Database for ITk Pixel Module

Serial Number	20UPGM22601067
ProdDB ID	f0dd42…8ea3a1
LocalDB ID	64ed37e6c96c32004230ef1f
Component Type	MODULE
Parents	No match.
Children	20UPGB42307034 Bare Module 20UPGPQ2601067 PCB 20UPGFC0099706 FE Chip 20UPGFC0099686 FE Chip 20UPGFC0099675 FE Chip 20UPGFC0099668 FE Chip
Flags

Item	Value
FE chip version	2
PCB-Bare Orientation isNormal	True
Wirebond protection roof presence	None
Alternative ID	None
Rank	None
Is preproduction module	None

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	64ed37e6c96c32004230ef1f
Stage	MODULE/INITIAL_WARM
Test Type	E_SUMMARY
Institute ObjectId
User Name	HideyukiOide
ObjectId of this record	66784be4ec2504ee0fd1d74d
ObjectId of RAW record	None

Key	Data
ANALYSIS_VERSION	localdb-tools v2.2.23-rc5
MODULE_TEMPERATURE	20
QUAD-MODULE_ADC_CALIBRATION	1 2 3 4
QUAD-MODULE_ANALOG_READBACK	1 2 3 4
MODULE_BAD_PIXEL_NUMBER	N/A
QUAD-MODULE_DATA_TRANSMISSION	1 2 3 4
MODULE_DISCONNECTED_PIXEL_NUMBER	N/A
MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER	N/A
MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A
QUAD-MODULE_INJECTION_CAPACITANCE	1 2 3 4
QUAD-MODULE_LP_MODE	1 2 3 4
QUAD-MODULE_MIN_HEALTH_TEST	1 2 3 4
MODULE_OVERVOLTAGE_PROTECTION	0
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_1	20UPGFC0099706 : Passed (v2.2.4)
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_2	20UPGFC0099686 : Passed (v2.2.4)
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_3	20UPGFC0099675 : Failed (v2.2.4)
MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_4	20UPGFC0099668 : Failed (v2.2.4)
QUAD-MODULE_PIXEL_FAILURE_ANALYSIS	1 2 3 4
QUAD-MODULE_SLDO	1 2 3 4
QUAD-MODULE_TUNING	1 2 3 4
MODULE_UNDERSHUNT_PROTECTION	-1
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_1	N/A
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_2	N/A
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_3	N/A
MODULE_UNDERSHUNT_PROTECTION_FE_LINK_4	N/A
QUAD-MODULE_VCAL_CALIBRATION	1 2 3 4

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	N/A
ELECTRICALLY_BAD_PIXEL_NUMBER	N/A
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	N/A
ELECTRICALLY_BAD_PIXEL_NUMBER	N/A
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	N/A
ELECTRICALLY_BAD_PIXEL_NUMBER	N/A
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Key	Data
BAD_PIXEL_NUMBER	N/A
DISCONNECTED_PIXEL_NUMBER	N/A
ELECTRICALLY_BAD_PIXEL_NUMBER	N/A
HIGHEST_NUMBER_BAD_PIXELS_CLUSTER	N/A

Expand ProductionDB Record

667927dcadfd0f003544c34b

state

ready

stateTs

2024-06-24T08:01:32.069Z

stateUserIdentity

24-6238-1

date

2024-06-23T16:23:00.000Z

testType

id	6393a0a915838700361eedc0
code	E_SUMMARY
name	Electrical Test (e-test) Module Summary
state	active

institution

id	64229fe1b8fd040036839f29
code	HR
name	Hayashi-Repic Co.

user

id	5d14d2eb8c0a21000956c8f6
userIdentity	24-6238-1
firstName	Hideyuki
middleName
lastName	Oide

runNumber

66784be4ec2504ee0fd1d74d

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version used to generate summary	string	None	True	2.2.23-rc5	None	None
MODULE_TEMPERATURE	Required temperature	float	None	True	20	None	None

results

code

MODULE_ADC_CALIBRATION

name

ADC Calibration

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_ADC_CALIBRATION_FE_LINK_1

name

Link to ADC Calibration of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792757adfd0f003544bf2f

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

66784aedec2504ee0fd1d5bd

passed

True

state

ready

problems

False

date

2023-08-31T01:44:00.000Z

associateChild

None

code

MODULE_ADC_CALIBRATION_FE_LINK_2

name

Link to ADC Calibration of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792757ead3ed0035f30049

