Database for ITk Pixel Module

Serial Number	20UPIS07100040
ProdDB ID	1b13f9…6bd68f
LocalDB ID	64411ae8d88aa000380b1c16
Component Type	SENSOR_TILE
Parents	20UPGB12100055
Children	No match.
Flags

Item	Value
Main Vendor readonly	7
Sensor Type or Test Structure readonly	1
Version of component	pre-production
Scratch id (to be used if not the same as agreed manufacturer ID)	2010-11335
Alternative Identifier	V8-1-022108-1-016
Original Manufacturer ID	P
Breakdown Voltage (-999 if no breakdown occurred)	None
Depletion Voltage (V)	None

Key	Data
QC Passed	True
Date	2 years ago
component ObjectId	64411ae8d88aa000380b1c16
Stage	sensor_manufacturer
Test Type	IV_MEASURE
Institute ObjectId
User Name	StefanoTerzo
ObjectId of this record	6441239fd88aa000380b5369
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vBMPTITZGGAINVNONBHTPLVBZJZDBFD
HUM	0
TEMP	24
BREAKDOWN_VOLTAGE	0
IV_ARRAY	{'time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80, 82, 84, 86, 88, 90, 92, 94, 96, 98, 100, 102, 104, 106, 108, 110, 112, 114, 116, 118, 120, 122, 124, 126, 128, 130, 132, 134, 136, 138, 140, 142, 144, 146, 148, 150, 152, 154, 156, 158, 160, 162, 164, 166, 168, 170, 172, 174, 176, 178, 180, 182, 184, 186, 188, 190, 192, 194, 196, 198, 200, 202, 204, 206, 208, 210, 212, 214, 216, 218, 220, 222, 224, 226, 228, 230, 232, 234, 236, 238, 240], 'voltage': [0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75, 76, 77, 78, 79, 80, 81, 82, 83, 84, 85, 86, 87, 88, 89, 90, 91, 92, 93, 94, 95, 96, 97, 98, 99, 100, 101, 102, 103, 104, 105, 106, 107, 108, 109, 110, 111, 112, 113, 114, 115, 116, 117, 118, 119, 120], 'current': [0.008187000000000002, 0.082027, 0.125964, 0.17258, 0.20797900000000002, 0.23554, 0.257056, 0.27402000000000004, 0.288258, 0.300685, 0.311862, 0.322362, 0.332278, 0.341743, 0.35102, 0.360024, 0.368718, 0.377336, 0.38584799999999997, 0.39432, 0.403057, 0.412027, 0.421099, 0.430183, 0.43943, 0.448699, 0.45797800000000005, 0.46747500000000003, 0.477042, 0.486491, 0.496089, 0.505869, 0.515527, 0.525481, 0.535409, 0.545465, 0.5556319999999999, 0.565828, 0.5761959999999999, 0.587003, 0.5978589999999999, 0.608737, 0.620024, 0.6315510000000001, 0.643513, 0.655142, 0.6673690000000001, 0.680059, 0.693364, 0.706538, 0.720327, 0.731749, 0.742839, 0.753314, 0.7641439999999999, 0.775809, 0.788576, 0.800568, 0.813622, 0.827055, 0.841327, 0.855525, 0.870841, 0.886741, 0.902677, 0.918855, 0.93561, 0.952214, 0.9694810000000001, 0.987453, 1.005, 1.023, 1.0410000000000001, 1.059, 1.077, 1.097, 1.1159999999999999, 1.136, 1.157, 1.1769999999999998, 1.198, 1.22, 1.242, 1.2630000000000001, 1.285, 1.306, 1.328, 1.35, 1.3719999999999999, 1.394, 1.4160000000000001, 1.4389999999999998, 1.461, 1.484, 1.507, 1.5310000000000001, 1.554, 1.578, 1.602, 1.627, 1.651, 1.676, 1.701, 1.726, 1.752, 1.778, 1.804, 1.829, 1.856, 1.883, 1.911, 1.938, 1.966, 1.9929999999999999, 2.022, 2.053, 2.08, 2.1100000000000003, 2.137, 2.166, 2.1959999999999997], 'sigma current': [], 'temperature': [24], 'humidity': []}
IV_IMG	014b6465bf2ad7b91d2f7885b21e222f989f55bdb42e883a58fd2718a031a234
LEAK_CURRENT	0.421099

ProductionDB Record

Current Stage: Parylene Masking

No tests are allocated for this stage.

Past QC Stages and Results

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
65786d…5a5a4c	BAREMODULERECEPTION	IV_MEASURE	MarioJose	N/A	2 years ago	No tags	Selected
644123…0b5369	sensor_manufacturer	IV_MEASURE	StefanoTerzo	N/A	2 years ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/WIREBOND_PROTECTION
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPIS07100040

MODULE/PARYLENE_MASKING

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: sensor_manufacturer)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Parylene Masking

Past QC Stages and Results

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

Back to top page of this component