Database for ITk Pixel Module

Serial Number	20UPGM22601067
ProdDB ID	f0dd42…8ea3a1
LocalDB ID	64ed37e6c96c32004230ef1f
Component Type	MODULE
Parents	No match.
Children	20UPGB42307034 Bare Module 20UPGPQ2601067 PCB 20UPGFC0099706 FE Chip 20UPGFC0099686 FE Chip 20UPGFC0099675 FE Chip 20UPGFC0099668 FE Chip
Flags

Item	Value
FE chip version	2
PCB-Bare Orientation isNormal	True
Wirebond protection roof presence	None
Alternative ID	None
Rank	None
Is preproduction module	None

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	64ed37e6c96c32004230ef1f
Stage	MODULE/FINAL_COLD
Test Type	E_SUMMARY
Institute ObjectId
User Name	Shift-LeaderHayashi-REPIC-KEK
ObjectId of this record	673cd1c82338e8ffa566c404
ObjectId of RAW record	None

Key	Data
ANALYSIS_VERSION	localdb-tools v2.2.34-rc23
MEASUREMENT_DATE	None
MODULE_TEMPERATURE	-15
QUAD-MODULE_ADC_CALIBRATION	1 2 3 4
QUAD-MODULE_ANALOG_READBACK	1 2 3 4
MODULE_BAD_PIXEL_NUMBER	N/A
QUAD-MODULE_DATA_TRANSMISSION	1 2 3 4
MODULE_DISCONNECTED_PIXEL_NUMBER	52
MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER	1377
MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A
QUAD-MODULE_INJECTION_CAPACITANCE	1 2 3 4
QUAD-MODULE_LP_MODE	1 2 3 4
QUAD-MODULE_MIN_HEALTH_TEST	1 2 3 4
MODULE_OVERVOLTAGE_PROTECTION	-1
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_1	N/A
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_2	N/A
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_3	N/A
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_4	N/A
QUAD-MODULE_PIXEL_FAILURE_ANALYSIS	1 2 3 4
QUAD-MODULE_SLDO	1 2 3 4
QUAD-MODULE_TUNING	1 2 3 4
MODULE_UNDERSHUNT_PROTECTION	-1
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_1	N/A
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_2	N/A
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_3	N/A
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_4	N/A
QUAD-MODULE_VCAL_CALIBRATION	1 2 3 4

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	30
ELECTRICALLY_BAD_PIXEL_NUMBER	403
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	9
ELECTRICALLY_BAD_PIXEL_NUMBER	305
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	8
ELECTRICALLY_BAD_PIXEL_NUMBER	396
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	5
ELECTRICALLY_BAD_PIXEL_NUMBER	273
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Expand ProductionDB Record

673e0ed82da8f055682d356e

state

ready

stateTs

2024-11-20T16:31:20.713Z

stateUserIdentity

9833-9995-1

date

2024-11-19T17:58:00.000Z

testType

id	6393a0a915838700361eedc0
code	E_SUMMARY
name	Electrical Test (e-test) Module Summary
state	active

institution

id	64229fe1b8fd040036839f29
code	HR
name	Hayashi-Repic Co.

user

id	6704b3f3f081870042f075da
userIdentity	9833-9995-1
firstName	Shift-Leader
middleName
lastName	Hayashi-REPIC-KEK

runNumber

673cd1c82338e8ffa566c404

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version used to generate summary	string	None	True	2.2.34-rc23	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	None	False	None	None	None
MODULE_TEMPERATURE	Required temperature	float	None	True	-15	None	None

results

code

MODULE_ADC_CALIBRATION

name

ADC Calibration

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_ADC_CALIBRATION_FE_LINK_1

name

Link to ADC Calibration of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0dd82da8f055682d1a01

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

673cd1832338e8ffa566c2a6

passed

True

state

ready

problems

False

date

2024-10-25T05:35:00.000Z

associateChild

None

code

MODULE_ADC_CALIBRATION_FE_LINK_2

name

Link to ADC Calibration of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0dd82da8f055682d19fd

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

673cd1842338e8ffa566c2ad

passed

True

state

ready

problems

False

date

2024-10-25T05:35:00.000Z

associateChild

None

code

MODULE_ADC_CALIBRATION_FE_LINK_3

name

Link to ADC Calibration of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0dd84386c2105c106a4a

