20UPGS35300133

MODULE/FINAL_METROLOGY

Component Information

Serial Number 20UPGS35300133
ProdDB ID  b86919…863e76
LocalDB ID 62ba0908e684f9000ada931b
Component Type SENSOR_TILE
Parents 20UPGB42000017 
Children No match.
Flags

 Properties

Item Value
Alternative Identifier V6-1-352911-3-005
Main Vendor readonly 5
Sensor Type or Test Structure readonly 3
Version of component pre-production
Scratch id (to be used if not the same as agreed manufacturer ID) 0002
Original Manufacturer ID MSLE
Depletion Voltage (V) 50
Breakdown Voltage (-999 if no breakdown occurred) None

 Comments


Test: IV_MEASURE QC Passed

(Stage: sensor_manufacturer)


Basic View Only: custom view for this TestRun is not prepared.

Metadata

Key Data
QC Passed True
Date 2 years ago
component ObjectId 62ba0908e684f9000ada931b
Stage sensor_manufacturer
Test Type IV_MEASURE
Institute ObjectId
User Name LingxinMeng
ObjectId of this record 655f7d5b5f9f8800384fb00d
ObjectId of RAW record None
Tags No tags

Results

Key Data
ANALYSIS_VERSION mqat vde1c6a22
HUM 0
TEMP 23.7
BREAKDOWN_VOLTAGE -999
IV_ARRAY {'time': [0, 2, 4, 6, 8, 10, 12, 14, 16, 18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 38, 40, 42, 44, 46, 48, 50, 52, 54, 56, 58, 60, 62, 64, 66, 68, 70, 72, 74, 76, 78, 80], 'voltage': [0, 5, 10, 15, 20, 25, 30, 35, 40, 45, 50, 55, 60, 65, 70, 75, 80, 85, 90, 95, 100, 105, 110, 115, 120, 125, 130, 135, 140, 145, 150, 155, 160, 165, 170, 175, 180, 185, 190, 195, 200], 'current': [0.8079000000000001, 0.71484, 0.8255800000000001, 0.9064, 0.9517000000000001, 0.9673, 0.9771000000000002, 0.9842000000000001, 0.9899, 0.9944999999999999, 0.9983000000000001, 1.0016, 1.0047000000000001, 1.0076, 1.0104000000000002, 1.0134, 1.016, 1.0184, 1.0208, 1.023, 1.0250000000000001, 1.0268000000000002, 1.0286, 1.0304000000000002, 1.0321, 1.0338, 1.0355, 1.0371, 1.0388000000000002, 1.0406, 1.0423, 1.0442, 1.0461, 1.048, 1.0497, 1.0513, 1.0529000000000002, 1.0544000000000002, 1.056, 1.0575, 1.0590000000000002], 'sigma current': [], 'temperature': [23.7], 'humidity': []}
IV_IMG a2cd4f924f18243cf63093c330a75de74a0cfc1adb7f42d20b21097a2e98a714
LEAK_CURRENT 0.7398052081633818
MAXIMUM_VOLTAGE 200
NO_BREAKDOWN_VOLTAGE_OBSERVED True