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

66784af5ec2504ee0fd1d5c6

passed

True

state

ready

problems

False

date

2023-08-31T01:44:00.000Z

associateChild

None

code

MODULE_ADC_CALIBRATION_FE_LINK_3

name

Link to ADC Calibration of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792757adfd0f003544bf41

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

66784afdec2504ee0fd1d5cf

passed

True

state

ready

problems

False

date

2023-08-31T01:44:00.000Z

associateChild

None

code

MODULE_ADC_CALIBRATION_FE_LINK_4

name

Link to ADC Calibration of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

66792757adfd0f003544bf39

testType

id	6393a06f15838700361eeb5c
code	ADC_CALIBRATION
name	ADC Calibration

runNumber

66784b06ec2504ee0fd1d5d8

passed

True

state

ready

problems

False

date

2023-08-31T01:44:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK

name

Analog Readback

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_ANALOG_READBACK_FE_LINK_1

name

Link to Analog Readback of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792761ead3ed0035f3007d

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

66784b57ec2504ee0fd1d66c

passed

False

state

ready

problems

False

date

2023-08-31T01:54:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK_FE_LINK_2

name

Link to Analog Readback of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679276bead3ed0035f300c9

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

66784b64ec2504ee0fd1d690

passed

False

state

ready

problems

False

date

2023-08-31T02:04:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK_FE_LINK_3

name

Link to Analog Readback of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792762adfd0f003544bf77

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

66784b71ec2504ee0fd1d6b4

passed

False

state

ready

problems

False

date

2023-08-31T02:13:00.000Z

associateChild

None

code

MODULE_ANALOG_READBACK_FE_LINK_4

name

Link to Analog Readback of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679276aead3ed0035f300b0

testType

id	6393a07c15838700361eebef
code	ANALOG_READBACK
name	Analog Readback

runNumber

66784b7eec2504ee0fd1d6d8

passed

False

state

ready

problems

False

date

2023-08-31T02:54:00.000Z

associateChild

None

code MODULE_BAD_PIXEL_NUMBER
name Number of bad pixels
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_1
name Number of bad pixels for Chip 1
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_2
name Number of bad pixels for Chip 2
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_3
name Number of bad pixels for Chip 3
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_BAD_PIXEL_NUMBER_FE_4
name Number of bad pixels for Chip 4
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None

code

MODULE_DATA_TRANSMISSION

name

Data transmission

dataType

codeTable

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

-1

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code MODULE_DATA_TRANSMISSION_FE_LINK_1
name Link to data transmission test of chip 1
dataType testRun
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DATA_TRANSMISSION_FE_LINK_2
name Link to data transmission test of chip 2
dataType testRun
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DATA_TRANSMISSION_FE_LINK_3
name Link to data transmission test of chip 3
dataType testRun
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DATA_TRANSMISSION_FE_LINK_4
name Link to data transmission test of chip 4
dataType testRun
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER
name Number of disconnected pixels
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_1
name Number of disconnected pixels for Chip 1
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_2
name Number of disconnected pixels for Chip 2
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_3
name Number of disconnected pixels for Chip 3
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_DISCONNECTED_PIXEL_NUMBER_FE_4
name Number of disconnected pixels for Chip 4
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None
code MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER
name Number of electrically bad pixels
dataType integer
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value None
associateChild None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_1
name	Number of electrically bad pixels for Chip 1
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_2
name	Number of electrically bad pixels for Chip 2
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_3
name	Number of electrically bad pixels for Chip 3
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_ELECTRICALLY_BAD_PIXEL_NUMBER_FE_4
name	Number of electrically bad pixels for Chip 4
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER
name	Highest number of bad pixels in a cluster
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_1
name	Highest number of bad pixels in a cluster for Chip 1
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_2
name	Highest number of bad pixels in a cluster for Chip 2
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_3
name	Highest number of bad pixels in a cluster for Chip 3
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_HIGHEST_NUMBER_BAD_PIXELS_CLUSTER_FE_4
name	Highest number of bad pixels in a cluster for Chip 4
dataType	integer
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code

MODULE_INJECTION_CAPACITANCE

name

Injection Capacitance

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_1

name

Link to Injection Capacitance of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679279eadfd0f003544c0e4

