20UPGM22601022

MODULE/INITIAL_WARM

Component Information

Serial Number 20UPGM22601022
ProdDB ID  f19318…ef0a81
LocalDB ID 6498f97f6a25bf0042ebdd98
Component Type MODULE
Parents No match.
Children 20UPGB42302001 Bare Module 20UPGFC0088388 FE Chip 20UPGFC0088424 FE Chip 20UPGFC0088361 FE Chip 20UPGFC0088503 FE Chip 20UPGB42302001 Bare Module 20UPGFC0088388 FE Chip 20UPGFC0088424 FE Chip 20UPGFC0088361 FE Chip 20UPGFC0088503 FE Chip 20UPGPQ2601022 PCB
Flags
Distribution of chips on wafer

 Properties

Item Value
FE chip version 2
PCB-Bare Orientation isNormal True
Wirebond protection roof presence None
IREF Trim Bit FE1 deleted None
IREF Trim Bit FE2 deleted None
IREF Trim Bit FE3 deleted None
IREF Trim Bit FE4 deleted None

 Comments


Test: VISUAL_INSPECTION QC Passed

(Stage: MODULE/ASSEMBLY)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2 years ago
component ObjectId 6498f97f6a25bf0042ebdd98
Stage MODULE/ASSEMBLY
Test Type VISUAL_INSPECTION
Institute ObjectId
User Name HideyukiOide
ObjectId of this record 64a22196dbbafc456df90284
ObjectId of RAW record None
Tags No tags

Results

Key Data
ANALYSIS_VERSION mqat v1.0.6
FE_CHIP_CONDITION_PASSED_QC 2
GLUE_DISTRIBUTION_PASSED_QC 2
PARYLENE_COATING_PASSED_QC 1
SENSOR_CONDITION_PASSED_QC 2
SMD_COMPONENTS_PASSED_QC 1
WIREBONDING_PASSED_QC 1

ProductionDB Record

id6527554c209cd500424803e1
stateready
stateTs2023-10-12T02:09:16.469Z
stateUserIdentity24-6238-1
date2023-10-10T00:50:00.000Z
testType
id6418292ae43ca10038f30f84
codeVISUAL_INSPECTION
nameVisual Inspection
stateactive
institution
id64229fe1b8fd040036839f29
codeHR
nameHayashi-Repic Co.
user
id5d14d2eb8c0a21000956c8f6
userIdentity24-6238-1
firstNameHideyuki
middleName
lastNameOide
runNumber64a22196dbbafc456df90284
passedTrue
problemsFalse
properties
codenamedataTypevalueTyperequiredvaluerangeMinrangeMax
ANALYSIS_VERSIONAnalysis VersionstringsingleFalse1.0.6NoneNone
results
codenamedataTypevalueTypearrayDimensionsadditionalrangeMinrangeMaxvalueassociateChild
FE_CHIP_CONDITION_PASSED_QCFE chip condition passed QC (1: good, 2: issues, 3: bad)integersingleNoneNoneNoneNone2None
GLUE_DISTRIBUTION_PASSED_QCGlue distribution passed QC (not applicable for bare module reception, 1: good, 2: issues, 3: bad)integersingleNoneNoneNoneNone2None
PARYLENE_COATING_PASSED_QCParylene coating passed QC (not applicable for bare module reception, 1: good, 2: issues, 3: bad)integersingleNoneNoneNoneNone1None
SENSOR_CONDITION_PASSED_QCSensor condition passed QC (1: good, 2: issues, 3: bad)integersingleNoneNoneNoneNone2None
SMD_COMPONENTS_PASSED_QCSMD components passed QC (1: good, 2: issues, 3: bad)integersingleNoneNoneNoneNone1None
WIREBONDING_PASSED_QCWirebonding passed QC (not applicable for bare module reception, 1: good, 2: issues, 3: bad)integersingleNoneNoneNoneNone1None
cts2023-10-12T02:09:16.469Z
sys
cts2023-10-12T02:09:16.469Z
mts2023-10-12T02:09:16.469Z
rev0
defects
commentsNone
attachments
components
idcodestatestateTsstateUserIdentitydummycompletedcompletedTscompletedUserIdentitytrashedtrashedTstrashedUserIdentityserialNumberalternativeIdentifierprojectsubprojectcomponentTypetypepropertiestestedAtStageinstitution
6498f97f6a25bf0042ebdd98f193185e0439e0b0795d0f4b4fef0a81ready2023-06-26T02:35:43.771Z6436-7637-1FalseFalseNoneNoneFalseNoneNone20UPGM22601022None
codeP
namePixels
codePG
namePixel general
codeMODULE
nameModule
codeOUTER_SYSTEM_QUAD_MODULE
nameOuter system quad module
  • codeFECHIP_VERSION
    nameFE chip version
    dataTypecodeTable
    requiredTrue
    defaultFalse
    valueITkpix_v1.1
    codeTable
    codevalue
    0RD53A
    1ITkpix_v1
    2ITkpix_v1.1
    3ITkpix_v2
    9No FE chip
  • codeORIENTATION
    namePCB-Bare Orientation isNormal
    dataTypeboolean
    requiredTrue
    defaultFalse
    valueTrue
codeMODULE/ASSEMBLY
nameBare module to module PCB assembly
order1
initialTrue
finalFalse
codeHR
nameHayashi-Repic Co.

