Database for ITk Pixel Module

Serial Number	20UPGFC0099668
ProdDB ID	afad07…8a2b06
LocalDB ID	622ce9e7be7827000a0db31d
Component Type	fe_chip
Parents	20UPGM22601067 20UPGB42307034
Children	No match.
Flags

Item	Value
Wafer serial number	20UPGFW0000389
Target Iref trim	None
Target Iref trim version	None

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	622ce9e7be7827000a0db31d
Stage	MODULE/LONG_TERM_STABILITY_TEST
Test Type	PIXEL_FAILURE_ANALYSIS
Institute ObjectId
User Name	Shift-LeaderHayashi-REPIC-KEK
ObjectId of this record	6719d16fc447bfb7e214bcdc
ObjectId of RAW record	None
Tags	No tags

Key	Data
ANALYSIS_VERSION	mqat v2.2.6
MEASUREMENT_DATE	None
YARR_VERSION	None
PIXEL_FAILURE_BAD_ANALOG	2
PIXEL_FAILURE_BAD_DIGITAL	0
PIXEL_FAILURE_DEAD_ANALOG	1
PIXEL_FAILURE_DEAD_DIGITAL	0
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	4
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	4
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	-1
PIXEL_FAILURE_DISCONNECTED_PIXELS	4
PIXEL_FAILURE_DISC_PIXEL_ALL_ELEC	-1
PIXEL_FAILURE_ELECTRICALLY_FAILED	870
PIXEL_FAILURE_FAILING_PIXELS	-1
PIXEL_FAILURE_HIGH_ENC	5
PIXEL_FAILURE_HIGH_NOISE	5
PIXEL_FAILURE_MERGED_BUMPS	0
PIXEL_FAILURE_SOURCE_SCAN_DONE	True
PIXEL_FAILURE_TUNING_BAD	857

Filename	Contents
output.log	Download
0x18554.log	Download
0x18554_TUNING_BAD_Threshold_1d.png
0x18554_HIGH_ENC_Noise_1d.png
0x18554_PFA_electrical_failures.png
0x18554_merged.png
0x18554_source2d.png
0x18554_matrix_pixels_source1d_xtalk.png
0x18554_inneredge_pixels_source1d_xtalk.png
0x18554_outeredge_pixels_source1d_xtalk.png
0x18554_all_pixels_source1d_xtalk.png
0x18554_source_vs_xtalk.png
0x18554_PIXEL_FAILURE_ANALYSIS_depclassification.png
0x18554_PIXEL_FAILURE_ANALYSIS_indepclassification.png
0x18554_summary.png
20UPGFC0099668_MODULE__LONG_TERM_STABILITY_TEST_PIXEL-FAILURE-ANALYSIS.zip	Download

Expand ProductionDB Record

673e0c7f3e14f454f16cf322

state

ready

stateTs

2024-11-20T16:21:19.143Z

stateUserIdentity

9833-9995-1

date

2024-10-24T04:47:00.000Z

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis
state	active

institution

id	64229fe1b8fd040036839f29
code	HR
name	Hayashi-Repic Co.

user

id	6704b3f3f081870042f075da
userIdentity	9833-9995-1
firstName	Shift-Leader
middleName
lastName	Hayashi-REPIC-KEK

runNumber

6719d16fc447bfb7e214bcdc

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Pixel Failure Analysis Version	string	None	True	2.2.6	None	None
MEASUREMENT_DATE	Date measurement performed	datetime	None	False	None	None	None
YARR_VERSION	Yarr Version	string	None	False	None	None	None