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784bcaec2504ee0fd1d71d

passed

True

state

ready

problems

False

date

2023-08-31T04:34:00.000Z

associateChild

None

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_2

name

Link to Injection Capacitance of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927acead3ed0035f302f1

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784bd2ec2504ee0fd1d72a

passed

True

state

ready

problems

False

date

2023-08-31T04:34:00.000Z

associateChild

None

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_3

name

Link to Injection Capacitance of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679279dadfd0f003544c0d9

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784bdcec2504ee0fd1d737

passed

True

state

ready

problems

False

date

2023-08-31T04:34:00.000Z

associateChild

None

code

MODULE_INJECTION_CAPACITANCE_FE_LINK_4

name

Link to Injection Capacitance of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code MODULE_LP_MODE
name Low Power Mode
dataType codeTable
valueType single
arrayDimensions None
additional False
rangeMin None
rangeMax None
value 0
associateChild None
codeTable
code value
-1 not there
0 not pass
1 pass

code

MODULE_LP_MODE_FE_LINK_1

name

Link to Low Power Mode of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792790ead3ed0035f301a4

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

66784b87ec2504ee0fd1d6df

passed

False

state

ready

problems

False

date

2023-08-31T05:25:00.000Z

associateChild

None

code

MODULE_LP_MODE_FE_LINK_2

name

Link to Low Power Mode of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679279eead3ed0035f30250

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

66784b90ec2504ee0fd1d6e6

passed

False

state

ready

problems

False

date

2023-08-31T05:25:00.000Z

associateChild

None

code

MODULE_LP_MODE_FE_LINK_3

name

Link to Low Power Mode of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679278fead3ed0035f3018d

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

66784b98ec2504ee0fd1d6ed

passed

False

state

ready

problems

False

date

2023-08-31T05:25:00.000Z

associateChild

None

code

MODULE_LP_MODE_FE_LINK_4

name

Link to Low Power Mode of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679279eadfd0f003544c0ef

testType

id	6393a08415838700361eec49
code	LP_MODE
name	Low Power Mode

runNumber

66784ba1ec2504ee0fd1d6f4

passed

False

state

ready

problems

False

date

2023-08-31T05:25:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST

name

Min Health Test

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_MIN_HEALTH_TEST_FE_LINK_1

name

Link to Min Health Test of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST_FE_LINK_2

name

Link to Min Health Test of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST_FE_LINK_3

name

Link to Min Health Test of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_MIN_HEALTH_TEST_FE_LINK_4

name

Link to Min Health Test of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_OVERVOLTAGE_PROTECTION

name

Overvoltage Protection

dataType

codeTable

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_1

name

Link to Overvoltage Protection of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792795adfd0f003544c082

testType

id	6393a08615838700361eec62
code	OVERVOLTAGE_PROTECTION
name	Overvoltage Protection

runNumber

66784baaec2504ee0fd1d6fb

passed

True

state

ready

problems

False

date

2023-08-31T04:39:00.000Z

associateChild

None

code

MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_2

name

Link to Overvoltage Protection of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927a4ead3ed0035f3028a

testType

id	6393a08615838700361eec62
code	OVERVOLTAGE_PROTECTION
name	Overvoltage Protection

runNumber

66784bb2ec2504ee0fd1d702

passed

True

state

ready

problems

False

date

2023-08-31T04:39:00.000Z

associateChild

None

code

MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_3

name

Link to Overvoltage Protection of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792794ead3ed0035f301f9

testType

id	6393a08615838700361eec62
code	OVERVOLTAGE_PROTECTION
name	Overvoltage Protection

runNumber

66784bbaec2504ee0fd1d709

passed

False

state

ready

problems

False

date

2023-08-31T04:39:00.000Z

associateChild

None

code

MODULE_OVERVOLTAGE_PROTECTION_FE_LINK_4

name

Link to Overvoltage Protection of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927a4adfd0f003544c12b

testType

id	6393a08615838700361eec62
code	OVERVOLTAGE_PROTECTION
name	Overvoltage Protection

runNumber

66784bc1ec2504ee0fd1d710

passed

False

state

ready

problems

False

date

2023-08-31T04:39:00.000Z

associateChild

None

code

MODULE_PIXEL_FAILURE_ANALYSIS

name

Pixel Failure Analysis

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_1

name

Link to Pixel Failure Analysis of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_2

name

Link to Pixel Failure Analysis of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_3

name

Link to Pixel Failure Analysis of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_PIXEL_FAILURE_ANALYSIS_FE_LINK_4

name

Link to Pixel Failure Analysis of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code MODULE_SLDO
name SLDO
dataType codeTable
valueType single
arrayDimensions None
additional None
rangeMin None
rangeMax None
value 0
associateChild None
codeTable
code value
-1 not there
0 not pass
1 pass

code

MODULE_SLDO_FE_LINK_1

name

Link to SLDO of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792774ead3ed0035f300fa

