20UPGS35300140

MODULE/LONG_TERM_STABILITY_TEST

Component Information

Serial Number 20UPGS35300140
ProdDB ID  547b7b…b91504
LocalDB ID 62ba0a99e684f9000ada9561
Component Type SENSOR_TILE
Parents No match.
Children No match.
Flags

 Properties

Item Value
Alternative Identifier V6-1-352918-3-002
Main Vendor readonly 5
Sensor Type or Test Structure readonly 3
Version of component pre-production
Scratch id (to be used if not the same as agreed manufacturer ID) 0003
Original Manufacturer ID MSLB
Depletion Voltage (V) 51
Breakdown Voltage (-999 if no breakdown occurred) None

 Comments


Test: IV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 3 years ago
component ObjectId 62ba0a99e684f9000ada9561
Stage sensor_manufacturer
Test Type IV_MEASURE
Institute ObjectId
User Name HanadiAli
ObjectId of this record 62bc3b5fe684f9000adf3576
ObjectId of RAW record None
Tags No tags

Results

Key Data
HUM 0
TEMP 23.9
BREAKDOWN_VOLTAGE 0
IV_ARRAY {'time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'current': [0.8385000000000001, 0.68365, 0.7723200000000001, 0.86555, 0.88829, 0.9017999999999999, 0.90888, 0.9149800000000001, 0.9196500000000001, 0.92329, 0.9262000000000001, 0.9288700000000001, 0.9313500000000001, 0.9338700000000001, 0.9361100000000001, 0.93801, 0.9398400000000001, 0.94165, 0.94347, 0.94529, 0.9471200000000001, 0.9488800000000001, 0.9505, 0.9533, 0.9549, 0.9564, 0.9578, 0.9594, 0.9609, 0.9626000000000001, 0.9641, 0.9656000000000001, 0.967, 0.9683000000000002, 0.9697, 0.9710000000000001, 0.9722000000000002, 0.9735, 0.9747000000000001, 0.9760000000000001, 0.9772000000000002], 'sigma current': [], 'temperature': [23.9], 'humidity': []}
IV_IMG 14682010be9b286f90be7747a79d0b526f9f4a20cd3f5a4d07b2d25a31c85aba
LEAK_CURRENT 0.9471200000000001