results

code	name	dataType	valueType	arrayDimensions	additional	rangeMin	rangeMax	value	associateChild
PIXEL_FAILURE_BAD_ANALOG	Number of bad pixels from analog scan	integer	single	None	None	None	None	2	None
PIXEL_FAILURE_BAD_DIGITAL	Number of bad pixels from digital scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DEAD_ANALOG	Number of dead pixels from analog scan	integer	single	None	None	None	None	1	None
PIXEL_FAILURE_DEAD_DIGITAL	Number of dead pixels from digital scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	Number of disconnected bump from source scan	integer	single	None	None	None	None	4	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	Number of bad (transition region) pixels from disconnected bump bond scan (xtalk based)	integer	single	None	None	None	None	4	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	Number of disconnected bumps from 0-bias threshold scan	integer	single	None	None	None	None	-1	None
PIXEL_FAILURE_DISCONNECTED_PIXELS	Number of disconnected pixels	integer	single	None	None	None	None	4	None
PIXEL_FAILURE_DISC_PIXEL_ALL_ELEC	Number of pixels failing disconnected pixel test	integer	single	None	None	None	None	-1	None
PIXEL_FAILURE_ELECTRICALLY_FAILED	Number of electrically failed pixels	integer	single	None	None	None	None	870	None
PIXEL_FAILURE_FAILING_PIXELS	Total number of failing pixels	integer	single	None	None	None	None	-1	None
PIXEL_FAILURE_HIGH_ENC	Number of pixels with High ENC	integer	single	None	None	None	None	5	None
PIXEL_FAILURE_HIGH_NOISE	Number of pixels with high noise occupancy	integer	single	None	None	None	None	5	None
PIXEL_FAILURE_MERGED_BUMPS	Number of merged bumps	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_SOURCE_SCAN_DONE	Source scan done	boolean	single	None	None	None	None	True	None
PIXEL_FAILURE_TUNING_BAD	Number of pixels with bad tuning	integer	single	None	None	None	None	857	None

cts

2024-11-20T16:21:19.143Z

sys

cts	2024-11-20T16:21:19.143Z
mts	2024-11-20T16:21:20.954Z
rev	1

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

url

urlCernbox

filename

user

039a2007c1fae991990295c012d63349

2024-11-20T16:21:20.954Z

TestRun_673e0c7f3e14f454f16cf322_Attachment_Pack.zip

/nas/db/localdb-tools/viewer/static/cache/thumbnail/TestRun_673e0c7f3e14f454f16cf322_Attachment_Pack.zip

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/0/3/9/039a2007c1fae991990295c012d63349?authz=zteos64:MDAwMDAyYjR4nO1QsUrDUBSlBYs6iDh20EtxECHNey9NmtxJN3EShQ6GDC99L2lomxeSl8GC4ibo7h90cBOkHyB10MV-g39iLA4Ojo7e4cA9nHM4nPV5fb2Wb05ns5dGcyXRw0y06pNsr8YsU6rC5HrEv7Ev8zTOVZmJpBiaQmqjkptZroQhQpOYlukd73qedCl3HcOJLNugNCKG6zHb4J0wIrTrOV3mnS5q_hnXcFjGAAwIQ9pBYgMjzA6gTET1U8el_rJOAPEXY5GuP8kC0ImQqcZcKd3uso5TuRlx6IGPGFWHNm1T6rQ9t01JACkfS1zGgEgRqrIah3loA88yhIEqNP5uFGrMkxR_MLFUCEUpFBLQOe9LBJWGcsBHEW7B2Ni4fmpcXPY-7k8e1t7Or472d2q37vx1ut167K3eNf93_oOd4X3xfNP4BHC0034%3d

https://cernbox.cern.ch/files/spaces/eos/atlas/atlascerngroupdisk/det-itk/prod-db/0/3/9/039a2007c1fae991990295c012d63349

039a2007c1fae991990295c012d63349

id	6704b3f3f081870042f075da
userIdentity	9833-9995-1
firstName	Shift-Leader
middleName
lastName	Hayashi-REPIC-KEK

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

622ce9e7be7827000a0db31d

afad07d7a27868b138513579118a2b06

ready

2022-03-12T18:43:51.984Z

9198-3887-1

False

None

False

None

20UPGFC0099668

None

parent

component

649290dfa0f5c00042e4bd40

code

f6ff9a952249c40fd03bd6418a803546

state

ready

stateTs

2023-06-21T05:55:43.968Z

stateUserIdentity

24-6238-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB42307034

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	MODULE/THERMAL_CYCLES
name	Thermal Cycles

highestLevelParent

component

64ed37e6c96c32004230ef1f

code

f0dd42cb70997a03eb37b202e98ea3a1

state

ready

stateTs

2023-08-29T00:12:22.218Z

stateUserIdentity

24-779-1

dummy

False

completed

False

completedTs

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completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGM22601067

