Database for ITk Pixel Module

Serial Number	20UPGFC0096323
ProdDB ID	8e24ad…2d3543
LocalDB ID	622cbae4be7827000a0d29cb
Component Type	fe_chip
Parents	20UPGM22110303 20UPGB42200012
Children	No match.
Flags

Item	Value
Wafer serial number	20UPGFW0000376

Key	Data
QC Passed	False
Date	a year ago
component ObjectId	622cbae4be7827000a0d29cb
Stage	MODULE/INITIAL_COLD
Test Type	PIXEL_FAILURE_ANALYSIS
Institute ObjectId
User Name	FrancescoCrescioli
ObjectId of this record	65b125fc9060648bdd586348
ObjectId of RAW record	None
Tags	No tags

Key	Data
ANALYSIS_VERSION	mqat v2.2.2
PIXEL_FAILURE_BAD_ANALOG	21
PIXEL_FAILURE_BAD_DIGITAL	0
PIXEL_FAILURE_DEAD_ANALOG	4
PIXEL_FAILURE_DEAD_DIGITAL	0
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	-1
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	0
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	0
PIXEL_FAILURE_DISCONNECTED_PIXELS	8
PIXEL_FAILURE_ELECTRICALLY_FAILED	1567
PIXEL_FAILURE_FAILING_PIXELS	1567
PIXEL_FAILURE_HIGH_ENC	6
PIXEL_FAILURE_HIGH_NOISE	32
PIXEL_FAILURE_MERGED_BUMPS	0
PIXEL_FAILURE_SOURCE_SCAN_DONE	False
PIXEL_FAILURE_TUNING_BAD	1504

Filename	Contents
output.log	Download
0x17843.log	Download
0x17843_TUNING_BAD_Threshold_1d.png
0x17843_HIGH_ENC_Noise_1d.png
0x17843_PFA_electrical_failures.png
0x17843_merged.png
0x17843_matrix_pixels_noisediff1d_xtalk.png
0x17843_inneredge_pixels_noisediff1d_xtalk.png
0x17843_outeredge_pixels_noisediff1d_xtalk.png
0x17843_all_pixels_noisediff1d_xtalk.png
0x17843_PIXEL_FAILURE_ANALYSIS_depclassification.png
0x17843_PIXEL_FAILURE_ANALYSIS_indepclassification.png
0x17843_summary.png
20UPGFC0096323_MODULE__INITIAL_COLD_PIXEL-FAILURE-ANALYSIS.zip	Download

Expand ProductionDB Record

65d3531098cf8900429c9aba

state

ready

stateTs

2024-02-19T13:09:36.993Z

stateUserIdentity

9086-39-1

date

2024-01-24T15:00:00.000Z

testType

id	6393a09615838700361eed0a
code	PIXEL_FAILURE_ANALYSIS
name	Pixel Failure Analysis
state	active

institution

id	5d42fb891fd678000a409866
code	LPNHE
name	Laboratoire de Physique Nucléaire et de Hautes Energies

user

id	5e98594f8bc0cb000ba8d3a8
userIdentity	9086-39-1
firstName	Francesco
middleName
lastName	Crescioli

runNumber

65b125fc9060648bdd586348

passed

False

problems

False

properties

code	name	dataType	valueType	required	value	rangeMin	rangeMax
ANALYSIS_VERSION	Pixel Failure Analysis Version	string	None	True	2.2.2	None	None