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

673cd1852338e8ffa566c2b4

passed

True

state

ready

problems

False

date

2024-10-25T05:35:00.000Z

associateChild

None

code

MODULE_ADC_CALIBRATION_FE_LINK_4

name

Link to ADC Calibration of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

673e0dd82da8f055682d19f4

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

673cd1862338e8ffa566c2bb

passed

True

state

ready

problems

False

date

2024-10-25T05:35:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK

name

Analog Readback

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_ANALOG_READBACK_FE_LINK_1

name

Link to Analog Readback of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ddf2da8f055682d1aaf

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

673cd1932338e8ffa566c342

passed

True

state

ready

problems

False

date

2024-10-25T06:12:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK_FE_LINK_2

name

Link to Analog Readback of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ddf3e14f454f16d21b2

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

673cd1962338e8ffa566c359

passed

True

state

ready

problems

False

date

2024-10-25T06:13:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK_FE_LINK_3

name

Link to Analog Readback of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ddf3e14f454f16d21e9

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

673cd1982338e8ffa566c370

passed

False

state

ready

problems

False

date

2024-10-25T06:13:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK_FE_LINK_4

name

Link to Analog Readback of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ddf3e14f454f16d21b5

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

673cd1992338e8ffa566c387

passed

False

state

ready

problems

False

date

2024-10-25T06:13:00.000Z

associateChild

None

code MODULE_BAD_PIXEL_NUMBER
name Number of bad pixels
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_1
name Number of bad pixels for Chip 1
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_2
name Number of bad pixels for Chip 2
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_3
name Number of bad pixels for Chip 3
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_4
name Number of bad pixels for Chip 4
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None

code

MODULE_DATA_TRANSMISSION

name

Data transmission

dataType

codeTable

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_DATA_TRANSMISSION_FE_LINK_1

name

Link to data transmission test of chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ec32da8f055682d3304

testType

id	63c858276cde8700361375ad
code	DATA_TRANSMISSION
name	Data Transmission

runNumber

673cd1c52338e8ffa566c3e8

passed

True

state

ready

problems

False

date

2024-10-25T08:17:00.000Z

associateChild

None

code

MODULE_DATA_TRANSMISSION_FE_LINK_2

name

Link to data transmission test of chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e942da8f055682d2cf8

testType

id	63c858276cde8700361375ad
code	DATA_TRANSMISSION
name	Data Transmission

runNumber

673cd1c62338e8ffa566c3f1

passed

True

state

ready

problems

False

date

2024-10-25T08:18:00.000Z

associateChild

None

code

MODULE_DATA_TRANSMISSION_FE_LINK_3

name

Link to data transmission test of chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ec02da8f055682d3284

testType

id	63c858276cde8700361375ad
code	DATA_TRANSMISSION
name	Data Transmission

runNumber

673cd1c72338e8ffa566c3fa

passed

True

state

ready

problems

False

date

2024-10-25T08:18:00.000Z

associateChild

None

code

MODULE_DATA_TRANSMISSION_FE_LINK_4

name

Link to data transmission test of chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ea02da8f055682d2deb

testType

id	63c858276cde8700361375ad
code	DATA_TRANSMISSION
name	Data Transmission

runNumber

673cd1c82338e8ffa566c403

passed

True

state

ready

problems

False

date

2024-10-25T08:18:00.000Z

associateChild

None

code MODULE_DISCONNECTED_PIXEL_NUMBER
name Number of disconnected pixels
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 52
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_1
name Number of disconnected pixels for Chip 1
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 30
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_2
name Number of disconnected pixels for Chip 2
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 9
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_3
name Number of disconnected pixels for Chip 3
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 8
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_4
name Number of disconnected pixels for Chip 4
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 5
associateChild None
code MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER
name Number of electrically bad pixels
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 1377
associateChild None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_1
name	Number of electrically bad pixels for Chip 1
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	403
associateChild	None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_2
name	Number of electrically bad pixels for Chip 2
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	305
associateChild	None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_3
name	Number of electrically bad pixels for Chip 3
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	396
associateChild	None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_4
name	Number of electrically bad pixels for Chip 4
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	273
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER
name	Highest number of bad pixels in a cluster
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_1
name	Highest number of bad pixels in a cluster for Chip 1
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_2
name	Highest number of bad pixels in a cluster for Chip 2
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_3
name	Highest number of bad pixels in a cluster for Chip 3
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_4
name	Highest number of bad pixels in a cluster for Chip 4
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code

