Database for ITk Pixel Module

Serial Number	20UPGFC0097959
ProdDB ID	78402e…8002fc
LocalDB ID	6232fde8a3cd8a000a66fd28
Component Type	fe_chip
Parents	20UPIMS2102142 20UPGB12100050
Children	No match.
Flags

Item	Value
Wafer serial number	20UPGFW0000382

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	6232fde8a3cd8a000a66fd28
Stage	MODULE/INITIAL_WARM
Test Type	PIXEL_FAILURE_ANALYSIS
Institute ObjectId
User Name	JuanIgnacioCarlotto
ObjectId of this record	66696c86a2332dec72e60381
ObjectId of RAW record	None
Tags	No tags

Key	Data
ANALYSIS_VERSION	mqat v2.2.5rc1
PIXEL_FAILURE_BAD_ANALOG	9
PIXEL_FAILURE_BAD_DIGITAL	0
PIXEL_FAILURE_DEAD_ANALOG	803
PIXEL_FAILURE_DEAD_DIGITAL	6144
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	13865
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	23
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	0
PIXEL_FAILURE_DISCONNECTED_PIXELS	13868
PIXEL_FAILURE_DISC_PIXEL_ALL_ELEC	21019
PIXEL_FAILURE_ELECTRICALLY_FAILED	8695
PIXEL_FAILURE_FAILING_PIXELS	22563
PIXEL_FAILURE_HIGH_ENC	1
PIXEL_FAILURE_HIGH_NOISE	0
PIXEL_FAILURE_MERGED_BUMPS	0
PIXEL_FAILURE_SOURCE_SCAN_DONE	True
PIXEL_FAILURE_TUNING_BAD	1738

Filename	Contents
0x17ea7.log	Download
0x17ea7_matrix_pixels_source1d_xtalk.png
0x17ea7_merged.png
0x17ea7_HIGH_ENC_Noise_1d.png
0x17ea7_outeredge_pixels_source1d_xtalk.png
0x17ea7_all_pixels_noisediff1d_xtalk.png
0x17ea7_PIXEL_FAILURE_ANALYSIS_depclassification.png
0x17ea7_all_pixels_source1d_xtalk.png
0x17ea7_TUNING_BAD_Threshold_1d.png
0x17ea7_source_vs_xtalk.png
0x17ea7_summary.png
0x17ea7_source2d.png
output.log	Download
0x17ea7_PIXEL_FAILURE_ANALYSIS_indepclassification.png
0x17ea7_outeredge_pixels_noisediff1d_xtalk.png
0x17ea7_matrix_pixels_noisediff1d_xtalk.png
0x17ea7_PFA_electrical_failures.png
20UPGFC0097959_MODULE__INITIAL_WARM_PIXEL-FAILURE-ANALYSIS.zip	Download

Expand ProductionDB Record

66696c3861ecee003411574b

state

ready

stateTs

2024-06-12T09:36:56.454Z

stateUserIdentity

7595-2623-1

date

2024-06-12T09:38:00.000Z

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis
state	active

institution

id	5ecf13a093e5ee000a0e5ac6
code	IFAE
name	Institut de Fisica d'Altes Energies (IFAE)

user

id	60fa79ed0347f3000afd97c7
userIdentity	7595-2623-1
firstName	Juan
middleName	Ignacio
lastName	Carlotto

runNumber

66696c86a2332dec72e60381

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Pixel Failure Analysis Version	string	None	True	2.2.5rc1	None	None

results

code	name	dataType	valueType	arrayDimensions	additional	rangeMin	rangeMax	value	associateChild
PIXEL_FAILURE_BAD_ANALOG	Number of bad pixels from analog scan	integer	single	None	None	None	None	9	None
PIXEL_FAILURE_BAD_DIGITAL	Number of bad pixels from digital scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DEAD_ANALOG	Number of dead pixels from analog scan	integer	single	None	None	None	None	803	None
PIXEL_FAILURE_DEAD_DIGITAL	Number of dead pixels from digital scan	integer	single	None	None	None	None	6144	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	Number of disconnected bump from source scan	integer	single	None	None	None	None	13865	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	Number of bad (transition region) pixels from disconnected bump bond scan (xtalk based)	integer	single	None	None	None	None	23	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	Number of disconnected bumps from 0-bias threshold scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_PIXELS	Number of disconnected pixels	integer	single	None	None	None	None	13868	None
PIXEL_FAILURE_DISC_PIXEL_ALL_ELEC	Number of pixels failing disconnected pixel test	integer	single	None	None	None	None	21019	None
PIXEL_FAILURE_ELECTRICALLY_FAILED	Number of electrically failed pixels	integer	single	None	None	None	None	8695	None
PIXEL_FAILURE_FAILING_PIXELS	Total number of failing pixels	integer	single	None	None	None	None	22563	None
PIXEL_FAILURE_HIGH_ENC	Number of pixels with High ENC	integer	single	None	None	None	None	1	None
PIXEL_FAILURE_HIGH_NOISE	Number of pixels with high noise occupancy	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_MERGED_BUMPS	Number of merged bumps	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_SOURCE_SCAN_DONE	Source scan done	boolean	single	None	None	None	None	True	None
PIXEL_FAILURE_TUNING_BAD	Number of pixels with bad tuning	integer	single	None	None	None	None	1738	None