ProductionDB Record

id655f7d5b5f9f8800384fb00d
stateready
stateTs2023-11-23T16:27:07.212Z
stateUserIdentity24-6454-1
date2023-11-23T16:27:07.046Z
testType
id5b1a3abf130f5600054a42a8
codeIV_MEASURE
nameIV measurement
stateactive
institution
id62559a2de668fe000ae62bd1
codeMICRON
nameMicron Semiconductor Ltd (Micron)
user
id5d1a55a857df3c0009ada431
userIdentity24-6454-1
firstNameLingxin
middleNameNone
lastNameMeng
runNumber1
passedTrue
problemsFalse
properties
codenamedataTypevalueTyperequiredvaluerangeMinrangeMax
ANALYSIS_VERSIONAnalysis VersionstringsingleFalsede1c6a22NoneNone
HUMHumidity [%]floatsingleTrue0NoneNone
TEMPTemperature [°C]floatsingleTrue23.7NoneNone
results
  • codeBREAKDOWN_VOLTAGE
    nameBreakdown voltage [V] (if no breakdown put -999)
    dataTypefloat
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    value-999
    associateChildNone
  • codeIV_ARRAY
    nameIV data
    dataTypeobject
    valueTypesingle
    arrayDimensions1
    additionalFalse
    value
    time
    • 0
    • 2
    • 4
    • 6
    • 8
    • 10
    • 12
    • 14
    • 16
    • 18
    • 20
    • 22
    • 24
    • 26
    • 28
    • 30
    • 32
    • 34
    • 36
    • 38
    • 40
    • 42
    • 44
    • 46
    • 48
    • 50
    • 52
    • 54
    • 56
    • 58
    • 60
    • 62
    • 64
    • 66
    • 68
    • 70
    • 72
    • 74
    • 76
    • 78
    • 80
    voltage
    • 0
    • 5
    • 10
    • 15
    • 20
    • 25
    • 30
    • 35
    • 40
    • 45
    • 50
    • 55
    • 60
    • 65
    • 70
    • 75
    • 80
    • 85
    • 90
    • 95
    • 100
    • 105
    • 110
    • 115
    • 120
    • 125
    • 130
    • 135
    • 140
    • 145
    • 150
    • 155
    • 160
    • 165
    • 170
    • 175
    • 180
    • 185
    • 190
    • 195
    • 200
    current
    • 0.8079000000000001
    • 0.71484
    • 0.8255800000000001
    • 0.9064
    • 0.9517000000000001
    • 0.9673
    • 0.9771000000000002
    • 0.9842000000000001
    • 0.9899
    • 0.9944999999999999
    • 0.9983000000000001
    • 1.0016
    • 1.0047000000000001
    • 1.0076
    • 1.0104000000000002
    • 1.0134
    • 1.016
    • 1.0184
    • 1.0208
    • 1.023
    • 1.0250000000000001
    • 1.0268000000000002
    • 1.0286
    • 1.0304000000000002
    • 1.0321
    • 1.0338
    • 1.0355
    • 1.0371
    • 1.0388000000000002
    • 1.0406
    • 1.0423
    • 1.0442
    • 1.0461
    • 1.048
    • 1.0497
    • 1.0513
    • 1.0529000000000002
    • 1.0544000000000002
    • 1.056
    • 1.0575
    • 1.0590000000000002
    sigma current
    temperature
    • 23.7
    humidity
    associateChildNone
  • codeIV_IMG
    namePlot of IV curves (not for bare modules and modules)
    dataTypeimage
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    valuea2cd4f924f18243cf63093c330a75de74a0cfc1adb7f42d20b21097a2e98a714
    associateChildNone
  • codeLEAK_CURRENT
    nameLeakage current at depletion voltage + 20 (50) V for 3D (planar) sensors [μA]
    dataTypefloat
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    value0.7398052081633818
    associateChildNone
  • codeMAXIMUM_VOLTAGE
    nameMaximum measured Voltage [V]
    dataTypefloat
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    rangeMinNone
    rangeMaxNone
    value200
    associateChildNone
  • codeNO_BREAKDOWN_VOLTAGE_OBSERVED
    nameNo breakdown voltage observed
    dataTypeboolean
    valueTypesingle
    arrayDimensionsNone
    additionalFalse
    rangeMinNone
    rangeMaxNone
    valueTrue
    associateChildNone
cts2023-11-23T16:27:07.212Z
sys
cts2023-11-23T16:27:07.212Z
mts2023-11-23T16:27:07.212Z
rev0
defects
commentsNone
attachments
components
idcodestatestateTsstateUserIdentitydummycompletedcompletedTscompletedUserIdentitytrashedtrashedTsserialNumberalternativeIdentifierancestorMapprojectsubprojectcomponentTypetypepropertiestestedAtStageinstitution
62ba0908e684f9000ada931bb86919bea77d47c9bd51ad3f4e863e76ready2022-06-27T19:46:16.717Z6105-5335-1FalseFalseNoneNoneFalseNone20UPGS35300133V6-1-352911-3-005
parent
component
id63d148b20499130036777fc9
code70d38898e2d0bb74b7f86ece54cb9968
stateready
stateTs2023-01-25T15:20:18.290Z
stateUserIdentity4709-4605-1
dummyFalse
completedFalse
completedTsNone
completedUserIdentityNone
trashedFalse
trashedTsNone
trashedUserIdentityNone
serialNumber20UPGB42000017
alternativeIdentifierNone
project
codeP
namePixels
subproject
codePG
namePixel general
componentType
codeBARE_MODULE
nameBare Module
type
codeQUAD_BARE_MODULE
nameQuad bare module
testedAtStage
codeBAREMODULERECEPTION
nameReception at ITk institute
highestLevelParent
component
id63d148b20499130036777fc9
code70d38898e2d0bb74b7f86ece54cb9968
stateready
stateTs2023-01-25T15:20:18.290Z
stateUserIdentity4709-4605-1
dummyFalse
completedFalse
completedTsNone
completedUserIdentityNone
trashedFalse
trashedTsNone
trashedUserIdentityNone
serialNumber20UPGB42000017
alternativeIdentifierNone
project
codeP
namePixels
subproject
codePG
namePixel general
componentType
codeBARE_MODULE
nameBare Module
type
codeQUAD_BARE_MODULE
nameQuad bare module
testedAtStage
codeBAREMODULERECEPTION
nameReception at ITk institute
codeP
namePixels
codePG
namePixel general
codeSENSOR_TILE
nameSensor Tile
codeOUTER_PIXEL_QUAD_SENSOR_TILE
nameOuter Pixel Quad Sensor Tile
codenamedataTyperequireddefaultvalue
MAN_SNOAlternative IdentifierstringTrueTrueV6-1-352911-3-005
MAIN_VENDORMain VendorintegerTrueFalse5
SENSOR_TYPE_OR_TEST_STRUCTURESensor Type or Test StructureintegerTrueFalse3
VERSIONVersion of componentstringTrueFalsepre-production
SENSOR_SCRATCHIDScratch id (to be used if not the same as agreed manufacturer ID)stringFalseFalse0002
MAN_IDOriginal Manufacturer IDstringFalseFalseMSLE
V_FULLDEPLDepletion Voltage (V)floatTrueFalse50
codesensor_manufacturer
nameSensor Manufacturer
order0
initialTrue
finalFalse
codeMICRON
nameMicron Semiconductor Ltd (Micron)

