Database for ITk Pixel Module

Serial Number	20UPGS35300140
ProdDB ID	547b7b…b91504
LocalDB ID	62ba0a99e684f9000ada9561
Component Type	SENSOR_TILE
Parents	No match.
Children	No match.
Flags

Item	Value
Alternative Identifier	V6-1-352918-3-002
Main Vendor readonly	5
Sensor Type or Test Structure readonly	3
Version of component	pre-production
Scratch id (to be used if not the same as agreed manufacturer ID)	0003
Original Manufacturer ID	MSLB
Depletion Voltage (V)	51
Breakdown Voltage (-999 if no breakdown occurred)	None

Key	Data
QC Passed	True
Date	2 years ago
component ObjectId	62ba0a99e684f9000ada9561
Stage	BAREMODULERECEPTION
Test Type	IV_MEASURE
Institute ObjectId
User Name	TanviWamorkar
ObjectId of this record	64b5d0c3c8312c0042870eb1
ObjectId of RAW record	None
Tags	No tags

Results

Key	Data
ANALYSIS_VERSION	mqat vv1
HUM	43.4
TEMP	20.8
BREAKDOWN_VOLTAGE	-999
IV_ARRAY	{'voltage': [0, 4.7, 9.7, 14.7, 19.7, 24.7, 29.8, 34.8, 39.8, 44.8, 49.9, 54.8, 59.8, 64.7, 69.8, 74.8, 79.8, 84.8, 89.8, 94.8, 99.9, 104.8, 109.9, 114.8, 119.8, 124.8, 129.9, 134.8, 139.9, 144.9, 150, 154.9, 160, 164.9, 169.9, 174.9, 179.9, 185, 190, 194.9, 199.9], 'current': [0, 0.08535, 0.1185499999999999, 0.136, 0.1387, 0.13995, 0.141, 0.1430499999999999, 0.1447999999999999, 0.14685, 0.1479499999999999, 0.14865, 0.15095, 0.1515, 0.1525, 0.1535, 0.15375, 0.155, 0.1559999999999999, 0.1567, 0.1575, 0.15805, 0.1588999999999999, 0.15935, 0.1599, 0.1605, 0.161, 0.1615, 0.1619999999999999, 0.16275, 0.1632, 0.1637, 0.16435, 0.1645, 0.165, 0.1655, 0.1659999999999999, 0.1664, 0.1668, 0.167, 0.1675], 'sigmacurrent': [0, 0.0012854960132182, 0.0004153311931459, 0.0005477225575051, 0.0002449489742783, 0.0002692582403567, 0.0002236067977499, 0.00015, 0.0004, 0.00105, 0.00015, 0.0005937171043518, 0.0011926860441876, 0.0009486832980505, 2.775557561562892e-17, 0, 0.0011672617529928, 0, 2.775557561562892e-17, 0.0002449489742783, 0, 0.00015, 0.0002, 0.0002291287847477, 0.0002, 2.775557561562892e-17, 0, 0, 2.775557561562892e-17, 0.00025, 0.0002449489742783, 0.0002449489742783, 0.0002291287847477, 2.775557561562892e-17, 0, 0, 2.775557561562892e-17, 0.0002, 0.0002449489742783, 0, 0]}
IV_IMG	fd43d406bad138cd09556aece1dbd874e6c5e057bf8f033659272a3e0c7ed2c6
LEAK_CURRENT	0.18

ProductionDB Record

Expand ProductionDB Record

64b5d0c3c8312c0042870eb1

state

ready

stateTs

2023-07-17T23:37:39.438Z

stateUserIdentity

5937-5083-1

date

2023-07-17T23:35:00.000Z

testType

id	5b1a3abf130f5600054a42a8
code	IV_MEASURE
name	IV measurement
state	active

institution

id	5d318624df98f200097386d5
code	ANL
name	Argonne National Laboratory

user

id	6202fb94987fb9000ab47762
userIdentity	5937-5083-1
firstName	Tanvi
middleName
lastName	Wamorkar

runNumber

passed

True

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Analysis Version	string	single	False	v1	None	None
HUM	Humidity [%]	float	single	True	43.4	None	None
TEMP	Temperature [°C]	float	single	True	20.8	None	None

results

code BREAKDOWN_VOLTAGE
name Breakdown voltage [V] (if no breakdown put -999)
order 1
dataType float
valueType single
arrayDimensions None
additional False
value -999
associateChild None

code

IV_ARRAY

name

IV data

order

dataType

object

valueType

single

arrayDimensions

additional

False

value

voltage	0 4.7 9.7 14.7 19.7 24.7 29.8 34.8 39.8 44.8 49.9 54.8 59.8 64.7 69.8 74.8 79.8 84.8 89.8 94.8 99.9 104.8 109.9 114.8 119.8 124.8 129.9 134.8 139.9 144.9 150 154.9 160 164.9 169.9 174.9 179.9 185 190 194.9 199.9
current	0 0.08535 0.1185499999999999 0.136 0.1387 0.13995 0.141 0.1430499999999999 0.1447999999999999 0.14685 0.1479499999999999 0.14865 0.15095 0.1515 0.1525 0.1535 0.15375 0.155 0.1559999999999999 0.1567 0.1575 0.15805 0.1588999999999999 0.15935 0.1599 0.1605 0.161 0.1615 0.1619999999999999 0.16275 0.1632 0.1637 0.16435 0.1645 0.165 0.1655 0.1659999999999999 0.1664 0.1668 0.167 0.1675
sigmacurrent	0 0.0012854960132182 0.0004153311931459 0.0005477225575051 0.0002449489742783 0.0002692582403567 0.0002236067977499 0.00015 0.0004 0.00105 0.00015 0.0005937171043518 0.0011926860441876 0.0009486832980505 2.775557561562892e-17 0 0.0011672617529928 0 2.775557561562892e-17 0.0002449489742783 0 0.00015 0.0002 0.0002291287847477 0.0002 2.775557561562892e-17 0 0 2.775557561562892e-17 0.00025 0.0002449489742783 0.0002449489742783 0.0002291287847477 2.775557561562892e-17 0 0 2.775557561562892e-17 0.0002 0.0002449489742783 0 0

