Database for ITk Pixel Module

Serial Number	20UPGS33300781
ProdDB ID	895627…388f00
LocalDB ID	64b93d2bc8312c0042b297aa
Component Type	SENSOR_TILE
Parents	20UPGB42200047
Children	No match.
Flags

Item	Value
Main Vendor readonly	3
Sensor Type or Test Structure readonly	3
Version of component	pre-production
Scratch id (to be used if not the same as agreed manufacturer ID)
Alternative Identifier	V4-1-143822-3-006
Original Manufacturer ID	Q6
Depletion Voltage (V)	51.85097133267797
Breakdown Voltage (-999 if no breakdown occurred)	None

Key	Data
QC Passed	True
Date	2 years ago
component ObjectId	64b93d2bc8312c0042b297aa
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	JennyLunde
ObjectId of this record	655dcbe5e7aee500385a8aed
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vwebApp
HUM	47.400000000000006
TEMP	20.700000000000003
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'current': [0.0006151845, 0.88606499, 1.0071189999999999, 1.0818808, 1.134567, 1.1757707, 1.2080088, 1.2370834, 1.2593641999999998, 1.2779846, 1.296108, 1.3121467, 1.3230301, 1.335361, 1.3497711, 1.3599982999999998, 1.3683172000000001, 1.3756054000000002, 1.384778, 1.3922644, 1.3994327, 1.4041309000000002, 1.4090789000000001, 1.4147452, 1.4170738999999999, 1.4212541, 1.4237958, 1.4288360999999998, 1.4328484000000001, 1.4355396, 1.4380504, 1.4403048, 1.4450855, 1.4486589, 1.4486914, 1.4515711999999998, 1.4560584, 1.4581057, 1.460925, 1.4618457, 1.4638375], 'sigma current': [0.00037980804363469073, 0.004289877887267515, 0.0032139191029022587, 0.002483873086756096, 0.003325816725090114, 0.0024456399321604824, 0.0024489761035084772, 0.0018298582337316746, 0.002545739351238537, 0.0017693371765846438, 0.001094668899713524, 0.0019939984425492896, 0.001634131332271426, 0.001112894424462668, 0.001470767482945191, 0.0011030896055070458, 0.0016213903361689973, 0.0017775556375102344, 0.0014640888710123364, 0.001274726741959519, 0.001144819932468751, 0.0015475503545927098, 0.0010288052887802842, 0.0009721774872247274, 0.001412456603069837, 0.0008515750700907069, 0.0009565198261289225, 0.0009877520437842576, 0.0010665590779074011, 0.0011653928474505972, 0.001269460795421107, 0.0009174367432023602, 0.000973215660695109, 0.0008723533241882312, 0.002147772344650287, 0.0008839610096981934, 0.001046058655674268, 0.0008405873673938723, 0.0024667881952044695, 0.0009019881805089362, 0.0013648909805873976], 'temperature': [20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7, 20.7], 'humidity': [47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4, 47.4]}
LEAK_CURRENT	1.4170738999999999
MAXIMUM_VOLTAGE	200
NO_BREAKDOWN_VOLTAGE_OBSERVED	True

ProductionDB Record

Current Stage: Module reception

No tests are allocated for this stage.

Past QC Stages and Results

Module Complete (MODULE/COMPLETE)

Module damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	Registered	Registered
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
655dcb…5a8aed	BAREMODULERECEPTION	IV_MEASURE	JennyLunde	N/A	2 years ago	No tags	Selected
64ba58…379dff	sensor_manufacturer	IV_MEASURE	HuaYe	N/A	2 years ago	No tags	Selected
64ba56…b6a93b	sensor_manufacturer	CV_MEASURE	HuaYe	N/A	2 years ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS33300781

MODULE/RECEPTION

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Module reception

Past QC Stages and Results

Module Complete (MODULE/COMPLETE)

Module damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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