MODULE_INJECTION_CAPACITANCE

name

Injection Capacitance

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_1

name

Link to Injection Capacitance of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0dfc2da8f055682d1d89

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

673cd19e2338e8ffa566c3b4

passed

True

state

ready

problems

False

date

2024-10-25T08:09:00.000Z

associateChild

None

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_2

name

Link to Injection Capacitance of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0df72da8f055682d1d29

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

673cd19f2338e8ffa566c3c1

passed

True

state

ready

problems

False

date

2024-10-25T08:09:00.000Z

associateChild

None

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_3

name

Link to Injection Capacitance of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0df83e14f454f16d2463

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

673cd1a12338e8ffa566c3ce

passed

True

state

ready

problems

False

date

2024-10-25T08:09:00.000Z

associateChild

None

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_4

name

Link to Injection Capacitance of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0df94386c2105c106d56

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

673cd1a22338e8ffa566c3db

passed

True

state

ready

problems

False

date

2024-10-25T08:09:00.000Z

associateChild

None

code MODULE_LP_MODE
name Low Power Mode
dataType codeTable
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 1
associateChild None
codeTable
code value
-1 not there
0 not pass
1 pass

code

MODULE_LP_MODE_FE_LINK_1

name

Link to Low Power Mode of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e023e14f454f16d253f

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

673cd19a2338e8ffa566c38e

passed

True

state

ready

problems

False

date

2024-10-25T08:15:00.000Z

associateChild

None

code

MODULE_LP_MODE_FE_LINK_2

name

Link to Low Power Mode of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0dfe2da8f055682d1dd0

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

673cd19b2338e8ffa566c395

passed

True

state

ready

problems

False

date

2024-10-25T08:15:00.000Z

associateChild

None

code

MODULE_LP_MODE_FE_LINK_3

name

Link to Low Power Mode of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e022da8f055682d1e24

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

673cd19c2338e8ffa566c39c

passed

True

state

ready

problems

False

date

2024-10-25T08:15:00.000Z

associateChild

None

code

MODULE_LP_MODE_FE_LINK_4

name

Link to Low Power Mode of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e003e14f454f16d2501

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

673cd19d2338e8ffa566c3a3

passed

True

state

ready

problems

False

date

2024-10-25T08:15:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST

name

Min Health Test

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_MIN_HEALTH_TEST_FE_LINK_1

name

Link to Min Health Test of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e834386c2105c107b52

testType

id	6393a08a15838700361eec84
code	MIN_HEALTH_TEST
name	Minimal Health Test

runNumber

671ef38bc447bfb7e214f54b

passed

True

state

ready

problems

False

date

2024-10-28T02:14:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST_FE_LINK_2

name

Link to Min Health Test of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e534386c2105c1075c9

testType

id	6393a08a15838700361eec84
code	MIN_HEALTH_TEST
name	Minimal Health Test

runNumber

671ef38bc447bfb7e214f53a

passed

True

state

ready

problems

False

date

2024-10-28T02:14:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST_FE_LINK_3

name

Link to Min Health Test of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e562da8f055682d25ba

testType

id	6393a08a15838700361eec84
code	MIN_HEALTH_TEST
name	Minimal Health Test

runNumber

671ef38dc447bfb7e214f56d

passed

True

state

ready

problems

False

date

2024-10-28T02:14:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST_FE_LINK_4

name

Link to Min Health Test of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e583e14f454f16d2dd4

testType

id	6393a08a15838700361eec84
code	MIN_HEALTH_TEST
name	Minimal Health Test

runNumber

671ef38cc447bfb7e214f55c

passed

True

state

ready

problems

False

date

2024-10-28T02:14:00.000Z

associateChild

None

code

MODULE_OVERVOLTAGE_PROTECTION

name

Overvoltage Protection

dataType

codeTable

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

-1

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code	MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_1
name	Link to Overvoltage Protection of Chip 1
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_2
name	Link to Overvoltage Protection of Chip 2
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_3
name	Link to Overvoltage Protection of Chip 3
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_4
name	Link to Overvoltage Protection of Chip 4
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code

MODULE_PIXEL_FAILURE_ANALYSIS

name

Pixel Failure Analysis

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_1

name

Link to Pixel Failure Analysis of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0ea12da8f055682d2e06