dateTime

2023-08-02T11:58:26.438Z

userIdentity

5937-5083-1

associateChild

None

code	IV_IMG
name	Plot of IV curves (not for bare modules and modules)
order	1
dataType	image
valueType	single
arrayDimensions	None
additional	False
value	fd43d406bad138cd09556aece1dbd874e6c5e057bf8f033659272a3e0c7ed2c6
dateTime	2023-08-02T01:03:04.250Z
userIdentity	5937-5083-1
associateChild	None

code	LEAK_CURRENT
name	Leakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
order	1
dataType	float
valueType	single
arrayDimensions	None
additional	False
value	0.18
dateTime	2023-07-18T12:06:55.346Z
userIdentity	5937-5083-1
associateChild	None

cts

2023-07-17T23:37:39.438Z

sys

cts	2023-07-17T23:37:39.438Z
mts	2023-07-17T23:37:39.438Z
rev	0

defects

comments

None

attachments

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

62ba0a99e684f9000ada9561

547b7bf08b3db632c4611438beb91504

ready

2022-06-27T19:52:57.838Z

6105-5335-1

False

None

False

None

20UPGS35300140

V6-1-352918-3-002

parent

component

63d148b9049913003677803d

code

42953fbd7457b3b25a9606d8ccbd147a

state

ready

stateTs

2023-01-25T15:20:25.525Z

stateUserIdentity

4709-4605-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB42000072

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULERECEPTION
name	Reception at ITk institute

highestLevelParent

component

63d148b9049913003677803d

code

42953fbd7457b3b25a9606d8ccbd147a

state

ready

stateTs

2023-01-25T15:20:25.525Z

stateUserIdentity

4709-4605-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB42000072

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	BAREMODULERECEPTION
name	Reception at ITk institute

code	P
name	Pixels

code	PG
name	Pixel general

code	SENSOR_TILE
name	Sensor Tile

code	OUTER_PIXEL_QUAD_SENSOR_TILE
name	Outer Pixel Quad Sensor Tile

code	name	dataType	required	default	value
MAN_SNO	Alternative Identifier	string	True	True	V6-1-352918-3-002
MAIN_VENDOR	Main Vendor	integer	True	False	5
SENSOR_TYPE_OR_TEST_STRUCTURE	Sensor Type or Test Structure	integer	True	False	3
VERSION	Version of component	string	True	False	pre-production
SENSOR_SCRATCHID	Scratch id (to be used if not the same as agreed manufacturer ID)	string	False	False	0003
MAN_ID	Original Manufacturer ID	string	False	False	MSLB
V_FULLDEPL	Depletion Voltage (V)	float	True	False	51

code	BAREMODULERECEPTION
name	Bare module reception at ITk institute
order	8
initial	False
final	False

code	MICRON
name	Micron Semiconductor Ltd (Micron)

Current Stage: Long Term Stability Test

No tests are allocated for this stage.

Past QC Stages and Results

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
IV measurement (IV_MEASURE)	Registered	Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A

QA at Institutes (QA)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE)	No result	N/A
Inter-pixel resistance (INTER-PIXEL_RESISTANCE)	No result	N/A
IT measurement (IT_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	No result	N/A
Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)	No result	N/A
Visual inspection (VISUAL_INSPECTION)	No result	N/A

Sensor Manufacturer (sensor_manufacturer)

Test	Local Result	ProdDB Record
CV measurement (CV_MEASURE)	No result	N/A
IV measurement (IV_MEASURE)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
64b5d0…870eb1	BAREMODULERECEPTION	IV_MEASURE	TanviWamorkar	N/A	2 years ago	No tags	Selected
62bc3b…df3576	sensor_manufacturer	IV_MEASURE	HanadiAli	N/A	3 years ago	No tags	Selected

Stage	Tests
sensor_manufacturer	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE)
WAFER_PROCESSING	Visual inspection (VISUAL_INSPECTION) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY) IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
QA	CV measurement (CV_MEASURE) IV measurement (IV_MEASURE) IT measurement (IT_MEASURE) Inter-pixel capacitance (INTER-PIXEL_CAPACITANCE) Inter-pixel resistance (INTER-PIXEL_RESISTANCE) Sensor Metrology: Sensor bow and thickness (SENSOR_METROLOGY)
POST_IRRAD	IV measurement (IV_MEASURE) CV measurement (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION	IV measurement (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION

20UPGS35300140

MODULE/LONG_TERM_STABILITY_TEST

Component Information

Properties

Comments

Test: IV_MEASURE QC Passed

(Stage: BAREMODULERECEPTION)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

ProductionDB Record

Current Stage: Long Term Stability Test

Past QC Stages and Results

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

QA at Institutes (QA)

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Sensor Manufacturer (sensor_manufacturer)

All Registered QC Tests

Check QC Flow

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