Top Page > Component List > 20UPGS33300477 > QC Result / sensor_manufacturer / CV_MEASURE

20UPGS33300477
Outer-Quad-Sensor
  ITkPD Component Page Jump to ITkPD component page

Component Information

Item Value
Serial Number 20UPGS33300477
Production DB Component ID 62cce4608fc505f824608d073e119014
LocalDB Component ID 6426d38778fe7f0036e05cf6
Component Type sensor_tile
Super-Component 20UPGB43000019 
Sub-Components No match.
Flags

Properties

Item Data Type Value
Main Vendor integer 3
Sensor Type or Test Structure integer 3
Version of component string pre-production
Scratch id (to be used if not the same as agreed manufacturer ID) string
Alternative Identifier string V4-1-269431-3-002
Original Manufacturer ID string Q2
Depletion Voltage (V) float 57.0810548710842
Breakdown Voltage (-999 if no breakdown occurred) float None

Comments


Test: CV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2023-04-12 05:05:31 PDT(-0700)
component ObjectId 6426d38778fe7f0036e05cf6
Stage sensor_manufacturer
Test Type CV_MEASURE
Institute ObjectId
User Name ChristopherKrause
ObjectId of this record 64369e8b0ca03e0036559511
ObjectId of RAW record None

Results

Key Data
ANALYSIS_VERSION mqat vOHBAGFBOSGFKYDAXSPBZMOUXCDHJFL
HUM 0
TEMP 20
CV_ARRAY {'Time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'Voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'Capacitance': [0.0011431739370106084, 0.07265668736317352, 0.14176746124053863, 0.21080662202625639, 0.2800066274208632, 0.34963110282488513, 0.4196917770159459, 0.4878608297364291, 0.5584161228047293, 0.6294818478082098, 0.7017939375937744, 0.7669090347183634, 0.7860656284149392, 0.7906856221631581, 0.7926579329713233, 0.7952046234850834, 0.8062385513621807, 0.8081240647580197, 0.808560122521439, 0.8089965333204153, 0.8092876701721557, 0.7856476381027917, 0.8097246702110851, 0.8100162002430035, 0.8101620243032405, 0.8103078877452287, 0.8105997328311919, 0.8107457145035498, 0.8108917356144258, 0.8110377961780265, 0.8111838962085662, 0.8114762147273504, 0.8116224332440549, 0.8117686912846181, 0.8119149888632871, 0.8119149888632871, 0.8120613259943128, 0.8122077026919554, 0.8122077026919554, 0.8122077026919554, 0.8123541189704793], 'Sigma Capacitance': [], 'Temperature': [], 'Humidity': []}
CV_IMG 9c270ff057fab1a0c39312d58d04a23642caa58fa806c44d04ecb86161311d15
V_FULLDEPL 57.0810548710842

ProductionDB Record

{}

Current Stage: Initial Cold

No tests are allocated for this stage.

Past QC Stages and Results

  Stage: QC cross-check (module swapping) (MODULE/QC_CROSSCHECK) Alternative

No tests are allocated for this stage.

  Stage: Initial Warm (MODULE/INITIAL_WARM) Complete

No tests are allocated for this stage.

  Stage: Wire Bonding (MODULE/WIREBONDING) Complete

No tests are allocated for this stage.

  Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Initial state to associate flex to bare module (MODULE/INIT) Complete

No tests are allocated for this stage.

  Stage: Bare module reception at ITk institute (BAREMODULERECEPTION) Complete

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Bare Module Assembly (BAREMODULEASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Not to be used for detector (NOT_USED) Alternative

No tests are allocated for this stage.

  Stage: Post Irradiation (POST_IRRAD) Alternative

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: QA at Institutes (QA) Alternative

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IT measurement
(IT_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING) Complete

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Visual inspection
(VISUAL_INSPECTION)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Sensor Manufacturer (sensor_manufacturer) Complete

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
IV measurement
(IV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
LocalDB Test ID Stage Test Name Inspector Date QC Registration
64369ec20ca03e003655979d sensor_manufacturer IV_MEASURE ChristopherKrause 2023-04-12 05:06:26 PDT(-0700) Selected
64369e8b0ca03e0036559511 sensor_manufacturer CV_MEASURE ChristopherKrause 2023-04-12 05:05:31 PDT(-0700) Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
Back to top page of this component