Database for ITk Pixel Module

Serial Number	20UPIS07100029
ProdDB ID	35811f…b6348b
LocalDB ID	64411ac1d88aa000380b1b58
Component Type	SENSOR_TILE
Parents	20UPGB12100054
Children	No match.
Flags

Item	Value
Main Vendor readonly	7
Sensor Type or Test Structure readonly	1
Version of component	pre-production
Scratch id (to be used if not the same as agreed manufacturer ID)	2010-11335
Alternative Identifier	V8-1-022108-1-014
Original Manufacturer ID	N
Breakdown Voltage (-999 if no breakdown occurred)	None
Depletion Voltage (V)	None

Key	Data
QC Passed	True
Date	2 years ago
component ObjectId	64411ac1d88aa000380b1b58
Stage	sensor_manufacturer
Test Type	IV_MEASURE
Institute ObjectId
User Name	StefanoTerzo
ObjectId of this record	6441239d0ca03e00368d1197
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vPXOZXWEUOTVCWKNXOQPPJALLCDCOWR
HUM	0
TEMP	24
BREAKDOWN_VOLTAGE	0
IV_ARRAY	{'time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80, 82, 84, 86, 88, 90, 92, 94, 96, 98, 100, 102, 104, 106, 108, 110, 112, 114, 116, 118, 120, 122, 124, 126, 128, 130, 132, 134, 136, 138, 140, 142, 144, 146, 148, 150, 152, 154, 156, 158, 160, 162, 164, 166, 168, 170, 172, 174, 176, 178, 180, 182, 184, 186, 188, 190, 192, 194, 196, 198, 200, 202, 204, 206, 208, 210, 212, 214, 216, 218, 220, 222, 224, 226, 228, 230, 232, 234, 236, 238, 240], 'voltage': [0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75, 76, 77, 78, 79, 80, 81, 82, 83, 84, 85, 86, 87, 88, 89, 90, 91, 92, 93, 94, 95, 96, 97, 98, 99, 100, 101, 102, 103, 104, 105, 106, 107, 108, 109, 110, 111, 112, 113, 114, 115, 116, 117, 118, 119, 120], 'current': [0.006327999999999999, 0.068976, 0.123672, 0.181254, 0.223241, 0.255352, 0.280694, 0.299937, 0.315727, 0.32946, 0.341863, 0.353593, 0.364815, 0.37565499999999996, 0.386424, 0.397043, 0.407447, 0.417885, 0.42835300000000004, 0.438845, 0.449562, 0.460407, 0.471424, 0.48258199999999996, 0.49408599999999997, 0.505872, 0.517865, 0.530272, 0.54303, 0.556063, 0.569539, 0.583416, 0.597615, 0.612403, 0.627715, 0.6436299999999999, 0.659918, 0.67688, 0.694309, 0.7123389999999999, 0.730889, 0.749807, 0.769411, 0.7895770000000001, 0.81031, 0.831354, 0.8530580000000001, 0.87518, 0.897833, 0.921068, 0.945055, 0.9692739999999999, 0.993781, 1.018, 1.043, 1.069, 1.0950000000000002, 1.121, 1.1480000000000001, 1.175, 1.2020000000000002, 1.23, 1.258, 1.286, 1.316, 1.345, 1.374, 1.405, 1.435, 1.466, 1.498, 1.53, 1.562, 1.5939999999999999, 1.628, 1.661, 1.695, 1.729, 1.764, 1.798, 1.8339999999999999, 1.869, 1.905, 1.9420000000000002, 1.979, 2.017, 2.0540000000000003, 2.092, 2.1310000000000002, 2.17, 2.21, 2.249, 2.289, 2.329, 2.37, 2.411, 2.452, 2.494, 2.5349999999999997, 2.5780000000000003, 2.62, 2.6630000000000003, 2.7070000000000003, 2.751, 2.795, 2.839, 2.884, 2.929, 2.9739999999999998, 3.02, 3.066, 3.112, 3.1590000000000003, 3.206, 3.253, 3.3009999999999997, 3.349, 3.397, 3.445, 3.495, 3.5429999999999997], 'sigma current': [], 'temperature': [24], 'humidity': []}
IV_IMG	085b99a1b662545c87843e6d78e9fb49ed52673c79a5c31af5d85664bdf617ce
LEAK_CURRENT	0.471424

ProductionDB Record

Current Stage: Parylene Masking

No tests are allocated for this stage.

Past QC Stages and Results

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
65786c…5a58cc	BAREMODULERECEPTION	IV_MEASURE	MarioJose	N/A	2 years ago	No tags	Selected
644123…8d1197	sensor_manufacturer	IV_MEASURE	StefanoTerzo	N/A	2 years ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPIS07100029

MODULE/PARYLENE_MASKING

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: sensor_manufacturer)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Parylene Masking

Past QC Stages and Results

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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