 Current Stage: Initial Warm

Test Type Local Result
Electrical Test (e-test) Module Summary
(E_SUMMARY)
No TestRun!
IV measurement
(IV_MEASURE)
No TestRun!

 Candidate TestRuns of this Stage

LDB ID TestRun Code QC Passed Inspector Measurement Date Analysis Date Analysis Version Tags QC Registration
65273a…bf23d2 QUAD_MODULE_METROLOGY Fail HideyukiOide N/A 2 years ago 1.0.11 No tags Selected
64a221…f90284 VISUAL_INSPECTION Pass HideyukiOide N/A 2 years ago 1.0.6 No tags Selected
64ab51…916635 GLUE_MODULE_FLEX_ATTACH Pass HideyukiOide N/A 2 years ago No tags Selected
64ab51…916632 MASS_MEASUREMENT Pass HideyukiOide N/A 2 years ago 1.0.6 No tags Selected

Past QC Stages and Results

Wire Bonding (MODULE/WIREBONDING)

Test Local Result ProdDB Record
Visual Inspection
(VISUAL_INSPECTION)
Registered Registered
Wirebond pull test
(WIREBOND_PULL_TEST)
Registered Registered
Wirebonding Information
(WIREBONDING)
Registered Registered

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Test Local Result ProdDB Record
Flatness
(FLATNESS)
No result N/A
Glue Information Module+Flex Attach
(GLUE_MODULE_FLEX_ATTACH)
Registered Registered
Mass Measurement
(MASS_MEASUREMENT)
Registered Registered
Quad Module Metrology
(QUAD_MODULE_METROLOGY)
Registered Registered
Triplet Module Metrology
(TRIPLET_METROLOGY)
No result N/A
Visual Inspection
(VISUAL_INSPECTION)
Registered Registered

Initial state to associate flex to bare module (MODULE/INIT)