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

66784b0fec2504ee0fd1d5e5

passed

False

state

ready

problems

False

date

2023-08-31T03:13:00.000Z

associateChild

None

code

MODULE_SLDO_FE_LINK_2

name

Link to SLDO of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679277eead3ed0035f30150

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

66784b17ec2504ee0fd1d5f2

passed

False

state

ready

problems

False

date

2023-08-31T03:22:00.000Z

associateChild

None

code

MODULE_SLDO_FE_LINK_3

name

Link to SLDO of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792773adfd0f003544bfc8

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

66784b20ec2504ee0fd1d5ff

passed

False

state

ready

problems

False

date

2023-08-31T03:34:00.000Z

associateChild

None

code

MODULE_SLDO_FE_LINK_4

name

Link to SLDO of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792787adfd0f003544c014

testType

id	6393a07115838700361eeb71
code	SLDO
name	SLDO

runNumber

66784b28ec2504ee0fd1d60c

passed

False

state

ready

problems

False

date

2023-08-31T03:44:00.000Z

associateChild

None

code MODULE_TUNING
name Tuning
dataType codeTable
valueType single
arrayDimensions None
additional None
rangeMin None
rangeMax None
value 1
associateChild None
codeTable
code value
-1 not there
0 not pass
1 pass

code

MODULE_TUNING_FE_LINK_1

name

Link to Tuning of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_TUNING_FE_LINK_2

name

Link to Tuning of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_TUNING_FE_LINK_3

name

Link to Tuning of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_TUNING_FE_LINK_4

name

Link to Tuning of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

667927adadfd0f003544c186

testType

id	6393a08815838700361eec73
code	INJECTION_CAPACITANCE
name	Injection Capacitance

runNumber

66784be4ec2504ee0fd1d744

passed

True

state

ready

problems

False

date

2023-08-31T05:23:00.000Z

associateChild

None

code

MODULE_UNDERSHUNT_PROTECTION

name

Undershunt protection

dataType

codeTable

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

-1

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_1
name	Link to undershunt protection test of chip 1
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_2
name	Link to undershunt protection test of chip 2
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_3
name	Link to undershunt protection test of chip 3
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code	MODULE_UNDERSHUNT_PROTECTION_FE_LINK_4
name	Link to undershunt protection test of chip 4
dataType	testRun
valueType	single
arrayDimensions	None
additional	False
rangeMin	None
rangeMax	None
value	None
associateChild	None

code

MODULE_VCAL_CALIBRATION

name

Vcal Calibration

dataType

codeTable

valueType

single

arrayDimensions

None

additional

None

rangeMin

None

rangeMax

None

value

associateChild

None

codeTable

code	value
-1	not there
0	not pass
1	pass

code

MODULE_VCAL_CALIBRATION_FE_LINK_1

name

Link to Vcal Calibration of Chip 1

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679277dead3ed0035f3013d

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

66784b30ec2504ee0fd1d61b

passed

True

state

ready

problems

False

date

2023-08-31T04:17:00.000Z

associateChild

None

code

MODULE_VCAL_CALIBRATION_FE_LINK_2

name

Link to Vcal Calibration of Chip 2

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792792ead3ed0035f301c6

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

66784b38ec2504ee0fd1d62a

passed

True

state

ready

problems

False

date

2023-08-31T04:17:00.000Z

associateChild

None

code

MODULE_VCAL_CALIBRATION_FE_LINK_3

name

Link to Vcal Calibration of Chip 3

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

6679277bead3ed0035f30123

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

66784b41ec2504ee0fd1d639

passed

True

state

ready

problems

False

date

2023-08-31T04:17:00.000Z

associateChild

None

code

MODULE_VCAL_CALIBRATION_FE_LINK_4

name

Link to Vcal Calibration of Chip 4

dataType

testRun

valueType

single

arrayDimensions

None

additional

False

rangeMin

None

rangeMax

None

value

66792792ead3ed0035f301d8

testType

id	6393a07815838700361eebc0
code	VCAL_CALIBRATION
name	VCAL Calibration

runNumber

66784b4bec2504ee0fd1d648

passed

True

state

ready

problems

False

date

2023-08-31T04:17:00.000Z

associateChild

None

cts

2024-06-24T08:01:32.072Z

sys

cts	2024-06-24T08:01:32.072Z
mts	2024-06-24T08:01:32.072Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