ProductionDB Record

id62bc3b5fe684f9000adf3576
stateready
date2022-06-29T11:45:33.011Z
testType
id5b1a3abf130f5600054a42a8
codeIV_MEASURE
nameIV measurement
stateactive
institution
id62559a2de668fe000ae62bd1
codeMICRON
nameMicron Semiconductor Ltd (Micron)
user
id619987f9ce722a000a8bb65b
userIdentity6105-5335-1
firstNameHanadi
middleName
lastNameAli
runNumber1
passedTrue
problemsFalse
properties
codenamedataTypevalueTyperequiredvaluerangeMinrangeMax
HUMHumidity [%]floatsingleTrue0NoneNone
TEMPTemperature [°C]floatsingleTrue23.9NoneNone
results
codenameorderdataTypevalueTypearrayDimensionsadditionalvalueassociateChild
BREAKDOWN_VOLTAGEBreakdown voltage [V] (if no breakdown put -999)1floatsingleNoneFalse0None
IV_ARRAYIV data1objectsingle1False
time
  • 0
  • 2
  • 4
  • 6
  • 8
  • 10
  • 12
  • 14
  • 16
  • 18
  • 20
  • 22
  • 24
  • 26
  • 28
  • 30
  • 32
  • 34
  • 36
  • 38
  • 40
  • 42
  • 44
  • 46
  • 48
  • 50
  • 52
  • 54
  • 56
  • 58
  • 60
  • 62
  • 64
  • 66
  • 68
  • 70
  • 72
  • 74
  • 76
  • 78
  • 80
voltage
  • 0
  • 5
  • 10
  • 15
  • 20
  • 25
  • 30
  • 35
  • 40
  • 45
  • 50
  • 55
  • 60
  • 65
  • 70
  • 75
  • 80
  • 85
  • 90
  • 95
  • 100
  • 105
  • 110
  • 115
  • 120
  • 125
  • 130
  • 135
  • 140
  • 145
  • 150
  • 155
  • 160
  • 165
  • 170
  • 175
  • 180
  • 185
  • 190
  • 195
  • 200
current
  • 0.8385000000000001
  • 0.68365
  • 0.7723200000000001
  • 0.86555
  • 0.88829
  • 0.9017999999999999
  • 0.90888
  • 0.9149800000000001
  • 0.9196500000000001
  • 0.92329
  • 0.9262000000000001
  • 0.9288700000000001
  • 0.9313500000000001
  • 0.9338700000000001
  • 0.9361100000000001
  • 0.93801
  • 0.9398400000000001
  • 0.94165
  • 0.94347
  • 0.94529
  • 0.9471200000000001
  • 0.9488800000000001
  • 0.9505
  • 0.9533
  • 0.9549
  • 0.9564
  • 0.9578
  • 0.9594
  • 0.9609
  • 0.9626000000000001
  • 0.9641
  • 0.9656000000000001
  • 0.967
  • 0.9683000000000002
  • 0.9697
  • 0.9710000000000001
  • 0.9722000000000002
  • 0.9735
  • 0.9747000000000001
  • 0.9760000000000001
  • 0.9772000000000002
sigma current
temperature
  • 23.9
humidity
None
IV_IMGPlot of IV curves (not for bare modules and modules)1imagesingleNoneFalse14682010be9b286f90be7747a79d0b526f9f4a20cd3f5a4d07b2d25a31c85abaNone
LEAK_CURRENTLeakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]1floatsingleNoneFalse0.9471200000000001None
cts2022-06-29T11:45:35.289Z
sys
cts2022-06-29T11:45:35.289Z
mts2022-06-29T11:45:35.289Z
rev0
defects
commentsNone
attachments
components
idcodestatestateTsstateUserIdentitydummycompletedcompletedTscompletedUserIdentitytrashedtrashedTsserialNumberalternativeIdentifierprojectsubprojectcomponentTypetypepropertiestestedAtStageinstitution
62ba0a99e684f9000ada9561547b7bf08b3db632c4611438beb91504ready2022-06-27T19:52:57.838Z6105-5335-1FalseFalseNoneNoneFalseNone20UPGS35300140V6-1-352918-3-002
codeP
namePixels
codePG
namePixel general
codeSENSOR_TILE
nameSensor Tile
codeOUTER_PIXEL_QUAD_SENSOR_TILE
nameOuter Pixel Quad Sensor Tile
codenamedataTyperequireddefaultvalue
MAN_SNOAlternative IdentifierstringTrueTrueV6-1-352918-3-002
MAIN_VENDORMain VendorintegerTrueFalse5
SENSOR_TYPE_OR_TEST_STRUCTURESensor Type or Test StructureintegerTrueFalse3
VERSIONVersion of componentstringTrueFalsepre-production
SENSOR_SCRATCHIDScratch id (to be used if not the same as agreed manufacturer ID)stringFalseFalse0003
MAN_IDOriginal Manufacturer IDstringFalseFalseMSLB
V_FULLDEPLDepletion Voltage (V)floatTrueFalse51
codesensor_manufacturer
nameSensor Manufacturer
order1
initialTrue
finalFalse
codeMICRON
nameMicron Semiconductor Ltd (Micron)

 Current Stage: Long Term Stability Test

Past QC Stages and Results

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)		 Registered Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A

QA at Institutes (QA)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)		 No result N/A
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)		 No result N/A
IT measurement
(IT_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A
Visual inspection
(VISUAL_INSPECTION)		 No result N/A

Sensor Manufacturer (sensor_manufacturer)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 Registered Registered
LocalDB Test ID Stage Test Name Inspector Measurement Date Analysis Date Tags QC Registration
64b5d0…870eb1 BAREMODULERECEPTION IV_MEASURE TanviWamorkar N/A 2 years ago No tags Selected
62bc3b…df3576 sensor_manufacturer IV_MEASURE HanadiAli N/A 3 years ago No tags Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
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