cts

2024-06-12T09:36:56.454Z

sys

cts	2024-06-12T09:36:56.454Z
mts	2024-06-12T09:36:57.266Z
rev	1

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

url

urlCernbox

filename

user

ace96bd6062be37db6eb1bd412c39167

2024-06-12T09:36:57.266Z

TestRun_66696c3861ecee003411574b_Attachment_Pack.zip

/home/data/viewer/static/cache/thumbnail/TestRun_66696c3861ecee003411574b_Attachment_Pack.zip

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/a/c/e/ace96bd6062be37db6eb1bd412c39167?authz=zteos64:MDAwMDAyOWJ4nO1Qv0vDQBilBR2KQ3Xs9CkiLknuR5Mmh4qzowoOIcOld2lDbe5ILg79J4p_gOAgToKDoLN0cnF1cxFnkSIuDsbi4ODk7Dc8Ph7vPR6vcVNv1PLm5fvT9XxrLjUDLVbqI71eI9SRqnC4OeTf2JV51stVqUVaDBwhjVXJHZ0rYYnY4U7XkTurXEiB3I5veTHuWhjLxOKJX0E7ThDuBK4gwe6kFu73S9iTGsAFRBhBjAZAEGlHUKaC4Tb2fBzO6kTQ-2Io6oQjHYFJhcwMy5UyNvVQEFDMAkrd7ZCxpDrmYhtjzw58G6MIMj6UbJYDImNQtTVskMcucK0Z9FVh2O9GoYY8zdgPpicVQy6mUJSi-pbgfnHh9OC2eaUel8uto9fp88bHxcl4Mjl7GR-Ttbvz1v-2f9wW3qYPm5_w09Oh

https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/a/c/e/ace96bd6062be37db6eb1bd412c39167

ace96bd6062be37db6eb1bd412c39167

id	60fa79ed0347f3000afd97c7
userIdentity	7595-2623-1
firstName	Juan
middleName	Ignacio
lastName	Carlotto

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

6232fde8a3cd8a000a66fd28

78402e0e8aa40b8f8ffdd9a9458002fc

ready

2022-03-17T09:22:48.281Z

9198-3887-1

False

None

False

None

20UPGFC0097959

None

parent

component

655dc72d5f9f88003848a899

code

e1d176ae362562273d79ee0b70e58fcc

state

ready

stateTs

2023-11-22T09:17:33.203Z

stateUserIdentity

5887-7484-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB12100050

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	SINGLE_BARE_MODULE
name	Single bare module

testedAtStage

code	MODULE/INITIAL_WARM
name	Initial Warm

highestLevelParent

component

6634e3bcdda7600035dfd11e

code

e7bb6e8e6ee0b5856f05c4db84b49e88

state

ready

stateTs

2024-05-03T13:16:44.147Z

stateUserIdentity

7595-2623-1

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False

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None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPIMS2102142

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PI
name	Inner pixels

componentType

code	MODULE
name	Module

type

code	TRIPLET_L0_STAVE_MODULE
name	Triplet L0 stave module

testedAtStage

code	MODULE/INITIAL_WARM
name	Initial Warm

code	P
name	Pixels

code	PG
name	Pixel general

code	FE_CHIP
name	Front-end Chip

code	ITKPIX_V11
name	ITkpix_V1.1

code	name	dataType	required	default	value
WAFERSN	Wafer serial number	string	False	False	20UPGFW0000382

code	MODULE/INITIAL_WARM
name	Initial Warm
order	7
initial	False
final	False

code	BONN
name	University of Bonn

Past QC Stages and Results

Initial Cold (MODULE/INITIAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	Registered	Registered
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	Registered	Registered
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Initial Warm (MODULE/INITIAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	Registered	Registered
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	Registered	Registered
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
Analog Readback (ANALOG_READBACK)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