results

code	name	dataType	valueType	arrayDimensions	additional	rangeMin	rangeMax	value	associateChild
PIXEL_FAILURE_BAD_ANALOG	Number of bad pixels from analog scan	integer	single	None	None	None	None	21	None
PIXEL_FAILURE_BAD_DIGITAL	Number of bad pixels from digital scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DEAD_ANALOG	Number of dead pixels from analog scan	integer	single	None	None	None	None	4	None
PIXEL_FAILURE_DEAD_DIGITAL	Number of dead pixels from digital scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_SOURCE_SCAN	Number of disconnected bump from source scan	integer	single	None	None	None	None	-1	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_XTALK_SCAN	Number of bad (transition region) pixels from disconnected bump bond scan (xtalk based)	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_BUMPS_ZERO_BIAS_SCAN	Number of disconnected bumps from 0-bias threshold scan	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_DISCONNECTED_PIXELS	Number of disconnected pixels	integer	single	None	None	None	None	8	None
PIXEL_FAILURE_ELECTRICALLY_FAILED	Number of electrically failed pixels	integer	single	None	None	None	None	1567	None
PIXEL_FAILURE_FAILING_PIXELS	Total number of failing pixels	integer	single	None	None	None	None	1567	None
PIXEL_FAILURE_HIGH_ENC	Number of pixels with High ENC	integer	single	None	None	None	None	6	None
PIXEL_FAILURE_HIGH_NOISE	Number of pixels with high noise occupancy	integer	single	None	None	None	None	32	None
PIXEL_FAILURE_MERGED_BUMPS	Number of merged bumps	integer	single	None	None	None	None	0	None
PIXEL_FAILURE_SOURCE_SCAN_DONE	Source scan done	boolean	single	None	None	None	None	False	None
PIXEL_FAILURE_TUNING_BAD	Number of pixels with bad tuning	integer	single	None	None	None	None	1504	None

cts

2024-02-19T13:09:36.994Z

sys

cts	2024-02-19T13:09:36.994Z
mts	2024-02-19T13:09:38.249Z
rev	1

defects

comments

None

attachments

code

dateTime

title

description

contentType

type

url

filename

user

6c78f25a8db87529344d1ed02b58ac17

2024-02-19T13:09:38.248Z

TestRun_65d3531098cf8900429c9aba_Attachment_Pack.zip

/home/data/viewer/static/cache/thumbnail/TestRun_65d3531098cf8900429c9aba_Attachment_Pack.zip

None

eos

https://eosatlas.cern.ch/eos/atlas/atlascerngroupdisk/det-itk/prod-db/6/c/7/6c78f25a8db87529344d1ed02b58ac17?authz=zteos64:MDAwMDAyOWF4nO2QMUvEQBCFuQMVrhIrPZtBLCxMsptkk81U2lhYWNhYhCC57N4Zzssum73m7K60s7IQxD8gaKPlgY1g4R8Qe3-G8bCwsLJ2isfw8WZ4vM5Du9Myy7Pp291id6G0Qy022hO91fIDT6ray-1p_q2FNNXAqLEWZT30hLROY_e0UcIRPS_yCi_e3ywKxmWREKcfs9ihVEqHRyR08rDXJzROmPCTw6dWeiQF7GoDlADlGFAMGPjEDzMYlwJpSCNO03mcDAZfJCBxOtEZ2FLIyqJRyrqcEU4CZDxKdlLEfjPIqEtp5CbcpSSDKh9JnL8BUSE0YS0OTY9BrjXCiaot_n4o1CgvK_xBBlIhYTSAeiyabQX2LvyXpcnz-drB9uVNNOWPq-76WfL-mhyTztX9THb_q_1btXB7_TFtfwImYcsw

6c78f25a8db87529344d1ed02b58ac17

id	5e98594f8bc0cb000ba8d3a8
userIdentity	9086-39-1
firstName	Francesco
middleName
lastName	Crescioli

components

code

state

stateTs

stateUserIdentity

dummy

completed

completedTs

completedUserIdentity

trashed

trashedTs

serialNumber

alternativeIdentifier

ancestorMap

project

subproject

componentType

type

properties

testedAtStage

institution

622cbae4be7827000a0d29cb

8e24ad9331366985fb49aa15e12d3543

ready

2022-03-12T15:23:16.505Z

9198-3887-1

False

None

False

None

20UPGFC0096323

None

parent

component

64b7f7c20ca4ae0042e7024f

code

e2b6a8af29f528fa904b52c0ca9b6d6f

state

ready

stateTs

2023-07-19T14:48:34.109Z

stateUserIdentity

23-6780-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGB42200012

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	BARE_MODULE
name	Bare Module