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	MODULE
name	Module

type

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

testedAtStage

code	MODULE/THERMAL_CYCLES
name	Thermal Cycles

code	P
name	Pixels

code	PG
name	Pixel general

code	FE_CHIP
name	Front-end Chip

code	ITKPIX_V11
name	ITkpix_V1.1

code	name	dataType	required	default	value
WAFERSN	Wafer serial number	string	False	False	20UPGFW0000389

code	MODULE/LONG_TERM_STABILITY_TEST
name	Long Term Stability Test
order	18
initial	False
final	False

code	BONN
name	University of Bonn

Past QC Stages and Results

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Final Warm (MODULE/FINAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	Registered	Registered
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered

Thermal Cycles (MODULE/THERMAL_CYCLES)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
Tuning (TUNING)	No result	N/A

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
Tuning (TUNING)	No result	N/A

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Test	Local Result	ProdDB Record
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
Tuning (TUNING)	No result	N/A

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	Registered	Registered
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	No result	N/A
Analog Readback (ANALOG_READBACK)	No result	N/A
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	No result	N/A
Low Power Mode (LP_MODE)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	No result	N/A
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	No result	N/A
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	No result	N/A

Initial Warm (MODULE/INITIAL_WARM)

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	Registered	Registered
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	No result	N/A
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	No result	N/A
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Test	Local Result	ProdDB Record
Analog Readback (ANALOG_READBACK)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

Test	Local Result	ProdDB Record
Electrical FE chip tests (FECHIP_TEST)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
673cd1…66c403	MODULE/FINAL_COLD	DATA_TRANSMISSION	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
671ef7…14f777	MODULE/FINAL_COLD	PIXEL_FAILURE_ANALYSIS	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671ef3…14f55c	MODULE/FINAL_COLD	MIN_HEALTH_TEST	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671ef5…14f668	MODULE/FINAL_COLD	TUNING	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c3a3	MODULE/FINAL_COLD	LP_MODE	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c3db	MODULE/FINAL_COLD	INJECTION_CAPACITANCE	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c32b	MODULE/FINAL_COLD	VCAL_CALIBRATION	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c2ef	MODULE/FINAL_COLD	SLDO	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c387	MODULE/FINAL_COLD	ANALOG_READBACK	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c2bb	MODULE/FINAL_COLD	ADC_CALIBRATION	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c234	MODULE/FINAL_WARM	LP_MODE	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
671afb…14d9da	MODULE/FINAL_WARM	TUNING	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671afa…14d8c5	MODULE/FINAL_WARM	PIXEL_FAILURE_ANALYSIS	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
671afa…14d7eb	MODULE/FINAL_WARM	MIN_HEALTH_TEST	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
673cd1…66c29c	MODULE/FINAL_WARM	DATA_TRANSMISSION	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c270	MODULE/FINAL_WARM	INJECTION_CAPACITANCE	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c1b4	MODULE/FINAL_WARM	VCAL_CALIBRATION	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c174	MODULE/FINAL_WARM	SLDO	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c214	MODULE/FINAL_WARM	ANALOG_READBACK	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
673cd1…66c13c	MODULE/FINAL_WARM	ADC_CALIBRATION	Shift-LeaderHayashi-REPIC-KEK	a year ago	a year ago	No tags	Selected
6719d1…14bcdc	MODULE/LONG_TERM_STABILITY_TEST	PIXEL_FAILURE_ANALYSIS	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719d0…14bbc9	MODULE/LONG_TERM_STABILITY_TEST	MIN_HEALTH_TEST	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719ae…14b67b	MODULE/THERMAL_CYCLES	PIXEL_FAILURE_ANALYSIS	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
6719ad…14b584	MODULE/THERMAL_CYCLES	MIN_HEALTH_TEST	Shift-LeaderHayashi-REPIC-KEK	N/A	a year ago	No tags	Selected
66784c…d1d8ae	MODULE/INITIAL_COLD	OVERVOLTAGE_PROTECTION	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784c…d1d892	MODULE/INITIAL_COLD	LP_MODE	HideyukiOide	2 years ago	a year ago	No tags	Selected
64f054…74ec0f	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	HideyukiOide	2 years ago	a year ago	No tags
66784c…d1d8e2	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784c…d1d7e6	MODULE/INITIAL_COLD	VCAL_CALIBRATION	HideyukiOide	2 years ago	a year ago	No tags	Selected
64f050…74eb5c	MODULE/INITIAL_COLD	SLDO	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784c…d1d776	MODULE/INITIAL_COLD	ADC_CALIBRATION	HideyukiOide	2 years ago	a year ago	No tags	Selected
64f023…74e3e0	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	HideyukiOide	2 years ago	a year ago	No tags
66784b…d1d744	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784b…d1d710	MODULE/INITIAL_WARM	OVERVOLTAGE_PROTECTION	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784b…d1d6f4	MODULE/INITIAL_WARM	LP_MODE	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784b…d1d60c	MODULE/INITIAL_WARM	SLDO	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784b…d1d5d8	MODULE/INITIAL_WARM	ADC_CALIBRATION	HideyukiOide	2 years ago	a year ago	No tags	Selected
622ced…0dc236	TESTONWAFER	FECHIP_TEST	MarkStandke	N/A	a year ago	No tags	Selected
66784c…d1d876	MODULE/INITIAL_COLD	ANALOG_READBACK	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784b…d1d648	MODULE/INITIAL_WARM	VCAL_CALIBRATION	HideyukiOide	2 years ago	a year ago	No tags	Selected
66784b…d1d6d8	MODULE/INITIAL_WARM	ANALOG_READBACK	HideyukiOide	2 years ago	a year ago	No tags	Selected