LocalDB Test ID Stage Test Name Inspector Measurement Date Analysis Date Tags QC Registration
65273a…bf23d2 MODULE/ASSEMBLY QUAD_MODULE_METROLOGY HideyukiOide N/A 2 years ago No tags Selected
64a221…f90284 MODULE/ASSEMBLY VISUAL_INSPECTION HideyukiOide N/A 2 years ago No tags Selected
64ab51…916635 MODULE/ASSEMBLY GLUE_MODULE_FLEX_ATTACH HideyukiOide N/A 2 years ago No tags Selected
64ab51…916632 MODULE/ASSEMBLY MASS_MEASUREMENT HideyukiOide N/A 2 years ago No tags Selected
649b96…6c2439 MODULE/WIREBONDING VISUAL_INSPECTION HideyukiOide N/A 2 years ago No tags Selected
64ad6e…15f44b MODULE/WIREBONDING WIREBOND_PULL_TEST HideyukiOide N/A 2 years ago No tags Selected
64ad6e…15f44e MODULE/WIREBONDING WIREBONDING HideyukiOide N/A 2 years ago No tags Selected
Stage Tests
MODULE/INIT
MODULE/ASSEMBLY
  • Mass Measurement  (MASS_MEASUREMENT)
  • Glue Information Module+Flex Attach  (GLUE_MODULE_FLEX_ATTACH)
  • Triplet Module Metrology  (TRIPLET_METROLOGY)
  • Visual Inspection  (VISUAL_INSPECTION)
  • Flatness  (FLATNESS)
  • Quad Module Metrology  (QUAD_MODULE_METROLOGY)
MODULE/WIREBONDING
  • Wirebonding Information  (WIREBONDING)
  • Wirebond pull test  (WIREBOND_PULL_TEST)
  • Visual Inspection  (VISUAL_INSPECTION)
  • IV measurement  (IV_MEASURE)
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
MODULE/INITIAL_WARM
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
MODULE/QC_CROSSCHECK
  • IV measurement  (IV_MEASURE)
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • Visual Inspection  (VISUAL_INSPECTION)
MODULE/INITIAL_COLD
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
MODULE/PARYLENE_MASKING
  • Visual Inspection  (VISUAL_INSPECTION)
  • Parylene (de-)masking  (DE_MASKING)
  • IV measurement  (IV_MEASURE)
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
MODULE/PARYLENE_COATING
  • Parylene Properties  (PARYLENE)
  • Visual Inspection  (VISUAL_INSPECTION)
MODULE/PARYLENE_UNMASKING
  • Flatness  (FLATNESS)
  • Visual Inspection  (VISUAL_INSPECTION)
  • IV measurement  (IV_MEASURE)
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • Parylene (de-)masking  (DE_MASKING)
MODULE/WIREBOND_PROTECTION
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • Wire bonding protection roof envelope  (WP_ENVELOPE)
  • Mass Measurement  (MASS_MEASUREMENT)
  • Visual Inspection  (VISUAL_INSPECTION)
  • IV measurement  (IV_MEASURE)
MODULE/POST_PARYLENE_WARM
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
  • Visual Inspection  (VISUAL_INSPECTION)
MODULE/POST_PARYLENE_COLD
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
  • Visual Inspection  (VISUAL_INSPECTION)
MODULE/THERMAL_CYCLES
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • Thermal Cycling  (THERMAL_CYCLING)
  • Flatness  (FLATNESS)
  • Visual Inspection  (VISUAL_INSPECTION)
  • IV measurement  (IV_MEASURE)
MODULE/LONG_TERM_STABILITY_TEST
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
  • Longterm stability DCS  (LONG_TERM_STABILITY_DCS)
MODULE/FINAL_WARM
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
  • Visual Inspection  (VISUAL_INSPECTION)
MODULE/FINAL_COLD
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
  • Visual Inspection  (VISUAL_INSPECTION)
MODULE/FINAL_METROLOGY
  • Flatness  (FLATNESS)
  • Visual Inspection  (VISUAL_INSPECTION)
  • IV measurement  (IV_MEASURE)
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
MODULE/QC_STATUS
  • Module ranking  (RANKING)
MODULE/UNHAPPY
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
  • Visual Inspection  (VISUAL_INSPECTION)
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
MODULE/TAB_CUTTING
  • Mass Measurement  (MASS_MEASUREMENT)
  • Module PCB Tab Cutting Information  (CUTTER_PCB_TAB)
  • Visual Inspection  (VISUAL_INSPECTION)
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
LLS/PRE_TC_WARM
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
LLS/PRE_TC_COLD
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
LLS/POST_TC_WARM
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
LLS/POST_TC_COLD
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
LLS/RECEPTION
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
OB_LOADED_MODULE_CELL/FINAL_COLD
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
OB_LOADED_MODULE_CELL/THERMAL_COLD
  • Thermal Measure  (THERMAL_PERFORMANCE)
OB_LOADED_MODULE_CELL/THERMAL_WARM
  • Thermal Measure  (THERMAL_PERFORMANCE)
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
OB_LOADED_MODULE_CELL/TAB_CUTTING
  • Electrical Test (e-test) Module Summary  (E_SUMMARY)
  • IV measurement  (IV_MEASURE)
  • Module PCB Tab Cutting Information  (CUTTER_PCB_TAB)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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