Test	Local Result	ProdDB Record
Electrical FE chip tests (FECHIP_TEST)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
66508c…b4266a	MODULE/INITIAL_COLD	DATA_TRANSMISSION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66508c…b42649	MODULE/INITIAL_COLD	UNDERSHUNT_PROTECTION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66508b…b4262e	MODULE/INITIAL_COLD	OVERVOLTAGE_PROTECTION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
666970…e60630	MODULE/INITIAL_COLD	PIXEL_FAILURE_ANALYSIS	JuanIgnacioCarlotto	N/A	a year ago	No tags	Selected
66696f…e6055c	MODULE/INITIAL_COLD	MIN_HEALTH_TEST	JuanIgnacioCarlotto	N/A	a year ago	No tags	Selected
66696e…e60453	MODULE/INITIAL_COLD	TUNING	JuanIgnacioCarlotto	N/A	a year ago	No tags	Selected
66508b…b42613	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66508b…b425e6	MODULE/INITIAL_COLD	VCAL_CALIBRATION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66508b…b425b3	MODULE/INITIAL_COLD	SLDO	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66508b…b42586	MODULE/INITIAL_COLD	ANALOG_READBACK	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66508b…b42513	MODULE/INITIAL_COLD	ADC_CALIBRATION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e60381	MODULE/INITIAL_WARM	PIXEL_FAILURE_ANALYSIS	JuanIgnacioCarlotto	N/A	a year ago	No tags	Selected
66696c…e60278	MODULE/INITIAL_WARM	TUNING	JuanIgnacioCarlotto	N/A	a year ago	No tags	Selected
66696c…e60177	MODULE/INITIAL_WARM	MIN_HEALTH_TEST	JuanIgnacioCarlotto	N/A	a year ago	No tags	Selected
66696c…e600fe	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e603b8	MODULE/INITIAL_WARM	DATA_TRANSMISSION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e60399	MODULE/INITIAL_WARM	UNDERSHUNT_PROTECTION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e600d3	MODULE/INITIAL_WARM	OVERVOLTAGE_PROTECTION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e60046	MODULE/INITIAL_WARM	VCAL_CALIBRATION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e60015	MODULE/INITIAL_WARM	SLDO	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e600b6	MODULE/INITIAL_WARM	ANALOG_READBACK	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
66696c…e5ffea	MODULE/INITIAL_WARM	ADC_CALIBRATION	JuanIgnacioCarlotto	a year ago	a year ago	No tags	Selected
623301…6727dd	TESTONWAFER	FECHIP_TEST	MarkStandke	N/A	3 years ago	No tags	Selected

Stage	Tests
TESTONWAFER	Electrical FE chip tests (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING	ADC Calibration (ADC_CALIBRATION) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO) Low Power Mode (LP_MODE) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/INITIAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Low Power Mode (LP_MODE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE)
MODULE/WIREBOND_PROTECTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) Low Power Mode (LP_MODE) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION)
MODULE/POST_PARYLENE_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE)
MODULE/POST_PARYLENE_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/THERMAL_CYCLES	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Cold startup (COLD_STARTUP)
MODULE/LONG_TERM_STABILITY_TEST	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Undershunt Protection (UNDERSHUNT_PROTECTION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Data Transmission (DATA_TRANSMISSION) Cold startup (COLD_STARTUP)
MODULE/FINAL_METROLOGY	Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE) Analog Readback (ANALOG_READBACK)
MODULE/QC_STATUS
MODULE/UNHAPPY	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/NOTCONSIDEREDINYIELDS	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Undershunt Protection (UNDERSHUNT_PROTECTION) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION) Tuning (TUNING)
MODULE/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
LLS/PRE_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Low Power Mode (LP_MODE) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/PRE_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY	OB:Loaded local support QC electrical connectivity (OBLoadedLocalSupportQC_ElectricalConnectivity) OB:Loaded local support QC electrical performance (OBLoadedLocalSupportQC_ElectricalPerformance) OB:Loaded local support reception at the integration site (OBLoadedLocalSupport_IntegrationSite) OB:Loaded local support QC electrical low power (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE

20UPGFC0097959

MODULE/PARYLENE_MASKING

Component Information

Wafer

Properties

Comments

Test: PIXEL_FAILURE_ANALYSIS QC Failed

(Stage: MODULE/INITIAL_WARM)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

ProductionDB Record

Current Stage: Parylene Masking

Past QC Stages and Results

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

All Registered QC Tests

Check QC Flow

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