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis

runNumber

671ef735c447bfb7e214f735

passed

False

state

ready

problems

False

date

2024-10-28T02:30:00.000Z

associateChild

None

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_2

name

Link to Pixel Failure Analysis of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e732da8f055682d294c

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis

runNumber

671ef733c447bfb7e214f722

passed

False

state

ready

problems

False

date

2024-10-28T02:30:00.000Z

associateChild

None

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_3

name

Link to Pixel Failure Analysis of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e782da8f055682d2a31

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis

runNumber

671ef733c447bfb7e214f71a

passed

False

state

ready

problems

False

date

2024-10-28T02:30:00.000Z

associateChild

None

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_4

name

Link to Pixel Failure Analysis of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e763e14f454f16d3119

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis

runNumber

671ef737c447bfb7e214f777

passed

False

state

ready

problems

False

date

2024-10-28T02:30:00.000Z

associateChild

None

code MODULE_SLDO
name SLDO
dataType codeTable
valueType single
arrayDimensions None
additional None
rangeMin None
rangeMax None
value 0
associateChild None
codeTable
code value
-1 not there
0 not pass
1 pass

code

MODULE_SLDO_FE_LINK_1

name

Link to SLDO of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0deb2da8f055682d1c3c

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

673cd1872338e8ffa566c2c8

passed

False

state

ready

problems

False

date

2024-10-25T07:26:00.000Z

associateChild

None

code

MODULE_SLDO_FE_LINK_2

name

Link to SLDO of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0de82da8f055682d1bc9

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

673cd1892338e8ffa566c2d5

passed

False

state

ready

problems

False

date

2024-10-25T07:26:00.000Z

associateChild

None

code

MODULE_SLDO_FE_LINK_3

name

Link to SLDO of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0de94386c2105c106bdb

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

673cd18a2338e8ffa566c2e2

passed

False

state

ready

problems

False

date

2024-10-25T07:26:00.000Z

associateChild

None

code

MODULE_SLDO_FE_LINK_4

name

Link to SLDO of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0de92da8f055682d1bf7

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

673cd18c2338e8ffa566c2ef

passed

False

state

ready

problems

False

date

2024-10-25T07:26:00.000Z

associateChild

None

code MODULE_TUNING
name Tuning
dataType codeTable
valueType single
arrayDimensions None
additional None
rangeMin None
rangeMax None
value 0
associateChild None
codeTable
code value
-1 not there
0 not pass
1 pass

code

MODULE_TUNING_FE_LINK_1

name

Link to Tuning of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e084386c2105c106ed2

testType

id	6393a09015838700361eecc5
code	TUNING
name	Tuning

runNumber

671ef5d0c447bfb7e214f61e

passed

False

state

ready

problems

False

date

2024-10-28T02:24:00.000Z

associateChild

None

code

MODULE_TUNING_FE_LINK_2

name

Link to Tuning of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e053e14f454f16d258e

testType

id	6393a09015838700361eecc5
code	TUNING
name	Tuning

runNumber

671ef5ccc447bfb7e214f5e6

passed

False

state

ready

problems

False

date

2024-10-28T02:24:00.000Z

associateChild

None

code

MODULE_TUNING_FE_LINK_3

name

Link to Tuning of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e082da8f055682d1ef3

testType

id	6393a09015838700361eecc5
code	TUNING
name	Tuning

runNumber

671ef5d0c447bfb7e214f603

passed

True

state

ready

problems

False

date

2024-10-28T02:24:00.000Z

associateChild

None

code

MODULE_TUNING_FE_LINK_4

name

Link to Tuning of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0e073e14f454f16d25e6

testType

id	6393a09015838700361eecc5
code	TUNING
name	Tuning

runNumber

671ef5d1c447bfb7e214f668

passed

False

state

ready

problems

False

date

2024-10-28T02:24:00.000Z

associateChild

None

code

MODULE_UNDERSHUNT_PROTECTION

name

Undershunt protection

dataType

codeTable

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

-1

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_1
name	Link to undershunt protection test of chip 1
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_2
name	Link to undershunt protection test of chip 2
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_3
name	Link to undershunt protection test of chip 3
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_4
name	Link to undershunt protection test of chip 4
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code

MODULE_VCAL_CALIBRATION

name

Vcal Calibration

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_VCAL_CALIBRATION_FE_LINK_1

name

Link to Vcal Calibration of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0df44386c2105c106ccd