 Current Stage: Final flatness measurement

Past QC Stages and Results

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Bare module reception at ITk institute (BAREMODULERECEPTION)

Test Local Result ProdDB Record
IV measurement
(IV_MEASURE)		 Registered Registered

Bare Module Assembly (BAREMODULEASSEMBLY)

Not to be used for detector (NOT_USED)

Post Irradiation (POST_IRRAD)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A

QA at Institutes (QA)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
Inter-pixel capacitance
(INTER-PIXEL_CAPACITANCE)		 No result N/A
Inter-pixel resistance
(INTER-PIXEL_RESISTANCE)		 No result N/A
IT measurement
(IT_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A

Wafer Processing (dicing, UBM, flip-chip) (WAFER_PROCESSING)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 No result N/A
Sensor Metrology: Sensor bow and thickness
(SENSOR_METROLOGY)		 No result N/A
Visual inspection
(VISUAL_INSPECTION)		 No result N/A

Sensor Manufacturer (sensor_manufacturer)

Test Local Result ProdDB Record
CV measurement
(CV_MEASURE)		 No result N/A
IV measurement
(IV_MEASURE)		 Registered Registered
LocalDB Test ID Stage Test Name Inspector Measurement Date Analysis Date Tags QC Registration
6565f8…eba019 BAREMODULERECEPTION IV_MEASURE RichardBates N/A 2 years ago No tags Selected
655f7d…4fb00d sensor_manufacturer IV_MEASURE LingxinMeng N/A 2 years ago No tags Selected
Stage Tests
sensor_manufacturer
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
WAFER_PROCESSING
  • Visual inspection  (VISUAL_INSPECTION)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
QA
  • CV measurement  (CV_MEASURE)
  • IV measurement  (IV_MEASURE)
  • IT measurement  (IT_MEASURE)
  • Inter-pixel capacitance  (INTER-PIXEL_CAPACITANCE)
  • Inter-pixel resistance  (INTER-PIXEL_RESISTANCE)
  • Sensor Metrology: Sensor bow and thickness  (SENSOR_METROLOGY)
POST_IRRAD
  • IV measurement  (IV_MEASURE)
  • CV measurement  (CV_MEASURE)
NOT_USED
BAREMODULEASSEMBLY
BAREMODULERECEPTION
  • IV measurement  (IV_MEASURE)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING
MODULE/INITIAL_WARM
MODULE/QC_CROSSCHECK
MODULE/INITIAL_COLD
MODULE/PARYLENE_MASKING
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING
MODULE/POST_PARYLENE_WARM
MODULE/POST_PARYLENE_COLD
MODULE/WIREBOND_PROTECTION
MODULE/THERMAL_CYCLES
MODULE/LONG_TERM_STABILITY_TEST
MODULE/FINAL_WARM
MODULE/FINAL_COLD
MODULE/FINAL_METROLOGY
MODULE/QC_STATUS
MODULE/UNHAPPY
MODULE/NOTCONSIDEREDINYIELDS
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION
MODULE/TAB_CUTTING
LLS/PRE_TC_WARM
LLS/PRE_TC_COLD
LLS/POST_TC_WARM
LLS/POST_TC_COLD
LLS/RECEPTION
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM
OB_LOADED_MODULE_CELL/FINAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION
OB_LOADED_MODULE_CELL/TAB_CUTTING
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
Back to top page of this component