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20UPGS33300476
Outer-Quad-Sensor
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Component Information

Item Value
Serial Number 20UPGS33300476
Production DB Component ID 9fecdc196f13eef52d4638945d53dace
LocalDB Component ID 6426d38378fe7f0036e05cdf
Component Type sensor_tile
Super-Component 20UPGB43000018 
Sub-Components No match.
Flags

Properties

Item Data Type Value
Main Vendor integer 3
Sensor Type or Test Structure integer 3
Version of component string pre-production
Scratch id (to be used if not the same as agreed manufacturer ID) string
Alternative Identifier string V4-1-269431-3-001
Original Manufacturer ID string Q1
Depletion Voltage (V) float 56.8857482226146
Breakdown Voltage (-999 if no breakdown occurred) float None

Comments


Test: CV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2023-04-12 05:05:31 PDT(-0700)
component ObjectId 6426d38378fe7f0036e05cdf
Stage sensor_manufacturer
Test Type CV_MEASURE
Institute ObjectId
User Name ChristopherKrause
ObjectId of this record 64369e8bd88aa00038d392ff
ObjectId of RAW record None

Results

Key Data
ANALYSIS_VERSION mqat vLLSEZBTGQLOFZDAEAJXXLHQDEZZRXL
HUM 0
TEMP 20
CV_ARRAY {'Time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'Voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'Capacitance': [0.001092214858921675, 0.07276648507783039, 0.14184222043306854, 0.21078726554282634, 0.27982891126047654, 0.3490942096179818, 0.4187146769158194, 0.4862971197594191, 0.5562525276114855, 0.6267935658712809, 0.6989804342864692, 0.7673121583005496, 0.7925168090239515, 0.7984766279622955, 0.8006214359536159, 0.801912471430164, 0.8053705393475495, 0.8148492654345735, 0.8167650834560353, 0.8172081547828854, 0.8176515867375308, 0.6331939692402854, 0.8180953797114441, 0.818391442453873, 0.8185395340966284, 0.8188358379979476, 0.8188358379979476, 0.8191323028173866, 0.8194289286714899, 0.8195773020229887, 0.8197257156769059, 0.8198741696478384, 0.8200226639503908, 0.8201711985991738, 0.8203197736088053, 0.8203197736088053, 0.8204683889939088, 0.8204683889939088, 0.8206170447691156, 0.8206170447691156, 0.8207657409490633], 'Sigma Capacitance': [], 'Temperature': [], 'Humidity': []}
CV_IMG f7cffa967f225b7f6461546c083b39442ec86074f27c3324189428be4f4eb309
V_FULLDEPL 56.8857482226146

ProductionDB Record

{}

Current Stage: Initial Warm

No tests are allocated for this stage.

Past QC Stages and Results

  Stage: Wire Bonding (MODULE/WIREBONDING) Complete

No tests are allocated for this stage.

  Stage: Bare module to module PCB assembly (MODULE/ASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Initial state to associate flex to bare module (MODULE/INIT) Complete

No tests are allocated for this stage.

  Stage: Bare module reception at ITk institute (BAREMODULERECEPTION) Complete

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Bare Module Assembly (BAREMODULEASSEMBLY) Locally Signed Off

No tests are allocated for this stage.

  Stage: Not to be used for detector (NOT_USED) Alternative

No tests are allocated for this stage.

  Stage: Post Irradiation (POST_IRRAD) Alternative

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: QA at Institutes (QA) Alternative

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IT measurement
(IT_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING) Complete

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
IV measurement
(IV_MEASURE)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.
Visual inspection
(VISUAL_INSPECTION)
No result Test is missing in LocalDB.
N/A Test is not pushed to ITkPD.

  Stage: Sensor Manufacturer (sensor_manufacturer) Complete

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
IV measurement
(IV_MEASURE)
Registered Jump to the LocalDB Test Record!
Registered Jump to the ITkPD TestRun Page!
LocalDB Test ID Stage Test Name Inspector Date QC Registration
64369ec10ca03e003655978d sensor_manufacturer IV_MEASURE ChristopherKrause 2023-04-12 05:06:25 PDT(-0700) Selected
64369e8bd88aa00038d392ff sensor_manufacturer CV_MEASURE ChristopherKrause 2023-04-12 05:05:31 PDT(-0700) Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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