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

673cd18e2338e8ffa566c2fe

passed

True

state

ready

problems

False

date

2024-10-25T08:03:00.000Z

associateChild

None

code

MODULE_VCAL_CALIBRATION_FE_LINK_2

name

Link to Vcal Calibration of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0df03e14f454f16d2391

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

673cd18f2338e8ffa566c30d

passed

True

state

ready

problems

False

date

2024-10-25T08:03:00.000Z

associateChild

None

code

MODULE_VCAL_CALIBRATION_FE_LINK_3

name

Link to Vcal Calibration of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0df13e14f454f16d23c5

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

673cd1902338e8ffa566c31c

passed

True

state

ready

problems

False

date

2024-10-25T08:03:00.000Z

associateChild

None

code

MODULE_VCAL_CALIBRATION_FE_LINK_4

name

Link to Vcal Calibration of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

673e0df14386c2105c106ca0

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

673cd1912338e8ffa566c32b

passed

True

state

ready

problems

False

date

2024-10-25T08:03:00.000Z

associateChild

None

cts

2024-11-20T16:31:20.715Z

sys

cts	2024-11-20T16:31:20.715Z
mts	2024-11-20T16:31:20.715Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

project

subproject

componentType

type

properties

testedAtStage

institution

64ed37e6c96c32004230ef1f

f0dd42cb70997a03eb37b202e98ea3a1

ready

2023-08-29T00:12:22.218Z

24-779-1

False

None

False

None

20UPGM22601067

None

code	P
name	Pixels

code	PG
name	Pixel general

code	MODULE
name	Module

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

code FECHIP_VERSION
name FE chip version
dataType codeTable
required True
default False
value ITkpix_v1.1
codeTable
code value
0 RD53A
1 ITkpix_v1
2 ITkpix_v1.1
3 ITkpix_v2
9 No FE chip
code ORIENTATION
name PCB-Bare Orientation isNormal
dataType boolean
required True
default False
value True

code	MODULE/FINAL_COLD
name	Final Cold
order	15
initial	False
final	False

code	HR
name	Hayashi-Repic Co.

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
673ffc…54e552	MODULE/ASSEMBLY	QUAD_MODULE_METROLOGY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671b2b…6c0045	MODULE/FINAL_COLD	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c404	MODULE/FINAL_COLD	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719d8…6bffe7	MODULE/FINAL_WARM	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c29e	MODULE/FINAL_WARM	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719d3…6bffdc	MODULE/LONG_TERM_STABILITY_TEST	LONG_TERM_STABILITY_DCS	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
6719b4…6bffc4	MODULE/LONG_TERM_STABILITY_TEST	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c11c	MODULE/LONG_TERM_STABILITY_TEST	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719a0…6bffae	MODULE/THERMAL_CYCLES	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
67199c…6bffa8	MODULE/THERMAL_CYCLES	FLATNESS	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671709…14715f	MODULE/THERMAL_CYCLES	THERMAL_CYCLING	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c0f2	MODULE/THERMAL_CYCLES	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673d7f…f0e700	MODULE/WIREBONDING	WIREBOND_PULL_TEST	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
64eee2…74db3f	MODULE/WIREBONDING	WIREBONDING	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
66784b…d1d752	MODULE/INITIAL_WARM	IV_MEASURE	HideyukiOide	N/A	a year ago	No tags	Selected
64eee5…74db58	MODULE/WIREBONDING	VISUAL_INSPECTION	HideyukiOide	N/A	a year ago	No tags	Selected
64ee92…74ca61	MODULE/ASSEMBLY	VISUAL_INSPECTION	HideyukiOide	N/A	a year ago	No tags	Selected
64eee1…74db19	MODULE/ASSEMBLY	GLUE_MODULE_FLEX_ATTACH	HideyukiOide	N/A	a year ago	No tags	Selected
64eee0…74db15	MODULE/ASSEMBLY	MASS_MEASUREMENT	HideyukiOide	N/A	a year ago	No tags	Selected
66784b…d1d74d	MODULE/INITIAL_WARM	E_SUMMARY	HideyukiOide	N/A	a year ago	No tags	Selected