type

code	QUAD_BARE_MODULE
name	Quad bare module

testedAtStage

code	MODULE/INITIAL_WARM
name	Initial Warm

highestLevelParent

component

655f30d65f9f8800384e8035

code

d230ed85b2bc18a9eb693303cdcd7214

state

ready

stateTs

2023-11-23T11:00:38.582Z

stateUserIdentity

9086-39-1

dummy

False

completed

False

completedTs

None

completedUserIdentity

None

trashed

False

trashedTs

None

trashedUserIdentity

None

serialNumber

20UPGM22110303

alternativeIdentifier

None

project

code	P
name	Pixels

subproject

code	PG
name	Pixel general

componentType

code	MODULE
name	Module

type

code	OUTER_SYSTEM_QUAD_MODULE
name	Outer system quad module

testedAtStage

code	MODULE/INITIAL_WARM
name	Initial Warm

code	P
name	Pixels

code	PG
name	Pixel general

code	FE_CHIP
name	Front-end Chip

code	ITKPIX_V11
name	ITkpix_V1.1

code	name	dataType	required	default	value
WAFERSN	Wafer serial number	string	False	False	20UPGFW0000376

code	MODULE/INITIAL_COLD
name	Initial Cold
order	8
initial	False
final	False

code	BONN
name	University of Bonn

Test Type	Local Result
ADC Calibration (ADC_CALIBRATION)	TestRun Present
Analog Readback (ANALOG_READBACK)	TestRun Present
SLDO (SLDO)	TestRun Present
VCAL Calibration (VCAL_CALIBRATION)	TestRun Present
Injection Capacitance (INJECTION_CAPACITANCE)	TestRun Present
Tuning (TUNING)	TestRun Present
Minimal Health Test (MIN_HEALTH_TEST)	TestRun Present
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	TestRun Present
Low Power Mode (LP_MODE)	TestRun Present
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	TestRun Present
Undershunt Protection (UNDERSHUNT_PROTECTION)	No TestRun!
Data Transmission (DATA_TRANSMISSION)	No TestRun!

LDB ID	TestRun Code	QC Passed	Inspector	Measurement Date	Analysis Date	Analysis Version	Tags	QC Registration
65aa6e…1da02e	OVERVOLTAGE_PROTECTION	Fail	FrancescoCrescioli	a year ago	a year ago	2.2.2	No tags	Selected
65aa6d…21141e	LP_MODE	Fail	FrancescoCrescioli	a year ago	a year ago	2.2.2	No tags	Selected
65b125…586348	PIXEL_FAILURE_ANALYSIS	Fail	FrancescoCrescioli	N/A	a year ago	2.2.2	No tags	Selected
65b125…586286	MIN_HEALTH_TEST	Pass	FrancescoCrescioli	N/A	a year ago	2.2.2	No tags	Selected
65b124…5860df	TUNING	Fail	FrancescoCrescioli	N/A	a year ago	2.2.2	No tags	Selected
65aa6d…2113f1	INJECTION_CAPACITANCE	Pass	FrancescoCrescioli	a year ago	a year ago	2.2.2	No tags	Selected
65aa6d…7de97e	VCAL_CALIBRATION	Pass	FrancescoCrescioli	a year ago	a year ago	2.2.2	No tags	Selected
65aa6c…183d5a	SLDO	Fail	FrancescoCrescioli	a year ago	a year ago	2.2.2	No tags	Selected
65aa6c…585551	ANALOG_READBACK	Fail	FrancescoCrescioli	a year ago	a year ago	2.2.2	No tags	Selected
65aa6c…7de94a	ADC_CALIBRATION	Pass	FrancescoCrescioli	a year ago	a year ago	2.2.2	No tags	Selected

Test	Local Result	ProdDB Record
ADC Calibration (ADC_CALIBRATION)	Registered	Registered
Analog Readback (ANALOG_READBACK)	Registered	Registered
Data Transmission (DATA_TRANSMISSION)	No result	N/A
Injection Capacitance (INJECTION_CAPACITANCE)	Registered	Registered
Low Power Mode (LP_MODE)	Registered	Registered
Minimal Health Test (MIN_HEALTH_TEST)	Registered	Registered
Overvoltage Protection (OVERVOLTAGE_PROTECTION)	Registered	Registered
Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)	Registered	Registered
SLDO (SLDO)	Registered	Registered
Tuning (TUNING)	Registered	Registered
Undershunt Protection (UNDERSHUNT_PROTECTION)	No result	N/A
VCAL Calibration (VCAL_CALIBRATION)	Registered	Registered

Test	Local Result	ProdDB Record
Analog Readback (ANALOG_READBACK)	No result	N/A
Minimal Health Test (MIN_HEALTH_TEST)	No result	N/A

Test	Local Result	ProdDB Record
Electrical FE chip tests (FECHIP_TEST)	Registered	Registered