Stage	Tests
TESTONWAFER	Electrical FE chip tests (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING	ADC Calibration (ADC_CALIBRATION) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO) Low Power Mode (LP_MODE) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/INITIAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Low Power Mode (LP_MODE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE)
MODULE/WIREBOND_PROTECTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) Low Power Mode (LP_MODE) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION)
MODULE/POST_PARYLENE_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE)
MODULE/POST_PARYLENE_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/THERMAL_CYCLES	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Cold startup (COLD_STARTUP)
MODULE/LONG_TERM_STABILITY_TEST	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Undershunt Protection (UNDERSHUNT_PROTECTION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Data Transmission (DATA_TRANSMISSION) Cold startup (COLD_STARTUP)
MODULE/FINAL_METROLOGY	Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE) Analog Readback (ANALOG_READBACK)
MODULE/QC_STATUS
MODULE/UNHAPPY	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/NOTCONSIDEREDINYIELDS	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Undershunt Protection (UNDERSHUNT_PROTECTION) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION) Tuning (TUNING)
MODULE/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
LLS/PRE_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Low Power Mode (LP_MODE) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/PRE_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY	OB:Loaded local support QC electrical connectivity (OBLoadedLocalSupportQC_ElectricalConnectivity) OB:Loaded local support QC electrical performance (OBLoadedLocalSupportQC_ElectricalPerformance) OB:Loaded local support reception at the integration site (OBLoadedLocalSupport_IntegrationSite) OB:Loaded local support QC electrical low power (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE

20UPGFC0099668

MODULE/COMPLETE

Component Information

Wafer

Properties

Comments

Test: PIXEL_FAILURE_ANALYSIS QC Failed

(Stage: MODULE/LONG_TERM_STABILITY_TEST)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

ProductionDB Record

Current Stage: Module Complete

Past QC Stages and Results

Modules damaged, impossible to recover (MODULE/GRAVEYARD)

Stage for QA modules and others not to be considered in yield calculation (MODULE/NOTCONSIDEREDINYIELDS)

Modules failed test, needs investigation (MODULE/UNHAPPY)

Ranking of the module (MODULE/QC_STATUS)

Final flatness measurement (MODULE/FINAL_METROLOGY)

Final Cold (MODULE/FINAL_COLD)

Final Warm (MODULE/FINAL_WARM)

Long Term Stability Test (MODULE/LONG_TERM_STABILITY_TEST)

Thermal Cycles (MODULE/THERMAL_CYCLES)

Post-Parylene Cold (MODULE/POST_PARYLENE_COLD)

Post-Parylene Warm (MODULE/POST_PARYLENE_WARM)

Wirebond Protection (alt) (MODULE/WIREBOND_PROTECTION)

Parylene Unmasking (MODULE/PARYLENE_UNMASKING)

Parylene Coating (MODULE/PARYLENE_COATING)

Parylene Masking (MODULE/PARYLENE_MASKING)

Initial Cold (MODULE/INITIAL_COLD)

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

All Registered QC Tests

Check QC Flow

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