trashedUserIdentity

serialNumber

alternativeIdentifier

project

subproject

componentType

type

properties

testedAtStage

institution

64ed37e6c96c32004230ef1f

f0dd42cb70997a03eb37b202e98ea3a1

ready

2023-08-29T00:12:22.218Z

24-779-1

False

None

False

None

20UPGM22601067

None

code	P
name	Pixels

code	PG
name	Pixel general

code	MODULE
name	Module

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

code FECHIP_VERSION
name FE chip version
dataType codeTable
required True
default False
value ITkpix_v1.1
codeTable
code value
0 RD53A
1 ITkpix_v1
2 ITkpix_v1.1
3 ITkpix_v2
9 No FE chip
code ORIENTATION
name PCB-Bare Orientation isNormal
dataType boolean
required True
default False
value True

code	MODULE/INITIAL_WARM
name	Initial Warm
order	3
initial	False
final	False

code	HR
name	Hayashi-Repic Co.

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
673ffc…54e552	MODULE/ASSEMBLY	QUAD_MODULE_METROLOGY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671b2b…6c0045	MODULE/FINAL_COLD	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c404	MODULE/FINAL_COLD	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719d8…6bffe7	MODULE/FINAL_WARM	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c29e	MODULE/FINAL_WARM	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719d3…6bffdc	MODULE/LONG_TERM_STABILITY_TEST	LONG_TERM_STABILITY_DCS	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
6719b4…6bffc4	MODULE/LONG_TERM_STABILITY_TEST	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c11c	MODULE/LONG_TERM_STABILITY_TEST	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719a0…6bffae	MODULE/THERMAL_CYCLES	IV_MEASURE	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
67199c…6bffa8	MODULE/THERMAL_CYCLES	FLATNESS	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671709…14715f	MODULE/THERMAL_CYCLES	THERMAL_CYCLING	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c0f2	MODULE/THERMAL_CYCLES	E_SUMMARY	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673d7f…f0e700	MODULE/WIREBONDING	WIREBOND_PULL_TEST	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
64eee2…74db3f	MODULE/WIREBONDING	WIREBONDING	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
66784b…d1d752	MODULE/INITIAL_WARM	IV_MEASURE	HideyukiOide	N/A	a year ago	No tags	Selected
64eee5…74db58	MODULE/WIREBONDING	VISUAL_INSPECTION	HideyukiOide	N/A	a year ago	No tags	Selected
64ee92…74ca61	MODULE/ASSEMBLY	VISUAL_INSPECTION	HideyukiOide	N/A	a year ago	No tags	Selected
64eee1…74db19	MODULE/ASSEMBLY	GLUE_MODULE_FLEX_ATTACH	HideyukiOide	N/A	a year ago	No tags	Selected
64eee0…74db15	MODULE/ASSEMBLY	MASS_MEASUREMENT	HideyukiOide	N/A	a year ago	No tags	Selected
66784b…d1d74d	MODULE/INITIAL_WARM	E_SUMMARY	HideyukiOide	N/A	a year ago	No tags	Selected