LocalDB Test ID	Stage	Test Name	Inspector	Measurement Date	Analysis Date	Tags	QC Registration
65aa6e…1da02e	MODULE/INITIAL_COLD	OVERVOLTAGE_PROTECTION	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65aa6d…21141e	MODULE/INITIAL_COLD	LP_MODE	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65b125…586348	MODULE/INITIAL_COLD	PIXEL_FAILURE_ANALYSIS	FrancescoCrescioli	N/A	a year ago	No tags	Selected
65b125…586286	MODULE/INITIAL_COLD	MIN_HEALTH_TEST	FrancescoCrescioli	N/A	a year ago	No tags	Selected
65b124…5860df	MODULE/INITIAL_COLD	TUNING	FrancescoCrescioli	N/A	a year ago	No tags	Selected
65aa6d…2113f1	MODULE/INITIAL_COLD	INJECTION_CAPACITANCE	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65aa6d…7de97e	MODULE/INITIAL_COLD	VCAL_CALIBRATION	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65aa6c…183d5a	MODULE/INITIAL_COLD	SLDO	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65aa6c…585551	MODULE/INITIAL_COLD	ANALOG_READBACK	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65aa6c…7de94a	MODULE/INITIAL_COLD	ADC_CALIBRATION	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65a904…ab1909	MODULE/INITIAL_WARM	PIXEL_FAILURE_ANALYSIS	FrancescoCrescioli	N/A	a year ago	No tags	Selected
65a904…17be3e	MODULE/INITIAL_WARM	TUNING	FrancescoCrescioli	N/A	a year ago	No tags	Selected
65a903…cb79d9	MODULE/INITIAL_WARM	MIN_HEALTH_TEST	FrancescoCrescioli	N/A	a year ago	No tags	Selected
659fc7…f21442	MODULE/INITIAL_WARM	INJECTION_CAPACITANCE	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
659fc7…5c74ab	MODULE/INITIAL_WARM	OVERVOLTAGE_PROTECTION	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
659fc7…5c7487	MODULE/INITIAL_WARM	LP_MODE	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
659fc6…5c7453	MODULE/INITIAL_WARM	VCAL_CALIBRATION	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
659fc6…f21404	MODULE/INITIAL_WARM	SLDO	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
65a945…78f29c	MODULE/INITIAL_WARM	ANALOG_READBACK	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
659fc5…5c741a	MODULE/INITIAL_WARM	ADC_CALIBRATION	FrancescoCrescioli	a year ago	a year ago	No tags	Selected
622cbe…0d35b1	TESTONWAFER	FECHIP_TEST	MarkStandke	N/A	3 years ago	No tags	Selected