Stage	Tests
MODULE/INIT
MODULE/ASSEMBLY	Mass Measurement (MASS_MEASUREMENT) Glue Information Module+Flex Attach (GLUE_MODULE_FLEX_ATTACH) Triplet Module Metrology (TRIPLET_METROLOGY) Visual Inspection (VISUAL_INSPECTION) Flatness (FLATNESS) Quad Module Metrology (QUAD_MODULE_METROLOGY)
MODULE/WIREBONDING	Wirebonding Information (WIREBONDING) Wirebond pull test (WIREBOND_PULL_TEST) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY)
MODULE/INITIAL_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/QC_CROSSCHECK	IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY) Visual Inspection (VISUAL_INSPECTION)
MODULE/INITIAL_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/PARYLENE_MASKING	Visual Inspection (VISUAL_INSPECTION) Parylene (de-)masking (DE_MASKING) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY)
MODULE/PARYLENE_COATING	Parylene Properties (PARYLENE) Visual Inspection (VISUAL_INSPECTION)
MODULE/PARYLENE_UNMASKING	Flatness (FLATNESS) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY) Parylene (de-)masking (DE_MASKING)
MODULE/WIREBOND_PROTECTION	Electrical Test (e-test) Module Summary (E_SUMMARY) Wire bonding protection roof envelope (WP_ENVELOPE) Mass Measurement (MASS_MEASUREMENT) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE)
MODULE/POST_PARYLENE_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/POST_PARYLENE_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/THERMAL_CYCLES	Electrical Test (e-test) Module Summary (E_SUMMARY) Thermal Cycling (THERMAL_CYCLING) Flatness (FLATNESS) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE)
MODULE/LONG_TERM_STABILITY_TEST	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Longterm stability DCS (LONG_TERM_STABILITY_DCS)
MODULE/FINAL_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/FINAL_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/FINAL_METROLOGY	Flatness (FLATNESS) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY)
MODULE/QC_STATUS	Module ranking (RANKING)
MODULE/UNHAPPY	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Visual Inspection (VISUAL_INSPECTION) Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/TAB_CUTTING	Mass Measurement (MASS_MEASUREMENT) Module PCB Tab Cutting Information (CUTTER_PCB_TAB) Visual Inspection (VISUAL_INSPECTION) Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
LLS/PRE_TC_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/PRE_TC_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/POST_TC_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/POST_TC_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/RECEPTION	Electrical Test (e-test) Module Summary (E_SUMMARY)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
OB_LOADED_MODULE_CELL/FINAL_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
OB_LOADED_MODULE_CELL/THERMAL_COLD	Thermal Measure (THERMAL_PERFORMANCE)
OB_LOADED_MODULE_CELL/THERMAL_WARM	Thermal Measure (THERMAL_PERFORMANCE)
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Module PCB Tab Cutting Information (CUTTER_PCB_TAB)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Longterm stability DCS (LONG_TERM_STABILITY_DCS)	Registered	Registered

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
Flatness (FLATNESS)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Thermal Cycling (THERMAL_CYCLING)	Registered	Registered
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

20UPGM22601067

MODULE/COMPLETE

Component Information

Distribution of chips on wafer

Properties

Comments

Test: E_SUMMARY QC Failed

(Stage: MODULE/FINAL_COLD)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results
Compact

ProductionDB Record

Current Stage: Module Complete

Past QC Stages and Results

Module graveyard - damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Module unhappy - failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

All Registered QC Tests

Check QC Flow

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Test	Local Result	ProdDB Record
Parylene (de-)masking (DE_MASKING)	No result	N/A
Electrical Test (e-test) Module Summary (E_SUMMARY)	No result	N/A
Flatness (FLATNESS)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Parylene Properties (PARYLENE)	No result	N/A
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Flatness (FLATNESS)	No result	N/A
Glue Information Module+Flex Attach (GLUE_MODULE_FLEX_ATTACH)	Registered	Registered
Mass Measurement (MASS_MEASUREMENT)	Registered	Registered
Quad Module Metrology (QUAD_MODULE_METROLOGY)	Registered	Registered
Triplet Module Metrology (TRIPLET_METROLOGY)	No result	N/A
Visual Inspection (VISUAL_INSPECTION)	Registered	Registered

20UPGM22601067

MODULE/COMPLETE

Component Information

Distribution of chips on wafer

Properties

Comments

Test: E_SUMMARY QC Failed

(Stage: MODULE/FINAL_COLD)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results Compact

ProductionDB Record

Current Stage: Module Complete

Past QC Stages and Results

Module graveyard - damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Module unhappy - failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

All Registered QC Tests

Check QC Flow

Back to top page of this component

Results
Compact