Stage	Tests
MODULE/INIT
MODULE/ASSEMBLY	Mass Measurement (MASS_MEASUREMENT) Glue Information Module+Flex Attach (GLUE_MODULE_FLEX_ATTACH) Triplet Module Metrology (TRIPLET_METROLOGY) Visual Inspection (VISUAL_INSPECTION) Flatness (FLATNESS) Quad Module Metrology (QUAD_MODULE_METROLOGY)
MODULE/WIREBONDING	Wirebonding Information (WIREBONDING) Wirebond pull test (WIREBOND_PULL_TEST) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY)
MODULE/INITIAL_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/QC_CROSSCHECK	IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY) Visual Inspection (VISUAL_INSPECTION)
MODULE/INITIAL_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/PARYLENE_MASKING	Visual Inspection (VISUAL_INSPECTION) Parylene (de-)masking (DE_MASKING) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY)
MODULE/PARYLENE_COATING	Parylene Properties (PARYLENE) Visual Inspection (VISUAL_INSPECTION)
MODULE/PARYLENE_UNMASKING	Flatness (FLATNESS) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY) Parylene (de-)masking (DE_MASKING)
MODULE/WIREBOND_PROTECTION	Electrical Test (e-test) Module Summary (E_SUMMARY) Wire bonding protection roof envelope (WP_ENVELOPE) Mass Measurement (MASS_MEASUREMENT) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE)
MODULE/POST_PARYLENE_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/POST_PARYLENE_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/THERMAL_CYCLES	Electrical Test (e-test) Module Summary (E_SUMMARY) Thermal Cycling (THERMAL_CYCLING) Flatness (FLATNESS) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE)
MODULE/LONG_TERM_STABILITY_TEST	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Longterm stability DCS (LONG_TERM_STABILITY_DCS)
MODULE/FINAL_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/FINAL_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Visual Inspection (VISUAL_INSPECTION)
MODULE/FINAL_METROLOGY	Flatness (FLATNESS) Visual Inspection (VISUAL_INSPECTION) IV measurement (IV_MEASURE) Electrical Test (e-test) Module Summary (E_SUMMARY)
MODULE/QC_STATUS	Module ranking (RANKING)
MODULE/UNHAPPY	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Visual Inspection (VISUAL_INSPECTION) Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
MODULE/TAB_CUTTING	Mass Measurement (MASS_MEASUREMENT) Module PCB Tab Cutting Information (CUTTER_PCB_TAB) Visual Inspection (VISUAL_INSPECTION) Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
LLS/PRE_TC_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/PRE_TC_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/POST_TC_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/POST_TC_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY)
LLS/RECEPTION	Electrical Test (e-test) Module Summary (E_SUMMARY)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
OB_LOADED_MODULE_CELL/FINAL_COLD	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
OB_LOADED_MODULE_CELL/THERMAL_COLD	Thermal Measure (THERMAL_PERFORMANCE)
OB_LOADED_MODULE_CELL/THERMAL_WARM	Thermal Measure (THERMAL_PERFORMANCE)
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Electrical Test (e-test) Module Summary (E_SUMMARY) IV measurement (IV_MEASURE) Module PCB Tab Cutting Information (CUTTER_PCB_TAB)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Longterm stability DCS (LONG_TERM_STABILITY_DCS)	Registered	Registered

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
Flatness (FLATNESS)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered
Thermal Cycling (THERMAL_CYCLING)	Registered	Registered
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Electrical Test (e-test) Module Summary (E_SUMMARY)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

20UPGM22601067

MODULE/COMPLETE

Component Information

Distribution of chips on wafer

Properties

Comments

Test: E_SUMMARY QC Failed

(Stage: MODULE/INITIAL_WARM)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results
Compact

ProductionDB Record

Current Stage: Module Complete

Past QC Stages and Results

Module graveyard - damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Module unhappy - failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

All Registered QC Tests

Check QC Flow

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Test	Local Result	ProdDB Record
Parylene (de-)masking (DE_MASKING)	No result	N/A
Electrical Test (e-test) Module Summary (E_SUMMARY)	No result	N/A
Flatness (FLATNESS)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Parylene Properties (PARYLENE)	No result	N/A
Visual Inspection (VISUAL_INSPECTION)	No result	N/A

Test	Local Result	ProdDB Record
Flatness (FLATNESS)	No result	N/A
Glue Information Module+Flex Attach (GLUE_MODULE_FLEX_ATTACH)	Registered	Registered
Mass Measurement (MASS_MEASUREMENT)	Registered	Registered
Quad Module Metrology (QUAD_MODULE_METROLOGY)	Registered	Registered
Triplet Module Metrology (TRIPLET_METROLOGY)	No result	N/A
Visual Inspection (VISUAL_INSPECTION)	Registered	Registered

20UPGM22601067

MODULE/COMPLETE

Component Information

Distribution of chips on wafer

Properties

Comments

Test: E_SUMMARY QC Failed

(Stage: MODULE/INITIAL_WARM)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results Compact

ProductionDB Record

Current Stage: Module Complete

Past QC Stages and Results

Module graveyard - damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Module unhappy - failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

All Registered QC Tests

Check QC Flow

Back to top page of this component

Results
Compact