authz=zteos64:MDAwMDAyOWN4nO1QPUvEQBAlB2dxNnJgc9VyKNgk2d1svqaytlFEsAgpktu9GM7LLskG4cBesLaxt1CsBFFOxEJ_gKWVWN4vEEvjYWFhZe3M8Hg8ZobH69y0Oka59H76drvQa-d6pHi_NVFrBnVsISs70fvJNw5EWWSlrBXPq5HNhTabdVuVkps8tXHTdGPFxQFLeYLNEKfMJEQMzcBh1ExYOsTEDz2fhtuPRrRTC7Q50IjSZoCGQEJEMWUxqnMOhBEvINHcToyyL8XBfjRRMdI5F4WGUkptOX5IvcADGhBvPQIYNgUusQjxrDCwCI5RkYwFzP8gXgBq3GoYlamLEqUA7clKw--HXI6TvIAfSiYkYJc4qKp5w7qofX552D7o9o_Y_Wt28rL6sXz2tLh193yVPVzPdsms95_tH7NFx9PphfEJ2uvOGw%3d%3dhttps://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/0/0/2/00259fc1a9afe3c73a6981c2a8c92e7500259fc1a9afe3c73a6981c2a8c92e75
id64526724012cc8004282cb9e
userIdentity6200-2650-1
firstNameMario
middleName
lastNameJose
components
idcodestatestateTsstateUserIdentitydummycompletedcompletedTscompletedUserIdentitytrashedtrashedTstrashedUserIdentityserialNumberalternativeIdentifierancestorMapprojectsubprojectcomponentTypetypepropertiestestedAtStageinstitution
651ed652a40d6900382ce92438f44a923c3cb311adc4b477a6abb1daready2023-10-05T15:29:22.688Z23-6780-1FalseFalseNoneNoneFalseNoneNone20UPGB12200057None
parent
component
id664745686e3f8c0035fc7c4f
code9ab583a9c716cf13629f0e38957dc6d2
stateready
stateTs2024-05-17T11:54:16.677Z
stateUserIdentity7608-2618-1
dummyFalse
completedFalse
completedTsNone
completedUserIdentityNone
trashedFalse
trashedTsNone
trashedUserIdentityNone
serialNumber20UPIM52002136
alternativeIdentifierNone
project
codeP
namePixels
subproject
codePI
nameInner pixels
componentType
codeMODULE
nameModule
type
codeTRIPLET_L0_RING0.5_MODULE
nameTriplet L0 Ring0.5 module
testedAtStage
codeMODULE/FINAL_COLD
nameFinal Cold
highestLevelParent
component
id664745686e3f8c0035fc7c4f
code9ab583a9c716cf13629f0e38957dc6d2
stateready
stateTs2024-05-17T11:54:16.677Z
stateUserIdentity7608-2618-1
dummyFalse
completedFalse
completedTsNone
completedUserIdentityNone
trashedFalse
trashedTsNone
trashedUserIdentityNone
serialNumber20UPIM52002136
alternativeIdentifierNone
project
codeP
namePixels
subproject
codePI
nameInner pixels
componentType
codeMODULE
nameModule
type
codeTRIPLET_L0_RING0.5_MODULE
nameTriplet L0 Ring0.5 module
testedAtStage
codeMODULE/FINAL_COLD
nameFinal Cold
codeP
namePixels
codePG
namePixel general
codeBARE_MODULE
nameBare Module
codeSINGLE_BARE_MODULE
nameSingle bare module
codenamedataTyperequireddefaultvaluecodeTable
FECHIP_VERSIONFE chip versioncodeTableTrueFalseITkpix_v1.1
codevalue
0RD53A
1ITkpix_v1
2ITkpix_v1.1
3ITkpix_v2
9No FE chip
SENSOR_TYPESensor TypecodeTableTrueFalseL0 inner pixel 3D sensor tile
codevalue
0No sensor
1Market survey sensor tile
2L0 inner pixel 3D sensor tile
3L0 inner pixel planar sensor tile
4L1 inner pixel quad sensor tile
5Outer pixel quad sensor tile
9Dummy sensor tile
VENDORVendor codecodeTableTrueFalseIZM
codevalue
0Advacam
1Leonardo
2IZM
3HPK (in-kind)
4HPK (CERN order)
5RAL (in-house)
6Glasgow (in-house)
9ITk institute
codeBAREMODULERECEPTION
nameReception at ITk institute
order3
initialFalse
finalFalse
codeIZM
nameFraunhofer-Institut für Zuverlässigkeit und Mikrointegration (IZM)

Current Stage: Initial state to associate flex to bare module

No tests are allocated for this stage.

Past QC Stages and Results

  Stage: Reception at ITk institute (BAREMODULERECEPTION) Complete

Test Local Result ProdDB Record
Sensor IV on bare module
(BARE_MODULE_SENSOR_IV)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
Flatness
(FLATNESS)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Mass Measurement
(MASS_MEASUREMENT)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
Quad Bare Module Metrology
(QUAD_BARE_MODULE_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Single Bare Module Metrology
(SINGLE_BARE_MODULE_METROLOGY)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
Visual Inspection
(VISUAL_INSPECTION)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!

  Stage: Not to be used for the detector (NOT_USED) Alternative

No tests are allocated for this stage.

  Stage: Bare module failed test, needs investigation (UNHAPPY) Alternative

No tests are allocated for this stage.

  Stage: Bare module assembly (BAREMODULEASSEMBLY) Complete

No tests are allocated for this stage.

LocalDB Test ID Stage Test Name Inspector Date QC Registration
672cc5a324c086e961069863 BAREMODULERECEPTION SINGLE_BARE_MODULE_METROLOGY MarioJose 2024-11-07 05:50:27 PST(-0800) Selected
670083ebf081870042d8568f BAREMODULERECEPTION VISUAL_INSPECTION MarioJose 2024-10-04 17:50:43 PDT(-0700) Selected
66f2b867d7e818004383c9bd BAREMODULERECEPTION MASS_MEASUREMENT MarioJose 2024-09-24 06:02:31 PDT(-0700) Selected
667d6ebd5868cd0037c2b4b2 BAREMODULERECEPTION BARE_MODULE_SENSOR_IV MarioJose 2024-06-27 06:53:01 PDT(-0700) Selected
Stage Tests
BAREMODULEASSEMBLY
UNHAPPY
NOT_USED
BAREMODULERECEPTION
  • Visual Inspection  (VISUAL_INSPECTION)
  • Mass Measurement  (MASS_MEASUREMENT)
  • Quad Bare Module Metrology  (QUAD_BARE_MODULE_METROLOGY)
  • Flatness  (FLATNESS)
  • Sensor IV on bare module  (BARE_MODULE_SENSOR_IV)
  • Single Bare Module Metrology  (SINGLE_BARE_MODULE_METROLOGY)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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