Stage	Tests
TESTONWAFER	Electrical FE chip tests (FECHIP_TEST)
HYBRIDISATION
UNUSABLE
BAREMODULEASSEMBLY
BAREMODULERECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK)
MODULE/INIT
MODULE/ASSEMBLY
MODULE/WIREBONDING	ADC Calibration (ADC_CALIBRATION) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO) Low Power Mode (LP_MODE) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/INITIAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/QC_CROSSCHECK	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
MODULE/INITIAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_MASKING	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Low Power Mode (LP_MODE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/PARYLENE_COATING
MODULE/PARYLENE_UNMASKING	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE)
MODULE/WIREBOND_PROTECTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) Low Power Mode (LP_MODE) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION)
MODULE/POST_PARYLENE_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE)
MODULE/POST_PARYLENE_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) VCAL Calibration (VCAL_CALIBRATION) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) SLDO (SLDO) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/THERMAL_CYCLES	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Cold startup (COLD_STARTUP)
MODULE/LONG_TERM_STABILITY_TEST	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) SLDO (SLDO) Tuning (TUNING) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) Analog Readback (ANALOG_READBACK) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Undershunt Protection (UNDERSHUNT_PROTECTION) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Tuning (TUNING) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Undershunt Protection (UNDERSHUNT_PROTECTION) Tuning (TUNING) Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Data Transmission (DATA_TRANSMISSION) Cold startup (COLD_STARTUP)
MODULE/FINAL_METROLOGY	Data Transmission (DATA_TRANSMISSION) ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Injection Capacitance (INJECTION_CAPACITANCE) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Injection Capacitance (INJECTION_CAPACITANCE) Analog Readback (ANALOG_READBACK)
MODULE/QC_STATUS
MODULE/UNHAPPY	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) Data Transmission (DATA_TRANSMISSION) VCAL Calibration (VCAL_CALIBRATION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Injection Capacitance (INJECTION_CAPACITANCE)
MODULE/NOTCONSIDEREDINYIELDS	ADC Calibration (ADC_CALIBRATION) VCAL Calibration (VCAL_CALIBRATION) SLDO (SLDO) Undershunt Protection (UNDERSHUNT_PROTECTION) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Analog Readback (ANALOG_READBACK) Overvoltage Protection (OVERVOLTAGE_PROTECTION) Low Power Mode (LP_MODE) Injection Capacitance (INJECTION_CAPACITANCE) Data Transmission (DATA_TRANSMISSION)
MODULE/GRAVEYARD
MODULE/COMPLETE
MODULE/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Data Transmission (DATA_TRANSMISSION) Tuning (TUNING)
MODULE/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
LLS/PRE_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Low Power Mode (LP_MODE) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/PRE_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_WARM	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/POST_TC_COLD	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
LLS/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Analog Readback (ANALOG_READBACK) SLDO (SLDO) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/INIT
OB_LOADED_MODULE_CELL/ASSEMBLY
OB_LOADED_MODULE_CELL/THERMAL_CYCLES
OB_LOADED_MODULE_CELL/FINAL_WARM	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/FINAL_COLD	ADC Calibration (ADC_CALIBRATION) Analog Readback (ANALOG_READBACK) SLDO (SLDO) VCAL Calibration (VCAL_CALIBRATION) Injection Capacitance (INJECTION_CAPACITANCE) Low Power Mode (LP_MODE) Data Transmission (DATA_TRANSMISSION) Minimal Health Test (MIN_HEALTH_TEST) Tuning (TUNING) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS)
OB_LOADED_MODULE_CELL/THERMAL_COLD
OB_LOADED_MODULE_CELL/THERMAL_WARM
OB_LOADED_MODULE_CELL/ENVELOPE_CHECK
OB_LOADED_MODULE_CELL/QC_STATUS
OB_LOADED_MODULE_CELL/UNHAPPY
OB_LOADED_MODULE_CELL/COMPLETE
OB_LOADED_MODULE_CELL/RECEPTION	Minimal Health Test (MIN_HEALTH_TEST) Pixel Failure Analysis (PIXEL_FAILURE_ANALYSIS) SLDO (SLDO)
OB_LOADED_MODULE_CELL/TAB_CUTTING	Minimal Health Test (MIN_HEALTH_TEST)
OB_LOADED_MODULE_CELL/PIGTAIL_INSERTION
TEST_AFTER_LOADED_LOCAL_SUPPORT_ASSEMBLY	OB:Loaded local support QC electrical connectivity (OBLoadedLocalSupportQC_ElectricalConnectivity) OB:Loaded local support QC electrical performance (OBLoadedLocalSupportQC_ElectricalPerformance) OB:Loaded local support reception at the integration site (OBLoadedLocalSupport_IntegrationSite) OB:Loaded local support QC electrical low power (OBLoadedLocalSupport_QCElectricalLowPower)
TEST_JM_OEC_FE

20UPGFC0096323

MODULE/INITIAL_COLD

Component Information

Wafer

Properties

Comments

Test: PIXEL_FAILURE_ANALYSIS QC Failed

(Stage: MODULE/INITIAL_COLD)

Basic View Only: custom view for this TestRun is not prepared.

Metadata

Results

Attachments

ProductionDB Record

Current Stage: Initial Cold

Candidate TestRuns of this Stage

Past QC Stages and Results

QC cross-check (module swapping) (MODULE/QC_CROSSCHECK)

Initial Warm (MODULE/INITIAL_WARM)

Wire Bonding (MODULE/WIREBONDING)

Bare module to module PCB assembly (MODULE/ASSEMBLY)

Initial state to associate flex to bare module (MODULE/INIT)

Reception at ITk institute (BAREMODULERECEPTION)

Bare module assembly (BAREMODULEASSEMBLY)

Not to be used for detector (UNUSABLE)

Hybridisation (HYBRIDISATION)

Testing on wafer (TESTONWAFER)

All Registered QC Tests

Check QC Flow

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