20UPGS33300476

MODULE/INITIAL_WARM

Component Information

Serial Number 20UPGS33300476
ProdDB ID  9fecdc…53dace
LocalDB ID 6426d38378fe7f0036e05cdf
Component Type SENSOR_TILE
Parents 20UPGB43000018 
Children No match.
Flags

 Properties

Item Value
Main Vendor readonly 3
Sensor Type or Test Structure readonly 3
Version of component pre-production
Scratch id (to be used if not the same as agreed manufacturer ID)
Alternative Identifier V4-1-269431-3-001
Original Manufacturer ID Q1
Depletion Voltage (V) 56.8857482226146
Breakdown Voltage (-999 if no breakdown occurred) None

 Comments


Test: CV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2 years ago
component ObjectId 6426d38378fe7f0036e05cdf
Stage sensor_manufacturer
Test Type CV_MEASURE
Institute ObjectId
User Name ChristopherKrause
ObjectId of this record 64369e8bd88aa00038d392ff
ObjectId of RAW record None
Tags No tags

Results

Key Data
ANALYSIS_VERSION mqat vLLSEZBTGQLOFZDAEAJXXLHQDEZZRXL
HUM 0
TEMP 20
CV_ARRAY {'Time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'Voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'Capacitance': [0.001092214858921675, 0.07276648507783039, 0.14184222043306854, 0.21078726554282634, 0.27982891126047654, 0.3490942096179818, 0.4187146769158194, 0.4862971197594191, 0.5562525276114855, 0.6267935658712809, 0.6989804342864692, 0.7673121583005496, 0.7925168090239515, 0.7984766279622955, 0.8006214359536159, 0.801912471430164, 0.8053705393475495, 0.8148492654345735, 0.8167650834560353, 0.8172081547828854, 0.8176515867375308, 0.6331939692402854, 0.8180953797114441, 0.818391442453873, 0.8185395340966284, 0.8188358379979476, 0.8188358379979476, 0.8191323028173866, 0.8194289286714899, 0.8195773020229887, 0.8197257156769059, 0.8198741696478384, 0.8200226639503908, 0.8201711985991738, 0.8203197736088053, 0.8203197736088053, 0.8204683889939088, 0.8204683889939088, 0.8206170447691156, 0.8206170447691156, 0.8207657409490633], 'Sigma Capacitance': [], 'Temperature': [], 'Humidity': []}
CV_IMG f7cffa967f225b7f6461546c083b39442ec86074f27c3324189428be4f4eb309
V_FULLDEPL 56.8857482226146

ProductionDB Record

{}

 Current Stage: Initial Warm

Past QC Stages and Results

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)		 No result N/A

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A

QA at Institutes (QA)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)		 No result N/A
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)		 No result N/A
IT measurement
(IT_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A
Visual inspection
(VISUAL_INSPECTION)		 No result N/A

Sensor Manufacturer (sensor_manufacturer)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 Registered Registered
IV measurement
(IV_MEASURE)		 Registered Registered
LocalDB Test ID Stage Test Name Inspector Measurement Date Analysis Date Tags QC Registration
64369e…55978d sensor_manufacturer IV_MEASURE ChristopherKrause N/A 2 years ago No tags Selected
64369e…d392ff sensor_manufacturer CV_MEASURE ChristopherKrause N/A 2 years ago No tags Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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